JPH01243398A - X-ray photographing device - Google Patents

X-ray photographing device

Info

Publication number
JPH01243398A
JPH01243398A JP7092488A JP7092488A JPH01243398A JP H01243398 A JPH01243398 A JP H01243398A JP 7092488 A JP7092488 A JP 7092488A JP 7092488 A JP7092488 A JP 7092488A JP H01243398 A JPH01243398 A JP H01243398A
Authority
JP
Japan
Prior art keywords
brightness
ray
exposure time
optimal
conditions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7092488A
Other languages
Japanese (ja)
Other versions
JP2680334B2 (en
Inventor
Hidenori Sato
秀紀 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP63070924A priority Critical patent/JP2680334B2/en
Publication of JPH01243398A publication Critical patent/JPH01243398A/en
Application granted granted Critical
Publication of JP2680334B2 publication Critical patent/JP2680334B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To enable easy setting of optimal brightness by, at time of test X-ray exposure, fixing a lamp voltage and making an exposure time variable to obtain conditions for optimal brightness and also by, at time of cine-photographing, fixing the exposure time for optimal conditions and making variable a lamp voltage and a lamp current. CONSTITUTION:A CPU14 compares an integrated value of a brightness signal sent from a sample-and-hold circuit with a brightness setting value sent from an input terminal 17. If the brightness signal is higher than the brightness setting value, the CPU decreases X-ray conditions and vice versa, to enable the observation of picture elements with a constant brightness always. In this case, the X-ray conditions are controlled by the CPU14 and the values of kV and mA are both converted by a D/A converter 18 and then sent to a generator unit 2. An exposure time is sent for a time lapse set to a programmable timer 19. With this, the system compares the signal as against the shortest X-ray exposure time and, when the formal output signal waveform has neared an optimal output value, sets an X-ray exposure time based on a ratio between that signal output and the optimal output in order to obtain the optimal X-ray conditions.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、自動輝度調整を行なえるX線撮影装置に関し
、特に、管電圧の依存度を少なくして適正輝度のシネ撮
影を行なえるようにしたX線撮影装置に関する。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to an X-ray imaging device that can automatically adjust brightness, and in particular, to reduce the dependence on tube voltage to achieve proper brightness. The present invention relates to an X-ray imaging device capable of performing imaging.

(従来の技術) 従来、X線撮影装置に備わっている自動輝度調整は、曝
射時間(ms)を固定として最適輝度となるべく管電圧
(kV)と管電流(mA)とを適宜調整するものとなっ
ている。
(Prior Art) Conventionally, the automatic brightness adjustment provided in X-ray imaging apparatuses is a method that fixes the exposure time (ms) and adjusts the tube voltage (kV) and tube current (mA) as appropriate to achieve the optimum brightness. It becomes.

′ (発明が解決しようとする課題) このような自動輝度調整を備えている従来のX線撮影装
置では、シネ撮影においてそのI!L迩輝度調整を、予
定の曝射時間、mAの下でkVを可変することにより実
現しているが、被写体の厚さによってkVの変化が大き
く、体厚が薄い場合はkVは低く、体厚が厚い場合はk
Vは高くなりすぎるという問題点があった。
(Problem to be Solved by the Invention) Conventional X-ray imaging apparatuses equipped with such automatic brightness adjustment have a problem with I! during cine imaging. L-brightness adjustment is achieved by varying the kV under the planned exposure time and mA, but the kV changes greatly depending on the thickness of the subject; if the body is thin, the kV is low, and the body k if thick
There was a problem that V was too high.

そこで本発明の目的は、シネ撮影に際してkVの依存度
を少なくしてI&適輝度に設定できるようにしたX線撮
影装置を提供することにある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an X-ray imaging apparatus that can reduce the dependence on kV and set the luminance to I and appropriate brightness during cine imaging.

[発明の構成] (諜Uを解決するための手段) 本発明は上記課題を解決し且つ目的を達成するなめに次
のような手段を講じた構成としている。
[Structure of the invention] (Means for solving the problem of espionage) The present invention has a structure that takes the following means in order to solve the above problems and achieve the object.

