JPH01264185A - Socket for measuring integrated circuit - Google Patents

Abstract

PURPOSE:To prevent leak by attachment of frost by providing protrusions on the top surface of a socket insulation body where a number of contacts are disposed in a line in the middle between adjacent contacts. CONSTITUTION:A number of contacts 2, 2,... to contact lead terminals of an IC mounted for measurement of electric characteristics are held and fixed at the inside of a socket insulation body 1 of a parallelopiped. Socket pins 3 connected with the contacts respectively are protruding out from the underside of the socket insulation body 1. A protrusion 4 is provided in the top surface of the socket insulation body between adjacent contacts 2 which are exposed in the top surface of the socket insulation body 1 at their top parts, crossing the top surface, and the underside of a main body of a package of the IC mounted in this socket is prevented from tightly contacting the top surface of the socket insulation body. This makes frost less likely to be attached around the contacts if the mounted IC is at a low temperature, thereby leak can be prevented.

Description

Detailed Description of the Invention [Industrial Application Field] The present invention provides a method for connecting the lead terminals of the integrated circuit to be measured with a measuring device when measuring the electrical characteristics of the integrated circuit. Regarding the socket to which the is attached.

[Conventional technology]

Conventionally, sockets used to mount integrated circuits (hereinafter referred to as ICs) in which a large number of lead terminals lined up in a row protrude outward from one surface of a package body, for example, have been used.
For example, as shown in the side view of FIG. 2, a contact 2 that contacts the lead terminal of the attached IC is provided on the upper surface side of the parallelepiped socket insulator 11, and a socket pin 3 connected to this contact is provided. It protruded outward from the lower surface of the insulator 11, and the upper exposed portion of the contactor 2 and the upper surface of the insulator 11 were substantially on the same plane.

[Problem to be solved by the invention]

In the conventional socket described above, the upper part of the contact and the upper surface of the socket insulator that holds it inside are almost on the same plane, so there is no problem when the temperature of the IC to be measured is room temperature or high temperature, but Measurement 1. When C is low, the bottom surface of the package body from which the lead terminals of the IC under test protrude will come into close contact with the top surface of the socket insulator, and frost will easily form between the contacts. There was a problem with leaks occurring between the two.

[Means to solve the problem]

The socket of the present invention comprises a contact element that comes into contact with a lead terminal of an IC to be measured, and a socket insulator that holds and fixes the contact element inside, and the upper surface side of the socket insulator on which the contact element is provided. In this case, when the IC to be measured is mounted on the main socket, the lead terminal of the IC to be measured protrudes from the intermediate portion between adjacent contactors. A protrusion is provided to prevent the lower surface of the package body from coming into close contact with the upper surface of the socket insulator.

〔Example〕

Next, the present invention will be explained by examples.

FIG. 1(a) is a plan view of an embodiment of the present invention, and FIG. 1(b) is a plan view of an embodiment of the present invention.
is a side view, and the same figure (c) is a vertical view. In these figures, a large number of contacts 2゜2, . . Further, socket pins 3 connected to each contactor are protruded from the lower surface of the socket insulator 1 to the outside. On the upper surface of the socket insulator l at the intermediate part between adjacent contacts 2 whose upper portions are exposed on the upper surface of the socket insulator 1, a protruding strip 4 is provided so as to cross this upper surface. The strip 4 prevents the lower surface of the package body of the IC mounted in this socket from coming into close contact with the upper surface of the socket insulator.

〔Effect of the invention〕

As mentioned above, in the socket of the present invention, a large number of contacts are arranged in a row, and the socket insulator has a convex strip on the upper surface between adjacent contacts. The lower surface of the package body from which the IC lead terminals protrude does not come into close contact with the upper surface of the socket insulator. Therefore, even when the mounted IC is at a low temperature, there is a distance between the IC and the socket insulator, so frost is difficult to form near the contacts, and therefore leakage due to frost does not occur.

Furthermore, since the creepage distance between the contacts is increased by the protrusions, the current leakage path becomes longer, which also increases the leakage prevention effect.

[Brief explanation of the drawing]

FIGS. 1(a), 1(b), and 1(c) are a plan view, a side view, and a vertical view, respectively, of an embodiment of the present invention. FIG. 2 is a side view of a conventional socket. 1.11...Socket insulator, 2...
Contact, 3...Socket pin, 4...
Convex rays (protrusions). Agent Patent Attorney Uchihara Oto (tz) (b) (c) Part l Diagram Z

Claims (1)

[Claims] A socket for an integrated circuit in which a contact that contacts a lead terminal of an integrated circuit to be mounted is arranged in a hole on the upper surface side of a socket insulator, and a socket pin connected to the contact is drawn out of the socket insulator. , a protrusion is provided on the upper surface of the socket insulator between the adjacent contacts to prevent the lead terminal surface of the package body of the attached integrated circuit from coming into surface contact with the upper surface of the socket insulator. An integrated circuit measurement socket characterized by: