JPH01173661U - - Google Patents
Info
- Publication number
- JPH01173661U JPH01173661U JP6927988U JP6927988U JPH01173661U JP H01173661 U JPH01173661 U JP H01173661U JP 6927988 U JP6927988 U JP 6927988U JP 6927988 U JP6927988 U JP 6927988U JP H01173661 U JPH01173661 U JP H01173661U
- Authority
- JP
- Japan
- Prior art keywords
- analysis line
- sensitivity
- computer
- wavelength
- monochromator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims description 4
- 230000035945 sensitivity Effects 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 239000006199 nebulizer Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
第１図は本案の一実施例の発光分析装置の構成
図、第２図は分析線近傍のプロフアイルを示す図
、第３図は感度の評価関数を示す図、第４図は近
接線の影響の評価関数を示す図、第５図は左右対
称性の評価関数を示す図である。
１……試料、２……ネブライザ、３……光源、
４……分光器、５……波長駆動モータ、６……検
知器、７……コンピユータ、８……キーボード、
９……ＣＲＴ表示器、１０……プリンタ、１１…
…発光線データベース。
Figure 1 is a configuration diagram of an optical emission spectrometer according to an embodiment of the present invention, Figure 2 is a diagram showing the profile near the analysis line, Figure 3 is a diagram showing the sensitivity evaluation function, and Figure 4 is a diagram showing the profile of the vicinity line. FIG. 5 is a diagram showing an evaluation function for influence, and FIG. 5 is a diagram showing an evaluation function for left-right symmetry. 1...sample, 2...nebulizer, 3...light source,
4...Spectroscope, 5...Wavelength drive motor, 6...Detector, 7...Computer, 8...Keyboard,
9...CRT display, 10...printer, 11...
...Emission line database.
Claims (1)
の位置に波長を設定しているコンピユータ制御の
発光分析装置において、分析線近傍のプロフアイ
ルより、感度や分光干渉を評価関数で評価し、最
適分析線を自動的に決定することを特徴とする走
査形発光分析装置。 In computer-controlled emission spectrometers that are equipped with a monochromator and set the wavelength at the position of the analysis line depending on the element to be measured, sensitivity and spectral interference are evaluated using evaluation functions from the profile near the analysis line, and the optimum analysis line is determined. A scanning emission spectrometer characterized in that automatic determination is performed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6927988U JPH01173661U (en) | 1988-05-27 | 1988-05-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6927988U JPH01173661U (en) | 1988-05-27 | 1988-05-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01173661U true JPH01173661U (en) | 1989-12-08 |
Family
ID=31294560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6927988U Pending JPH01173661U (en) | 1988-05-27 | 1988-05-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01173661U (en) |
-
1988
- 1988-05-27 JP JP6927988U patent/JPH01173661U/ja active Pending
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