JPH01194317A - Holding jig of semiconductor wafer - Google Patents

Holding jig of semiconductor wafer

Info

Publication number
JPH01194317A
JPH01194317A JP1835688A JP1835688A JPH01194317A JP H01194317 A JPH01194317 A JP H01194317A JP 1835688 A JP1835688 A JP 1835688A JP 1835688 A JP1835688 A JP 1835688A JP H01194317 A JPH01194317 A JP H01194317A
Authority
JP
Japan
Prior art keywords
wafer
susceptor
semiconductor wafer
jig
holding jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1835688A
Other languages
Japanese (ja)
Inventor
Yoshitomo Hayashi
善智 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP1835688A priority Critical patent/JPH01194317A/en
Publication of JPH01194317A publication Critical patent/JPH01194317A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to mount a wafer on a susceptor and take it out of a susceptor without its touching a treated surface of a semiconductor wafer, by forming a cutout groove serving as a moving path of a handling jig from a periphery to the center of a plate surface of the susceptor. CONSTITUTION:A cutout groove 5 is formed from a periphery to the center on a susceptor and claws 3A and 3B for supporting are arranged on both surfaces of the susceptor along the groove 5 such that comparative position of them may be shifted so as to be at different levels. When a semiconductor wafer 4 is provided on the susceptor 2, a handling jig is applied to a P part of the back surface of the wafer 4 to suck the wafer 4 and then the jig is moved into the groove from the upper part of the susceptor 2 and the wafer 4 falls in the claw 3A for mounting with the treated surface facing an outer side. In the same way, the wafer 4 is mounted on the opposite surface of the susceptor 2 with the treated surface facing the outer side by operating the jig sucking the wafer.

Description

【発明の詳細な説明】 (産業上の利用分野〕 この発明は、減圧CVD法による成膜工程で用いる半導
体ウェハの保持治具の構成に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to the structure of a holding jig for a semiconductor wafer used in a film forming process using a low pressure CVD method.

〔従来の技術〕[Conventional technology]

まず第8図ないし第10図に頭記した保持治具の従来構
造を示す0図において1は石英バイブを組合せて作られ
た石英ボートと呼称される脚部、2は前記脚部1の上に
起立姿勢に並べ立てた円板状のサセプタであり、該サセ
プタ2の表裏両面にはウェハ支持用の爪3を備えている
。なお1基の保持治具で通常は30〜50枚程度のサセ
プタが定ピッチ間隔置きに装備されている。
First, in Fig. 0 showing the conventional structure of the holding jig shown in Figs. The susceptors 2 are disk-shaped susceptors arranged in an upright position, and claws 3 for supporting wafers are provided on both the front and back surfaces of the susceptors 2. Note that one holding jig is usually equipped with about 30 to 50 susceptors at regular intervals.

かかる構成で半導体ウェハ4は処理面を外側に向け、そ
の周縁を爪3の間に落とし込んでサセプタ2の板面上に
担持され、この状態で減圧CVD装置に搬入して成膜処
理される。
With this configuration, the semiconductor wafer 4 is supported on the plate surface of the susceptor 2 with its processing surface facing outward and its peripheral edge dropped between the claws 3, and in this state is carried into a low pressure CVD apparatus and subjected to film formation processing.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで上記した従来構成の保持治具に対し半導体ウェ
ハ4を装荷、取出す場合には、ピンセットを用いてウェ
ハ4の周縁をつまみ1人手作業により一枚ずつ行うよう
にしているのが現状である。
Currently, when loading and unloading the semiconductor wafers 4 into the holding jig having the conventional structure described above, one person manually picks up the periphery of the wafers 4 one by one using tweezers.

しかしながらピンセットを用いると細心の注意を払って
もウェハ処理面にピンセットが触れることになり、この
ためにウェハの成膜面に汚染、傷つきが発生してウェハ
の品質を損なうことが多い。
However, when using tweezers, even if careful attention is taken, the tweezers end up touching the wafer processing surface, which often causes contamination and damage to the film-forming surface of the wafer, impairing the quality of the wafer.

しかも現行の構成ではサセプタに装荷されるウェハの処
理面が外側に向いてサセプタの板面に密着担持されてい
るため、例えば真空吸着式のハンドリング用治具を使用
してウェハの裏面側を吸着することができず、このまま
ではハンドリング工程の自動化を進めることができない
Moreover, in the current configuration, the processing side of the wafer loaded onto the susceptor faces outward and is closely supported on the plate surface of the susceptor. Therefore, for example, a vacuum suction type handling jig is used to suction the back side of the wafer. If this continues, it will not be possible to proceed with automation of the handling process.

