JPH0124631Y2 - - Google Patents
Info
- Publication number
- JPH0124631Y2 JPH0124631Y2 JP2327584U JP2327584U JPH0124631Y2 JP H0124631 Y2 JPH0124631 Y2 JP H0124631Y2 JP 2327584 U JP2327584 U JP 2327584U JP 2327584 U JP2327584 U JP 2327584U JP H0124631 Y2 JPH0124631 Y2 JP H0124631Y2
- Authority
- JP
- Japan
- Prior art keywords
- lead wire
- measurement terminal
- measurement
- measuring
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 69
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 61
- 230000007246 mechanism Effects 0.000 description 13
- 230000002950 deficient Effects 0.000 description 12
- 229910000679 solder Inorganic materials 0.000 description 7
- 238000000034 method Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Relating To Insulation (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2327584U JPS60135668U (ja) | 1984-02-20 | 1984-02-20 | 電子部品の測定機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2327584U JPS60135668U (ja) | 1984-02-20 | 1984-02-20 | 電子部品の測定機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60135668U JPS60135668U (ja) | 1985-09-09 |
| JPH0124631Y2 true JPH0124631Y2 (cs) | 1989-07-25 |
Family
ID=30516364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2327584U Granted JPS60135668U (ja) | 1984-02-20 | 1984-02-20 | 電子部品の測定機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60135668U (cs) |
-
1984
- 1984-02-20 JP JP2327584U patent/JPS60135668U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60135668U (ja) | 1985-09-09 |
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