JPH011979A - High speed edge connector tester - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

Detailed Description of the Invention (Field of Industrial Application) This invention provides a method for attaching a plurality of probe contacts for edge connector contact to a linear carrier and connecting and disconnecting these contacts to an edge connector of a unit amplifier last. This article relates to a high-speed edge connector tester.

(Prior Art) U.S. Pat. No. 4,598, incorporated herein by reference.
．． No. 246 and No. 4.625,164 are capable of opening electronic circuits to automatic test equipment that operates to determine the integrity of the components of the circuit and the cooperation between the components. It has an interface that allows for reliable connection.

A major drawback of conventional test heads is that they are limited in the speed at which tests can be performed periodically. One of the causes of time delay is related to the length of the circuit. The longer the wire length, the more time it takes to propagate the electrical signal and the less processing power the test device has. Other sources of time delays are transients induced by capacitance, inductance, and other electrical properties of the wire, which must be resolved before the test can proceed. Both effects are directly dependent on the total extension or length of the signal path, and in conventional test heads, especially those with edge connector contacts for testing electrical circuit equipment, the wire length is about a foot and a half; is correlated with several milliseconds of lost time per cycle, and is also undesirable if there is no unacceptable throughput delay.

(Object of the invention and its structure) The main object of the present invention is to provide a plurality of edge connector contact probe contacts, and to connect these contacts to a unit amplifier.
To provide a high-speed edge connector tester mounted on a linear carrier that can be moved to connect to and disconnect from an edge connector under test.

A plurality of automatic test equipment contact probe contacts mounted on the carrier are individually connected to corresponding edge connector contacts via oil-free, minimum length conductive wires.

The linearly movable carrier, the edge contacting probe contact, and the automatic test equipment contacting probe contact are mounted on a test fixture that is movable to electrically connect the automatic test equipment contacting probe contact with the automatic test equipment. Ru. Minimum path length electrical interconnections are made between the automatic test equipment and the unit amplifier test edge connector via several probes and interconnect lines. The present invention can at least increase the signal processing speed compared to conventional devices.

Other objects, aspects and features of the invention will become apparent as the invention is better understood with reference to the following illustrative and non-limiting detailed description and accompanying drawings.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Referring to FIG. 1, a perspective view of a novel high speed edge connector test assembly 10 according to the present invention is shown. The edge connector tester 10 cooperates with a test head or fixture of automatic test equipment of the type disclosed in the aforementioned US patents. These test fixtures include an electronic circuit board receiving surface that is movably mounted to a fixed probe support plate.

Electronic circuit boards, generally unit amplifier tests (U U
T) is received in the receiving surface and is adapted to create a vacuum to pull the unit amplifier test down into contact with the probe supported on the probe support plate.

These probes are electrically connected to automatic test equipment.

The edge connector tester 10 is attached to the receiving surface and moves up and down together. Units such as computers and storage devices
For under-Φ testing, edge connectors are typically soldered or otherwise secured along or apart from the edges. In the embodiment of FIGS. 1 and 2, the unit amplifier test edge connector is located remote from the physical edge, and in the embodiment of FIG. 3, the unit is substantially superimposed on the physical edge.・Touch the edge connector of the amplifier test.

In the tester 10, a plurality of edge connector contacts 12 are attached to a plate or board 14. In the illustrated example, the contacts are arranged in two rows, but there may be one or three rows of contacts.
It can be a row or any number of rows, just a contact (probe).
The number of rows of 12 must be equal to the number of rows of contacts it contacts. The number of probes can be chosen to be equal to the number of contactors for a particular unit under φ test, or can be chosen to provide a universal test pattern that can contact any of a plurality of units under test. contact 1
2 are preferably ``rPOGO'' spring probes which are individually removable and palm-held onto the board 14.

A second array of automatic test equipment contacts 16 is attached to board 18 . This board 18 is web 20
The contact 16 is fixed to the board 14 through the contact 12.
occupies a lower position behind. The lateral distance between the contact 12, 16 arrays is selected to accommodate the lateral misalignment of the edge connector for a particular unit under φ test.