この発明は上記の点にかんがみ成されたものであり、そ
の目的は半導体ウェハの装荷、取出しに際してウェハの
処理面に触れることなく真空吸着式ハンドリング治具を
用いてウェハの裏面を吸着し、この状態のままサセプタ
に対してウェハの装荷、取出しが行えるようにした取扱
性に優れた半導体ウェハの保持治具を提供することにあ
る。
This invention has been made in view of the above points, and its purpose is to use a vacuum suction type handling jig to adsorb the back side of the wafer without touching the processing surface of the wafer when loading or unloading the semiconductor wafer. It is an object of the present invention to provide a semiconductor wafer holding jig which has excellent handling properties and allows loading and unloading of wafers to and from a susceptor in the same state.

〔課題を解決するための手段〕[Means to solve the problem]

この発明は、サセプタの板面に周縁より中心に向けてウ
ェハの裏面を吸着したハンドリング用治具の移動通路と
なる切込溝を形成することにより前記課題の解決を図る
ようにしたものである。
This invention attempts to solve the above-mentioned problem by forming grooves in the plate surface of the susceptor from the periphery toward the center, which serve as movement paths for the handling jig that holds the back surface of the wafer. .

〔作用〕[Effect]

上記のようにサセプタに切込溝を形成しておくことによ
り、ウェハの裏面に当てがって半導体ウェハを吸着した
例えば真空吸着式のハンドリング用治具を前記切込溝内
で移動操作することができ、これによりウェハ処理面に
全く触れることなしに半導体ウェハをサセプタに対し装
荷、取出しを行えるとともに、併せてハンドリング工程
の自動化も可能となる。
By forming the cut grooves in the susceptor as described above, a handling jig, such as a vacuum suction type handling jig, which is applied to the back side of the wafer and adsorbs the semiconductor wafer, can be moved within the cut grooves. This makes it possible to load and unload semiconductor wafers onto and from a susceptor without touching the wafer processing surface at all, and it also becomes possible to automate the handling process.

加えてサセプタの表裏両面に半導体ウェハを装荷する場
合には、サセプタの表面と裏面に設けたウェハ支持用の
爪をあらかじめ切込溝に沿い段違いに相対位置をずらし
て宜くことにより、他方のウェハとの干渉なしに真空吸
着式ハンドリング用治具をウェハの裏面側から操作して
ハンドリング作業を進めることができる。また前記切込
溝に対してサセプタへの半導体ウェハの装荷状態で切込
溝を溝栓で塞ぐようにすることにより、成膜処理工程で
流す処理ガスがサセプタの切込溝に流れ込んで乱される
おそれがなく、ウェハ面上に均質な膜を成長させること
できる。
In addition, when loading semiconductor wafers on both the front and back sides of the susceptor, the wafer support claws provided on the front and back sides of the susceptor can be shifted relative to each other along the cut grooves in advance, so that the other side The vacuum suction type handling jig can be operated from the back side of the wafer to proceed with handling work without interfering with the wafer. Furthermore, by plugging the notch groove with a groove plug when the semiconductor wafer is loaded on the susceptor, the processing gas flowing in the film forming process will not flow into the notch groove of the susceptor and be disturbed. It is possible to grow a homogeneous film on the wafer surface without the risk of oxidation.

〔実施例〕〔Example〕

第1図ないし第7図は本発明の実施例を示すものであり
、第8図ないし第10図に対応する同一部材には同じ符
号が付しである。
1 to 7 show embodiments of the present invention, and the same members corresponding to FIGS. 8 to 10 are given the same reference numerals.

まず第1図、第2図において、サセプタ2にはその周縁
頂部より板面の中心に向けて切込溝5が形成されており
、さらにサセプタ2の表裏面をA面、B面としてA面、
B面にそれぞれ設けたウェハ支持用の爪3A、 3Bが
前記切込溝5に沿って段違いになるよう相対的に位置を
Eだけずらして設置されている。なお切込溝5の溝幅は
後記する真空吸着式ハンドリング用治具が溝内をサセプ
タ2の半径方向へ移動できるような幅に定めである。
First, in FIGS. 1 and 2, a cut groove 5 is formed in the susceptor 2 from the top of its periphery toward the center of the plate surface, and the front and back surfaces of the susceptor 2 are defined as A side and B side. ,
The claws 3A and 3B for supporting the wafer provided on the B side are set along the cut groove 5 so as to be at different levels relative to each other by an amount E. Note that the groove width of the cut groove 5 is determined to be such that a vacuum suction type handling jig, which will be described later, can move within the groove in the radial direction of the susceptor 2.

