JPH0122684B2 - - Google Patents
Info
- Publication number
- JPH0122684B2 JPH0122684B2 JP54042711A JP4271179A JPH0122684B2 JP H0122684 B2 JPH0122684 B2 JP H0122684B2 JP 54042711 A JP54042711 A JP 54042711A JP 4271179 A JP4271179 A JP 4271179A JP H0122684 B2 JPH0122684 B2 JP H0122684B2
- Authority
- JP
- Japan
- Prior art keywords
- compounds
- substrate
- film
- coating solution
- solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 26
- 238000000576 coating method Methods 0.000 claims description 25
- 239000011248 coating agent Substances 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 16
- IYDGMDWEHDFVQI-UHFFFAOYSA-N phosphoric acid;trioxotungsten Chemical compound O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.O=[W](=O)=O.OP(O)(O)=O IYDGMDWEHDFVQI-UHFFFAOYSA-N 0.000 claims description 16
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 238000010304 firing Methods 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 11
- 235000019441 ethanol Nutrition 0.000 description 9
- 239000011521 glass Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- ZNOKGRXACCSDPY-UHFFFAOYSA-N tungsten trioxide Chemical compound O=[W](=O)=O ZNOKGRXACCSDPY-UHFFFAOYSA-N 0.000 description 6
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000003756 stirring Methods 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 4
- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 description 4
- 150000002148 esters Chemical class 0.000 description 4
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 4
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 4
- 229910001930 tungsten oxide Inorganic materials 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- YWEUIGNSBFLMFL-UHFFFAOYSA-N diphosphonate Chemical compound O=P(=O)OP(=O)=O YWEUIGNSBFLMFL-UHFFFAOYSA-N 0.000 description 3
- 238000007598 dipping method Methods 0.000 description 3
- 238000004090 dissolution Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- DLYUQMMRRRQYAE-UHFFFAOYSA-N phosphorus pentoxide Inorganic materials O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 description 3
- LMHHRCOWPQNFTF-UHFFFAOYSA-N s-propan-2-yl azepane-1-carbothioate Chemical compound CC(C)SC(=O)N1CCCCCC1 LMHHRCOWPQNFTF-UHFFFAOYSA-N 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 2
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- YFVFAWSVVBJVHS-UHFFFAOYSA-I C(CCC)(=O)[O-].[Ta+5].C(CCC)(=O)[O-].C(CCC)(=O)[O-].C(CCC)(=O)[O-].C(CCC)(=O)[O-] Chemical compound C(CCC)(=O)[O-].[Ta+5].C(CCC)(=O)[O-].C(CCC)(=O)[O-].C(CCC)(=O)[O-].C(CCC)(=O)[O-] YFVFAWSVVBJVHS-UHFFFAOYSA-I 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- WQDUMFSSJAZKTM-UHFFFAOYSA-N Sodium methoxide Chemical compound [Na+].[O-]C WQDUMFSSJAZKTM-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 150000001639 boron compounds Chemical class 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 229940043430 calcium compound Drugs 0.000 description 2
- 150000001674 calcium compounds Chemical class 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 150000002170 ethers Chemical class 0.000 description 2
- 235000011187 glycerol Nutrition 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
- 150000002576 ketones Chemical class 0.000 description 2
- 150000002604 lanthanum compounds Chemical class 0.000 description 2
- 150000002642 lithium compounds Chemical class 0.000 description 2
- 150000002681 magnesium compounds Chemical class 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 150000003018 phosphorus compounds Chemical class 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 150000003112 potassium compounds Chemical class 0.000 description 2
