JPH01192072A - Device for inspecting floppy disk driving unit control circuit in electronic device - Google Patents

Abstract

PURPOSE:To realize the labor saving and the acceleration of the inspection of an FDC and to improve the reliability of the inspection by supplying an inspection command by switching the connection of plural FD driving units to the FDC in an electronic device to be inspected by a controller. CONSTITUTION:The FDs with different modes are loaded on the plural FD driving units (15a-15c), respectively, and when the electronic device 12 to be inspected incorporating an FD drive unit control circuit 13 is placed at an inspecting position, the controller 20 switches the electrical connection of each unit 15 to the electronic device 12, and makes a CPU11 in the device 12 inspected the control circuit 13 according to an inspection program 14 by control ling the CPU11, and an inspected result is taken out from the CPU11. Therefore, it is possible to obtain the complete automation and acceleration of the inspec tion.

Description

[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a device for inspecting a floppy disk drive unit control circuit incorporated in an electronic device, and in particular, a device for inspecting a floppy disk drive unit mounted on a printed wiring board. A floppy disk drive unit control circuit testing device in an electronic device suitable for testing control circuits is provided.

[Conventional technology]

Electronic devices include components mounted on a printed wiring board (hereinafter referred to as a board) to form a desired electronic circuit, or a combination of these, such as a part of a personal computer or word processor. There are PCBs, personal cocipitators, word processors, etc. that combine these PCBs. In such electronic devices, after a desired electronic circuit is constructed by mounting components on a board, the electronic circuit and components are first inspected to see if they operate normally. Adjustments are made by adjusting the movable parts of the parts that have the

In addition, electronic devices are energized at the final stage of the assembly process and are actually operated to perform a functional test to determine whether they are exhibiting the performance as designed.

Conventionally, an inspection of an electronic device, particularly a floppy disk drive unit control circuit that controls a floppy disk drive unit mounted on a board, has been carried out as shown in FIG.

That is, the operator 10 attaches the board 12 to be tested, which is the electronic device to be tested, which has been transported to the testing process, to a current testing jig (not shown). Thereafter, the operator 10 moves the needle-shaped current-carrying connection member provided on the current-carrying test jig to electrically connect the board to be tested 12, the test program (test ROM) 14, and the floppy disk drive unit (FDD) 15. After making the connections and preparing for the test by connecting the board to be tested 12 to the CRT display 16, once the test preparations are complete,
The operator IO attaches the double-sided double-density (2D) floppy disk 9a to the floppy disk drive unit 15, presses the advance switch 18 according to the inspection step, and executes an inspection of the drive unit control circuit of the floppy disk drive unit. Then, a test image is displayed on the CRT display 16 to confirm whether a predetermined image is obtained.

If a predetermined image is obtained, it is determined that the function of the drive unit control circuit is normal; if a predetermined image is not obtained,
It is determined that the function of the drive control circuit is not normal, that is, it is defective. When the function of the floppy disk drive unit control circuit for the 2D floppy disk 9a is normal, the double-sided double density double track (2DD)
Similar tests are also performed on the floppy disk 9b and the double-sided high density (2HD) floppy disk 9C.

After completing the test in this way, the operator moves the needle-shaped current-carrying connection member provided on the current-carrying test jig to electrically connect the board to be tested 12, the test program 14, and the floppy disk drive unit 15. Remove the board to be inspected 1
2 from the energization test jig (not shown).

[Problem to be solved by the invention]

However, the inspection using the above-mentioned inspection method requires replacing the floppy disks 9a, 9b, 9c, and changing the advance switch 1.
This requires a lot of work by the operator 10, such as daily operations, and the inspection takes time, increasing the inspection cost. Moreover, since the quality of the substrate 12 to be inspected is judged by the operator, there is a risk that the quality of the inspection may be lowered due to variations among the operators.

SUMMARY OF THE INVENTION An object of the present invention is to provide a floppy disk drive unit control circuit testing device in an electronic device that can eliminate the above-mentioned problems, save labor during testing, and improve reliability of testing. .

[Means to solve the problem]

In order to achieve the above object, a floppy disk drive unit control circuit testing device in an electronic device according to the present invention comprises:
A plurality of floppy disk drive units each driving floppy disks in different modes, a drive unit control circuit for controlling these floppy disk drive units, and a control circuit electrically connected to each floppy disk drive unit. a testing mechanism electrically connected to the electronic device to be tested when the electronic device to be tested is placed at a testing position and provided with a program necessary for testing the drive unit control circuit; and each of the floppy disk drive units. and the electronic device to be tested, and controlling the testing mechanism to give a test command to the control circuit of the electronic device to be tested to execute testing of the drive unit control circuit according to the program; The present invention is characterized in that it has a controller that takes out the test results.