次に上記構成の保持治具に対して半導体ウェハを装荷、
取出しするハンドリング作業方法を第3図、第4図によ
り説明する。まず半導体ウェハのハンドリング用治具と
してバキュウムピンセット等として知られている真空吸
着式ハンドリング用治具を使用する。ここで半導体ウェ
ハ4をウェハカセットから取出して保持治具のサセプタ
2に装荷する場合には、ウェハ4の周縁に近い裏面側の
P部にハンドリング用治具を当てがってウェハを吸着し
、この吸着状態のままハンドリング用治具をサセプタ2
の上方から切込溝5内に沿って移動操作し、処理面を外
側に向けてウェハ4をサセプタ2のA面側の爪3Aの間
に落とし込んで装荷する。
Next, the semiconductor wafer is loaded onto the holding jig with the above configuration,
The handling method for taking out the material will be explained with reference to FIGS. 3 and 4. First, a vacuum suction type handling jig known as vacuum tweezers or the like is used as a semiconductor wafer handling jig. When the semiconductor wafer 4 is taken out from the wafer cassette and loaded onto the susceptor 2 of the holding jig, a handling jig is applied to the P section on the back side near the periphery of the wafer 4 to adsorb the wafer. In this suction state, transfer the handling jig to the susceptor 2.
The wafer 4 is moved from above along the inside of the cut groove 5, and the wafer 4 is dropped between the claws 3A on the side A of the susceptor 2, with the processing surface facing outward, and loaded.

次に前記と同様に裏面側からウェハ4を吸着したハンド
リング用治具の向きを反転して前記と反対側から操作し
、切込溝5内を移動してウェハ4をサセプタ2のB面側
に装荷する。この場合にウェハ支持用の爪3Aと3Bと
は段違いに相対位置がずれているのでハンドリング用治
具が既にA面側に装荷されているウェハと干渉し合うの
ことがない。
Next, in the same manner as above, the direction of the handling jig that has sucked the wafer 4 from the back side is reversed and operated from the opposite side, and the wafer 4 is moved inside the cut groove 5 to the B side of the susceptor 2. to be loaded. In this case, the relative positions of the wafer supporting claws 3A and 3B are shifted by different steps, so that the handling jig does not interfere with the wafer already loaded on the A side.

以下同様な操作を各サセプタ毎に行ってその表裏の両面
に半導体ウェハを装荷する。
Thereafter, similar operations are performed for each susceptor to load semiconductor wafers on both the front and back surfaces.

一方、成膜処理後にサセプタ2からウェハ4を取出す場
合には、前記の装荷順序とは逆にまずB面倒に装荷され
ているウェハ4に対し切込溝5を通してハンドリング治
具がウェハの裏面を吸着し、そのまま切込溝5に沿って
ハンドリング用治具を移動しながら引き上げて保持治具
から別なウェハカセットに移し替える0次にハンドリン
グ用治具の向きを反転して逆方向から前記と同欅な操作
でサセプタ2のA面側に装荷されているウェハ4を裏面
より吸着して引き出す、これにより半導体ウェハ4の処
理面に全く触れることなくハンドリング作業を進めるこ
とができる。
On the other hand, when taking out the wafer 4 from the susceptor 2 after the film-forming process, the handling jig first passes through the notch 5 to the wafer 4 that has been loaded in B, contrary to the loading order described above, and touches the back side of the wafer. The wafer is adsorbed, and while moving the handling jig along the cut groove 5, it is pulled up and transferred from the holding jig to another wafer cassette.Next, the direction of the handling jig is reversed and the above-mentioned wafer is transferred from the opposite direction. With the same key operation, the wafer 4 loaded on the A side of the susceptor 2 is attracted from the back side and pulled out, thereby allowing handling work to proceed without touching the processing surface of the semiconductor wafer 4 at all.