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 150000003377 silicon compounds Chemical class 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 150000003388 sodium compounds Chemical class 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 150000005846 sugar alcohols Polymers 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 150000003482 tantalum compounds Chemical class 0.000 description 2
- 150000003609 titanium compounds Chemical class 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229910052720 vanadium Inorganic materials 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- 150000003682 vanadium compounds Chemical class 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- 150000003755 zirconium compounds Chemical class 0.000 description 2
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 1
- GDXHBFHOEYVPED-UHFFFAOYSA-N 1-(2-butoxyethoxy)butane Chemical compound CCCCOCCOCCCC GDXHBFHOEYVPED-UHFFFAOYSA-N 0.000 description 1
- XDJWZONZDVNKDU-UHFFFAOYSA-N 1314-24-5 Chemical compound O=POP=O XDJWZONZDVNKDU-UHFFFAOYSA-N 0.000 description 1
- JXPHLUCMHXXHEJ-UHFFFAOYSA-N 2-(aminomethyl)-4-bromoaniline Chemical compound NCC1=CC(Br)=CC=C1N JXPHLUCMHXXHEJ-UHFFFAOYSA-N 0.000 description 1
- QQZOPKMRPOGIEB-UHFFFAOYSA-N 2-Oxohexane Chemical compound CCCCC(C)=O QQZOPKMRPOGIEB-UHFFFAOYSA-N 0.000 description 1
- AWFYPPSBLUWMFQ-UHFFFAOYSA-N 2-[5-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]-1,3,4-oxadiazol-2-yl]-1-(1,4,6,7-tetrahydropyrazolo[4,3-c]pyridin-5-yl)ethanone Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C1=NN=C(O1)CC(=O)N1CC2=C(CC1)NN=C2 AWFYPPSBLUWMFQ-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- HCGFUIQPSOCUHI-UHFFFAOYSA-N 2-propan-2-yloxyethanol Chemical compound CC(C)OCCO HCGFUIQPSOCUHI-UHFFFAOYSA-N 0.000 description 1
- DEXFNLNNUZKHNO-UHFFFAOYSA-N 6-[3-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperidin-1-yl]-3-oxopropyl]-3H-1,3-benzoxazol-2-one Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C1CCN(CC1)C(CCC1=CC2=C(NC(O2)=O)C=C1)=O DEXFNLNNUZKHNO-UHFFFAOYSA-N 0.000 description 1
- 229910002012 Aerosil® Inorganic materials 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-M Butyrate Chemical compound CCCC([O-])=O FERIUCNNQQJTOY-UHFFFAOYSA-M 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Natural products CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 1
- HQAXNHSSFWIMCM-UHFFFAOYSA-N CCCC(O)=O.CCCC(O)=O.CCCC(O)=O.P Chemical compound CCCC(O)=O.CCCC(O)=O.CCCC(O)=O.P HQAXNHSSFWIMCM-UHFFFAOYSA-N 0.000 description 1
- 229920000742 Cotton Polymers 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- UEZVMMHDMIWARA-UHFFFAOYSA-N Metaphosphoric acid Chemical compound OP(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-N 0.000 description 1
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 1
- 239000004988 Nematic liquid crystal Substances 0.000 description 1
- 239000000020 Nitrocellulose Substances 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- 229920001800 Shellac Polymers 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- FJWGYAHXMCUOOM-QHOUIDNNSA-N [(2s,3r,4s,5r,6r)-2-[(2r,3r,4s,5r,6s)-4,5-dinitrooxy-2-(nitrooxymethyl)-6-[(2r,3r,4s,5r,6s)-4,5,6-trinitrooxy-2-(nitrooxymethyl)oxan-3-yl]oxyoxan-3-yl]oxy-3,5-dinitrooxy-6-(nitrooxymethyl)oxan-4-yl] nitrate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](O[N+]([O-])=O)[C@H]1O[N+]([O-])=O)O[C@H]1[C@@H]([C@@H](O[N+]([O-])=O)[C@H](O[N+]([O-])=O)[C@@H](CO[N+]([O-])=O)O1)O[N+]([O-])=O)CO[N+](=O)[O-])[C@@H]1[C@@H](CO[N+]([O-])=O)O[C@@H](O[N+]([O-])=O)[C@H](O[N+]([O-])=O)[C@H]1O[N+]([O-])=O FJWGYAHXMCUOOM-QHOUIDNNSA-N 0.000 description 1
- FGUJWQZQKHUJMW-UHFFFAOYSA-N [AlH3].[B] Chemical class [AlH3].[B] FGUJWQZQKHUJMW-UHFFFAOYSA-N 0.000 description 1
