JPH01169385A - Distance measuring apparatus - Google Patents

Distance measuring apparatus

Info

Publication number
JPH01169385A
JPH01169385A JP62327489A JP32748987A JPH01169385A JP H01169385 A JPH01169385 A JP H01169385A JP 62327489 A JP62327489 A JP 62327489A JP 32748987 A JP32748987 A JP 32748987A JP H01169385 A JPH01169385 A JP H01169385A
Authority
JP
Japan
Prior art keywords
light
phase difference
signal
circuit
changeover switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62327489A
Other languages
Japanese (ja)
Inventor
Kohei Tomita
公平 冨田
Hiroaki Takimasa
宏章 滝政
Nobuo Nakatsuka
中塚 信雄
Takayoshi Horii
堀井 孝佳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP62327489A priority Critical patent/JPH01169385A/en
Publication of JPH01169385A publication Critical patent/JPH01169385A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To always enable accurate measurement of distance, by applying a projection signal of a light emitting element and a reception signal of a light receiving element selectively to a phase difference detection circuit. CONSTITUTION:Light with a modulated intensity is projected to an object with a light emitting element 1 by a projection signal with a specified frequency. A changeover switch 6 applies a projection signal of a light emitting element 1 and a reception signal of a light receiving element 2 selectively to a phase difference detection circuit 10. A correction circuit 20 subtracts a phase difference data obtained from a phase difference detection circuit 10 when the changeover switch 6 selects the projection signal from a phase difference data obtained from the phase difference detection circuit 10 when the changeover switch 6 selects the reception signal and outputs a phase difference data after the correction. An output circuit 30 calculates a distance from the phase difference data to be shown on a display device 32.

Description

【発明の詳細な説明】 発明の要約 強度変調された光を被測定物体(対象物)に投射してそ
の反射光を受光し、投光信号と受光信号の位相差を検出
し、この位相差に基づいて距離を測定する装置において
2位相検出回路の一方の入力に投光信号を与え、他方の
入力に切換スイッチにより投光信号と受光信号とを切換
えて与える。
[Detailed Description of the Invention] Summary of the Invention Projecting intensity-modulated light onto an object to be measured (object) and receiving the reflected light, detecting the phase difference between the light projection signal and the light reception signal, and detecting the phase difference between the light projection signal and the light reception signal. In a device that measures distance based on , a light emitting signal is applied to one input of a two-phase detection circuit, and a light emitting signal and a light receiving signal are switched and applied to the other input using a changeover switch.

位相検出回路の両人力が投光信号のときに回路で生じる
位相誤差が測定される。この測定した位相誤差を用いて
位相検出回路で検出した投、受光信号の位相差を補正す
る。
The phase error that occurs in the circuit when both inputs of the phase detection circuit are light emitting signals is measured. This measured phase error is used to correct the phase difference between the projection and reception signals detected by the phase detection circuit.

発明の背景 この発明は、所定周波数の信号によって強度変調された
発光素子の出力光を対象物に投射し、その反射光を受光
素子で受光し、投光信号と受光信号との位相差から対象
物までの距離を測定する装置に関する。
Background of the Invention This invention projects the output light of a light emitting element whose intensity is modulated by a signal of a predetermined frequency onto a target object, receives the reflected light with a light receiving element, and detects the target object from the phase difference between the light emitting signal and the light receiving signal. This invention relates to a device that measures the distance to an object.

このような距離測定装置には投光信号と受光信号の位相
差を検出する位相差検出回路が設けられている。投光信
号は発光素子の投射光をモニタする受光素子から得られ
、増巾回路を経て位相差検出回路の一方の入力に与えら
れる。対象物からの反射光を受光する受光素子の受光信
号は振1[1を常に一定にするためにAGC(自動利得
制御)増1】回路を経て位相差検出回路の他方の入力に
与えられる。このようなモニタ用受光素子、各増巾回路
等におけるばらつき、温度トリット等によって投光信号
、受光信号に位相ずれが発生し、しかもこの位相ずれ量
は装置ごとに異なっていたり、温度によって変動する。
Such a distance measuring device is provided with a phase difference detection circuit that detects a phase difference between a light emitting signal and a light receiving signal. The light projection signal is obtained from a light receiving element that monitors the light projected by the light emitting element, and is applied to one input of the phase difference detection circuit through an amplification circuit. The light reception signal of the light receiving element that receives the reflected light from the object is applied to the other input of the phase difference detection circuit through an AGC (automatic gain control) circuit with an amplitude of 1 [to keep the amplitude 1 constant]. A phase shift occurs in the light emitting signal and the light receiving signal due to variations in the monitor light receiving element, each amplifier circuit, etc., temperature trit, etc., and the amount of phase shift varies depending on the device or varies depending on the temperature. .

