JPH01215025A - Plasma cvd device - Google Patents

Plasma cvd device

Info

Publication number
JPH01215025A
JPH01215025A JP3959688A JP3959688A JPH01215025A JP H01215025 A JPH01215025 A JP H01215025A JP 3959688 A JP3959688 A JP 3959688A JP 3959688 A JP3959688 A JP 3959688A JP H01215025 A JPH01215025 A JP H01215025A
Authority
JP
Japan
Prior art keywords
substrate
cathode
anode
magnetic field
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3959688A
Other languages
Japanese (ja)
Other versions
JP2628529B2 (en
Inventor
Susumu Tanaka
進 田中
Yutaka Shimada
豊 島田
Susumu Fukuoka
福岡 進
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Sagami Ltd
Original Assignee
Tokyo Electron Sagami Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Sagami Ltd filed Critical Tokyo Electron Sagami Ltd
Priority to JP63039596A priority Critical patent/JP2628529B2/en
Publication of JPH01215025A publication Critical patent/JPH01215025A/en
Application granted granted Critical
Publication of JP2628529B2 publication Critical patent/JP2628529B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To form an excellent film onto the surface of a substrate by installing a coil outside a vacuum vessel, making currents flow through the coil and producing a magnetic field crossing at right angles to an electric field between an anode and a cathode. CONSTITUTION:A flat type coil 18 is mounted outside a vacuum vessel 11, and currents are made to flow through the flat type coil 18 and a magnetic field M crossing at right angles to an electric field E is generated between an anode (the vacuum vessel 11) and a cathode (a sample base 12), thus uniformly generating plasma having high energy intensity to the upper section of a substrate 14 in a wide area.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体製造プロセスに用いられるプラズマC
VD (Che+*fcal Vapor  Depo
sltlon )装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to plasma C
VD (Che+*fcal Vapor Depo
sltlon) device.

〔従来の技術〕[Conventional technology]

従来の平行平板型プラズマCVD装置を第3図に示す。 A conventional parallel plate type plasma CVD apparatus is shown in FIG.

同図において符号1は真空容器で、この真空容器1の内
部には基板2の載置台を兼ねた陰極3が設けられている
。この陰極3の上方には陽極4が対向配置され、これら
両極3.4間に高周波電源5からの電力がマツチングボ
ックス6を介して印加されるようになっている。また、
上記陽極4には反応ガスのガス導入ロアが設けられ、前
記真空容61には反応済みのガスを排出するガス排出口
8が設けられている。なお、図中9は真空容器1と陽極
4とを電気的に絶縁する絶縁物である。
In the figure, reference numeral 1 denotes a vacuum container, and inside this vacuum container 1, a cathode 3 which also serves as a mounting table for a substrate 2 is provided. An anode 4 is placed above the cathode 3 to face each other, and power from a high frequency power source 5 is applied via a matching box 6 between these two electrodes 3,4. Also,
The anode 4 is provided with a gas introduction lower for reacting gas, and the vacuum volume 61 is provided with a gas outlet 8 for discharging the reacted gas. Note that 9 in the figure is an insulator that electrically insulates the vacuum container 1 and the anode 4.

上記のような構成において、例えば基板2上に窒化シリ
コン膜を形成する場合には、まず真空容器l内をI X
 10−’ Torr程度まで減圧し、反応ガスとして
S i H4−NH3をガス導入ロアより真空容器1内
に導入する。そして、上記陰極3及び陽極4間に例えば
13.58 MHz 、 500 Wの高周波電力を高
周波電源5よりマツチングボックス6を介して印加し、
真空容器1内にプラズマを発生させる。このプラズマに
よって真空容器1内の反応ガスが活性化され、基板2の
表面に窒化シリコン膜が形成される。
In the above configuration, for example, when forming a silicon nitride film on the substrate 2, first the inside of the vacuum chamber l is
The pressure is reduced to about 10-' Torr, and S i H4-NH3 is introduced into the vacuum vessel 1 from the gas introduction lower as a reaction gas. Then, a high frequency power of, for example, 13.58 MHz and 500 W is applied between the cathode 3 and the anode 4 from the high frequency power source 5 via the matching box 6,
Plasma is generated within the vacuum container 1. This plasma activates the reactive gas in the vacuum chamber 1, and a silicon nitride film is formed on the surface of the substrate 2.

