JPH01182759A - Kelvin measuring contact - Google Patents
Kelvin measuring contactInfo
- Publication number
- JPH01182759A JPH01182759A JP63005618A JP561888A JPH01182759A JP H01182759 A JPH01182759 A JP H01182759A JP 63005618 A JP63005618 A JP 63005618A JP 561888 A JP561888 A JP 561888A JP H01182759 A JPH01182759 A JP H01182759A
- Authority
- JP
- Japan
- Prior art keywords
- contact
- terminal
- measured
- contacts
- kelvin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 12
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical class C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Multi-Conductor Connections (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はＩＣ，ＬＳＩ等の電子装置の電気的特性測定用
のコンタクトに関し、特にケルビン測定用コンタクトに
関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a contact for measuring electrical characteristics of electronic devices such as ICs and LSIs, and particularly to a contact for measuring Kelvin.
ＩＣ，ＬＳＩ等の電子装置の電気的特性を、比較的大き
な電流を流すことにより測定する際、被測定端子と測定
用コンタクトの接触面に生じる接触抵抗成分による電圧
降下が大きくなり、特性の正確な測定が困難な場合、電
流供給用コンタクトと電圧測定用コンタクトの２つのコ
ンタクトを用いて電気的特性測定での接触抵抗成分の影
響を取り除くケルビン測定法が用いられ、従来１種々の
ケルビン測定用コンタクトが考案されている。When measuring the electrical characteristics of electronic devices such as ICs and LSIs by flowing a relatively large current, the voltage drop due to the contact resistance component that occurs at the contact surface between the terminal under test and the measurement contact becomes large, making it difficult to accurately measure the characteristics. When measurement is difficult, the Kelvin measurement method is used that uses two contacts, a current supply contact and a voltage measurement contact, to eliminate the influence of contact resistance components in electrical characteristic measurements. Contact has been devised.
第５図に従来のケルビン測定用コンタクトの一例を示す
。FIG. 5 shows an example of a conventional Kelvin measurement contact.
第６図は第５図の縦断面図、第７図は第５図のＡ−Ａ線
断面図である。従来のケルビン測定用コンタクトは円筒
型の第１のコンタクト１の内部に絶縁層３によって電気
的に絶縁された円柱型の第２のコンタクトを有″する二
重構造としたものである。また４は２つのコンタクト１
及び２を支持する台座であり、２つのコンタクト１及び
２はこの台座４に固定されている。５及び６は第１のコ
ンタクト１及び第２のコンタクト２の引き出し部で、こ
の引き出し部５及び６に測定治具又は測定器からの配線
を結線する。このようにコンタクト部を円筒型及び円柱
型の二重構造とすることによりコンタクトの接触部を小
さくすることができ、表面実装タイプのＩＣの外部リー
ドのように面積の狭い被測定端子にも２つのコンタクト
内接触させることができる。6 is a longitudinal cross-sectional view of FIG. 5, and FIG. 7 is a cross-sectional view taken along the line AA of FIG. 5. The conventional Kelvin measurement contact has a double structure in which a cylindrical first contact 1 has a cylindrical second contact electrically insulated by an insulating layer 3. is two contacts 1
and 2, and the two contacts 1 and 2 are fixed to this pedestal 4. Reference numerals 5 and 6 are lead-out portions of the first contact 1 and the second contact 2, and wiring from a measuring jig or measuring instrument is connected to the lead-out portions 5 and 6. By making the contact part have a double structure of cylindrical and cylindrical shapes in this way, the contact part of the contact can be made small, and it is possible to make the contact part small, so that it can be used even for terminals to be measured with a narrow area, such as external leads of surface mount type ICs. Can be made into contact within one contact.