- ZLFFKRJBTDLWRM-UHFFFAOYSA-K [B+3].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O Chemical compound [B+3].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O ZLFFKRJBTDLWRM-UHFFFAOYSA-K 0.000 description 1
- GHVZOJONCUEWAV-UHFFFAOYSA-N [K].CCO Chemical compound [K].CCO GHVZOJONCUEWAV-UHFFFAOYSA-N 0.000 description 1
- QFJPQEKQIKSNBU-UHFFFAOYSA-M [Ti]O Chemical compound [Ti]O QFJPQEKQIKSNBU-UHFFFAOYSA-M 0.000 description 1
- WGFUTMKFZYTBRE-UHFFFAOYSA-I [V+5].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O Chemical compound [V+5].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O WGFUTMKFZYTBRE-UHFFFAOYSA-I 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- JPUHCPXFQIXLMW-UHFFFAOYSA-N aluminium triethoxide Chemical compound CCO[Al](OCC)OCC JPUHCPXFQIXLMW-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- ZRHOFLXFAAEXEE-UHFFFAOYSA-J butanoate;titanium(4+) Chemical compound [Ti+4].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O ZRHOFLXFAAEXEE-UHFFFAOYSA-J 0.000 description 1
- ZZHNUBIHHLQNHX-UHFFFAOYSA-N butoxysilane Chemical compound CCCCO[SiH3] ZZHNUBIHHLQNHX-UHFFFAOYSA-N 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- WPCPXPTZTOMGRF-UHFFFAOYSA-K di(butanoyloxy)alumanyl butanoate Chemical compound [Al+3].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O WPCPXPTZTOMGRF-UHFFFAOYSA-K 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- CWAFVXWRGIEBPL-UHFFFAOYSA-N ethoxysilane Chemical compound CCO[SiH3] CWAFVXWRGIEBPL-UHFFFAOYSA-N 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- JILPJDVXYVTZDQ-UHFFFAOYSA-N lithium methoxide Chemical compound [Li+].[O-]C JILPJDVXYVTZDQ-UHFFFAOYSA-N 0.000 description 1
- WIAVVDGWLCNNGT-UHFFFAOYSA-M lithium;butanoate Chemical compound [Li+].CCCC([O-])=O WIAVVDGWLCNNGT-UHFFFAOYSA-M 0.000 description 1
- AZVCGYPLLBEUNV-UHFFFAOYSA-N lithium;ethanolate Chemical compound [Li+].CC[O-] AZVCGYPLLBEUNV-UHFFFAOYSA-N 0.000 description 1
- XDKQUSKHRIUJEO-UHFFFAOYSA-N magnesium;ethanolate Chemical compound [Mg+2].CC[O-].CC[O-] XDKQUSKHRIUJEO-UHFFFAOYSA-N 0.000 description 1
- CRGZYKWWYNQGEC-UHFFFAOYSA-N magnesium;methanolate Chemical compound [Mg+2].[O-]C.[O-]C CRGZYKWWYNQGEC-UHFFFAOYSA-N 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- ARYZCSRUUPFYMY-UHFFFAOYSA-N methoxysilane Chemical compound CO[SiH3] ARYZCSRUUPFYMY-UHFFFAOYSA-N 0.000 description 1
- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 1
- 229920001220 nitrocellulos Polymers 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 235000011007 phosphoric acid Nutrition 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- UHZYTMXLRWXGPK-UHFFFAOYSA-N phosphorus pentachloride Chemical compound ClP(Cl)(Cl)(Cl)Cl UHZYTMXLRWXGPK-UHFFFAOYSA-N 0.000 description 1
- IPNPIHIZVLFAFP-UHFFFAOYSA-N phosphorus tribromide Chemical compound BrP(Br)Br IPNPIHIZVLFAFP-UHFFFAOYSA-N 0.000 description 1
- VSAISIQCTGDGPU-UHFFFAOYSA-N phosphorus trioxide Inorganic materials O1P(O2)OP3OP1OP2O3 VSAISIQCTGDGPU-UHFFFAOYSA-N 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920006122 polyamide resin Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920001289 polyvinyl ether Polymers 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- RWMKSKOZLCXHOK-UHFFFAOYSA-M potassium;butanoate Chemical compound [K+].CCCC([O-])=O RWMKSKOZLCXHOK-UHFFFAOYSA-M 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- ZLGIYFNHBLSMPS-ATJNOEHPSA-N shellac Chemical compound OCCCCCC(O)C(O)CCCCCCCC(O)=O.C1C23[C@H](C(O)=O)CCC2[C@](C)(CO)[C@@H]1C(C(O)=O)=C[C@@H]3O ZLGIYFNHBLSMPS-ATJNOEHPSA-N 0.000 description 1
- 239000004208 shellac Substances 0.000 description 1
- 229940113147 shellac Drugs 0.000 description 1
- 235000013874 shellac Nutrition 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- MFBOGIVSZKQAPD-UHFFFAOYSA-M sodium butyrate Chemical compound [Na+].CCCC([O-])=O MFBOGIVSZKQAPD-UHFFFAOYSA-M 0.000 description 1