[Operation] The present invention configured as described above has floppy disks of different modes installed in each of a plurality of floppy disk drive units, for example, 2D, 2DD, and 2HD floppy disks are installed in each of three floppy disk drive units. When an electronic device under test containing a built-in floppy disk drive unit control circuit is placed in the test position, the controller switches the electrical connection between each floppy disk drive unit and the electronic device under test, and also controls the electronic device under test. The circuit is controlled to test the drive unit control circuit according to the test program, and the test results can be retrieved by the control device, eliminating the need for workers to be involved in the test process, making the test completely automated and quick. Not only can this be achieved, but it is also possible to save labor in testing and improve reliability.

〔Example〕

DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of a floppy disk drive unit control circuit testing device in an electronic device according to the present invention will be described in detail with reference to the accompanying drawings.

FIG. 2 is a basic configuration diagram showing an embodiment of a floppy disk drive unit control circuit testing device in an electronic device according to the present invention.

The board to be inspected 12 has a control circuit consisting of a central processing unit (CPU) 11, a floppy disk drive unit control circuit (FDC) 13, and an expansion bus slot 17. 17 are interconnected by a bus 19. An input/output board (10 board) 23 is connected to the expansion bus slot 17 via an external bus 21.

The I10 board 23 is connected to the I10 board 27 on the controller 20 side via a parallel signal line 25. Further, the external bus 21 is connected to an FDC inspection program (test ROM) 14 built in the inspection mechanism, which will be described later.

On the other hand, the FDC 13 has two
A D floppy disk drive unit 15a, a 2DD floppy disk drive unit 15b, and a 2HD floppy disk drive unit 15c are connected. This multiplexer 31 is connected to I1 via a parallel signal line 33.
0 board 35, and receives a switching signal from the controller 20.

The CPUI 1 of the board to be inspected 12 receives an inspection execution command (inspection command) from the controller 20, as will be described in detail later, executes inspection of the FDC 13 according to the inspection program 14, and sends the inspection result to the controller 20.

The inspection mechanism 22 includes a robot section 24 as shown in FIG.
and Fixture Chubu 26.

The robot section 24 has a plurality of robots 32 attached to a bracket 30 that is moved up and down by a press 28. The robot 32 has a driver 3 controlled by the controller 20.
4 to move movable parts of movable parts such as switches built into the board 12 to be inspected.

The middle part of the fixture 26 contains an inspection program 14 and an I10 board 23, and connects three floppy disk drives to the knee 15 via a connector 36 and a multiplexer 31.
a, , 15b, and 15c (represented by reference numeral 15), and is also connected to the controller 20 via a plug 36. Further, the fixture section 26 is provided with guide pins 38 for positioning the substrate 12 to be inspected that has been transported to the inspection position, and contact pins 40 as contact members on the upper surface.

The transport mechanism 42 for transporting the substrate 12 under test to and from the test position is composed of rails 44, 46, 48, a horizontal movement mechanism 50, and a vertical movement mechanism 52. The rail 46, which serves as the inspection position, has a mechanism in which it descends when a rolling blade is applied, and rises to the illustrated position when the rolling blade is released.

The controller 20 includes a computer device 58 having a memory 54 and a floppy disk device 56, and a CRT display 60 . A keyboard 62, a printer 64, an expansion bus 66, an I10 board 35 connected to the expansion bus 66, and a comparator (CO
MP) 6B, GP-IB70, I10 board 27, input/output (110) interface 74, and I10 board 2
Relay unit 76 connected to 7, control panel 78 connected to I10 interface 74, GP-IB7
Fast Fourier Transformer (FFT) 80 connected to 0
, counter 82, digital storage oscilloscope 8
4. Consists of a multiplexer unit (MPX unit) 86 that inputs inspection signals to the FFT 80, the counter 82, the digital storage oscilloscope 84, and the comparator 68, and a power supply 88 that supplies power to the fixture section 26 via the plug 36. .

The MPX unit 86 receives a signal from the fixture middle part 26 via the spigot 36, and the relay unit 7°6 receives the signal from the spigot 36.
A signal is provided to the fixture middle section 26 via the. Also, I
10 board 27 is also connected to the plug 36 and sends and receives signals to and from the I10 board 23 of the fixture section 26. The control panel 78 controls the press machine 28 of the robot section 24, the driver 34, and the horizontal movement mechanism of the transport mechanism 42. 50, driving and controlling the vertical movement mechanism 52;

The general inspection process according to the embodiment configured as above is as follows:
It is as follows.