上述した従来のケルビン測定用コンタクトは、コンタク
ト部が円筒型と円柱型の２つのコンタクトが共に台座に
固定されている構造であることにより、被測定端子がコ
ンタクトに対して垂直に接しない場合１円柱型の第２の
コンタクトが被測定端子に接触しないという欠点がある
。The conventional Kelvin measurement contact described above has a structure in which two contacts, one cylindrical and the other cylindrical, are both fixed to a pedestal, so if the terminal to be measured does not touch the contact perpendicularly, There is a drawback that the cylindrical second contact does not contact the terminal to be measured.
この欠点を図を用いて説明する。This drawback will be explained using figures.
第８図は第５図で示した従来のケルビン測定用コンタク
トが被測定端子と斜めに接触した場合の縦断面図である
。FIG. 8 is a longitudinal cross-sectional view of the conventional Kelvin measuring contact shown in FIG. 5 in oblique contact with the terminal to be measured.
第８図でわかるように被測定端子７がコンタクトに対し
て垂直に接しない場合、円筒型の第１のコンタクト１は
被測定端子７に接触するが、円柱型の第２のコンタクト
２は、被測定端子７に接触せず、ケルビン測定ができな
くなる。As can be seen in FIG. 8, when the terminal to be measured 7 does not touch the contact perpendicularly, the cylindrical first contact 1 contacts the terminal to be measured 7, but the cylindrical second contact 2 The terminal to be measured 7 will not be contacted, and Kelvin measurement will not be possible.
本発明の目的は前記問題点を解消したケルビン測定用コ
ンタクトを提供することにある。An object of the present invention is to provide a contact for Kelvin measurement that eliminates the above-mentioned problems.
上述した従来のケルビン測定用コンタクトに対し１本発
明のケルビン測定用コンタクトは２つの」ンタクトの少
なくとも一方が他方に対して移動するという相違点を有
する。The Kelvin measuring contact of the present invention differs from the conventional Kelvin measuring contact described above in that at least one of the two contacts moves relative to the other.
本発明は筒型の第１のコンタクトと、該第１のコンタク
ト内に電気的に絶縁して相対的に出入可能に内装された
第２のコンタクトとを有することを特徴とするケルビン
測定用コンタクトである。The present invention is a contact for Kelvin measurement characterized by having a cylindrical first contact and a second contact electrically insulated and relatively movable inside the first contact. It is.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
（実施例１）
第１図は本発明の実施例１の側面図である。第２図は同
縦断面図、第３図は第１図のＡ−Ａ線断面図である。(Example 1) FIG. 1 is a side view of Example 1 of the present invention. FIG. 2 is a longitudinal sectional view of the same, and FIG. 3 is a sectional view taken along the line A--A in FIG. 1.
本発明は円筒型の第１のコンタクト１の内部に絶縁層３
によって電気的に絶縁された円柱型の第２のコンタクト
２を有する二重構造となっている。The present invention provides an insulating layer 3 inside a cylindrical first contact 1.
It has a double structure having a cylindrical second contact 2 which is electrically insulated.
本実施例では第１のコンタクト１は台座４に固定され、
第２のコンタクト２は台座４及び第１のコンタクト１と
は固定されずに軸方向を相対変位可能に支持され、ばね
８によって通常は先端部が第１のコンタクト１から突出
した状態となっている。In this embodiment, the first contact 1 is fixed to the base 4,
The second contact 2 is not fixed to the pedestal 4 and the first contact 1, but is supported so as to be able to move relative to it in the axial direction, and normally has its tip protruding from the first contact 1 due to the spring 8. There is.
５及び６は第１のコンタクト１及び第２のコンタクト２
の引き出し部で、この引き出し部５及び６に測定治具又
は測定器からの配線を結線する。5 and 6 are first contact 1 and second contact 2
Wiring from a measuring jig or measuring instrument is connected to the drawn out parts 5 and 6.
コンタクト部と被測定端子を接触させる動作を図を用い
て説明する。第４図は第１図で示した本発明によるケル
ビン測定用コンタクトが、被測定端子と斜めに接触した
場合の縦断面図である。被測定端子７がコンタクト部に
斜めに接触する際。The operation of bringing the contact portion into contact with the terminal to be measured will be explained using the drawings. FIG. 4 is a longitudinal cross-sectional view of the Kelvin measuring contact according to the present invention shown in FIG. 1 in oblique contact with the terminal to be measured. When the terminal to be measured 7 contacts the contact portion diagonally.