- QDRKDTQENPPHOJ-UHFFFAOYSA-N sodium ethoxide Chemical compound [Na+].CC[O-] QDRKDTQENPPHOJ-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- JMXKSZRRTHPKDL-UHFFFAOYSA-N titanium ethoxide Chemical compound [Ti+4].CC[O-].CC[O-].CC[O-].CC[O-] JMXKSZRRTHPKDL-UHFFFAOYSA-N 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 1
- -1 vanadium methylate Chemical compound 0.000 description 1
Landscapes
- Formation Of Insulating Films (AREA)
- Inorganic Insulating Materials (AREA)
Description
本発明は、各種電子部品の製造に有用な新規材
料及びその製造方法に関するものである。
タングステン酸化物例えば三酸化タングステン
(WO3)は、種々の特異的な電気特性を示すた
め、電子部品の製造材料、あるいはその材料の成
分として広く使用されている。
ところで、一般に金属酸化物を電子部品材料と
して供給する場合、基体例えばガラス、各種金
属、セラミツク、プラスチツク、半導体などの表
面に皮膜として担持させることが、しばしば要求
される。そのため、タングステン酸化物について
も、これを基体上に塗布法などで担持させる試み
がなされたが、三酸化タングステンを溶液として
基体表面に塗布することが困難であり、これまで
成功していない。したがつて、電子部品材料の分
野において、タングステン酸化物の皮膜を基体表
面に形成させることが一つの重要な課題となつて
いた。
本発明者らは、この課題の解明について種々研
究を重ね、タングステン酸化物の供給源としてこ
れまで使用されてきた三酸化タングステンよりも
リンタングステン酸の方が溶液形成性の点で優れ
ていることに着目し、これを利用することを試み
た。しかしながら、リンタングステン酸を、水、
アルコールのような溶媒に溶かし、基体表面に塗
布後焼成処理しても、表面が単に白化するだけ
で、こすると剥離し、均一で安定な連続皮膜は形
成しない。
そこで、本発明者らは、さらに研究を続けた結
果、皮膜形成助剤を併用すれば、このリンタング
ステン酸の膜の接着性が著しく向上することを見
出し、この知見に基づいて本発明をなすに至つ
た。
すなわち、本発明に従えば、リンタングステン
酸と皮膜形成助剤とを含有する溶液から成る電子
部品材料形成用塗布溶液と、該塗布溶液を無機質
又は有機質の基板上に塗布したのち、焼成処理す
ることによつて形成される電子部品材料の製造方
法が提供される。
本発明で使用されるリンタングステン酸は、一
般式xP2O5・yWO3・nH2Oで示される組成をも
つものの総称であるが、最もよく知られているの
は、P2O5・24WO3・nH2Oである。このものは、
基板上に塗布する場合、約1〜30重量%の濃度で
溶液中に含有させる。
また、本発明において用いる皮膜形成助剤は、
使用される溶媒に溶解しうるケイ素化合物、チタ
ン化合物、ジルコニウム化合物、バナジウム化合
物、タンタル化合物、ランタン化合物、リチウム
化合物、ナトリウム化合物、カリウム化合物、マ
グネシウム化合物、カルシウム化合物、アルミニ
ウム化合物、ホウ素化合物又はリン化合物である
か、あるいは合成樹脂類である。
このようなものの例には、ケイ素化合物として
市販シラノール溶液、市販アエロジル、メトキシ
シラン、エトキシシラン、ブトキシシランなど、
チタン化合物として四塩化チタンとカルボン酸と
の反応生成物に、さらにアルコールを反応させた
もの、チタンエチレート、チタンイソプロピレー
ト、チタンブチレートなど、ジルコニウム化合物
としてジルコニウムエチレート、ジルコニウムイ
ソプロピレートなど、バナジウム化合物としてバ
ナジウムメチレート、バナジウムエチレート、バ
ナジウムブチレートなど、タンタル化合物として
タンタルエチレート、タンタルブチレートなど、
ランタン化合物としてランタニウムイソプロピレ
ート、ランタニウムブチレートなど、リチウム化
合物としてリチウムメチレート、リチウムエチレ
ート、リチウムブチレートなど、ナトリウム化合
物としてナトリウムメチレート、ナトリウムエチ
レート、ナトリウムブチレートなど、カリウム化
合物としてカリウムメチレート、カリウムエチレ
ート、カリウムブチレートなど、マグネシウム化
合物としてマグネシウムメチレート、マグネシウ
ムエチレート、マグネシウムブチレートなど、カ
ルシウム化合物としてカルシウムエチレート、カ
ルシウムプロピレートなど、アルミニウム化合物
としてアルミナ、アルミニウムエチレート、アル
ミニウムイソプロピレート、アルミニウムブチレ
ートなど、ホウ素化合物として三酸化ホウ素、ホ
ウ酸、ボロンメチレート、ボロンエチレート、ボ
ロンブチレートなど、リン化合物として五酸化リ
ン、三酸化リン、正リン酸、メタリン酸、五臭化
リン、五塩化リン、リンエチレート、リンブチレ
ートなどがある。
また、合成樹脂としては、ポロ酢酸ビニル、ポ
リアクリル酸エステル、ポリメタクリル酸エステ
ル、ポリビニルエーテル、ポリビニルピロリド
ン、エチルセルロース、ニトロセルロース、セラ
ツク、フエノール樹脂、エポキシ樹脂、ポリアミ
ド樹脂、ポリウレタン樹脂などがある。
これらの皮膜形成助剤は、全固形分に対し、約
0.1〜49重量%の割合で用いられる。
次に、本発明の材料を構成する無機質又は有機
質の基板としては、ガラス板、金属板、セラミツ
ク板、プラスチツク板、半導体板、透明電極など
が用いられる。この基板の大きさには特に制限が
なく、作業性の問題のみを考慮して定めればよ
い。
本発明の電子部品材料は、リンタングステン酸
と皮膜形成助剤とを含有する溶液から成る電子部
品材料形成用塗布溶液を、所定の基板上に塗布
し、乾燥後焼成することによつて製造される。こ
の際使用される塗布溶液は、適当な溶媒に皮膜形
成助剤を溶かし、次いでこの中にリンタングステ
ン酸を加えて溶解させることによつて調製され
る。これは室温で行うこともできるが、溶解速度
を増大させるために50℃までの温度に加温するの
が有利である。この溶解には、通常2〜30分間を
要する。溶解後、液温を室温まで冷却し、必要に
応じて溶媒を追加する。この場合、最初にリンタ
ングステン酸を溶解しておき、次いで皮膜形成助
剤を加えて溶解する方法をとることもできる。
この塗布溶液の調製に用いる溶媒としては、各
成分を溶解することができ、かつ塗布時に基体表
面に均一に塗布しうるものであればどのようなも
のでもよいが、水、アルコール類、エステル類、
ケトン類、多価アルコール類及びそのエーテル、
β―ジケトンあるいはそれらの混合物が好適であ
る。
アルコール類としては、例えばメチルアルコー
ル、エチルアルコール、プロピルアルコール、ブ
チルアルコール、アミルアルコールなどが、エス
テル類としては、例えば酢酸メチル、酢酸エチ
ル、酢酸プロピル、酢酸ブチルなどが、ケトン類
としては、例えばアセトン、メチルエチルケト
ン、メチルブチルケトン及びシクロヘキサノンな
どが、多価アルコール類及びそのエーテルとして
は、例えばエチレングリコール、エチレングリコ
ールモノメチルエーテル、エチレングリコールモ
ノエチルエーテル、エチレングリコールジエチル
エーテル、エチレングリコールイソプロピルエー
テル、エチレングリコールモノブチルエーテル、
エチレングリコールジブチルエーテル、プロピレ
ングリコール、グリセリンなどが、β―ジケトン
としては、例えばアセチルアセトンがそれぞれ用
いられる。
基体表面に塗布溶液を塗布する手段としては、
従来慣用されている塗布手段を任意に用いること
ができる。このような手段としては、例えばスピ
ンナー法、スプレー法、刷毛塗り法、浸せき法、
ロールコート法、フローコート法、カーテンコー
ト法、スクリーン印刷法などをあげることができ
る。
このようにして、基板上に塗布溶液を塗布した
のち、これを乾燥し、次いで焼成処理を行うが、
これは150〜1200℃の温度に加熱することによつ
て行われる。この温度は基板が融解、軟化、分解
などの望ましくない状態をもたらさない温度範囲