The horizontal movement mechanism 50 of the transport mechanism 42 is moved up and down by the vertical movement mechanism 52, and transfers the substrate 12 to be inspected carried onto the rail 44 from the direction of arrow A onto the rail 46 which is the inspection position. The rail 46 is connected to the board 12 to be inspected.
When the board to be inspected 12 is carried in, it descends under the pressure of the
contacts the contact pins 40, and the substrate to be inspected 12 and the fixture section 26 are electrically connected. When this electrical connection is made, test signals and various data are transmitted from the combiator device 58 to the expansion bus 66, the I10 board 27, and the plug 36.
is applied to the fixture section 26 via the substrate to be inspected 1.
Various tests are performed on 2. In addition, robot part 2
The bracket 30 of No. 4 is lowered by the operation of the press 28, and the robot 32 is driven to check the operation of movable parts such as switches mounted on the board 12 to be inspected.

Data signals and inspection results regarding the board 12 to be inspected are sent from the fixture section 26 to the controller 20 via the plug 36.
is input to the MPX unit 86 and I10 board 27,
It is sent to computer device 58. When the operation check of the movable parts of the board 12 to be inspected is completed, the bracket 30 is raised by the press 28 and returns to the standby position shown in FIG. 1, and the functional inspection is completed.
z-7Lz4(i rises to the original 0 position, and the horizontal movement mechanism 50 carries out the substrate 12 to be inspected from the inspection position in the direction of arrow B via the rail 4.

The FDC 13 mounted on the board 12 to be inspected is inspected as follows.

The board 12 to be inspected is carried onto the rail 46 which is the inspection position, and the rail 46 is lowered so that the contact pins 4° are connected to the board 1 to be inspected.
2, the expansion bus slot 2 of the board to be tested 12
1 connects the inspection program 14 and r1 via the external bus 21.
0 board 23, and the FDC
l3 is connected to the floppy disk drive units 15a, 15b, 1 via the fixture middle part 26 and the multiplexer 31.
5c. Further, the I10 board 23 is electrically connected to the I10 board 27 via a plug 36.

When preparations for testing the board 12 to be tested are completed in this way, the controller 2o controls the I10 board 35, parallel signal 33,
A switching signal is given to the multiplexer 31 via F
Connect DC13 to 2D floppy disk drive unit 15
After connecting to a, a 2D inspection command (inspection command) is sent to the CPU II of the board to be inspected 12 (step 102).

When the FDCl 3 2D inspection command is input, the CPU II receives it, analyzes the contents of the command, and starts the FDCl 3 inspection (steps 130, 132, and 134 in FIG. 3 (B)). That is, the CPU 1 of the board to be inspected 12 analyzes the command from the controller 20 in step 134, reads the inspection contents for the FDCl3, and then selects the expansion bus slot 17,
A program necessary for 2D inspection is read from the inspection program 14 via the external bus 21, and the floppy disk drive unit 15 is loaded into the FDCl3 according to this program.
A drive control command is given to execute various tests such as writing to a floppy disk and reading from a floppy disk. When all the 2D tests are completed, the CPU 1 outputs the 2D test results together with the test completion status to the controller 20 (step 136), and waits for the next command.

On the other hand, the controller 20 reads the 2D inspection results input from the board to be inspected 12 (step 104), and determines whether the 2D function of the FDC 13 is normal (step 106). , and the controller 20 controls the FDC in step 106.
13, the process proceeds to step 126, where the transport mechanism 42 is controlled and the substrate to be inspected! We will process the 7fi12 as NG, such as transporting it to the rework process,
End the flow.

If it is determined in step 106 that the 2D function of the FDC 13 is normal, the process proceeds to step 108, where the multiplexer 31 is switched and the 2D function of the FDC 13 is normal.
It is connected to the floppy disk drive unit 15b for DD and sends an inspection command for the 2DD to the CPU II of the board to be inspected 12 (110).When the CPU 1 receives the inspection command for the 2DD from the controller 20, it The test is performed in the same way as in the case of 1, and the test results are sent to the controller 20 (step 138.140.1).
42.144). When the controller 20 receives the inspection results for the 2DD, it reads them and sends them to the FDC.
13 has functioned normally (step 11
2.114). If the function of the 2DD of the FDC 13 is not normal, proceed to step 126 and process as NG, as in step 106, and if the function is normal, switch the i-lunaplexer 31 and remove the FD.
C13 to 2HD floppy disk drive unit 15
c (step 116).

After that, the controller 20 controls the CPU of the board 12 to be inspected.
A test command regarding the 2HD is sent to II (step 118).