ところで、上記のような従来装置はプラズマのエネルギ
が弱いため、膜の成長速度が300〜500人/sin
と遅く、また生成膜のストレスが大きいため、5000
Å以上の膜厚を生成することは困難であった。そこで、
上記の欠点を改善し、良好−な膜を形成する手段として
、前記陽極及び陰極間に電界と直交する磁界を与えて基
板の表面に膜を形成するようにした薄膜生成技術が文献
等(例えば特公昭80−11109号公報)で知られて
いる。
By the way, in the conventional apparatus as described above, the plasma energy is weak, so the film growth rate is 300 to 500 people/sin.
5000 because it is slow and the stress on the formed film is large.
It has been difficult to produce a film with a thickness of Å or more. Therefore,
As a means of improving the above-mentioned drawbacks and forming a good film, a thin film production technique in which a film is formed on the surface of a substrate by applying a magnetic field orthogonal to the electric field between the anode and cathode is disclosed in the literature (e.g. It is known from Japanese Patent Publication No. 80-11109).

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

このようなマグネトロン方式は、陽極及び陰極間でプラ
ズマを均一に発生させるために均一な磁界を発生させる
必要があり、従来ではマグネットを回転させたり、移動
させたりして均一な磁界を得ていたため、マグネットを
回転または移動させるための駆動機構を必要とし、また
単位時間当りの磁界が弱いため、磁界のあるところはプ
ラズマ強度が強いが、平均的にはプラズマ強度が弱いと
いう問題があった。
This type of magnetron method requires a uniform magnetic field to be generated between the anode and cathode in order to generate plasma uniformly. Conventionally, a uniform magnetic field was obtained by rotating or moving the magnet. , a drive mechanism is required to rotate or move the magnet, and the magnetic field per unit time is weak, so the plasma intensity is strong where there is a magnetic field, but the plasma intensity is weak on average.

本発明はこのような問題点に鑑みてなされたもので、基
板の表面に良好な膜を形成することができるプラズマC
VD装置を提供することを目的とする。
The present invention was made in view of these problems, and uses plasma C that can form a good film on the surface of a substrate.
The purpose is to provide a VD device.

〔課題を解決するための手段〕[Means to solve the problem]

上記の課題を解決するために本発明は、真空容器外にコ
イルを設け、このコイルに電流を流して前記陽極と陰極
との間に電界と直交する磁界を発生させるようにしたこ
とを特徴とする。
In order to solve the above problems, the present invention is characterized in that a coil is provided outside the vacuum container, and a current is passed through the coil to generate a magnetic field orthogonal to the electric field between the anode and the cathode. do.

〔作 用〕[For production]

本発明では、基板の上方にエネルギ強度の高いプラズマ
が広い面積で均一に発生するため、基板の表面に良好な
膜を形成することができる。
In the present invention, since high-energy plasma is uniformly generated over a wide area above the substrate, a good film can be formed on the surface of the substrate.

〔実 施 例〕〔Example〕

以下、本発明の実施例を図面を参照して説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例を示すもので、図中11は陽
極を兼ねた真空容器、12は電気絶縁物13を介して真
空容器11内に設置された試料台である。この試料台1
2上には基板14が載置され、ガス導入ノズル15から
真空容器11内に導入される反応ガス(例えばS iH
4−NH3)によって基板14の表面に窒化シリコン膜
等が形成されるようになっている。
FIG. 1 shows an embodiment of the present invention, in which reference numeral 11 indicates a vacuum vessel which also serves as an anode, and 12 indicates a sample stage installed within the vacuum vessel 11 with an electrical insulator 13 interposed therebetween. This sample stage 1
A substrate 14 is placed on top of the reactor gas (for example, SiH) introduced into the vacuum container 11 from a gas introduction nozzle 15.
4-NH3) to form a silicon nitride film or the like on the surface of the substrate 14.

上記試料台12にはマツチングボックス16を介して高
周波発振器17が接続されており、この高周波発振器1
7から発振される高周波電力を試料台12及び真空容器
11に印加して真空容器11内にプラズマを発生させる
ように構成されている。
A high frequency oscillator 17 is connected to the sample stage 12 via a matching box 16.
The high-frequency power oscillated from 7 is applied to the sample stage 12 and the vacuum container 11 to generate plasma in the vacuum container 11.