すなわち、本発明は、自動輝度調整を行なえるX線撮影
装置において、シネ撮影に先達つテストX線曝射にあっ
ては管電圧を固定とし且つ曝射時間を可変としてI&適
輝度となるX線条件を求め、シネ撮影にあっては前記最
適輝度条件となる曝射時間を固定とし且つ管電圧、管電
流を可変して自動輝度調整を行う制御手段を具備したこ
とを特徴とする。
That is, the present invention provides an X-ray imaging apparatus capable of automatic brightness adjustment, in which the tube voltage is fixed and the exposure time is variable in advance of cine imaging and during test The present invention is characterized in that it is equipped with a control means that determines line conditions, fixes the exposure time that provides the optimum brightness condition in cine photography, and adjusts the brightness automatically by varying the tube voltage and tube current.

(作 用) このような構成によれば、予め固定した管電圧で最fl
ff度となるX線条件にてシネ撮影をスタートさせるこ
とができるので、シネ撮影時には前記予め固定した管電
圧の値又はその近傍値、に管電圧を調整するだけで最適
輝度とすることができる。
(Function) According to such a configuration, the maximum fl.
Since cine photography can be started under the X-ray conditions of ff degrees, optimal brightness can be achieved by simply adjusting the tube voltage to the pre-fixed tube voltage value or a value close to it during cine photography. .

(実施例) 以下本発明にかかるX線撮影装置の一実施例を第1図を
参照して説明する。
(Embodiment) An embodiment of the X-ray imaging apparatus according to the present invention will be described below with reference to FIG.

第1図において、1はX線を曝射するX線管で、高電圧
発生装置2に接続されている。X線管1は、高電圧発生
装置2がXIl制御系の信号を受けて決まるX線条件(
kV、mA、ms)によりX線を曝射し、そのX線は被
検体3を透過してイメージインテンシャファイヤ4に入
射し、光電変換されて被検体透過像を生成させる。この
像は光学分配器(光学系)5によりシネカメラ6とテレ
ビカメラ7に光学的に分配され、それぞれシネカメラ6
ではシネフィルムに、またテレビカメラ7ではテレビカ
メラ制御ユニット8を経てTVモニタ9に画像として映
し出される。
In FIG. 1, reference numeral 1 denotes an X-ray tube that emits X-rays, and is connected to a high voltage generator 2. The X-ray tube 1 is operated under X-ray conditions (
(kV, mA, ms), the X-rays pass through the subject 3 and enter the image intensity fire 4, where they are photoelectrically converted and generate a transmitted image of the subject. This image is optically distributed to a cine camera 6 and a television camera 7 by an optical distributor (optical system) 5.
Then, the image is displayed on a cine film, and in the television camera 7 via the television camera control unit 8, it is displayed as an image on the TV monitor 9.

ここで、これらの画像が常に一定輝度で観察でるように
自動輝度調整機構が具備されているが、その動作原理は
、次のようになっている。光学系5の内部には、画像の
明るさを検出するフォトマルが内蔵されており、光量す
なわち画像の輝度が電気信号に変換される。この信号は
アンプ10により増幅される。アンプ11は、アンプ1
0により増幅された信号をコンデンサ11により積分す
るための演算増幅器である。スイッチ13は、X線曝射
がスタートすると開き、X線曝射が終了して閉じるよう
になっている。このアンプ11とコンデンサ12、スイ
ッチ13にて構成される回路は、サンプルホールド回路
であり、このサンプルホールド回路により画像の輝度を
検出することができる。検出された輝度はCPU14に
より制御されているマルチプレクサ15を経てA / 
D変換器16によりアナログ/デジタル変換されてCP
U14にデータとして取り込まれる。
Here, an automatic brightness adjustment mechanism is provided so that these images can always be observed at a constant brightness, and its operating principle is as follows. The optical system 5 includes a built-in photomultiplier that detects the brightness of an image, and converts the amount of light, that is, the brightness of the image, into an electrical signal. This signal is amplified by amplifier 10. Amplifier 11 is amplifier 1
This is an operational amplifier for integrating a signal amplified by 0 using a capacitor 11. The switch 13 opens when X-ray exposure starts and closes when X-ray exposure ends. A circuit constituted by this amplifier 11, capacitor 12, and switch 13 is a sample-and-hold circuit, and the brightness of an image can be detected by this sample-and-hold circuit. The detected brightness is passed through the multiplexer 15 controlled by the CPU 14 to the A/
Analog/digital conversion is performed by the D converter 16 and the CP
The data is taken into U14 as data.

