JPH01245537A - Wafer carrier - Google Patents

Wafer carrier

Info

Publication number
JPH01245537A
JPH01245537A JP63071930A JP7193088A JPH01245537A JP H01245537 A JPH01245537 A JP H01245537A JP 63071930 A JP63071930 A JP 63071930A JP 7193088 A JP7193088 A JP 7193088A JP H01245537 A JPH01245537 A JP H01245537A
Authority
JP
Japan
Prior art keywords
wafer
carriers
carrier
wafers
running
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63071930A
Other languages
Japanese (ja)
Inventor
Junichi Hoshi
淳一 星
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP63071930A priority Critical patent/JPH01245537A/en
Publication of JPH01245537A publication Critical patent/JPH01245537A/en
Pending legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To restrain the dust from being raised while enabling wafers and carriers to be cleaned up efficiently as well as the wafers in every process to be shifted, etc., without fail by a method wherein leaf type carriers are made of the same material as that of wafers while jetting ports of fluid are provided near the wafer edge. CONSTITUTION:A carrier main body 1 is a one body element drawn out of a silicon ingot while a wafer 2 is held between two each of the main bodies. Besides, the main body 1 is provided with a fluid running-in port 3 to make gas such as air, N2 or liquid such as pure water etc., run therein. Any running-in fluid circulates through a circular ring 4 to be exhausted from pores (jetting ports) 5. The pores 5 are provided on the surface and rear side of a wafer extending over the whole periphery near the wafer edge. Besides, two each of main bodies are coupled with each other by connecting pins 6. Such carriers become a sealed vessel excluding the running-in ports by bonding a wafer type cover onto both ends of the carriers, at this time, the wafers comes into contact with the carriers but there is no possibility of the wafers and the carriers to be polluted since they are made of the same high quality material. Furthermore, every nook and corner of the wafer can be cleaned up and dried up by some cleaning solution and drying gas led in from the running-in ports.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、半導体ウェハを極めて清浄に保持できるウェ
ハキャリヤに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wafer carrier that can hold semiconductor wafers in an extremely clean manner.

[従来の技術の説明] 従来、半導体ウェハ製造プロセスあるいはIC製造プロ
セスあるいはIC検査工程に使用されるウェハキャリヤ
は、ウエハが25枚程度入るバッチ式であった。材質は
薬液処理、高温処理、静電対策等の用途に応じて多種用
いられ石英、ポリシリコン、テフロン(商標名)、ポリ
プロピレン、Al1等が主に使用されていた。従来のキ
ャリヤには、更に、搬送の際にゴミの付着をさけるため
に、密閉容器となるものも有る。従来のキャリヤは必ず
収納したウエハと接触するのでウェハは絶えずキャリヤ
により汚染される可能性があった。
[Description of Prior Art] Conventionally, wafer carriers used in semiconductor wafer manufacturing processes, IC manufacturing processes, or IC inspection processes have been of the batch type that can hold about 25 wafers. Various materials have been used depending on the purpose, such as chemical treatment, high temperature treatment, and static electricity countermeasures, and quartz, polysilicon, Teflon (trade name), polypropylene, Al1, etc. have been mainly used. Some conventional carriers are also airtight containers in order to prevent dust from adhering during transportation. Since conventional carriers always come into contact with stored wafers, there is a possibility that the wafers are constantly contaminated by the carrier.

汚染の可能性の少ない素材としては不純分の少ない透明
石英が代表的であるが、割れ易いという大きな欠点が存
在する。次に問題となるのは、輸送の際の振動によって
ウェハとキャリヤがぶつかることである。従って素材は
軟らかい方が良く、石英、A1等は問題が多い。次に問
題となるのはキャリヤからの発塵である。有機系のテフ
ロン(商標名)、ポリプロピレン、またポリシリコン等
はパーティクルを発生し易い。特に、静電対策用にカー
ボン等を混入したテフロン(商標名)は発塵が多い。
Transparent quartz, which has few impurities, is a typical material with a low possibility of contamination, but it has the major drawback of being easily broken. The next problem is that the wafer and carrier collide due to vibration during transportation. Therefore, the material should be softer, and quartz, A1, etc. have many problems. The next problem is dust generated from the carrier. Organic materials such as Teflon (trade name), polypropylene, and polysilicon tend to generate particles. In particular, Teflon (trade name), which contains carbon or the like as a countermeasure against static electricity, generates a lot of dust.