一方、前記真空容器11外には電界Eと直交する磁界M
を発生させる偏平型コイル18が設けられている。この
偏平型コイル18は巻厚Aと巻幅Bとの比が1=3とな
っており、広い面積で均一な磁界M゛を発生させるよう
になっている。巻厚と巻幅比が1=3以上であれば、さ
らに均一な磁界が広い範囲で得られる。なお、図中19
は真空容器11内を排気する排気ノズルで、この排気ノ
ズル19には図示しない真空ポンプが接続されている。
On the other hand, a magnetic field M perpendicular to the electric field E exists outside the vacuum chamber 11.
A flat coil 18 is provided that generates. This flat coil 18 has a ratio of winding thickness A to winding width B of 1=3, and is designed to generate a uniform magnetic field M' over a wide area. If the ratio of the winding thickness to the winding width is 1=3 or more, a more uniform magnetic field can be obtained over a wide range. In addition, 19 in the figure
is an exhaust nozzle for evacuating the inside of the vacuum container 11, and a vacuum pump (not shown) is connected to this exhaust nozzle 19.

上記のように構成された一実施例装置で基板14上に窒
化シリコン膜を形成する場合は、先ず真空容器11内を
図示しない真空ポンプにより高真空(例えばIX 10
″6Torr)にした後、ガス導入ノズル15より反応
ガス(例えばS I H4N H3)を真空容器11内
に導入し、真空容器11内の圧力を txto−’、〜
lX10’Torr程度まで上昇させる。次にこの状態
で高周波発振器17より真空容器11及び試料台12に
13.56 MHz 、 500 Wの高周波電力を印
加して基板14の上方に電界Eを発生させるとともに、
偏平型コイル18に電流を流して上記電界Eと直交する
磁界Mを発生させる。これにより基板14の上方にエネ
ルギ強度の高いプラズマが広い面積で均一に発生し、こ
のプラズマによって真空容器11内の反応ガスが活性化
されて基板14の表面に窒化シリコン膜が形成される。
When forming a silicon nitride film on the substrate 14 using the apparatus configured as described above, first, the inside of the vacuum container 11 is heated to a high vacuum (for example, IX 10
``6 Torr), a reaction gas (for example, SI H4N H3) is introduced into the vacuum vessel 11 from the gas introduction nozzle 15, and the pressure inside the vacuum vessel 11 is reduced to txto-', ~
Raise the temperature to about 1×10' Torr. Next, in this state, a high frequency power of 13.56 MHz and 500 W is applied from the high frequency oscillator 17 to the vacuum container 11 and the sample stage 12 to generate an electric field E above the substrate 14.
A current is passed through the flat coil 18 to generate a magnetic field M perpendicular to the electric field E described above. As a result, high-energy plasma is uniformly generated over a wide area above the substrate 14, and the plasma activates the reactive gas in the vacuum chamber 11, forming a silicon nitride film on the surface of the substrate 14.

このように、真空容器11外に偏平型コイル18を設け
、この偏平型コイル18に電流を流して陽極(真空容器
11)と陰極(試料台12)との間に電界Eと直交する
磁、界Mを発生させることにより、基板14の上方にエ
ネルギ強度の高いプラズマが広い面積で均一に発生する
ため、基板14の表面に良好な膜を形成することができ
る。
In this way, a flat coil 18 is provided outside the vacuum vessel 11, and a current is passed through the flat coil 18 to create a magnetic field perpendicular to the electric field E between the anode (vacuum vessel 11) and cathode (sample stage 12). By generating the field M, high-energy plasma is uniformly generated over a wide area above the substrate 14, so that a good film can be formed on the surface of the substrate 14.

また、生膜のストレスが小さいため、5000人の生膜
が可能となった。さらに、強いプラズマが得られるため
、膜の成長速度も2000〜3000人/mlnと速く
なる。
In addition, because the stress on the biomembranes is small, it has become possible to provide biomembranes for 5,000 people. Furthermore, since strong plasma can be obtained, the film growth rate is also as fast as 2000 to 3000 people/ml.

なお、本発明は上記実施例に限定されるものではない。Note that the present invention is not limited to the above embodiments.