The end of probe 12, spaced from the spring end, is coupled to one of the ends of probe 16, spaced from the spring end, via wire wrap 22, shown in FIG. Wire wrap 22 is non-flexible and therefore has a very long life.

Replacing the probe 12.16 is as simple as removing the spring contact and replacing it with a new or rebuilt one.

The board 14 is slidably mounted on linear bearings 24 and cantilevered to a /% housing 26 adjacent each longitudinal end of the board. As seen in FIG. 2, the housing 26 is mounted for movement with a movable circuit board receiving surface 28 of a test fixture for automatic test equipment. As shown schematically by arrow 32, unit amplifier test receiving surface 2
8 is movable relative to the fixed probe support plate 30. The receiving surface 28 may be mounted for movement relative to the stationary plate 30 by any means, preferably the spring suspension elastic layer support disclosed in the above-identified patent.

An actuator 34 is attached to the housing 26 to reciprocate the board 14 along the linear bearing 24. In FIG. 1, the actuator 34 is located in the center of the board 14.
Although only one actuator is shown, multiple actuators may be used.

Referring now to FIG. 2, actuator 34 includes a ram 36. As shown in FIG. This actuator is preferably a pneumatic cylinder so that the ram 36 can reciprocate in its extension direction. A joint 38 is provided between the board 14 and the opposite end of the ram 36 of the cylinder 34. As long as the board is guided in linear bearings (FIG. 1), the coupling 38 preferably transmits the force directly along the direction of movement of the ram of the cylinder;
Axial joints are chosen that have play a transverse to the direction of motion so that there is no interference or jamming due to sliding motion along the linear bearings. In the preferred embodiment, the fitting 38 is a so-called "T" fitting having a bracket 40 having a "T" slot secured to the board 14 and a cooperating button head 42 secured by screwing or otherwise to the free end of the ram 36.
including.

The unit amp test is shown at 44. As shown in the figures, the edge connector 46 is spaced a distance away from the physical edge of the unit amplifier test 44. Edge to unit 44 connector 4
The distance of 6 is adjusted by the lateral displacement of the probe support board 14.18. As shown in FIG. 3, when the edge connector 48 is superimposed on the physical edge of the unit amplifier test 50, only a single board 52 is needed to contact the edge contact 54 along with the test fixture contact contacts 56. Support your child. In the embodiment shown in FIG. 3, three rows of contacts 54 are shown, corresponding to the number of rows of a particular edge connector 48. Additionally, the three rows of contacts 54 are electrically paired with the two rows of contacts 56, and the number of contacts 54 is equal to the number of contacts 56.
furthermore, the contacts 54 are equal to the number of dashed lines 5
It is selectively and electrically interconnected with the contact 56 by a non-oil conductor, indicated schematically at 8.

Returning to FIG. 2, a plurality of spring POGO contacts 6
0 is fixed to the probe support board 30 as a unit.
The circuit points of amplifier test 44 are tested.

A plurality of other spring POGO contacts 62 are secured to the probe support plate 30, the number of these contacts 62 corresponding to the number of probes 16. The contactor 62 is attached to the probe support plate 3
Contactor 63 disposed on right angle connector 64 attached to
are aligned. The contact 65 is connected to the contact 63 on the inside and is aligned with the contact 16 . A connector 64 connects contacts 62 and 16. Any right angle connector may be used for unit 64, such as a right angle header assembly. Contacts 60 , 62 are electrically connected to automatic test equipment as shown schematically in dashed line 66 .

In operation, a vacuum is applied to the mobile unit amplifier test receiver 28, as indicated schematically by arrow 18 in FIG. The receiving surface 28 lowers in response to the vacuum and the contact 63
is brought into contact with the contactor 62, and the contactor 60 is brought into electrical contact with a predetermined circuit point of the circuit of the unit under test amplifier test 44. The automatic test equipment electrically contacts the circuit points and the contacts 63 contact the contacts 62 at the same time, thereby electrically connecting the automatic test equipment to the right angle connector 64.