一方、前記した切込溝5を開口したままウェハを成膜処
理すると、処理ガス流が切込溝5により乱され、これが
原因で均質な成膜の成長が阻害されるおそれがある。か
かる点、第5図ないし第7図に示すように各サセプタ2
に対してその切込溝5を塞ぐ溝栓6を用意して置き、半
導体ウェハ4を装荷した状態で前記溝栓6を切込溝5に
装填することにより、切込溝5に起因する処理ガスの乱
流発生を防いでウェハ上に均質な成膜を成形させること
ができる。なおこの溝栓6は図示のようにサセプタ2の
配列ピッチに合わせ支持部材7へ多連式に装着されてお
り、これにより複数枚の各サセプタ2に対して各溝栓6
を一括して着脱操作することができる。
On the other hand, if a film is formed on a wafer with the cut grooves 5 left open, the processing gas flow will be disturbed by the cut grooves 5, which may hinder the growth of a homogeneous film. At this point, as shown in FIGS. 5 to 7, each susceptor 2
By preparing a groove plug 6 to close the notched groove 5 and loading the groove plug 6 into the notched groove 5 with the semiconductor wafer 4 loaded, processing caused by the notched groove 5 can be avoided. It is possible to prevent gas turbulence and form a homogeneous film on the wafer. As shown in the figure, the groove plugs 6 are attached to the support member 7 in multiple manner in accordance with the arrangement pitch of the susceptors 2, so that each groove plug 6 is attached to each of the plurality of susceptors 2.
can be attached and detached all at once.

〔発明の効果〕〔Effect of the invention〕

以上述べたようにこの発明によれば、サセプタの板面に
周縁より中心に向けてウェハの裏面を吸着したハンドリ
ング用治具の移動通路となる切込溝を形成したことによ
り、半導体ウェハの処理面に全く触れることなく真空吸
着式ハンドリング用治具を用いてウェハを真面側より吸
着してサセプタへ装荷、取出しすることができ、併せて
前記の真空吸着式ハンドリング用治具を採用してウェハ
のハンドリング工程の自動化が可能となる。
As described above, according to the present invention, a cut groove is formed in the plate surface of the susceptor from the periphery toward the center to serve as a moving path for the handling jig that attracts the back surface of the wafer, thereby processing semiconductor wafers. Wafers can be loaded onto and unloaded from the susceptor by suction from the front side using a vacuum suction type handling jig without touching the surface at all. It becomes possible to automate the wafer handling process.

また、前記サセプタの表裏両面側に切込溝に沿い段違い
に相対位置をずらしてウェハ支持用の爪を設けることに
より、ウェハとの干渉なしに真空吸着式ハンドリング用
治具を用いてサセプタの表裏両面ヘウエハをセットする
ことができ、さらに半導体ウェハを装荷した状態でサセ
プタの切込溝を塞ぐ溝栓を設けることにより、電源処理
工程での処理ガス流の乱流を防いでウニへ上に均質な成
膜を形成できる等の効果が得られる。
In addition, by providing claws for supporting wafers on both the front and back sides of the susceptor at different relative positions along the cut grooves, it is possible to move the front and back sides of the susceptor using a vacuum suction type handling jig without interfering with the wafer. Wafers can be set on both sides, and by providing a groove plug that closes the cut groove of the susceptor with semiconductor wafers loaded, it prevents turbulence in the processing gas flow during the power processing process and ensures that the wafer is uniformly placed on the surface of the susceptor. Effects such as being able to form a thin film can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図ないし第7図は本発明実施例の構成を示し、第1
図、第2図はサセプタの正面図、側断面図、第3図、第
4図は半導体ウェハの装荷状態におけるサセプタの正面
図、側断面図、第5図は溝栓を装備した保持治具全体の
斜視図、第6図、第7図は第5図におけるサセプタの正
面図、側断面図、第8図は従来における保持治具全体の
構成斜視図、第9図、第10図は第8図におけるサセプ
タの正面図、側面図である。各図において、2:サセプ
タ、3.3A、 3B:ウェハ支持用爪、4:半導体ウ
ェハ、5:切込溝、6:溝栓。
1 to 7 show the configuration of an embodiment of the present invention, and the first
Figure 2 is a front view and side sectional view of the susceptor, Figures 3 and 4 are a front view and side sectional view of the susceptor with semiconductor wafers loaded, and Figure 5 is a holding jig equipped with a groove plug. 6 and 7 are a front view and a side sectional view of the susceptor in FIG. 5, FIG. 8 is a perspective view of the entire structure of a conventional holding jig, and FIGS. 9 and 10 are FIG. 9 is a front view and a side view of the susceptor in FIG. 8. In each figure, 2: susceptor, 3.3A, 3B: wafer support claw, 4: semiconductor wafer, 5: cut groove, 6: groove plug.