第２のコンタクト２が第１のコンタクト１より突出して
いることにより、まず第２のコンタクト２が先に被測定
端子７に接触する。さらに圧力が加えられると、第１の
コンタクト１が被測定端子７に接触するまで、第２のコ
ンタクト２が上方に移動し、第４図のように第１のコン
タクト１及ヒ第２のコンタクト２は共に被測定端子７に
確実に接触する。Since the second contact 2 protrudes from the first contact 1, the second contact 2 comes into contact with the terminal to be measured 7 first. When further pressure is applied, the second contact 2 moves upward until the first contact 1 comes into contact with the terminal to be measured 7, and as shown in FIG. 2 are both securely in contact with the terminal to be measured 7.
コンタクト部と被測定端子が垂直に接触する場合も上記
の動作で２つのコンタクトが共に被測定端子７に確実に
接触するのはいうまでもない。It goes without saying that even when the contact portion and the terminal to be measured are in vertical contact, the above operation ensures that both the two contacts are in contact with the terminal to be measured 7.
（実施例２）
次に本発明による他の実施例について図面を用いて説明
する。(Example 2) Next, another example according to the present invention will be described using the drawings.
第９図は本発明の実施例２の側面図である。第１０図は
同縦断面図、第１１図は第９図のＡ−Ａ線断面図である
。FIG. 9 is a side view of Embodiment 2 of the present invention. FIG. 10 is a longitudinal cross-sectional view of the same, and FIG. 11 is a cross-sectional view taken along the line AA in FIG. 9.
本実施例では、第２のコンタクト２を台座４に固定し、
第１のコンタクト１を台座４及び第２のコンタクト２と
は固定せずに変位可能にしたものであり、ばね８によっ
て通常は第１のコンタクト１の先端部を第２のコンタク
ト２から突出した状態になっている。その他の部分の構
造は実施例１と同様である。In this embodiment, the second contact 2 is fixed to the base 4,
The first contact 1 is not fixed to the base 4 and the second contact 2, but is movable, and the tip of the first contact 1 is normally projected from the second contact 2 by a spring 8. is in a state. The structure of other parts is the same as that of the first embodiment.
コンタクト部と被測定端子を接触させる動作を実施例１
と同様に図を用いて説明する。第１２図は第９図で示し
た本発明による実施例２のケルビン測定用コンタクトが
、被測定端子と斜めに接触した場合の縦断面図である。Example 1 shows the operation of bringing the contact part into contact with the terminal under test.
This will be explained using diagrams in the same way. FIG. 12 is a longitudinal cross-sectional view of the Kelvin measuring contact according to the second embodiment of the present invention shown in FIG. 9, which is in oblique contact with the terminal to be measured.
被測定端子７がコンタクト部に斜めに接触する際、第１
のコンタクト１が第２のコンタクト２より突出している
ことにより、まず第１のコンタクト１が先に被測定端子
７に接触する。さらに圧力が加えられると、第２のコン
タクト２が被測定端子７に接触するまで、第１のコンタ
クトが上方に移動し、第１２図のように第１のコンタク
ト１及び第２のコンタクト２は共に被測定端子７に確実
に接触する。When the terminal to be measured 7 contacts the contact part diagonally, the first
Since the contact 1 protrudes from the second contact 2, the first contact 1 comes into contact with the terminal to be measured 7 first. When further pressure is applied, the first contact moves upward until the second contact 2 contacts the terminal to be measured 7, and the first contact 1 and the second contact 2 move as shown in FIG. Both terminals surely contact the terminal 7 to be measured.
コンタクト部と被測定端子が垂直に接触する場合も上記
の動作で２つのコンタクトが共に被測定端子７に確実に
接触するのはいうまでもない。It goes without saying that even when the contact portion and the terminal to be measured are in vertical contact, the above operation ensures that both the two contacts are in contact with the terminal to be measured 7.