Actuation of actuator 34 causes ram 36 to move to the left in FIG. 2, causing board 14 and contacts to move to the left together. The contacts enter the edge connector 46 and each probe end is received in a corresponding contact opening in the connector 46. Simultaneously with the contact of the connector 46, the probe 16 contacts the contact 65 of the right angle connector 64, so that the automatic test equipment connects the probe 12 through the wire 22.
Therefore, it is electrically connected to the contacts of the edge connector 46. At the same time, the automatic test equipment has a predetermined connection integrity (
(in so-called circuit tests) and/or device functions (functional tests). After the test is completed, actuator 34 pulls ram to the right in FIG.
Cut off the connection with 4. Release the vacuum and remove the contact 60.
At the same time, the connection between the contact 62 and the contact 63 of the right-angle connector 64 is cut off.

As can be seen, the length of the wire over which propagation occurs is, according to the invention, kept as short as reasonably possible to reduce stable transients and propagation signal delays. The present invention provides significant improvements in processing power to provide an edge connector suitable for many of today's high speed testing applications.

Many modifications to the invention disclosed herein may be made by those skilled in the art without departing from the scope of the claims.

[Brief explanation of drawings]

FIG. 1 is a perspective view of the novel high speed edge connector test assembly of the present invention, and FIG. 2 shows the assembly mounted in a test fixture of an automatic test equipment and in contact with an edge connector of a unit amplifier test. FIG. 3 is a partially cross-sectional, partially pictorial side view of another embodiment of the present invention, also shown in a non-contact state, tubed into a test fixture of an automatic test device. It is a pictorial side view. 12.16...Contact (probe), 28...Movable circuit board receiving surface, 34...Actuator, 38...
・Joint, 44.50...Unit amplifier test,
46.48... Edge connector. 1 person outside FIG, 1 Procedure? ili (correct writing method) % formula % Name of the invention Relationship to the case of the person who corrects the high-speed edge connector tester Patent applicant

Claims (10)

[Claims] (1) A test fixture having a movable electronic circuit device receiving surface and a fixed probe support surface in a high-speed edge connector assembly for testing an electronic circuit device having a circuit point under test and an edge connector having a contact under test. and a first plurality of spring probes fixed to a probe support plate having a first plurality of fixed signal contacts regulating an array for testing circuit points of the electronic circuit device; a right-angle connector secured to an electrical circuit device having a first and a second plurality of contacts in respective planes thereof; a second plurality of spring probes having an end secured to the probe support plate with a plurality of fixed signal contacts; and a third spring probe having a number at least equal to the number of contacts of the edge connector.
a fourth plurality of spring probes having a number at least equal to the number of spring contacts of the third plurality; and the third plurality of spring contacts are in contact with the edge. a second plurality of spring contacts for moving the fourth and third plurality of spring contacts such that the fourth plurality of spring contacts selectively connect with the second contact; 3 and means for coupling to a fourth plurality. 2. The assembly of claim 1, wherein the first and second plurality of spring contacts are vertically upright and parallelly aligned. (3) The third and fourth plurality of spring contacts are horizontally oriented and parallel aligned.
Assembly as described in Section. (4) The moving means includes means for supporting the third and fourth plurality of contacts, and means coupled to means for moving the supporting means toward and away from the edge connector in linear reciprocating motion. An assembly as claimed in claim 3 comprising: 5. The assembly of claim 4, wherein the support means coupling movement means is mounted to the mobile electronic device receiving surface. (6) The assembly according to claim 5, wherein the support means coupled movement means includes a carriage mounted on a linear bearing, and an actuator for moving the carriage edge along the linear bearing. 7. The assembly of claim 6, wherein said actuator is pneumatically actuated and coupled to said carriage by means for confirming uniaxial force transmission, transaxial force play, and slippage. 8. The assembly of claim 4, wherein the fourth and third plurality of probes are supported by the same board. (9) the support means includes two laterally spaced boards, and the fourth and third plurality of spring contacts are each mounted on the laterally spaced boards; , claim 4 interconnected by a web.
Assembly as described in Section. 10. The assembly of claim 1, wherein the first, second, third and fourth plurality of spring contacts are POGO spring contacts or the like.