一方、輝度が最適になるための設定値は、その入力端子
17より入力し、画像の輝度信号と同様にマルチプレク
サ15を経てCPU14に取り込まれる。ここで、CP
U14では、サンプルホールド回路からの輝度信号の積
分値と入力端子17からの輝度設定値の両者を比較し、
輝度設定値に対して輝度信号の積分値が高い場合にはX
MA条件を低くするように、また低い場合にはX4を条
件を高くするように動作する。これにより、被写体厚の
変化、すなわちX線吸収の大小によらず、常に一定の輝
度で画素を観察することができる。
On the other hand, a setting value for optimizing the brightness is inputted from the input terminal 17 and taken into the CPU 14 via the multiplexer 15 in the same way as the image brightness signal. Here, C.P.
In U14, both the integrated value of the luminance signal from the sample and hold circuit and the luminance setting value from the input terminal 17 are compared,
If the integrated value of the brightness signal is higher than the brightness setting value,
It operates to lower the MA condition, and if it is lower, to raise the X4 condition. Thereby, pixels can always be observed with constant brightness regardless of changes in object thickness, that is, regardless of the magnitude of X-ray absorption.

この場合、X線条件は、CPU14により制御され、k
V、mAそれぞそれD /’ A変換器18゜18によ
りデジタル/アナログ変換されて高電圧発生装置2に信
号として送出される。
In this case, the X-ray conditions are controlled by the CPU 14 and k
V and mA are each converted into digital/analog by D/'A converters 18 and 18, and sent as signals to the high voltage generator 2.

また、XIl曝射時間はCPU14により制御されてお
り、プログラマブルタイマ19に設定された時間だけX
線曝信号を高電圧発生袋!2に送出する。高電圧発生装
置2は、これらのkV傷信号mA傷信号X線唱射信号に
応じてX線管1よりX線を発生させる。
In addition, the XIl exposure time is controlled by the CPU 14, and the XIl exposure time is controlled by the CPU 14.
High voltage generation bag for radiation exposure signal! Send to 2. The high voltage generator 2 generates X-rays from the X-ray tube 1 in response to these kV flaw signals, mA flaw signals, and X-ray emission signals.

上記の如くのX線制御系において、シネ撮影の開始前に
その最3+1X線条件を求めるために、あらかじめ設定
された管電圧でテストxis射を行ない、その輝度信号
の積分値を設定値と比較するが、第2図(a)(b)に
示すように、最初、最短X線曝射時間での信号比較を行
ない、設定値に対して信号出力が小さい場合、その次の
2番目のテストX線曝射はその許容される最長X線曝射
時間で行なう。
In the X-ray control system as described above, in order to determine the maximum 3+1 X-ray conditions before starting cine imaging, a test XIS is performed at a preset tube voltage, and the integrated value of the luminance signal is compared with the set value. However, as shown in Figure 2 (a) and (b), the signals are first compared using the shortest X-ray exposure time, and if the signal output is small compared to the set value, the next second test is performed. X-ray exposure is performed for the maximum allowable X-ray exposure time.

2番目のX線曝射での信号比較で設定値に対して信号出
力が大きい場合、3番目のX線X線曝射は、その信号出
力の設定値との比に応じてX線曝射時間を雉<シて行な
い、フォトマル出力信号の積分値が輝度設定値である最
適出力値になったらテストX線曝射を停止する。この時
のxiai射時間は、プログラマブルタイマ1つにセッ
トされ、撮影のX!l[l射時間とする。
If the signal output in the second X-ray exposure is larger than the set value in the signal comparison, the third X-ray The test X-ray exposure is stopped when the integrated value of the photomultiplier output signal reaches the optimal output value, which is the brightness setting value. The xiai shooting time at this time is set in one programmable timer, and the xiai shooting time is set in one programmable timer. l [l shot time.

撮影がスタートすると、このX1!曝射時間は固定され
、従来通りkV、mAを制御しながら自動輝度調整が行
なわれる。
When the shooting started, this X1! The exposure time is fixed, and automatic brightness adjustment is performed while controlling kV and mA as before.

2番目のテストX線曝射による信号比較で、まだ設定値
に対して信号出力が小さい場合、3番目のテストX線曝
射はあらかじめ決められた値(数kV)だけ管電圧を高
くし、最短X線曝射時間での信号比較を行なう、この場
合を第3図(a) (b)に示す、それ以後、a*X線
条件を求めるまでの方法は前述した場合と同じである。
If the signal output from the second test X-ray exposure is still small compared to the set value, the third test X-ray exposure increases the tube voltage by a predetermined value (several kV). The signal comparison is performed using the shortest X-ray exposure time. This case is shown in FIGS. 3(a) and 3(b). Thereafter, the method up to finding the a*X-ray condition is the same as that described above.

kVを高くして、その最長XR曝射時間でも最適信号出
力が得られない場合は、撮影できないものとしてテスト
曝射を停止して撮影シーケンスも停止させる。
If the optimum signal output cannot be obtained even with the longest XR exposure time when the kV is increased, it is assumed that imaging is not possible, and the test exposure is stopped and the imaging sequence is also stopped.