例えば上記実施例では偏平型コイル18を用いて磁界を
発生させるようにしたが、第2図に示すように真空容器
11外に複数個のコイル20・・・を同心状に設け、こ
れらのコイル20に流す電流を調整して基板上の磁界分
布を変化させてもよい。一般に同一磁界の場合には中心
部のプラズマが強くなるため、中心部の磁界を弱くする
ことで基板上に均一な成膜が可能となる。
For example, in the above embodiment, the flat coil 18 was used to generate the magnetic field, but as shown in FIG. The magnetic field distribution on the substrate may be changed by adjusting the current flowing through the substrate 20. Generally, when the magnetic field is the same, the plasma in the center becomes stronger, so by weakening the magnetic field in the center, it becomes possible to form a uniform film on the substrate.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、基板の上方にエネ
ルギ強度の高いプラズマを広い面積で均一に発生させる
ことができるため、基板の表面に良好な膜を形成するこ
とができる。
As described above, according to the present invention, plasma with high energy intensity can be uniformly generated over a wide area above the substrate, so that a good film can be formed on the surface of the substrate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示すプラズマCVD装置の
構成図、第2図は本発明の他の実施例を示すプラズマC
VD装置の構成図、第3図は従来のプラズマCVD装置
の構成図である。 11・・・真空容器、12・・・試料台、14・・・基
板、15・・・ガス導入ノズル、17・・・高周波発振
器、18・・・偏平型コイル、19・・・排気ノズル、
20・・・コイル。 出願人代理人  弁理士 鈴江武彦 第1図 第2図
FIG. 1 is a configuration diagram of a plasma CVD apparatus showing one embodiment of the present invention, and FIG. 2 is a plasma CVD apparatus showing another embodiment of the present invention.
FIG. 3 is a block diagram of a conventional plasma CVD apparatus. DESCRIPTION OF SYMBOLS 11... Vacuum container, 12... Sample stand, 14... Substrate, 15... Gas introduction nozzle, 17... High frequency oscillator, 18... Flat type coil, 19... Exhaust nozzle,
20...Coil. Applicant's agent Patent attorney Takehiko Suzue Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims]  陽極及び陰極を対向配置させた真空容器内に基板を前
記陰極上に載置し、前記真空容器内に反応ガスを導入す
るとともに、前記陽極及び陰極に電力を印加して基板上
に膜を形成するプラズマCVD装置において、前記真空
容器外にコイルを設け、このコイルに電流を流して前記
陽極と陰極との間に電界と直交する磁界を発生させるよ
うにしたことを特徴とするプラズマCVD装置。
A substrate is placed on the cathode in a vacuum container in which an anode and a cathode are arranged facing each other, and a reaction gas is introduced into the vacuum container, and electric power is applied to the anode and cathode to form a film on the substrate. A plasma CVD apparatus characterized in that a coil is provided outside the vacuum vessel, and a current is passed through the coil to generate a magnetic field orthogonal to the electric field between the anode and the cathode.
JP63039596A 1988-02-24 1988-02-24 Plasma CVD equipment Expired - Fee Related JP2628529B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63039596A JP2628529B2 (en) 1988-02-24 1988-02-24 Plasma CVD equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63039596A JP2628529B2 (en) 1988-02-24 1988-02-24 Plasma CVD equipment

Publications (2)

Publication Number Publication Date
JPH01215025A true JPH01215025A (en) 1989-08-29
JP2628529B2 JP2628529B2 (en) 1997-07-09

Family

ID=12557490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63039596A Expired - Fee Related JP2628529B2 (en) 1988-02-24 1988-02-24 Plasma CVD equipment

Country Status (1)

Country Link
JP (1) JP2628529B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS611025A (en) * 1985-03-07 1986-01-07 Toshiba Corp Plasma processing apparatus
JPS61119036A (en) * 1984-11-15 1986-06-06 Hitachi Ltd Low temperature plasma electromagnetic field controlling mechanism
JPS6314876A (en) * 1986-07-08 1988-01-22 Mitsubishi Heavy Ind Ltd Amorphous thin film forming device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61119036A (en) * 1984-11-15 1986-06-06 Hitachi Ltd Low temperature plasma electromagnetic field controlling mechanism
JPS611025A (en) * 1985-03-07 1986-01-07 Toshiba Corp Plasma processing apparatus
JPS6314876A (en) * 1986-07-08 1988-01-22 Mitsubishi Heavy Ind Ltd Amorphous thin film forming device

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