とくにAGC増巾回路では反射光の光量に応じて利得が
変動するのでその出力信号(受光信号)の位相ずれが顕
著でありかつ変化する。したがって1位相検出回路で検
出された投、受光信号の位相差には誤差が含まれている
という問題がある。
In particular, in an AGC amplification circuit, the gain varies depending on the amount of reflected light, so the phase shift of the output signal (light reception signal) is significant and changes. Therefore, there is a problem in that the phase difference between the projection and reception signals detected by the 1-phase detection circuit includes an error.

発明の概要 この発明は1位相誤差を定期的に測定し、これにより検
出位相差を補正し、常に正確な距離711J定が0■能
な装置を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide an apparatus that periodically measures one phase error, corrects the detected phase difference thereby, and is capable of always accurately determining the distance 711J.

この発明による距離測定装置は、所定周波数の投光信号
により強度変調される光を対象物に投射する発光素子、
対象物からの反射光を受光する受光素子1発光素子の投
光信号と受光素子の受光信号を切換えていずれか一方を
出力する切換スイッチ、投光信号と切換スイッチの出力
信号との位相差を検出してこの位相差を表わすデータを
出力する位相差検出回路、および切換スイッチの切換え
を制御するとともに、切換スイッチが受光信号を選択し
ているときに位相差検出回路から得られる位相差データ
から、切換スイッチが投光信号を選択しているときに位
相差検出回路から得られる位相差データを減算して、補
正後の位相差データを出力する補正回路を備えているこ
とを特徴とする。
A distance measuring device according to the present invention includes a light emitting element that projects light whose intensity is modulated by a light projection signal of a predetermined frequency onto an object;
A light-receiving element that receives reflected light from an object 1 A change-over switch that switches between the light-emitting signal of the light-emitting element and the light-receiving signal of the light-receiving element and outputs one of them, and the phase difference between the light-emitting signal and the output signal of the changeover switch. A phase difference detection circuit detects and outputs data representing this phase difference, and controls switching of the changeover switch, and also detects the phase difference from the phase difference data obtained from the phase difference detection circuit when the changeover switch selects the received light signal. The present invention is characterized by comprising a correction circuit that subtracts phase difference data obtained from the phase difference detection circuit when the changeover switch selects the light projection signal and outputs corrected phase difference data.

この発明によると、切換スイッチを切換制御することに
より、定期的に投光信号を選択してこの投光信号を受光
信号の受光回路(AGC増巾回路等を含む)を通して位
相差検出回路に与えることができる。位相差検出回路で
はこのとき投、受光側の各回路において生じている位相
ずれが測定される。
According to this invention, by controlling the changeover switch, a light emitting signal is periodically selected and the light emitting signal is applied to a phase difference detection circuit through a light receiving circuit (including an AGC amplification circuit, etc.) for a light receiving signal. be able to. At this time, the phase difference detection circuit measures the phase shift occurring in each of the circuits on the transmitting and receiving sides.

切換スイッチによって受光信号が選択されているときに
得られる位相差検出回路の検出位相差から上記の11定
した位相ずれを差引けば、増巾回路等で生じる位相誤差
が含まれていない正確な投。
By subtracting the above 11-determined phase difference from the detected phase difference of the phase difference detection circuit obtained when the light reception signal is selected by the selector switch, the accurate result that does not include the phase error caused by the amplification circuit, etc. can be obtained. Throw.

受光信号の位相差を得ることができる。このようにして
この発明によると、常に正確な距離測定が可能となる。
The phase difference of the received light signal can be obtained. In this way, according to the present invention, accurate distance measurement is always possible.