また、洗浄乾燥の際にも、ウェハがキャリヤの陰になる
、水切れが悪い、液が乾きにくい等の問題があった。洗
浄に使用されるのは、主にテフロン(商標名)のキャリ
ヤであるが、水切りの点で充分満足できるものではなか
った。また、キャリヤは自動機のセンダー、レシーバに
使用されるため、ピッチ等が各規格で決められているが
、割出等でキャリヤがウェハを傷つけることが多々ある
。また拡散炉等の気相中では、そのピッチ間隔がウェハ
品質に多大な影響を与えるため、異種間のキャリヤでの
移し変えが必然となる。この移し変えはウェハを傷つけ
る原因となっている。
Furthermore, during cleaning and drying, there were problems such as the wafer being in the shadow of the carrier, poor water drainage, and difficulty in drying the liquid. Teflon (trade name) carriers are mainly used for cleaning, but they are not completely satisfactory in terms of water removal. Furthermore, since carriers are used in senders and receivers of automatic machines, pitches and the like are determined by each standard, but carriers often damage wafers during indexing and the like. Furthermore, in a gas phase such as a diffusion furnace, the pitch interval has a great effect on wafer quality, so it is necessary to transfer carriers between different types. This transfer causes damage to the wafer.

[発明の目的] 本発明はかかる欠点を除去するものであり、ウエハの品
質を低下させる恐れのない全工程に適用可能なウェハキ
ャリヤを提供することを目的とする。
OBJECTS OF THE INVENTION The object of the present invention is to eliminate such drawbacks and to provide a wafer carrier that can be used in all processes without the risk of deteriorating the quality of wafers.

[実施例] 第1図に本発明の一実施例を示す。(a)は正面図であ
り、(b)はA−A’の断面図である。1は本実施例の
本体であり、抵抗率0.1Ωcm程度のシリコン(St
)インゴットから引出された一体物である。2は直径1
インチのSiウェハであり、2枚の本体1にはさまれて
保持される。3は流体の流入口であり、気体、例えばエ
アー、N2、または液体、例えば純水等を流入すること
ができる。流入された流体は、円環4を伝わり、細孔(
噴出口)5から吐出される。細孔5は、ウェハエツジ付
近の全周に渡ってウェハ上下面に設けられている。また
、2枚の本体1は、接続ピン6によって互いに結合され
ている。
[Example] FIG. 1 shows an example of the present invention. (a) is a front view, and (b) is a sectional view taken along line AA'. 1 is the main body of this embodiment, which is made of silicon (St
) It is a one-piece object drawn from an ingot. 2 is diameter 1
It is an inch Si wafer and is held between two main bodies 1. Reference numeral 3 denotes a fluid inlet port into which gas, such as air or N2, or liquid, such as pure water, can flow. The inflowing fluid travels through the ring 4 and passes through the pores (
It is discharged from the jet nozzle) 5. The pores 5 are provided on the upper and lower surfaces of the wafer all around the wafer edge. Further, the two main bodies 1 are connected to each other by a connecting pin 6.

本実施例によれば、ウエハを何枚でも厚さ方向に重ねる
ことができる。従って、キャリヤによるウェハロットの
枚数制限は生じない。また両端部に、ウェハ状のフタを
接着すれば流入口3を除いて密閉容器となる。流入口3
も、キャリヤ全体を支持する支持体によって塞げば完全
な密閉容器となる。ウェハはキャリヤと接触するが、同
種の高品質材料なので汚染の心配はない、また、Siイ
ンゴットの残りの部分から引出す(切出す)ことによっ
て安価に製造が可能である。本実施例の単結晶シリコン
は、臂解し易いという欠点は有るものの、ウェハよりも
厚いため、強度は強く、長期間の使用に耐える。また、
振動の際にも、同素材であるために、ウェハを傷つける
ことが少ない。
According to this embodiment, any number of wafers can be stacked in the thickness direction. Therefore, the number of wafers in a wafer lot is not limited by the carrier. Furthermore, if wafer-shaped lids are attached to both ends, the container becomes an airtight container except for the inlet 3. Inlet 3
However, if the carrier is closed with a support that supports the entire carrier, it becomes a completely sealed container. Although the wafer comes into contact with the carrier, there is no risk of contamination since the wafer is made of the same high-quality material, and it can be manufactured at low cost by being pulled out (cut out) from the rest of the Si ingot. Although the single-crystal silicon of this embodiment has the disadvantage of being easily broken down, it is thicker than the wafer, so it is strong and can withstand long-term use. Also,
Even when vibrating, the wafer is less likely to be damaged because it is made of the same material.

また硬度が高いため、チッピング等による発塵は少ない
。また、元のSiインゴットの抵抗率が比較的低いため
、良好な静電気特性を示す。
Also, because of its high hardness, there is little dust generation due to chipping, etc. Furthermore, since the resistivity of the original Si ingot is relatively low, it exhibits good electrostatic properties.

洗浄、乾燥の際にも、ウェハ2の表裏両面に渡って、広
い開口があることと、流入口から洗浄液、あるいは乾燥
用気体を導入可能なことでウェハの隅々まで洗浄、乾燥
を行なうことができる。
Even when cleaning and drying, the wafer 2 has wide openings on both the front and back sides, and cleaning liquid or drying gas can be introduced from the inlet, allowing cleaning and drying to every corner of the wafer. Can be done.

