JPH01264012A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPH01264012A JPH01264012A JP63092833A JP9283388A JPH01264012A JP H01264012 A JPH01264012 A JP H01264012A JP 63092833 A JP63092833 A JP 63092833A JP 9283388 A JP9283388 A JP 9283388A JP H01264012 A JPH01264012 A JP H01264012A
- Authority
- JP
- Japan
- Prior art keywords
- mosfet
- resistor
- pull
- potential
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 8
- 230000003071 parasitic effect Effects 0.000 abstract description 4
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体集積回路に関し、特に半導体集積装置内
の信号端子をプルアップ又はプルダウンする回路に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit, and more particularly to a circuit that pulls up or pulls down a signal terminal within a semiconductor integrated device.
従来、この種のプルアップ、プルダウン回路は、第5図
及び第6図に示す様にゲート回路28゜32に数キロオ
ームから数百キロオームの定抵抗器26.30の一端を
接続しその他端を電源に接続して構成されていた。Conventionally, this type of pull-up/pull-down circuit has been constructed by connecting one end of a constant resistor 26, 30 of several kilo ohms to several hundred kilo ohms to the gate circuit 28, 32, and connecting the other end to the gate circuit 28, 32, as shown in FIGS. It was configured to be connected to a power source.
上述した従来のプルアップ、プルダウン回路は定抵抗器
で構成されている為、抵抗器の抵抗値が数キロオームと
低い場合には、抵抗器を流れる電流が大きく、信号バス
等に於て複数の抵抗器が並列に接続される様な場合には
、これら抵抗器の合成抵抗が小さくなり信号バスに大電
流が流れる可能性があり、又CMO8半導体集積装置に
於いては直流試験時に電源リーク電流を正確に測定でき
ないという欠点がある。The conventional pull-up and pull-down circuits described above are composed of constant resistors, so if the resistance value of the resistor is as low as several kilohms, the current flowing through the resistor is large, and multiple When resistors are connected in parallel, the combined resistance of these resistors becomes small and a large current may flow in the signal bus.In addition, in CMO8 semiconductor integrated devices, power supply leakage current occurs during DC testing. The disadvantage is that it cannot be measured accurately.
又、抵抗器の抵抗値が数十キロオームから数百キロオー
ムと高いと、OR時定数が大きくなり信号バス等の信号
線の電位を規定時間内に目的の電位にプルアップ又はプ
ルダウンできない場合があるという欠点がある。Also, if the resistance value of the resistor is high, from tens of kilohms to hundreds of kilohms, the OR time constant will become large, and the potential of the signal line such as the signal bus may not be pulled up or down to the target potential within the specified time. There is a drawback.
本発明の半導体集積回路は、1つの抵抗器と1つのMO
SFETを有し、MOSFETのゲートは直接、ソース
は抵抗器を介して電源端子又は接地端子に接続され、ド
レインは半導体集積装置内のプルアップ又はプルダウン
すべきゲート回路の信号端子に接続されている。The semiconductor integrated circuit of the present invention includes one resistor and one MO
The gate of the MOSFET is connected directly, the source is connected to a power supply terminal or a ground terminal via a resistor, and the drain is connected to a signal terminal of a gate circuit to be pulled up or pulled down in a semiconductor integrated device. .
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図、第2図はそれぞれ本発明に係るプルアップ回路
及びプルダウン回路の実施例を示す回路図、第3図、第
4図はそれぞれ第1図、第2図に示すプルアップ回路及
びプルダウン回路のCMO8半導体集積回路に対する具
体的実施例の回路図である。FIGS. 1 and 2 are circuit diagrams showing embodiments of a pull-up circuit and a pull-down circuit according to the present invention, respectively, and FIGS. 3 and 4 are circuit diagrams showing the pull-up circuit and pull-down circuit shown in FIGS. 1 and 2, respectively. FIG. 2 is a circuit diagram of a specific embodiment of the circuit for a CMO8 semiconductor integrated circuit.
第3図に於て、MOSFET12はデプレーション型P
チャネルMO3FETであり、抵抗器11は、信号端子
13の電位が0となった時MO8FET12が非導通状
態即ち高抵抗状態となる様な抵抗値のものとする。In Figure 3, MOSFET 12 is a depletion type P
It is a channel MO3FET, and the resistor 11 has a resistance value such that when the potential of the signal terminal 13 becomes 0, the MO8FET 12 becomes a non-conducting state, that is, a high resistance state.
まず、PチャネルMOSFET14が導通状態でNチャ
ネルMOSFET15が非導通状態の場合には、信号端
子13と電源端子17とが同電位である為、MOSFE
T12が導通状態であるにもかかわらず、ソース、ドレ
イン間を電流は流れない。First, when the P-channel MOSFET 14 is in a conductive state and the N-channel MOSFET 15 is in a non-conductive state, the signal terminal 13 and the power supply terminal 17 are at the same potential, so the MOSFE
Even though T12 is in a conductive state, no current flows between the source and drain.