実施例の説明 第1図はこの発明の実施例を示すブロック図であり、第
2図は第1図における各ブロックの出力信号波形を示し
ている。第2図においては増巾回路等において生じる位
相ずれがない理想的なものとして各波形が図示されてい
る。また投光信号A、受光信号Bは9作図の便宜上その
周波数がかなり低いものとして示されている。
DESCRIPTION OF THE EMBODIMENTS FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 shows output signal waveforms of each block in FIG. In FIG. 2, each waveform is illustrated as an ideal waveform in which there is no phase shift caused by an amplification circuit or the like. Further, the light emitting signal A and the light receiving signal B are shown as having considerably low frequencies for convenience of drawing the figures.

発振回路4は一定周波数f (強度変調周波数、たとえ
ば8〜IOM Hz程度の正弦波信号を発生し、この信
号を用いてAPC(自動パワー制御)回路5によって発
光素子(レーザ・ダイオード)1が駆動される。発光素
子1の出力光は周波fif  で強度変調されることに
なる。この出力光は対象物に向けて投射される。一方9
発光素子1の出力光は近接して配置されたモニタ用受光
素子(フォトダイオード)3に直接に(もちろん必要に
応じてフィルタ等を介して)受光される。この受光索子
3の出力が投光信号Aを表わしている。
The oscillation circuit 4 generates a sine wave signal with a constant frequency f (intensity modulation frequency, for example, about 8 to IOM Hz), and this signal is used to drive the light emitting element (laser diode) 1 by the APC (automatic power control) circuit 5. The output light of the light emitting element 1 will be intensity-modulated at the frequency fif.This output light will be projected toward the object.
The output light of the light emitting element 1 is directly received by a monitoring light receiving element (photodiode) 3 arranged in close proximity (of course, via a filter or the like as necessary). The output of this light receiving cable 3 represents the light projection signal A.

素子3の受光信号は一方ではAPC回路5に与えられ、
このAPC回路5によって発光素子1の出力光のピーク
強度が常に一定となるように制御される。他方では受光
素子3の出力は増巾回路7で増111されて位相差検出
回路10に与えられるとともに切換スイッチ6の一方の
入力端子すに与えられる。
On the one hand, the light reception signal of the element 3 is given to the APC circuit 5,
The APC circuit 5 controls the peak intensity of the output light of the light emitting element 1 to be always constant. On the other hand, the output of the light receiving element 3 is amplified 111 by the amplification circuit 7 and applied to the phase difference detection circuit 10 and also applied to one input terminal of the changeover switch 6.

対象物からの反射光は受光索子2によって受光され、こ
の受光信号Bは切換スイッチ6の他方の端子aに与えら
れる。投光信号(投射光)Aと受光信号(反射光)Bと
の間には、対象物までの距MLに応じた位相差φ、があ
る。後に示すように位相差φLが検出され、この位相差
φLを用いて次式により距MLが求められる。
The reflected light from the object is received by the light receiving cable 2, and this light receiving signal B is given to the other terminal a of the changeover switch 6. There is a phase difference φ between the light projection signal (projection light) A and the light reception signal (reflected light) B, depending on the distance ML to the object. As shown later, the phase difference φL is detected, and using this phase difference φL, the distance ML is determined by the following equation.

L−(φL/2π)(C/fo) C: 光速 切換スイッチ6が端子aに接続されているときには受光
信号Bが切換スイッチ6を通ってAGC増巾回路8に与
えられる。この増巾回路8の出力信号は位相差検出回路
10に入力する。対象物までの距離によって反射光の強
度は変化するので受光信号Bのピーク・レベルも対象物
の位置によって変動する。AGC増巾回路8によって受
光信号のピーク・レベルが一定に保たれる。
L-(φL/2π)(C/fo) C: When the light speed changeover switch 6 is connected to the terminal a, the light reception signal B is applied to the AGC amplification circuit 8 through the changeover switch 6. The output signal of this amplification circuit 8 is input to a phase difference detection circuit 10. Since the intensity of the reflected light changes depending on the distance to the object, the peak level of the received light signal B also changes depending on the position of the object. The peak level of the received light signal is kept constant by the AGC amplification circuit 8.

切換スイッチ6がb側に接続されているときには投光信
号Aがこのスイッチ6を通って位相差検出回路IOに与
えられる。説明を簡素化するために以下の位相差検出回
路lOの説明では切換スイッチ6はa側に接続されてい
るものとする。
When the changeover switch 6 is connected to the b side, the light projection signal A is applied to the phase difference detection circuit IO through the switch 6. In order to simplify the explanation, in the following explanation of the phase difference detection circuit IO, it is assumed that the changeover switch 6 is connected to the a side.