また、流入する流体の圧力を制御することで、細孔から
噴出する流体の圧力を制御し、ウエハとキャリヤを非接
触な状態に保持することができる。
Furthermore, by controlling the pressure of the fluid flowing in, the pressure of the fluid ejected from the pores can be controlled, and the wafer and carrier can be maintained in a non-contact state.

更に、ウエハの上下両方向に噴出する流体の圧力を、交
互に周期的に変えることによって、ウェハを上下方向に
振動させることが可能である。これらによって、更にそ
の洗浄、乾燥効率の改善が見込める。ウェハの割出は、
キャリヤを充分に上下方向に離すことによって容易に防
ぐことができる。また、気相中の拡散では、ウニへ間に
ダミーのキャリヤを入れることで、ピッチの調節が容易
にできる。このように、はぼ全ての工程に渡って、本実
施例のキャリヤは使用可能である。
Further, by alternately and periodically changing the pressure of the fluid ejected both above and below the wafer, it is possible to vibrate the wafer in the vertical direction. These can be expected to further improve the cleaning and drying efficiency. Wafer indexing is
This can be easily prevented by separating the carriers sufficiently in the vertical direction. Furthermore, in the case of diffusion in the gas phase, the pitch can be easily adjusted by inserting a dummy carrier between the sea urchins. In this way, the carrier of this embodiment can be used in almost all processes.

本発明のキャリヤ形状は必ずしも四角形である必要はな
く、円型等でも良い。形状は円型にしたならば、あるS
iインゴットから更に大きな口径用のウェハキャリヤを
得ることができる。またー体物でなく前述した円環等の
形成が容易な二体物でもよい。この場合、接着等でなく
、機械的に嵌め込むのが適当である。
The carrier shape of the present invention does not necessarily have to be square, but may be circular or the like. If the shape is circular, a certain S
Wafer carriers for larger diameters can be obtained from i-ingots. Alternatively, instead of the one-body object, it may be a two-body object that is easy to form, such as the ring described above. In this case, it is appropriate to fit them mechanically instead of using adhesives or the like.

またキャリヤとウエハが一対一に対応する枚葉式である
ために、ウェハにウェハ情報を記入することなく、キャ
リヤに記入することができ、情報の読取りを容易にし、
またウェハの品質を低下させることがない。
In addition, since it is a single-wafer type in which the carrier and wafer correspond one-to-one, wafer information can be written on the carrier without being written on the wafer, making it easier to read the information.
Furthermore, the quality of the wafer is not degraded.

本発明のキャリヤは、またその保守も容易である。ウェ
ハと同素材であるために、同様な洗浄で清浄化され、ウ
エハと同時に洗浄が行なわれることが可能になる。従っ
て特殊な洗浄を必要としない。また新たな洗浄が必要な
場合とは、新規にキャリヤを使用する場合と、新たなウ
ェハを保持する場合とである。
The carrier of the present invention is also easy to maintain. Since it is made of the same material as the wafer, it can be cleaned in the same manner as the wafer, making it possible to clean it at the same time as the wafer. Therefore, no special cleaning is required. Further, new cleaning is required when a new carrier is used or when a new wafer is held.

[発明の効果] 以上説明したように、本発明はウェハと同素材を使用し
た枚葉式キャリヤであり、かつ、ウェハエツジ付近に流
体の噴出口を設けたことによって、塵埃発生を抑え、ウ
ェハおよびキャリヤを効率よく洗浄可能とし、工程毎の
ウェハ移動等を支障なく行なうことができる取扱性の良
好な工程を選ばない多目的高性能キャリヤを実現できる
[Effects of the Invention] As explained above, the present invention is a single-wafer type carrier using the same material as the wafer, and by providing a fluid jet port near the wafer edge, dust generation is suppressed and the wafer and It is possible to realize a multi-purpose, high-performance carrier that can be easily handled and can be used in any process, allowing the carrier to be efficiently cleaned and allowing wafers to be moved between processes without any problems.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例であり、(a)は正面図、(
b)は断面図である。 1:本体、 2:ウェハ、 3:流入口、 4:円環、 5:噴出口、 6:接続ビン。 特許出願人   キャノン株式会社 代理人 弁理士   伊 東 哲 也 代理人 弁理士   伊 東 辰 雄
FIG. 1 shows an embodiment of the present invention, in which (a) is a front view and (a) is a front view;
b) is a sectional view. 1: Main body, 2: Wafer, 3: Inlet, 4: Annular ring, 5: Spout, 6: Connection bin. Patent Applicant Canon Co., Ltd. Agent Patent Attorney Tetsuya Ito Agent Patent Attorney Tatsuo Ito

Claims (5)

