JPH01179351U - - Google Patents

Info

Publication number
JPH01179351U
JPH01179351U JP7633088U JP7633088U JPH01179351U JP H01179351 U JPH01179351 U JP H01179351U JP 7633088 U JP7633088 U JP 7633088U JP 7633088 U JP7633088 U JP 7633088U JP H01179351 U JPH01179351 U JP H01179351U
Authority
JP
Japan
Prior art keywords
chamber
sample
electron microscope
preliminary
vacuum valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7633088U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0615390Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7633088U priority Critical patent/JPH0615390Y2/ja
Publication of JPH01179351U publication Critical patent/JPH01179351U/ja
Application granted granted Critical
Publication of JPH0615390Y2 publication Critical patent/JPH0615390Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP7633088U 1988-06-10 1988-06-10 試料予備室を備えた電子顕微鏡 Expired - Lifetime JPH0615390Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7633088U JPH0615390Y2 (ja) 1988-06-10 1988-06-10 試料予備室を備えた電子顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7633088U JPH0615390Y2 (ja) 1988-06-10 1988-06-10 試料予備室を備えた電子顕微鏡

Publications (2)

Publication Number Publication Date
JPH01179351U true JPH01179351U (US20090163788A1-20090625-C00002.png) 1989-12-22
JPH0615390Y2 JPH0615390Y2 (ja) 1994-04-20

Family

ID=31301360

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7633088U Expired - Lifetime JPH0615390Y2 (ja) 1988-06-10 1988-06-10 試料予備室を備えた電子顕微鏡

Country Status (1)

Country Link
JP (1) JPH0615390Y2 (US20090163788A1-20090625-C00002.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002313271A (ja) * 2001-04-10 2002-10-25 Jeol Ltd 電子顕微鏡
CN111948240A (zh) * 2020-08-17 2020-11-17 浙江祺跃科技有限公司 一种原位高温蠕变疲劳扫描电子显微镜

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002313271A (ja) * 2001-04-10 2002-10-25 Jeol Ltd 電子顕微鏡
CN111948240A (zh) * 2020-08-17 2020-11-17 浙江祺跃科技有限公司 一种原位高温蠕变疲劳扫描电子显微镜
CN111948240B (zh) * 2020-08-17 2023-12-22 浙江祺跃科技有限公司 一种原位高温蠕变疲劳扫描电子显微镜

Also Published As

Publication number Publication date
JPH0615390Y2 (ja) 1994-04-20

Similar Documents

Publication Publication Date Title
JPH01179351U (US20090163788A1-20090625-C00002.png)
JPS63112746U (US20090163788A1-20090625-C00002.png)
JPS6176676U (US20090163788A1-20090625-C00002.png)
JPS5962662U (ja) 電子線装置
JPS6015246Y2 (ja) 電子顕微鏡等における試料装置
JP4063503B2 (ja) 電子顕微鏡
JPS6318760U (US20090163788A1-20090625-C00002.png)
JPS6438752U (US20090163788A1-20090625-C00002.png)
JPS6131225Y2 (US20090163788A1-20090625-C00002.png)
JPH02126358U (US20090163788A1-20090625-C00002.png)
JPS58176355U (ja) 走査電子顕微鏡等の対物レンズ
JPH0249058U (US20090163788A1-20090625-C00002.png)
JPH0518840Y2 (US20090163788A1-20090625-C00002.png)
JPS58117054U (ja) 電子顕微鏡における試料冷却傾斜装置
JPH018986Y2 (US20090163788A1-20090625-C00002.png)
JPS59110952U (ja) 走査型電子顕微鏡
JPS6365952U (US20090163788A1-20090625-C00002.png)
JPH0322846Y2 (US20090163788A1-20090625-C00002.png)
JPH08269694A (ja) ケーブル化された光ファイバ端面の薄膜形成方法
JPH0689686A (ja) 走査型電子顕微鏡
JPS6387760U (US20090163788A1-20090625-C00002.png)
JPH10302698A (ja) 試料交換装置
JPS6277854U (US20090163788A1-20090625-C00002.png)
JPH02140516U (US20090163788A1-20090625-C00002.png)
JPS63106053U (US20090163788A1-20090625-C00002.png)