次にMOSFET14が非導通状態、MOSFET 1
5が導通状態となる場合には、信号端子13の電位が下
るに従い、MOSFET12のソース、ドレイン間を流
れる電流が増加しようとするが、抵抗器11の電圧効果
に依りMOSFET12のソース電位がゲート電位より
下がる為MO8FET12のソース、ドレイン間がハイ
インピーダンス状態即ち電源端子17と信号端子13と
の間がハイインピーダンス状態となり、抵抗器11及び
MOSFET12を流れる電流は増加しない。この時、
電源端子17と信号端子130間はハイインピーダンス
状態であるので、信号端子13の電位の過渡的変化は、
MOSFET15のソースドレイン抵抗と寄生容量から
決まるOR時定数に従う。Next, MOSFET 14 is in a non-conducting state, MOSFET 1
5 becomes conductive, as the potential of the signal terminal 13 decreases, the current flowing between the source and drain of the MOSFET 12 tends to increase, but due to the voltage effect of the resistor 11, the source potential of the MOSFET 12 decreases to the gate potential. Therefore, the current flowing through the resistor 11 and the MOSFET 12 does not increase because the source and drain of the MO8FET 12 are in a high impedance state, that is, the power supply terminal 17 and the signal terminal 13 are in a high impedance state. At this time,
Since the power supply terminal 17 and the signal terminal 130 are in a high impedance state, a transient change in the potential of the signal terminal 13 is caused by
The OR time constant determined by the source-drain resistance and parasitic capacitance of MOSFET 15 is followed.
更に、MOSFET15が非導通状態、MOSFET1
4が導通状態となる場合には、MOSFET12は上述
の場合と逆の動作となり、導通状態となる。しかしなが
らMOSFET12のソースドレイン間の電位差が小さ
くなる為、抵抗器11とMOSFET12を流れる電流
は増加しない。この時、MOSFET12のソースと電
源端子17との間に抵抗器11が挿入されているので、
電源端子17と信号端子13の間のインピーダンスはM
OSFET14のソース、ドレイン間の抵抗に等しく、
その為、信号端子13の電位変化はMOSFET14の
ソースドレイン抵抗と寄生容量から決まるOR時定数に
従う。Furthermore, MOSFET15 is in a non-conducting state, MOSFET1
When MOSFET 4 becomes conductive, MOSFET 12 operates in the opposite manner to the above case and becomes conductive. However, since the potential difference between the source and drain of MOSFET 12 becomes smaller, the current flowing through resistor 11 and MOSFET 12 does not increase. At this time, since the resistor 11 is inserted between the source of the MOSFET 12 and the power supply terminal 17,
The impedance between the power supply terminal 17 and the signal terminal 13 is M
Equal to the resistance between the source and drain of OSFET14,
Therefore, the potential change of the signal terminal 13 follows an OR time constant determined from the source-drain resistance and parasitic capacitance of the MOSFET 14.
又、MOSFET14.15が共に非導通状態となると
、抵抗器11を流れる電流がOとなり、抵抗器11によ
る電圧降下がなくなるので、MOSFET12のゲート
ソース間の電位差が0、即ちMOSFET12が導通状
態となる。この結果、信号端子13は電源電位にプルア
ップされた状態となる。この場合の信号端子13と電源
端子17の間のインピーダンスは、MOSFET12が
導通状態である為、MOSFET12の導通抵抗を小さ
くすることにより抵抗器11の抵抗値となり、その結果
信号端子13の電位変化は抵抗器11と寄生容量から決
まるOR時定数に従う。Furthermore, when both MOSFETs 14 and 15 become non-conductive, the current flowing through the resistor 11 becomes O, and the voltage drop due to the resistor 11 disappears, so the potential difference between the gate and source of the MOSFET 12 becomes 0, that is, the MOSFET 12 becomes conductive. . As a result, the signal terminal 13 is pulled up to the power supply potential. In this case, since the MOSFET 12 is in a conductive state, the impedance between the signal terminal 13 and the power supply terminal 17 becomes the resistance value of the resistor 11 by reducing the conduction resistance of the MOSFET 12, and as a result, the potential change of the signal terminal 13 is The OR time constant determined by the resistor 11 and parasitic capacitance is followed.
第4図の場合も第3図と同様な動作が行なわれる。In the case of FIG. 4, the same operation as that of FIG. 3 is performed.