位相差検出回路10はヘテロダイン検波法を用いて位相
差を検出するものである。発振回路15は強度変調周波
数f に非常に近い周波数f の正OC 弦波信号を発生するもので、この発振出力はビート発生
回路11.13に与えられる。ビート発生回路11、1
3には上述の投光信号A、受光信号Bがそれぞれ入力し
ており1周波数f とf との差の周OC 波数f  −f  −f  をもつビート信号C,Dが
S      OC それぞれ作成される。これらのビート信号CとDの間に
は信号AとBの間の位相差φLがそのまま保存される(
後述する位相ずれについてはここでは不問)。ビート信
号の周波数f はたとえばlOKHz程度に選定され、
このように位相差φLを保存しかつ周波数を下げること
ができるので、後述するカウンター7を用いた位相差検
出が可能となる。
The phase difference detection circuit 10 detects a phase difference using a heterodyne detection method. The oscillation circuit 15 generates a positive OC sinusoidal signal with a frequency f 1 very close to the intensity modulation frequency f 2 , and this oscillation output is given to the beat generation circuit 11.13. Beat generation circuit 11, 1
The above-mentioned light emitting signal A and light receiving signal B are respectively input to 3, and beat signals C and D having a frequency f −f −f which is the difference between one frequency f and f are respectively created. . The phase difference φL between the signals A and B is preserved between these beat signals C and D (
(The phase shift described later is not a concern here.) The frequency f of the beat signal is selected to be, for example, about lOKHz,
Since the phase difference φL can be preserved and the frequency can be lowered in this way, it becomes possible to detect the phase difference using the counter 7, which will be described later.

コンパレータ12.14はそれぞれビート信号C1Dを
零レベルでレベル弁別するものであり(ゼロ・クロス)
、その出力信号E、Fはゲート信号発生回路IBに与え
られる。ゲート信号発生回路16は入力信号Eの立上り
から信号Fの立上りまでHレベルとなるゲート信号Gを
発生する。ゲート信号Gは検出すべき位相差φLの時間
の間Hレベルとなる。
Comparators 12 and 14 are for level discrimination of the beat signal C1D at zero level (zero cross).
, and their output signals E and F are applied to a gate signal generation circuit IB. The gate signal generation circuit 16 generates a gate signal G that is at H level from the rise of the input signal E to the rise of the signal F. The gate signal G is at H level during the time period of the phase difference φL to be detected.

カウンタ17には高速の(たとえば5MHz)クロック
・パルスHが与えられており、カウンタ17はゲート信
号GがHレベルの間このクロック・パルスHを計数する
。カウンタ17の計数値が位相差φ1.を表わすことに
なる。
A high-speed (eg, 5 MHz) clock pulse H is applied to the counter 17, and the counter 17 counts this clock pulse H while the gate signal G is at an H level. The count value of the counter 17 is the phase difference φ1. will represent.

上述したように投光信号Aは受光素子3で検出され、増
巾回路7を経て位相差検出回路lOに入力する。受光素
子2の受光信号BはAGC増巾回路8を経て位相差検出
回路10に入力する。このように投光信号Aと受光信号
Bとはそれぞれ異なる回路を通るので、これらの回路に
固有の位相ずれが発生する。またこの位相ずれは温度や
反射光強度(受光索子2への入射光量)に依存する。と
くにAGC増巾回路8は特有のゲイン−位相特性をもっ
ているので、変化する利得によって位相ずれも変化する
As described above, the light projection signal A is detected by the light receiving element 3, passes through the amplification circuit 7, and is input to the phase difference detection circuit IO. The light reception signal B of the light receiving element 2 is input to the phase difference detection circuit 10 via the AGC amplification circuit 8. In this way, since the light emitting signal A and the light receiving signal B pass through different circuits, a phase shift inherent to these circuits occurs. Further, this phase shift depends on the temperature and the intensity of reflected light (the amount of light incident on the light-receiving probe 2). In particular, since the AGC amplifying circuit 8 has a unique gain-phase characteristic, the phase shift changes as the gain changes.