【特許請求の範囲】[Claims] (1)半導体ウエハを収納するキャリヤにおいて、前記
キャリヤの材質が前記ウエハと同一であり、収納した前
記ウエハのエッジ付近に流体の噴出口を持つことを特徴
とするウエハキャリヤ。
(1) A wafer carrier for storing a semiconductor wafer, characterized in that the carrier is made of the same material as the wafer and has a fluid jet port near the edge of the stored wafer.
(2)前記キャリヤは、同種ウエハのインゴットから切
り出されたことを特徴とする特許請求の範囲第1項記載
のウエハキャリヤ。
(2) The wafer carrier according to claim 1, wherein the carrier is cut from an ingot of the same type of wafer.
(3)前記キャリヤは一対の本体間に一枚のウエハを挟
持する枚葉式キャリヤであり、該キャリヤはウエハ周縁
に沿って上下から前記噴出口からの噴出流体によりウエ
ハを非接触で保持可能でありかつウエハの上下両面は開
口していることを特徴とする特許請求の範囲第1項記載
のウエハキャリヤ。
(3) The carrier is a single-wafer type carrier that holds a wafer between a pair of bodies, and the carrier can hold the wafer in a non-contact manner by the fluid jetted from the spout from above and below along the periphery of the wafer. 2. The wafer carrier according to claim 1, wherein the wafer is open on both upper and lower surfaces.
(4)前記枚葉式キャリヤは複数段に積層可能であるこ
とを特徴とする特許請求の範囲第3項記載のウエハキャ
リヤ。
(4) The wafer carrier according to claim 3, wherein the single wafer type carrier can be stacked in multiple stages.
(5)前記キャリヤの上下面に蓋を装着してウエハを密
封収納可能に構成したことを特徴とする特許請求の範囲
第4項記載のウエハキャリヤ。
(5) The wafer carrier according to claim 4, wherein a lid is attached to the upper and lower surfaces of the carrier so that the wafer can be stored in a hermetically sealed manner.
JP63071930A 1988-03-28 1988-03-28 Wafer carrier Pending JPH01245537A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63071930A JPH01245537A (en) 1988-03-28 1988-03-28 Wafer carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63071930A JPH01245537A (en) 1988-03-28 1988-03-28 Wafer carrier

Publications (1)

Publication Number Publication Date
JPH01245537A true JPH01245537A (en) 1989-09-29

Family

ID=13474728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63071930A Pending JPH01245537A (en) 1988-03-28 1988-03-28 Wafer carrier

Country Status (1)

Country Link
JP (1) JPH01245537A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005179471A (en) * 2003-12-18 2005-07-07 Chuo Rika Kogyo Corp Aqueous emulsion-based adhesive
JP5486712B1 (en) * 2013-04-03 2014-05-07 有限会社アクセス Substrate transport box and substrate transport device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005179471A (en) * 2003-12-18 2005-07-07 Chuo Rika Kogyo Corp Aqueous emulsion-based adhesive
JP5486712B1 (en) * 2013-04-03 2014-05-07 有限会社アクセス Substrate transport box and substrate transport device

Similar Documents

Publication Publication Date Title
US6460552B1 (en) Method and apparatus for cleaning flat workpieces
JP3511514B2 (en) Substrate purification processing apparatus, dispenser, substrate holding mechanism, substrate purification processing chamber, and substrate purification method using these
JP3183214B2 (en) Cleaning method and cleaning device
US6467626B1 (en) Wafer storing method and storing container therefor and wafer transferring method for transferring wafer to the storing container
US5226437A (en) Washing apparatus
WO2003034479A1 (en) Substrate processing apparatus
US6946399B1 (en) Cleaning system method and apparatus for the manufacture of integrated cicuits
JPH05251544A (en) Conveyor
JP2598359B2 (en) Substrate cleaning equipment
JPH01245537A (en) Wafer carrier
GB2349742A (en) Method and apparatus for processing a wafer to remove an unnecessary substance therefrom
JPH06163501A (en) Method of and apparatus for cleaning substrate
KR100760992B1 (en) A position change apparatus of substrate
JPH04151828A (en) Chemical atmosphere separating device
JP2840799B2 (en) Single wafer cleaning method and apparatus
US20040250519A1 (en) [front opening unified pod and associated method for preventing outgassing pollution]
JPH06196466A (en) Wafer cleaning device
KR20160116476A (en) Apparatus for cleaning wafer
JPH05102121A (en) Method and apparatus for cleaning of sheet type
KR20030080355A (en) Method and system for wafer array
CN213212143U (en) Wafer bearing table and wafer processing system
JPH06286869A (en) Substrate holder
JP4396398B2 (en) Bernoulli Chuck
JP3467314B2 (en) Method for minimizing particle generation on wafer surface during high pressure oxidation of silicon
JPH07302827A (en) Semiconductor wafer carrying equipment