FR2224972A1 - Printed circuit card test instrument - signals measured on card as well as from card terminals - Google Patents

Printed circuit card test instrument - signals measured on card as well as from card terminals

Info

Publication number
FR2224972A1
FR2224972A1 FR7312000A FR7312000A FR2224972A1 FR 2224972 A1 FR2224972 A1 FR 2224972A1 FR 7312000 A FR7312000 A FR 7312000A FR 7312000 A FR7312000 A FR 7312000A FR 2224972 A1 FR2224972 A1 FR 2224972A1
Authority
FR
France
Prior art keywords
card
well
printed circuit
test instrument
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7312000A
Other languages
French (fr)
Other versions
FR2224972B1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel CIT SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel CIT SA filed Critical Alcatel CIT SA
Priority to FR7312000A priority Critical patent/FR2224972A1/en
Publication of FR2224972A1 publication Critical patent/FR2224972A1/en
Application granted granted Critical
Publication of FR2224972B1 publication Critical patent/FR2224972B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The instrument has first and second supports with means of engaging a control card and a test card with signal contact pins, the cards being parallel and removable in the supports. Third and fourth supports carry respectively fixed first and second connectors to which are plug connected to the control card and the test card and connected electrically to the signal contact pins. A control mechanism moves the control card into contact or out of contact with the contact pins. A fifth support carries signal output contacts accessible from the front of the instrument and cabled to the first and second connectors. The system permits measurement of signals on the card as well as from the card input terminals, no matter what type of circuit is printed on the card.
FR7312000A 1973-04-03 1973-04-03 Printed circuit card test instrument - signals measured on card as well as from card terminals Granted FR2224972A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7312000A FR2224972A1 (en) 1973-04-03 1973-04-03 Printed circuit card test instrument - signals measured on card as well as from card terminals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7312000A FR2224972A1 (en) 1973-04-03 1973-04-03 Printed circuit card test instrument - signals measured on card as well as from card terminals

Publications (2)

Publication Number Publication Date
FR2224972A1 true FR2224972A1 (en) 1974-10-31
FR2224972B1 FR2224972B1 (en) 1976-05-21

Family

ID=9117348

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7312000A Granted FR2224972A1 (en) 1973-04-03 1973-04-03 Printed circuit card test instrument - signals measured on card as well as from card terminals

Country Status (1)

Country Link
FR (1) FR2224972A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0293304A1 (en) * 1987-05-27 1988-11-30 Augat Inc. High-speed side access edge connector testing assembly
EP0372666A1 (en) * 1988-11-23 1990-06-13 Werner Dipl.-Ing. Thom Multicompatible holding fixture for printed-circuit boards or SMT devices to be tested, and for contact boards and supporting boards for use in testing apparatuses
WO2004095040A1 (en) * 2003-03-21 2004-11-04 Intel Corporation Automated circuit board test actuator system
US7110905B2 (en) 2002-09-30 2006-09-19 Intel Corporation Universal automated circuit board tester
EP1995602A1 (en) * 2007-05-23 2008-11-26 RRo Industrial Design B.V. Probe board, test fixture, method for making a probe board, and method for testing a Printed Circuit Board (PCB)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0293304A1 (en) * 1987-05-27 1988-11-30 Augat Inc. High-speed side access edge connector testing assembly
EP0372666A1 (en) * 1988-11-23 1990-06-13 Werner Dipl.-Ing. Thom Multicompatible holding fixture for printed-circuit boards or SMT devices to be tested, and for contact boards and supporting boards for use in testing apparatuses
US6999888B2 (en) 2002-09-30 2006-02-14 Intel Corporation Automated circuit board test actuator system
US7110905B2 (en) 2002-09-30 2006-09-19 Intel Corporation Universal automated circuit board tester
US7154257B2 (en) 2002-09-30 2006-12-26 Intel Corporation Universal automated circuit board tester
US7421365B2 (en) 2002-09-30 2008-09-02 Intel Corporation Automated circuit board test actuator system
US7523010B2 (en) 2002-09-30 2009-04-21 Intel Corporation Automated circuit board test actuator system
WO2004095040A1 (en) * 2003-03-21 2004-11-04 Intel Corporation Automated circuit board test actuator system
GB2414606A (en) * 2003-03-21 2005-11-30 Intel Corp Automated circuit board test actuator system
GB2414606B (en) * 2003-03-21 2007-04-04 Intel Corp Automated circuit board test actuator system
EP1995602A1 (en) * 2007-05-23 2008-11-26 RRo Industrial Design B.V. Probe board, test fixture, method for making a probe board, and method for testing a Printed Circuit Board (PCB)
WO2008143512A1 (en) * 2007-05-23 2008-11-27 Rro Industrial Design B.V. Probe board, test fixture, method for making a probe board, and method for testing a printed circuit board (pcb)

Also Published As

Publication number Publication date
FR2224972B1 (en) 1976-05-21

Similar Documents

Publication Publication Date Title
CA965148A (en) Condition measuring system using components of admittance of an electrical circuit
IE35622L (en) Electrical assembly for use in data processing
CA1028401A (en) Matched impedance printed circuit board connector
AT306140B (en) Housing arrangement for an electrical connector
CA1023028A (en) Printed circuit board connector
CA1029105A (en) Electrical contact pin for printed circuit board
EP0474086A3 (en)
CA1011838A (en) Printed circuit board connector
CA981801A (en) Printed circuit board connector card guide
FR2224972A1 (en) Printed circuit card test instrument - signals measured on card as well as from card terminals
CA921119A (en) Probe and guide assembly for testing printed circuit cards
ES215513U (en) Force meter device. (Machine-translation by Google Translate, not legally binding)
CA1027651A (en) Printed circuit board connector
KR840002108A (en) Method and device for automatic de-skewing of pin electronic interface circuit in electronic inspection device
CA989494A (en) Control wipe electrical connector for circuit cards
FR2251245A5 (en) Programming system for signal processing units - has interchangeable programmes recorded on printed circuit cards
SU798642A1 (en) Apparatus for monitoring electric wiring
SU473183A1 (en) Discrete logic device
ES441228A1 (en) Line testing circuit for switching system
JPS5789155A (en) Integrated logical operation circuit
SU781825A1 (en) Matrix-type registering device of galvanic couplings of instrument for testing electric wiring
JPS53138729A (en) Energizing device for electrostatic recording stylus
AU259417B2 (en) Signal detection circuit for detecting character information signals contained ina complex electrical signal
JPS5283027A (en) Circuit for detecting asynchronous input signal state variation
CA825787A (en) Printed circuit testing system employing electrosensitive paper

Legal Events

Date Code Title Description
ST Notification of lapse