投光信号Aと受光信号Bとの間に生じる上述した位相ず
れをφ  で表わすと、切換スイッチ6rr がa側に接続されているときに位相差検出回路10で検
出される位相差は、対象物の距離に基づく位相差φ に
、に記位相ずれφ  を加えたもの。
If the above-mentioned phase shift occurring between the light emitting signal A and the light receiving signal B is expressed as φ, the phase difference detected by the phase difference detection circuit 10 when the changeover switch 6rr is connected to the a side is The sum of the phase difference φ based on the distance of the object and the phase shift φ shown in .

L         err φ +φ  となる。L err It becomes φ + φ.

L   err 一方、切換スイッチ6をb側に切換えると、投光信号A
がAGC増中口中回路8て位相差検出回路10に入力す
ることになる。位相差検出回路10の2つの入力はとも
に投光信号Aであるから、対象物の距離に基づく位相差
は0であり1位相差検出回路10で検出される位相差は
1位相ずれφ  のcrr みとなる。
L err On the other hand, when the changeover switch 6 is switched to the b side, the light emission signal A
is input to the phase difference detection circuit 10 through the AGC amplification circuit 8. Since the two inputs of the phase difference detection circuit 10 are both light projection signals A, the phase difference based on the distance to the object is 0, and the phase difference detected by the 1 phase difference detection circuit 10 is crr of 1 phase shift φ. Become a servant.

したがって、切換スイッチ6をa側に接続したときの検
出位相差φ +φ  から、b側に切換L   crr えたときの検出位相差φ  を差引けば、対象物rr の距離に基づく正確な位相差φ、が得られることになる
Therefore, by subtracting the detected phase difference φ when switching to the b side L crr from the detected phase difference φ +φ when the changeover switch 6 is connected to the a side, the accurate phase difference φ based on the distance of the target object rr can be obtained. , will be obtained.

補正回路20には、切換スイッチ6がa側のときの測定
位相差φ +φ  を−時的に記憶するL   err ラッチ回路21と、b側のときに検出される位相ずれφ
  を記憶するラッチ回路22とが設けられ。
The correction circuit 20 includes an L err latch circuit 21 that temporally stores the measured phase difference φ +φ when the changeover switch 6 is on the a side, and a L err latch circuit 21 that temporarily stores the measured phase difference φ +φ when the changeover switch 6 is on the b side.
A latch circuit 22 for storing the information is provided.

err これらがカウンタ17の出力側に接続されている。err These are connected to the output side of the counter 17.

ラッチ切換回路23は、切換スイッチ6の切換えを制御
するとともに、ラッチ回路21.22におけるカウンタ
出力のラッチ動作をスイッチ6の切換えに同期して行な
うものである。
The latch switching circuit 23 controls the switching of the changeover switch 6, and also performs the latch operation of the counter output in the latch circuits 21 and 22 in synchronization with the switching of the switch 6.

第3図に示すように切換スイッチ6は一定の周期T(た
とえば10m5)で切換えられ、そのうちで比較的長い
時間t1においてa側に接続され。
As shown in FIG. 3, the changeover switch 6 is switched at a constant period T (for example, 10 m5), and is connected to the a side during a relatively long time t1.

比較的短い時間t2 (たとえば1ms前後)にb側に
接続される。これらの時間1 .1  で計測された位
相差φ +φ  、φ  がそれぞれラッL   er
r   err 子回路21.22にストアされるので、演算回路24は
(φ +φ  )−φ  −φ、の演算を行なL   
  err       errい、その結果φLを一
時的に記憶する。
It is connected to the b side in a relatively short time t2 (for example, around 1 ms). These times 1. The phase differences φ +φ and φ measured at 1 are L er
Since r err is stored in the child circuits 21 and 22, the arithmetic circuit 24 performs the calculation (φ +φ) −φ −φ, and L
err err, and as a result φL is temporarily stored.

演算回路24に記憶されている補正後の位相差φLのデ
ータは、出力回路3oにおいて、一方では演算回路31
に送られ、上述した式にしたがって距離りが算出され9
表示装置32に表示される。他方ではデータφLはD/
A変換回路33でアナログ量に変換され、アナログ出力
回路34から出力される。
The data of the corrected phase difference φL stored in the arithmetic circuit 24 is transmitted to the output circuit 3o on the one hand and to the arithmetic circuit 31.
The distance is calculated according to the formula described above.9
It is displayed on the display device 32. On the other hand, data φL is D/
It is converted into an analog quantity by the A conversion circuit 33 and outputted from the analog output circuit 34.