Claims (3)

【特許請求の範囲】[Claims] (1)CVD成膜工程で用いる半導体ウェハの保持治具
であり、起立したサセプタの板面上に処理面を外側に向
けて半導体ウェハを担持するものにおいて、前記サセプ
タの板面に周縁より中心に向けてウェハの裏面を吸着し
たハンドリング用治具の移動通路となる切込溝を形成し
たことを特徴とする半導体ウェハの保持治具。
(1) A holding jig for a semiconductor wafer used in the CVD film forming process, which supports the semiconductor wafer on the plate surface of an upright susceptor with the processed surface facing outward. 1. A holding jig for a semiconductor wafer, characterized in that a cut groove is formed to serve as a movement path for a handling jig that holds the back side of the wafer by suction.
(2)特許請求の範囲第1項記載の保持治具において、
サセプタの表裏両面側に切込溝に沿い段違いに相対位置
をずらしてウェハ支持用の爪を設けたことを特徴とする
半導体ウェハの保持治具。
(2) In the holding jig according to claim 1,
A holding jig for a semiconductor wafer, characterized in that claws for supporting the wafer are provided on both the front and back sides of a susceptor at different relative positions along the cut grooves.
(3)特許請求の範囲第1項記載の保持治具において、
半導体ウェハを装荷した状態でサセプタの切込溝を塞ぐ
溝栓を設けたことを特徴とする半導体ウェハの保持治具
(3) In the holding jig according to claim 1,
A holding jig for a semiconductor wafer, characterized in that a groove plug is provided to close a cut groove of a susceptor in a state where a semiconductor wafer is loaded.
JP1835688A 1988-01-28 1988-01-28 Holding jig of semiconductor wafer Pending JPH01194317A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1835688A JPH01194317A (en) 1988-01-28 1988-01-28 Holding jig of semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1835688A JPH01194317A (en) 1988-01-28 1988-01-28 Holding jig of semiconductor wafer

Publications (1)

Publication Number Publication Date
JPH01194317A true JPH01194317A (en) 1989-08-04

Family

ID=11969410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1835688A Pending JPH01194317A (en) 1988-01-28 1988-01-28 Holding jig of semiconductor wafer

Country Status (1)

Country Link
JP (1) JPH01194317A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013179481A1 (en) * 2012-06-01 2013-12-05 株式会社島津製作所 Substrate-mounting boat
CN108386946A (en) * 2018-01-19 2018-08-10 昆山苏熙莱卡电子科技有限公司 A kind of house special-purpose air humidification apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013179481A1 (en) * 2012-06-01 2013-12-05 株式会社島津製作所 Substrate-mounting boat
CN108386946A (en) * 2018-01-19 2018-08-10 昆山苏熙莱卡电子科技有限公司 A kind of house special-purpose air humidification apparatus

Similar Documents

Publication Publication Date Title
US6648974B1 (en) Device and method for handling substrates by means of a self-leveling vacuum system in epitaxial induction
US6109677A (en) Apparatus for handling and transporting plate like substrates
US20080025835A1 (en) Bernoulli wand
JP3312163B2 (en) Vacuum suction device
WO2006070607A1 (en) Silicon wafer polishing method and silicon wafer producing method, apparatus for polishing disc-like work and silicon wafer
JP2009043771A (en) Chuck table mechanism and holding method for workpiece
JP2002517088A (en) Batch type end effector for semiconductor wafer handling
EP0526644A1 (en) Semiconductor manufacturing equipment
JP2001068541A (en) Processed substrate tray
JP2009253115A (en) Wafer stage
JPH01194317A (en) Holding jig of semiconductor wafer
JP2010239023A (en) Substrate transfer device, and substrate processing device
JP2002033378A (en) Wafer-handling device
JPH06318628A (en) Method and apparatus for transferring component
JPH05160102A (en) Spinner and manufacture of semiconductor device using same
KR100774711B1 (en) Particle removing apparatus of epitaxial equipment for semiconductor manufacturing and removing method
JPS61156749A (en) Wafer flat plate type back side vacuum chuck
JP3121022B2 (en) Decompression processing equipment
JPH0529431A (en) Transferring arm for substrate
JP2005235906A (en) Wafer holding jig and vapor phase growing apparatus
JPH01161712A (en) Vapor growth apparatus
JP2583675Y2 (en) Thin film vapor deposition equipment
KR200241555Y1 (en) A wafer transmission arm
JP2005505134A (en) Tools for handling wafers and epitaxial growth stations
JPH11102952A (en) Semiconductor manufacture and equipment therefor