内で選ぶ必要がある。焼成時間としては、長い方
が好ましいが、作業性を考慮して、通常は5〜60
分の範囲内で選ばれる。雰囲気には特に制限はな
いが、通常は空気又は酸素中で焼成される。
このように焼成することにより、基板上に数百
Åないし数μの膜厚で、均一な連続膜が形成され
る。
このようにして得られた連続膜をもつ基板は、
各種電子部品の材料として好適に使用される。
例えば、シリコン単結晶のような半導体を基板
として用いた場合には、皮膜がN型を形成する拡
散用不純物供給源となるし、またパツシベーシヨ
ン、絶縁膜としても利用できる。また、液晶用デ
スプレイを基板として用いた場合には皮膜が有効
な配向膜となる。
さらに、ガラス基板上に形成された透明電極を
基板とすれば、エレクトロクロミツク材料とする
ことができる。
次に実施例をあげて本発明をさらに詳細に説明
する。
実施例 1
リンタングステン酸10gを、SiO2換算濃度10
%のシラノール溶液(東京応化工業社製、商品名
「OCD」)60gに加え、室温下、15分間かきまぜ
て溶解させる。次に、この溶液にメチルアルコー
ル20gを加え、塗布溶液を調製する。
このようにして得た塗布溶液を、厚さ1.7mmの
平滑なナトリウムガラス板上に滴下し、スピンナ
ーで15秒間塗布し、空気中、400℃において30分
間焼成する。
このようにして得られた材料の特性を以下に示
す。
The present invention relates to a new material useful for manufacturing various electronic components and a method for manufacturing the same. Tungsten oxide, such as tungsten trioxide (WO 3 ), exhibits various unique electrical properties and is therefore widely used as a manufacturing material for electronic components or as a component of such materials. By the way, when metal oxides are generally supplied as electronic component materials, it is often required that they be supported as a film on the surface of a substrate such as glass, various metals, ceramics, plastics, semiconductors, etc. Therefore, attempts have been made to support tungsten oxide on a substrate by a coating method, but this has not been successful so far because it is difficult to apply tungsten trioxide as a solution to the surface of the substrate. Therefore, in the field of electronic component materials, forming a tungsten oxide film on the surface of a substrate has become an important issue. The present inventors have conducted various studies to solve this problem, and have found that phosphotungstic acid is superior to tungsten trioxide, which has been used as a source of tungsten oxide, in terms of solution formation properties. We focused on this and tried to utilize it. However, phosphotungstic acid, water,
Even if it is dissolved in a solvent such as alcohol and baked after being applied to the surface of a substrate, the surface will simply whiten and peel off when rubbed, and a uniform and stable continuous film will not be formed. Therefore, as a result of further research, the present inventors discovered that the adhesion of this phosphotungstic acid film was significantly improved when a film-forming aid was used in combination.Based on this knowledge, the present invention was made. It came to this. That is, according to the present invention, a coating solution for forming an electronic component material is made of a solution containing phosphotungstic acid and a film-forming aid, and the coating solution is coated on an inorganic or organic substrate and then subjected to a firing treatment. A method of manufacturing an electronic component material formed by the method is provided. The phosphotungstic acid used in the present invention is a general term for substances having a composition represented by the general formula xP 2 O 5 .yWO 3 .nH 2 O, but the most well-known is 24WO 3 .nH 2 O. This thing is
When applied onto a substrate, it is included in the solution at a concentration of about 1 to 30% by weight. In addition, the film forming aid used in the present invention is
Silicon compounds, titanium compounds, zirconium compounds, vanadium compounds, tantalum compounds, lanthanum compounds, lithium compounds, sodium compounds, potassium compounds, magnesium compounds, calcium compounds, aluminum compounds, boron compounds or phosphorus compounds that are soluble in the solvent used. Or synthetic resins. Examples of such are commercially available silanol solutions as silicon compounds, commercially available Aerosil, methoxysilane, ethoxysilane, butoxysilane, etc.