最初のテストX線曝射による信号比較で、設定値に対し
て信号出力が大きい場合、2番目のテストX線曝射は、
あらかじめ決められた値(数kV)だけ管電圧を低くし
て、]&短X線唱射時間での信号比較を行なう、この場
合を第4図(a)(b )に示す。それ以後、f&適X
線条件を求めるまでの方法は前述した場合と同じである
。2番目のf&短X線曝射時間での信号比較でまだ設定
値に対して信号出力が大きい場合は、撮影できないもの
としてテストX線曝射を停止して撮影シーケンスも停止
させる。
If the signal output from the first test X-ray exposure is large compared to the set value, the second test X-ray exposure is
The tube voltage is lowered by a predetermined value (several kV), and signal comparison is performed at a short X-ray emission time. This case is shown in FIGS. 4(a) and 4(b). After that, f&suite
The method up to finding the line conditions is the same as in the case described above. If the signal output is still large compared to the set value in the signal comparison at the second f&short X-ray exposure time, it is determined that the test X-ray exposure is not possible and the imaging sequence is also stopped.

最短X線曝射時間による信号比較をした場合、フォーマ
ル出力信号波形が!&適出出力近い値になった時には、
その次のX線曝射を最長xi曝射時間に設定せずに、そ
の信号出力と最適出力との比でX線曝射時間を設定して
f!kaX線条件を求めることは言うまでもない。
When comparing signals based on the shortest X-ray exposure time, the formal output signal waveform is! & When the output value is close to the optimum output,
Instead of setting the next X-ray exposure to the maximum xi exposure time, set the X-ray exposure time based on the ratio of that signal output to the optimal output and f! It goes without saying that the kaX-ray conditions must be determined.

以上のように本実施例では、あらかじめ設定されたkV
にて撮影時間を変化させながらテストX線曝射を行なう
時、その設定可能な最大曝射時間と最小曝射時間でテス
トX線曝射し、その2つのX線曝射時間の範囲内でfk
週X線曝射条件が求められる場合に、3回目のテストX
線曝射は、最適条件になったら途中でX!I@射をスト
ップさせ、その曝射時間を記憶し、そのaax4tq射
時間により撮影をスタートさせるようにしたことにより
、撮影部位などに応じた任意のkVと撮影がスタートで
き、スタート後の自動輝度調整もスタート時のkV付近
で撮影することができる。
As described above, in this embodiment, the preset kV
When performing test X-ray exposure while changing the exposure time, test X-ray exposure is performed at the maximum and minimum exposure time that can be set, and within the range of the two fk
If weekly X-ray exposure conditions are required, the third test
For radiation exposure, once the optimum conditions are reached, press X! By stopping I@ radiation, memorizing the exposure time, and starting imaging with that aax4tq radiation time, imaging can be started at any kV depending on the area to be imaged, and automatic brightness control after starting. Adjustments can also be made to take pictures near the starting kV.

従って、自動輝度調整は、kV、mAにて行なうため、
大きな被写体厚変化にも従でき、撮影目的に応じて常に
安定した濃度の写真を得ることができる。
Therefore, since automatic brightness adjustment is performed in kV and mA,
It can follow large changes in subject thickness, and can always obtain photographs with stable density depending on the purpose of photography.

本発明は上記実施例に限定されるものではなく、本発明
の要旨を逸脱しない範囲で種々変形して実施できるもの
である。
The present invention is not limited to the above embodiments, but can be implemented with various modifications without departing from the gist of the present invention.