第1図に示す実施例において1発振回路4,15の発振
周波数f  、f  は素子のばらつき、温度Oe などにより変動があり1周波数確度は±100pp11
程度である。たとえば、  f  −10MHz、  
f  =OC 9,99M Hzの場合にビート周波数はf  −10
KHzとなる筈であるが、実際にはf  −10M H
Z±I KHz 、f  =9.99MHz±IKHz
、fs= IOK Hz±2KHzとなる。クロック発
生回路18のクロック信号Hの周波数をたとえば5MH
zとした場合、ビート信号1周期に相当する位相差測定
値はカウンター7の計数値でいうと 625カウントか
ら 417カウントまでばらつく。したがって。
In the embodiment shown in FIG. 1, the oscillation frequencies f and f of the single oscillation circuits 4 and 15 vary due to element variations, temperature Oe, etc., and the single frequency accuracy is ±100 pp11.
That's about it. For example, f -10MHz,
When f = OC 9,99 MHz, the beat frequency is f −10
It is supposed to be KHz, but in reality it is f -10M H
Z±I KHz, f=9.99MHz±IKHz
, fs=IOK Hz±2KHz. For example, the frequency of the clock signal H of the clock generation circuit 18 is set to 5MH.
When z, the phase difference measurement value corresponding to one period of the beat signal varies from 625 counts to 417 counts in terms of the count value of the counter 7. therefore.

検出位相差に誤差が生じる。An error occurs in the detected phase difference.

この問題を解決したのが第4図に示す例である。この図
は第1図の回路の一部を取出して示したものである。コ
ンパレータ12.14の出力はビート周波数を表わして
いる。一方のコンパレータ12の出力信号の周波数をP
LLなどの逓倍回路19で整数N倍にし、その出力をク
ロック信号としてカウンタ17に与える。このようにす
ることにより。
The example shown in FIG. 4 solves this problem. This figure shows a part of the circuit shown in FIG. 1. The output of comparator 12.14 represents the beat frequency. The frequency of the output signal of one comparator 12 is P
The signal is multiplied by an integer N by a multiplier circuit 19 such as LL, and the output is given to the counter 17 as a clock signal. By doing this.

カウンタ17のカウント数がnであれば位相差は2πX
 (n/N)で表わされることになり、素子のばらつき
や温度変化に基づく発振周波数の変動による測定誤差を
なくすることができる。
If the count number of the counter 17 is n, the phase difference is 2πX
(n/N), and it is possible to eliminate measurement errors due to fluctuations in oscillation frequency due to element variations or temperature changes.

第5図はさらに他の実施例を示している。第1図に示す
ものと同一物には同一符号が付けられている。第1図に
示す増巾回路8が、初段増[11回路81とAGC増r
11回路82とこれらの間に設けられた抵抗分割回路4
0と分割回路40の分割抵抗を選択するスイッチ41と
からなる回路に置きかえられている。増巾回路81の出
力信号のレベルが一定レベルを超えると振幅検出回路4
2で検出され、この検出信号は切換制御回路46のゲー
ト回路44に与えられる。AGC増巾回路82のゲイン
が一定値を超えるとゲイン検出回路43で検出され、こ
の検出信号は回路46のゲート回路45に与えられる。
FIG. 5 shows yet another embodiment. Components that are the same as those shown in FIG. 1 are given the same reference numerals. The amplification circuit 8 shown in FIG.
11 circuit 82 and the resistance divider circuit 4 provided between them.
0 and a switch 41 for selecting the dividing resistance of the dividing circuit 40. When the level of the output signal of the amplifier circuit 81 exceeds a certain level, the amplitude detection circuit 4
2, and this detection signal is given to the gate circuit 44 of the switching control circuit 46. When the gain of the AGC amplification circuit 82 exceeds a certain value, it is detected by the gain detection circuit 43, and this detection signal is given to the gate circuit 45 of the circuit 46.