Titanium compounds include the reaction product of titanium tetrachloride and carboxylic acid, which is further reacted with alcohol, titanium ethylate, titanium isopropylate, titanium butyrate, etc. Zirconium compounds include zirconium ethylate, zirconium isopropylate, vanadium Compounds such as vanadium methylate, vanadium ethylate, vanadium butyrate, tantalum compounds such as tantalum ethylate, tantalum butyrate, etc.
Lanthanum compounds such as lanthanium isopropylate and lanthanium butyrate; lithium compounds such as lithium methylate, lithium ethylate, and lithium butyrate; sodium compounds such as sodium methylate, sodium ethylate, and sodium butyrate; and potassium compounds such as potassium. Methylate, potassium ethylate, potassium butyrate, etc. Magnesium compounds include magnesium methylate, magnesium ethylate, magnesium butyrate, etc. Calcium compounds include calcium ethylate, calcium propylate, etc. Aluminum compounds include alumina, aluminum ethylate, aluminum Boron compounds such as isopropylate and aluminum butyrate; boron compounds such as boron trioxide, boric acid, boron methylate, boron ethylate, and boron butyrate; phosphorus compounds such as phosphorus pentoxide, phosphorus trioxide, orthophosphoric acid, metaphosphoric acid, and Examples include phosphorus bromide, phosphorus pentachloride, phosphorus ethylate, and phosphorus butyrate. Examples of synthetic resins include polyvinyl acetate, polyacrylic ester, polymethacrylic ester, polyvinyl ether, polyvinylpyrrolidone, ethyl cellulose, nitrocellulose, shellac, phenolic resin, epoxy resin, polyamide resin, and polyurethane resin. These film-forming aids contribute approximately to the total solids content.
It is used in a proportion of 0.1 to 49% by weight. Next, as the inorganic or organic substrate constituting the material of the present invention, a glass plate, a metal plate, a ceramic plate, a plastic plate, a semiconductor plate, a transparent electrode, etc. are used. There is no particular limit to the size of this substrate, and it may be determined by considering only the issue of workability. The electronic component material of the present invention is manufactured by applying an electronic component material forming coating solution containing phosphotungstic acid and a film forming aid onto a predetermined substrate, drying it, and then firing it. Ru. The coating solution used in this case is prepared by dissolving the film forming aid in a suitable solvent, and then adding and dissolving phosphotungstic acid therein. Although this can be carried out at room temperature, heating to a temperature of up to 50° C. is advantageous to increase the rate of dissolution. This dissolution usually takes 2 to 30 minutes. After dissolution, the liquid temperature is cooled to room temperature, and a solvent is added as necessary. In this case, it is also possible to first dissolve the phosphotungstic acid and then add and dissolve the film forming aid. The solvent used to prepare this coating solution may be any solvent as long as it can dissolve each component and can be applied uniformly to the substrate surface during coating, including water, alcohols, esters, etc. ,
Ketones, polyhydric alcohols and their ethers,
β-diketones or mixtures thereof are preferred. Examples of alcohols include methyl alcohol, ethyl alcohol, propyl alcohol, butyl alcohol, and amyl alcohol. Examples of esters include methyl acetate, ethyl acetate, propyl acetate, and butyl acetate. Examples of ketones include acetone. , methyl ethyl ketone, methyl butyl ketone, and cyclohexanone, and examples of polyhydric alcohols and their ethers include ethylene glycol, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol diethyl ether, ethylene glycol isopropyl ether, and ethylene glycol monobutyl ether. ,
Ethylene glycol dibutyl ether, propylene glycol, glycerin, etc. are used, and as the β-diketone, for example, acetylacetone is used. As a means of applying a coating solution to the substrate surface,
Any conventionally used application means can be used. Such methods include, for example, a spinner method, a spray method, a brush coating method, a dipping method,
Examples include a roll coating method, a flow coating method, a curtain coating method, and a screen printing method. After applying the coating solution onto the substrate in this way, it is dried and then subjected to a baking process.