以上説明したように本発明は、MOSFETのゲートは
直接、ソースは抵抗器を介して電源端子又は接地端子に
接続し、ドレインをプルアップ又はプルダウンすべき信
号端子に接続することにより、信号端子に信号が印加さ
れている場合の信号端子と電源端子或いは接地端子との
間のインピーダンスは、本発明のMOSFET及び抵抗
を接続しない場合のインピーダンスと変らない為、゛信
号端子の電位の過渡変化は、本発明のプルアップ回路又
はプルダウン回路がない場合と変らないという効果があ
る。As explained above, in the present invention, the gate of the MOSFET is connected directly, the source is connected to the power supply terminal or the ground terminal via a resistor, and the drain is connected to the signal terminal to be pulled up or pulled down. Since the impedance between the signal terminal and the power supply terminal or the ground terminal when a signal is applied is the same as the impedance when the MOSFET and resistor of the present invention are not connected, the transient change in the potential of the signal terminal is The effect is the same as when there is no pull-up circuit or pull-down circuit according to the present invention.
又、信号端子に信号が印加されず、信号端子をプルアッ
プ又はプルダウンする場合、信号端子と1i源端子又は
接地端子との間のインピーダンスは本発明で用いた抵抗
器の抵抗と等しくなる為、抵抗値を十分小さく選ぶこと
により、信号端子のCR時定数を小さくできるという効
果がある。Furthermore, when no signal is applied to the signal terminal and the signal terminal is pulled up or pulled down, the impedance between the signal terminal and the 1i source terminal or ground terminal is equal to the resistance of the resistor used in the present invention. By selecting a sufficiently small resistance value, the CR time constant of the signal terminal can be reduced.
更に、本発明は、プルアップ回路又はプルダウン回路を
流れる電流が増加しようとすると、プルアップ回路、プ
ルダウン回路のインピーダンスをハイインピーダンス状
態にする為、大電流が流れないという効果がある。Furthermore, the present invention has the effect that when the current flowing through the pull-up circuit or pull-down circuit attempts to increase, the impedance of the pull-up circuit or pull-down circuit is set to a high impedance state, so that a large current does not flow.
第1図、第2図はそれぞれ本発明に係るプルアップ回路
とプルダウン回路の実施例の回路図、第3図、第4図は
それぞれ第1図、第2図に示すプルアップ回路とプルダ
ウン回路の0M08回路に対する具体的実施例の回路図
、第5図、第6図はそれぞれ従来の技術に依るプルアッ
プ回路とプルダウン回路の回路図である。
1.17,24.25・・・・・・電源端子、2,8゜
11.22,26.30・・・・・・抵抗器、3,12
・・・・・・デプレーション型PチャネルMO3FET
、4゜6.13,19,27.31・・・・・・信号端
子、5゜10.28.32・・・・・・ゲート回路、7
.21・・・・・・デプレーション型NチャネルMO8
FET、9゜16、23.29・・・・・・接地端子、
14.18・・・・・・エンハンスメント型Pチャネル
MO8FET、15゜20・・・・・・エンハンスメン
ト型NチャネルMO8FET。
代理人 弁理士 内 原 音
、32FIGS. 1 and 2 are circuit diagrams of embodiments of a pull-up circuit and a pull-down circuit according to the present invention, respectively, and FIGS. 3 and 4 are circuit diagrams of the pull-up circuit and pull-down circuit shown in FIGS. 1 and 2, respectively. 5 and 6 are circuit diagrams of a pull-up circuit and a pull-down circuit, respectively, according to the prior art. 1.17, 24.25...Power terminal, 2,8゜11.22,26.30...Resistor, 3,12
・・・・・・Depletion type P channel MO3FET
, 4゜6.13,19,27.31...Signal terminal, 5゜10.28.32...Gate circuit, 7
.. 21... Depletion type N channel MO8
FET, 9°16, 23.29... Ground terminal,
14.18...Enhancement type P-channel MO8FET, 15°20...Enhancement type N-channel MO8FET. Agent Patent attorney Oto Uchihara, 32
Claims (1)
Tのゲートは直接、ソースは抵抗器を介してそれぞれ電
源端子又は接地端子に接続され、ドレインはプルアップ
又はプルダウンすべきゲート回路の信号端子に接続され
ていることを特徴とする半導体集積回路。It has one resistor and one MOSFET, MOSFET
A semiconductor integrated circuit characterized in that the gate of T is connected directly, the source is connected to a power supply terminal or a ground terminal through a resistor, and the drain is connected to a signal terminal of a gate circuit to be pulled up or pulled down.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63092833A JPH01264012A (en) | 1988-04-14 | 1988-04-14 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63092833A JPH01264012A (en) | 1988-04-14 | 1988-04-14 | Semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01264012A true JPH01264012A (en) | 1989-10-20 |
Family
ID=14065429
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63092833A Pending JPH01264012A (en) | 1988-04-14 | 1988-04-14 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01264012A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5624991A (en) * | 1993-11-01 | 1997-04-29 | Sumitomo Chemical Company Limited. | Polypropylene resin composition |
-
1988
- 1988-04-14 JP JP63092833A patent/JPH01264012A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5624991A (en) * | 1993-11-01 | 1997-04-29 | Sumitomo Chemical Company Limited. | Polypropylene resin composition |
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