ゲート回路44、45の出力によって選択スイッチ41
が切換制御される。ゲート回路44.45は上述した切
換スイッチ6の切換制御信号によって制御され、切換ス
イッチ6がa側に接続されているときには初段増巾回路
81の出力信号のレベルによってゲート回路44を通し
て選択スイッチ41の切換制御が行なわれ、切換スイッ
チ6がb側に接続されているときにはAGC増111回
路82のゲインによってゲート回路45を通して選択ス
イッチ41の切換制御が行なわれる。
The selection switch 41 is selected by the outputs of the gate circuits 44 and 45.
is controlled to switch. The gate circuits 44 and 45 are controlled by the switching control signal of the changeover switch 6 mentioned above, and when the changeover switch 6 is connected to the a side, the level of the output signal of the first stage amplifying circuit 81 is used to control the selection switch 41 through the gate circuit 44. Switching control is performed, and when the changeover switch 6 is connected to the b side, the selection switch 41 is controlled by the gain of the AGC amplifier 111 circuit 82 through the gate circuit 45.

第3図を用いて上述したように切換スイッチ6はa側に
接続されている時間の方がb側に切換えられている時間
よりもはるかに長い。AGC増中口中回路82定数は比
較的大きいので、切換スイッチ6がb側に接続されてい
るときに入力するモニタ用受光索子3の受光信号の振巾
に追従してそのゲインが変化することは殆んどなく、A
GC増巾回路82のゲインは基本的にはスイッチ6がa
側に接続されているときに入力する受光素子2の受光信
号の振巾に追従して変化する。したがって。
As described above with reference to FIG. 3, the time during which the changeover switch 6 is connected to the a side is much longer than the time during which it is switched to the b side. Since the constant of the AGC amplification circuit 82 is relatively large, its gain changes in accordance with the amplitude of the light reception signal of the monitor light reception cable 3 that is input when the changeover switch 6 is connected to the b side. There are almost no A
Basically, the gain of the GC amplification circuit 82 is set by the switch 6.
It changes in accordance with the amplitude of the light reception signal of the light receiving element 2 that is input when the light receiving element 2 is connected to the side. therefore.

AGC増巾回路82のゲインが大きいときにスイッチ6
がb側に切換えられ、モニタ用受光素子3の出力信号が
AGC増巾回路82に入力すると、この増巾回路82が
飽和するおそれがあるので選択スイッチ41がd側に切
換えられ、増巾回路81の出力信号の振巾が抵抗分割さ
れてAGC増中口中回路82えられる。受光素子2の受
光信号が大きいときには、スイッチ6がa側に接続され
ているときにこのことが振巾検出回路42で検出され、
同じように選択スイッチ41がd側に切換えられて抵抗
分割されることによりその振[1]が低下し、AGC増
巾回路82のゲインが小さくなりすぎるのが防止される
When the gain of the AGC amplification circuit 82 is large, the switch 6
is switched to the b side and the output signal of the monitor light receiving element 3 is input to the AGC amplification circuit 82. Since there is a risk that this amplification circuit 82 will be saturated, the selection switch 41 is switched to the d side and the amplification circuit The amplitude of the output signal 81 is resistance-divided and output to the AGC amplification circuit 82. When the light reception signal of the light receiving element 2 is large, this is detected by the amplitude detection circuit 42 when the switch 6 is connected to the a side.
Similarly, when the selection switch 41 is switched to the d side and resistance division is performed, the amplitude [1] is reduced, and the gain of the AGC amplification circuit 82 is prevented from becoming too small.

選択スイッチ41は抵抗分割回路40の抵抗を2段に切
換えているが、検出振巾や検出ゲインに応じて3段以上
に切換える構成とすることもできる。
Although the selection switch 41 switches the resistance of the resistance divider circuit 40 into two stages, it can also be configured to switch into three or more stages depending on the detection amplitude and detection gain.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の実施例を示すブロック図。 第2図は第1図の回路の各ブロックの出力信号波形を示
す波形図、第3図は切換スイッチの切換えを示すタイム
・チャートである。 第4図は変形例を示すブロック図、第5図は他の実施例
を示すブロック図である。 1・・・発光素子、   2・・・受光素子。 3・・・モニタ用受光素子。 4・・・強度変調波の発振回路。 6・・・切換回路、   10・・・位相差検出回路。 20・・・補正回路。 23・・・切換スイッチおよびラッチ切換回路。 以  上 特許出願人  立石電機株式会社 代 理 人   弁理士 牛 久 健 司(外1名) 第4図
FIG. 1 is a block diagram showing an embodiment of the invention. FIG. 2 is a waveform diagram showing output signal waveforms of each block of the circuit of FIG. 1, and FIG. 3 is a time chart showing switching of the changeover switch. FIG. 4 is a block diagram showing a modified example, and FIG. 5 is a block diagram showing another embodiment. 1... Light emitting element, 2... Light receiving element. 3... Light receiving element for monitor. 4...Intensity modulated wave oscillation circuit. 6...Switching circuit, 10...Phase difference detection circuit. 20... Correction circuit. 23... Changeover switch and latch changeover circuit. Patent applicant Tateishi Electric Co., Ltd. Agent Patent attorney Kenji Ushiku (1 other person) Figure 4