以上説明したように本発明は筒型の第１のコンタクトと
第１のコンタクトの内部に電気的に絶縁された柱型の第
２のコンタクトとの少なくとも一方を他方に対して相対
変位させることにより、被測定端子がコンタクトに対し
て斜めに接触する場合でも、２つのコンタクトを共に被
測定端子に確実に接触させることができる効果がある。As explained above, the present invention is achieved by displacing at least one of the cylindrical first contact and the columnar second contact electrically insulated inside the first contact relative to the other. Even when the terminal to be measured contacts the contact obliquely, there is an effect that both the two contacts can be reliably brought into contact with the terminal to be measured.
第１図は本発明のケルビン測定用コンタクトの実施例１
を示す側面図、第２図は第１図の縦断面図、第３図は第
１図のＡ−Ａ線断面図、第４図は本発明の実施例１の動
作説明図、第５図は従来のケルビン測定用コンタクトの
側面図、第６図は第５図の縦断面図、第７図は第５図の
Ａ−Ａ線断面図、第８図は従来例の問題点を説明する図
、第９図は本発明のケルビン測定用コンタクトの実施例
２を示す側面図、第１０図は第９図の縦断面図、第１１
図は第９図のＡ−Ａ線断面図、第１２図は本発明の実施
例２の動作説明図である。
１・・・第１のコンタクト ２・・・第２のコンタクト
３・・・絶縁層 ４・・・台座５・・・第
１のコンタクトの引き出し部６・・・第２のコンタクト
の引き出し部 。Figure 1 shows Example 1 of the contact for Kelvin measurement of the present invention.
FIG. 2 is a longitudinal sectional view of FIG. 1, FIG. 3 is a sectional view taken along line A-A of FIG. 6 is a side view of a conventional Kelvin measuring contact, FIG. 6 is a vertical sectional view of FIG. 5, FIG. 7 is a sectional view taken along line A-A of FIG. 5, and FIG. 8 explains problems with the conventional example. 9 is a side view showing Example 2 of the Kelvin measuring contact of the present invention, FIG. 10 is a longitudinal sectional view of FIG. 9, and FIG.
The figure is a sectional view taken along the line A--A in FIG. 9, and FIG. 12 is an explanatory diagram of the operation of the second embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... First contact 2... Second contact 3... Insulating layer 4... Pedestal 5... Leading out part of first contact 6... Leading out part of second contact.
Claims (1)
に電気的に絶縁して相対的に出入可能に内装された第２
のコンタクトとを有することを特徴とするケルビン測定
用コンタクト。1. A cylindrical first contact, and a second electrically insulated internally installed inside the first contact so that it can be relatively moved in and out.
A contact for Kelvin measurement, characterized in that it has a contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63005618A JPH01182759A (en) | 1988-01-13 | 1988-01-13 | Kelvin measuring contact |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63005618A JPH01182759A (en) | 1988-01-13 | 1988-01-13 | Kelvin measuring contact |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01182759A true JPH01182759A (en) | 1989-07-20 |
Family
ID=11616168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63005618A Pending JPH01182759A (en) | 1988-01-13 | 1988-01-13 | Kelvin measuring contact |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01182759A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012083234A (en) * | 2010-10-13 | 2012-04-26 | Hioki Ee Corp | Probe and measuring apparatus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6314169B2 (en) * | 1978-05-24 | 1988-03-29 | Nippon Jidosha Buhin Sogo Kenkyusho Kk |
-
1988
- 1988-01-13 JP JP63005618A patent/JPH01182759A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6314169B2 (en) * | 1978-05-24 | 1988-03-29 | Nippon Jidosha Buhin Sogo Kenkyusho Kk |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012083234A (en) * | 2010-10-13 | 2012-04-26 | Hioki Ee Corp | Probe and measuring apparatus |
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