[発明の効果〕 以上のように本発明では、シネ撮影に先立つテストX線
曝射にあっては管電圧を固定とし且つ曝射時間を可変と
して最Wi輝度となるX線条件を求め、シネ撮影にあっ
ては前記最3i!!!1度条件となる曝射時間を固定と
し且つ管電圧、管を流を可変して自動輝度調整を行うこ
とにより、予め固定した管電圧で最″i!i輝度となる
X線条件でシネ撮影をスタートさせることができるので
、シネ撮影時には予め固定−した゛管電圧の値又はその
近傍値に管電圧を調整するだけでfiWi輝度とするこ
とができる。 ゛従って、本発明によれば、シネ撮影を
、kVの依存度を少なくして最適輝度に設定できるよう
にしたX線撮影袋!を提供できる。
[Effects of the Invention] As described above, in the present invention, in the test X-ray exposure prior to cine imaging, the tube voltage is fixed and the exposure time is varied to find the X-ray conditions that give the highest Wi brightness. When it comes to photography, the above-mentioned 3i! ! ! By fixing the exposure time as the one-time condition and automatically adjusting the brightness by varying the tube voltage and tube flow, cine imaging can be performed under the X-ray conditions that achieve the maximum i!i brightness at the pre-fixed tube voltage. Therefore, when shooting a cine, it is possible to obtain the fiWi brightness by simply adjusting the tube voltage to a pre-fixed tube voltage value or a value close to it. It is possible to provide an X-ray imaging bag that allows imaging to be set at the optimum brightness with less dependence on kV!

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明にかかるx4tm影装置の一実施例の構
成を示す図、第2図〜第4図はそれぞれ同時実施例の動
作波形図である。 1・・・X線源、2・・・高電圧発生装置、3・・・被
検体、4・・・イメージインテンシファイヤ、5・・・
光学分配器、6・・・シネカメラ、7・・・テレビカメ
ラ、8・・・テレビカメラ制御ユニット、9・・・TV
モニタ、10゜11・・・アンプ、12・・・コンデン
サ、13・・・スイッチ、14・・・CPU、15・・
・マルチプレクサ、16A/D変換器、17・・・入力
端子、18・・・A/D変換器、19・・・プログラマ
ブルタイマ。 出願人代理人 弁理士 鈴江武彦
FIG. 1 is a diagram showing the configuration of an embodiment of the x4tm shadow device according to the present invention, and FIGS. 2 to 4 are operation waveform diagrams of simultaneous embodiments, respectively. DESCRIPTION OF SYMBOLS 1... X-ray source, 2... High voltage generator, 3... Subject, 4... Image intensifier, 5...
Optical distributor, 6... Cine camera, 7... Television camera, 8... Television camera control unit, 9... TV
Monitor, 10° 11...Amplifier, 12...Capacitor, 13...Switch, 14...CPU, 15...
- Multiplexer, 16 A/D converter, 17... Input terminal, 18... A/D converter, 19... Programmable timer. Applicant's agent Patent attorney Takehiko Suzue

Claims (1)

【特許請求の範囲】[Claims] 自動輝度調整を行なえるX線撮影装置において、シネ撮
影に先立つテストX線曝射にあっては管電圧を固定とし
且つ曝射時間を可変として最適輝度となるX線条件を求
め、シネ撮影にあつては前記最適輝度条件となる曝射時
間を固定とし且つ管電圧、管電流を可変して自動輝度調
整を行う制御手段を具備したことを特徴とするX線撮影
装置。
In an X-ray imaging device that can automatically adjust brightness, during test X-ray exposure prior to cine imaging, the tube voltage is fixed and the exposure time is varied to find the X-ray conditions that provide the optimal brightness. An X-ray imaging apparatus characterized by comprising a control means for fixing the exposure time that provides the optimum brightness condition and for automatically adjusting the brightness by varying the tube voltage and tube current.
JP63070924A 1988-03-25 1988-03-25 X-ray equipment Expired - Fee Related JP2680334B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63070924A JP2680334B2 (en) 1988-03-25 1988-03-25 X-ray equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63070924A JP2680334B2 (en) 1988-03-25 1988-03-25 X-ray equipment

Publications (2)

Publication Number Publication Date
JPH01243398A true JPH01243398A (en) 1989-09-28
JP2680334B2 JP2680334B2 (en) 1997-11-19

Family

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JP63070924A Expired - Fee Related JP2680334B2 (en) 1988-03-25 1988-03-25 X-ray equipment

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105072791A (en) * 2015-08-06 2015-11-18 南宁一举医疗电子有限公司 Photographic and prospective control system and method for medical diagnostic x-ray high-frequency and high-voltage generator

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362197A (en) * 1986-08-30 1988-03-18 Shimadzu Corp Automatic x-ray cinematographing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362197A (en) * 1986-08-30 1988-03-18 Shimadzu Corp Automatic x-ray cinematographing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105072791A (en) * 2015-08-06 2015-11-18 南宁一举医疗电子有限公司 Photographic and prospective control system and method for medical diagnostic x-ray high-frequency and high-voltage generator

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