When the inspection command for the 2HD is input, the CPU II receives it and executes the inspection in step 14.
6.148.150), send the test results to the controller 20 (step 152), and end the flow. The controller 20 reads the inspection results for the 2HD from the board to be inspected 12 (step 120), and determines whether the function of the 2HD of the FDC 13 is normal (step 122). 2) If it is determined that the function of the ID is not normal, it is processed as NG in the same way as described above (Step 126), and if the function is normal, the substrate 12 to be inspected is transferred to a non-defective product by the transport mechanism 42. In step 124), the flow is terminated.

As described above, in the inspection apparatus of the embodiment, the controller 20 switches and connects the FDC 13 mounted on the board to be inspected 12 to the floppy disk drive unit 15 a s 15 bs 15 c to which a floppy disk of a different mode is mounted, and A test execution command is given to the CPU (control circuit) 11 mounted on the test board 12, and the C
The PUI 1 reads out the program necessary for inspection from the inspection program 14 built into the inspection mechanism 22 and executes the FDC.
13 is executed, the test results are sent to the controller 20, and the controller 20 determines whether the test results are good or bad. Therefore, the FDC 13 mounted on the test board 12, which is the electronic device to be tested, can be automatically tested. It is possible to save labor, speed up testing, reduce costs, and improve the reliability of testing.

Note that FIG. 4 shows the flow of how commands and data are exchanged between the CPUI 1 of the board to be inspected 12 and the controller 20, and FIG. 4(A) shows the flow on the sending side;
Figure 4 (CB) shows the flow on the receiving side.

The transmitting side outputs a reception preparation request signal to the receiving side as in step 200, and waits for the receiving side to complete reception preparation (step 202). Then, it prepares for reception, sends a reception preparation completion signal to the transmitting side (steps 220 and 222), and then waits for a data transmission signal to be input from the transmitting side (step 224).

When the transmitting side receives the reception preparation completion signal from the reception side, it resets the reception preparation request signal (step 204), sets commands and data in the output port, and outputs a data transmission signal to the reception side (step 206.20B). ), the receiving side proceeds from step 224 to step 226 after receiving the data transmission signal, resets the reception ready signal, and receives and receives data from the input port (step 228).
, sends a data reception signal to the transmitting side (step 230
).

The transmitter that has output the data transmit signal is waiting for a data receive signal to be input from the receiver (step 210).
When the data reception signal is input, the data transmission completion signal is output to the transmission side (step 212).The reception side outputs the data reception completion signal to the transmission side when the data transmission completion signal is input from the transmission side. Output Step 234)
, end the flow. Further, after outputting the data transmission completion signal, the transmission side receives the data reception completion signal and confirms that the reception side has received the data (step 214).
), ending the flow of the send.

In the above embodiments, the inspection of a board of a personal computer or the like has been described, but the electronic device to be inspected may be a personal computer, a word processor, or the like.

〔Effect of the invention〕

As described above, according to the present invention, the controller switches the connection between a plurality of floppy disk drive units and the FDC in the electronic device to be tested, and also issues a test command to the control circuit installed in the electronic device to be tested. This control circuit executes a functional test of the FDC in the electronic device under test and reads out the test results.
Saving labor and speeding up the inspection of the FDC in the electronic device to be inspected improves the reliability of the diagram and inspection.

[Brief explanation of the drawing]

FIG. 1 is an explanatory diagram showing the overall configuration of an embodiment of a floppy disk drive unit control circuit inspection device in an electronic device according to the present invention, FIG. 2 is a block diagram of the embodiment, and FIG. 3 is an F
A flowchart showing the procedure of DC inspection, Fig. 4 is a flowchart showing the procedure for receiving and passing commands and data between the board to be inspected and the controller, and Fig. 5 is an explanation of the conventional inspection method of FDC in the electronic device to be inspected. It is a diagram. 11--CPU (control circuit), 12--Test board (tested electronic device), 13--Floppy disk drive unit control circuit (FDC), 14--
...Inspection program, 15.15a, 15b, 15c
m'-70ppy disk drive unit, 20...
-Controller, 22...Inspection mechanism. Agent Patent Attorney Tomo Murakami - No. 11 Figure 2 1:) OIOD FIC (A)
Figure 4

Claims (1)

[Claims] (1) Equipped with a plurality of floppy disk drive units each driving floppy disks in different modes, a drive unit control circuit and a control circuit that control these floppy disk drive units, and electrically connected to each floppy disk drive unit. a testing mechanism that is electrically connected to the electronic device to be tested when the connected electronic device to be tested is placed at a testing position, and is provided with a program necessary for testing the drive unit control circuit 1; The program switches the electrical connection between the floppy disk drive unit and the electronic device to be tested, controls the testing mechanism, gives a test command to the control circuit of the electronic device to be tested, and tests the drive unit control circuit. 1. A floppy disk drive unit control circuit testing device in an electronic device, comprising: a controller for executing the test according to the method and taking out the test results.