Claims (2)

【特許請求の範囲】[Claims] (1)所定周波数の投光信号により強度変調される光を
対象物に投射する発光素子、 対象物からの反射光を受光する受光素子、 発光素子の投光信号と受光素子の受光信号を切換えてい
ずれか一方を出力する切換スイッチ、投光信号と切換ス
イッチの出力信号との位相差を検出してこの位相差を表
わすデータを出力する位相差検出回路、および 切換スイッチの切換えを制御するとともに、切換スイッ
チが受光信号を選択しているときに位相差検出回路から
得られる位相差データから、切換スイッチが投光信号を
選択しているときに位相差検出回路から得られる位相差
データを減算して、補正後の位相差データを出力する補
正回路、を備えた距離測定装置。
(1) A light-emitting element that projects light whose intensity is modulated by a light-emitting signal of a predetermined frequency onto an object, a light-receiving element that receives reflected light from the object, and switching between the light-emitting signal of the light-emitting element and the light-receiving signal of the light-receiving element. a changeover switch that outputs either one of the output signals of the changeover switch; a phase difference detection circuit that detects the phase difference between the light emission signal and the output signal of the changeover switch and outputs data representing this phase difference; and a phase difference detection circuit that controls switching of the changeover switch. , Subtract the phase difference data obtained from the phase difference detection circuit when the changeover switch selects the light emission signal from the phase difference data obtained from the phase difference detection circuit when the changeover switch selects the light reception signal. and a correction circuit that outputs corrected phase difference data.
(2)切換スイッチおよび位相差検出回路に与えられる
投光信号が、発光素子の発光出力を直接に受光するモニ
タ用受光素子の受光信号である、特許請求の範囲第(1
)項に記載の距離測定装置。
(2) The light projection signal given to the changeover switch and the phase difference detection circuit is a light reception signal of a monitoring light receiving element that directly receives the light emission output of the light emitting element.
) Distance measuring device described in paragraph 1.
JP62327489A 1987-12-25 1987-12-25 Distance measuring apparatus Pending JPH01169385A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62327489A JPH01169385A (en) 1987-12-25 1987-12-25 Distance measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62327489A JPH01169385A (en) 1987-12-25 1987-12-25 Distance measuring apparatus

Publications (1)

Publication Number Publication Date
JPH01169385A true JPH01169385A (en) 1989-07-04

Family

ID=18199727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62327489A Pending JPH01169385A (en) 1987-12-25 1987-12-25 Distance measuring apparatus

Country Status (1)

Country Link
JP (1) JPH01169385A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4202288A1 (en) * 1991-01-31 1992-08-13 Shachihata Industrial Safety cap assembly for writing implement
US5316402A (en) * 1991-12-13 1994-05-31 Tombow Pencil Co., Ltd. Penholder cap
WO2008047640A1 (en) * 2006-10-18 2008-04-24 Panasonic Electric Works Co., Ltd. Spatial information detecting device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4202288A1 (en) * 1991-01-31 1992-08-13 Shachihata Industrial Safety cap assembly for writing implement
US5203637A (en) * 1991-01-31 1993-04-20 Shachihata Industrial Co., Ltd. Cap for writing implement with air vent and guide
US5316402A (en) * 1991-12-13 1994-05-31 Tombow Pencil Co., Ltd. Penholder cap
WO2008047640A1 (en) * 2006-10-18 2008-04-24 Panasonic Electric Works Co., Ltd. Spatial information detecting device
US7755743B2 (en) 2006-10-18 2010-07-13 Panasonic Electric Works Co., Ltd. Spatial information detecting apparatus

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