This is done by heating to a temperature of 150-1200°C. This temperature must be selected within a temperature range that does not lead to undesirable conditions such as melting, softening, or decomposition of the substrate. The longer the baking time, the better, but considering workability, it is usually 5 to 60 minutes.
Selected within minutes. Although there are no particular restrictions on the atmosphere, firing is usually performed in air or oxygen. By baking in this manner, a uniform continuous film with a thickness of several hundred angstroms to several micrometers is formed on the substrate. The substrate with the continuous film obtained in this way is
Suitable for use as a material for various electronic components. For example, when a semiconductor such as a silicon single crystal is used as a substrate, the film serves as a source of impurities for diffusion to form an N type, and can also be used as a passivation or insulating film. Further, when a liquid crystal display is used as a substrate, the film becomes an effective alignment film. Furthermore, if the substrate is a transparent electrode formed on a glass substrate, it can be an electrochromic material. Next, the present invention will be explained in more detail with reference to Examples. Example 1 10g of phosphotungstic acid, SiO2 equivalent concentration 10
% silanol solution (manufactured by Tokyo Ohka Kogyo Co., Ltd., trade name "OCD") and stirred for 15 minutes at room temperature to dissolve. Next, 20 g of methyl alcohol is added to this solution to prepare a coating solution. The coating solution thus obtained is dropped onto a smooth sodium glass plate with a thickness of 1.7 mm, coated with a spinner for 15 seconds, and baked in air at 400° C. for 30 minutes. The properties of the material thus obtained are shown below.
【表】
素ガラスの透過率は91%であつた。
実施例 2
リンタングステン酸5gをエチルアルコール10
gに加え、常温で5分間かきまぜ溶解する。この
溶液にSiO2換算濃度8.5%のシラノール溶液50g
とと、五酸化リン1gを加え塗布溶液を調製す
る。次に、透明導電膜が形成されている厚さ0.7
mmのガラス基板上に上記の塗布溶液を滴下し、ス
ピンナーを用い2000rpm,10秒で塗布したのち、
この基板を酸素雰囲気中で300℃で30分間焼成す
る(膜厚は3500Å)。
次いでビーカーにグリセリン10重量部、硫酸1
重量部を混合し、その中に上記基板と対向電極と
してステンレス板を入れる。そして透明導電膜側
に負の電圧2.0Vをかけたところ青色の発色とな
り、正の電圧をかけると消色した。
実施例 3
リンタングステン酸15gをTiO2換算濃度12%
のヒドロキシチタンのアルコール溶液(東京応化
製、チタンフイルム)80gに30℃で20分間かきま
ぜて溶解する。この溶液にエチレングリコールモ
ノエチルエーテル20gを加え、塗布溶液とする、
厚さ1.1mmの平滑なナトリウムガラスに浸せき法
で塗布し、空気中で200℃で60分間焼成する。こ
のようにして得られた性質は次のとおりである。[Table] The transmittance of the raw glass was 91%. Example 2 5 g of phosphotungstic acid and 10 g of ethyl alcohol
g and stir for 5 minutes at room temperature to dissolve. Add 50 g of silanol solution with a SiO 2 equivalent concentration of 8.5% to this solution.
and 1 g of phosphorus pentoxide to prepare a coating solution. Next, a transparent conductive film is formed with a thickness of 0.7
After dropping the above coating solution onto a glass substrate of mm size and applying it using a spinner at 2000 rpm for 10 seconds,
This substrate is baked at 300°C for 30 minutes in an oxygen atmosphere (film thickness is 3500 Å). Next, add 10 parts by weight of glycerin and 1 part of sulfuric acid to a beaker.
Mix parts by weight, and place the above substrate and a stainless steel plate as a counter electrode therein. When a negative voltage of 2.0 V was applied to the transparent conductive film side, a blue color developed, and when a positive voltage was applied, the color disappeared. Example 3 15g of phosphotungstic acid at a TiO 2 equivalent concentration of 12%
Dissolve in 80 g of hydroxytitanium alcohol solution (Titanium Film, manufactured by Tokyo Ohka) by stirring at 30°C for 20 minutes. Add 20g of ethylene glycol monoethyl ether to this solution to make a coating solution.
It is applied by dipping onto smooth sodium glass with a thickness of 1.1 mm and fired at 200°C for 60 minutes in air. The properties thus obtained are as follows.
【表】
素ガラスの透過率は92%であつた。
実施例 4
リンタングステン酸10gをアセトン10gに室温
で10分間かきまぜ溶解する。この溶液に15%ポリ
ビニルブチラールのエチルアルコール溶液を50g
を加えさらにエチレングリコールモノメチルエー
テル30gを加え塗布溶液とする。厚さ1.5mmの平
滑なステンレス板をこの塗布溶液に浸し引き上げ
速度25cm/分で引き上げ塗布し、空気中で200℃
で60分間焼成した。このようにして得られた膜厚
は約5000Åであり、抵抗値は1014Ωcm以上であつ
た。
実施例 5
リンタングステン酸8gをSiO2換算濃度6.1%
のシラノール溶液(東京応化製、シリカフイル
ム)80gに常温で20分間かきまぜ、溶解する。こ
の溶液にn―ブチルアルコール5gと酢酸ブチル
5gを加え塗布溶液とする。この塗布溶液をスピ
ンナーを用いてシリコン薄板上に4000rpm,20秒
で塗布し、300℃で30分さらに1100℃(乾燥N22
/分)で30分加熱して拡散したところ、拡散深
さ1.0μ、表面比抵抗60Ω/□であつた。
実施例 6
リンタングステン酸10gをエチルアルコール60
gに30℃で10分間かきまぜ溶解する。この溶液に
タンタルブチレート6gと五酸化リン0.5gとア
セチルアセトン2gを加え塗布溶液とする。この
塗布溶液を透明導電膜が形成されたガラス基板に
浸せき法で30cm/分で引き上げ塗布する。次に約
200℃の温度で焼成し、2000Åの膜厚を得た。こ
の被膜層を綿布を用いて一定方向にラビングし、
ネマチツク液晶を用いて素子を組み、表示動作試
験を行つた結果、良好なツイストネマチツク配向
性を示した。[Table] The transmittance of the raw glass was 92%. Example 4 10 g of phosphotungstic acid is dissolved in 10 g of acetone by stirring at room temperature for 10 minutes. Add 50g of 15% polyvinyl butyral ethyl alcohol solution to this solution.
and 30 g of ethylene glycol monomethyl ether to prepare a coating solution. A smooth stainless steel plate with a thickness of 1.5 mm was immersed in this coating solution, pulled up at a pulling speed of 25 cm/min, and coated at 200°C in air.
Baked for 60 minutes. The film thickness thus obtained was approximately 5000 Å, and the resistance value was 10 14 Ωcm or more. Example 5 8 g of phosphotungstic acid at a SiO 2 equivalent concentration of 6.1%
Dissolve in 80 g of silanol solution (manufactured by Tokyo Ohka, Silica Film) by stirring for 20 minutes at room temperature. 5 g of n-butyl alcohol and 5 g of butyl acetate are added to this solution to prepare a coating solution. This coating solution was applied onto a silicon thin plate using a spinner at 4000 rpm for 20 seconds, and then heated at 300°C for 30 minutes and further heated at 1100°C (dry N 2 2
/min) for 30 minutes to diffuse, the diffusion depth was 1.0μ, and the surface resistivity was 60Ω/□. Example 6 10 g of phosphotungstic acid and 60 g of ethyl alcohol
Stir and dissolve in g at 30℃ for 10 minutes. 6 g of tantalum butyrate, 0.5 g of phosphorus pentoxide, and 2 g of acetylacetone are added to this solution to prepare a coating solution. This coating solution is applied onto a glass substrate on which a transparent conductive film is formed by dipping at a rate of 30 cm/min. Then about
It was fired at a temperature of 200°C to obtain a film thickness of 2000 Å. This coating layer is rubbed in a certain direction using cotton cloth,
A device was constructed using nematic liquid crystal and a display operation test was performed, which showed good twisted nematic orientation.
Claims (1)
する電子部品材料形成用塗布溶液。 2 リンタングステン酸と皮膜形成助剤とを含有
する電子部品材料形成用塗布溶液を、無機質又は
有機質に基板上に塗布したのち、焼成処理するこ
とを特徴とする電子部品材料の製造方法。[Claims] 1. A coating solution for forming an electronic component material containing phosphotungstic acid and a film forming aid. 2. A method for producing an electronic component material, which comprises applying a coating solution for forming an electronic component material containing phosphotungstic acid and a film-forming aid onto an inorganic or organic substrate, and then firing the substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4271179A JPS55136403A (en) | 1979-04-09 | 1979-04-09 | Material for electronic part and method of producing same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4271179A JPS55136403A (en) | 1979-04-09 | 1979-04-09 | Material for electronic part and method of producing same |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55136403A JPS55136403A (en) | 1980-10-24 |
JPH0122684B2 true JPH0122684B2 (en) | 1989-04-27 |
Family
ID=12643647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4271179A Granted JPS55136403A (en) | 1979-04-09 | 1979-04-09 | Material for electronic part and method of producing same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55136403A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104081517A (en) * | 2012-01-23 | 2014-10-01 | 日立化成株式会社 | Material for forming passivation film for semiconductor substrate, method of manufacturing semiconductor substrate comprising passivation film for semiconductor substrate, solar cell element, and method of manufacturing solar cell element |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4966583A (en) * | 1972-10-14 | 1974-06-27 |
-
1979
- 1979-04-09 JP JP4271179A patent/JPS55136403A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4966583A (en) * | 1972-10-14 | 1974-06-27 |
Also Published As
Publication number | Publication date |
---|---|
JPS55136403A (en) | 1980-10-24 |
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