JPH01154660A - Testing method for communication system - Google Patents

Testing method for communication system

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Publication number
JPH01154660A
JPH01154660A JP31231687A JP31231687A JPH01154660A JP H01154660 A JPH01154660 A JP H01154660A JP 31231687 A JP31231687 A JP 31231687A JP 31231687 A JP31231687 A JP 31231687A JP H01154660 A JPH01154660 A JP H01154660A
Authority
JP
Japan
Prior art keywords
identification
signal
error rate
eye pattern
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP31231687A
Other languages
Japanese (ja)
Other versions
JP2571408B2 (en
Inventor
Hiroshi Nishimoto
央 西本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62312316A priority Critical patent/JP2571408B2/en
Publication of JPH01154660A publication Critical patent/JPH01154660A/en
Application granted granted Critical
Publication of JP2571408B2 publication Critical patent/JP2571408B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To evaluate the aperture of an eye pattern with a simple means by measuring the error rate of a signal identified by an identification point moved in the amplitude and time directions of the eye pattern. CONSTITUTION:A reception signal equalized and amplified by an equalizing amplifier 11 is inputted to a timing recovery circuit 13, from which an identification phase signal (c) is generated, the signal (c) is subjected to amplitude modulation at an identification phase modulation circuit 15 by using a signal shifted by pi/2 by a phase shifter 17 from a sinusoidal wave signal (d) from a sinusoidal wave oscillation circuit 16. On the other hand, the identification level signal (f) is subjected to amplitude modulation by using said sinusoidal wave signal (d) by the identification level modulation circuit 14 and the outputs of the modulation circuits 15, 16 are fed to an identification device 12 to form an identification point moved circularly or in an elliptic form. The identification device 12 uses the identification point to identify said signal (b) and the error rate of the identification output signal is measured by an error rate measuring instrument 18.

Description

【発明の詳細な説明】 〔概要〕 誤り率によりアイパターンの開口度の評価を行う通信シ
ステムの試験方法に関し、 簡単な手段でアイパターンの開口度の評価を行うことを
目的とし、 受信信号の識別を行う識別レベルを正弦波で変調し、且
つ識別位相を前記正弦波と位相差がπ/2の正弦波で変
調して、円又は楕円状に移動する識別点を形成し、この
識別点により受信信号を識別し、識別出力信号の誤り率
を測定するように構成する。
[Detailed Description of the Invention] [Summary] Regarding a communication system testing method that evaluates the eye pattern aperture based on error rate, the present invention aims to evaluate the eye pattern aperture using a simple method. The identification level for performing identification is modulated with a sine wave, and the identification phase is modulated with a sine wave having a phase difference of π/2 from the sine wave to form an identification point that moves in a circular or elliptical shape, and this identification point The configuration is configured to identify the received signal by using the method and measure the error rate of the identified output signal.

〔産業上の利用分野〕[Industrial application field]

本発明は、誤り率によりアイパターンの開口度の評価を
行う通信システムの試験方法に関するものである。
The present invention relates to a communication system testing method that evaluates the aperture of an eye pattern based on an error rate.

ディジタル通信システムに於いては、送信装置や受信装
置等を含めてそれぞれ所望の特性が得られるか否か試験
を行うものであり、各種の試験項目に対応した試験方法
が提案されている。このような通信システムの試験は、
簡単な操作で且つ信幀性が高いことが要望されている。
BACKGROUND ART In digital communication systems, tests are performed to determine whether desired characteristics can be obtained for each device including a transmitting device, a receiving device, etc., and testing methods corresponding to various test items have been proposed. Testing of such communication systems is
There is a demand for simple operation and high reliability.

〔従来の技術〕[Conventional technology]

通信システムの試験項目としては、例えば、送信出力レ
ベル、変調特性、符号誤り率特性、アイパターン開口度
等がある。例えば、ディジタル光通信システムに於ける
光送信装置の変調特性については、その出力光信号をア
イパターン測定装置に入力し、所望のアイパターン開口
度が得られるか否かアイマスクを用いて試験する方法が
知られている。
Test items for communication systems include, for example, transmission output level, modulation characteristics, code error rate characteristics, and eye pattern aperture. For example, to determine the modulation characteristics of an optical transmitter in a digital optical communication system, the output optical signal is input to an eye pattern measuring device and tested using an eye mask to see if the desired eye pattern aperture is obtained. method is known.

又ディジタル光通信システムの光受信装置の受信能力に
ついては、試験装置からの光信号レベルを減衰器等によ
り変化させたり、又は干渉光信号を重畳して誤り率を測
定することにより試験を行う方法が知られている。
Regarding the reception ability of optical receivers in digital optical communication systems, there are methods to test the optical signal level from the test equipment by changing the level of the optical signal using an attenuator, etc., or by superimposing interference optical signals and measuring the error rate. It has been known.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

前述の従来の試験方法に於いて、例えば、アイマスクを
用いて変調特性を試験する方法は、アイパターン測定装
置に表示されたアイパターンを目視で観測するものであ
るから、比較的低い確率でアイパターンが劣化する変調
特性については見落とす欠点があった。
Among the conventional test methods mentioned above, for example, the method of testing modulation characteristics using an eye mask visually observes the eye pattern displayed on an eye pattern measuring device, so there is a relatively low probability that The problem was that the modulation characteristics, which deteriorated the eye pattern, were overlooked.

又光受信信号の受信能力の試験に於いては、干渉光信号
を重畳することにより、アイパターンを劣化させて誤り
率を測定することになるが、このアイパターンは、光信
号の消光比やデユーティによってもその劣化量が変化す
るものであり、又時間方向のアイ開口については評価で
きず、従って、正確な試験を行うことが容易ではなかっ
た。
In addition, in testing the reception ability of optical reception signals, the error rate is measured by degrading the eye pattern by superimposing an interference optical signal, but this eye pattern is based on the extinction ratio of the optical signal and The amount of deterioration changes depending on the duty, and the eye opening in the time direction cannot be evaluated, so it is not easy to conduct an accurate test.

又伝送特性の試験として、誤り率を測定する場合は、ア
イパターンと関連させたものではなく、アイパターンの
開口度を充分に把握することはできないものであった。
Furthermore, when measuring the error rate as a test of transmission characteristics, it is not related to the eye pattern, and the aperture of the eye pattern cannot be fully grasped.

本発明は、簡単な手段でアイパターンの開口度の評価を
行うことを目的とするものである。
An object of the present invention is to evaluate the aperture of an eye pattern using simple means.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の通信システムの試験方法は、アイパターンの振
幅方向と時間方向との識別位置を自動的に移動させて開
口度を評価するものであり、第1図を参照して説明する
The communication system testing method of the present invention evaluates the degree of aperture by automatically moving the identification position of the eye pattern in the amplitude direction and the time direction, and will be described with reference to FIG.

アイパターンlの開口度評価試験を行う通信システムの
試験方法に於いて、受信信号の識別を行う識別レベル2
を正弦波で変調し、且つ識別位相3を前記正弦波と位相
差がπ/2の正弦波で変調して、円又は楕円状に移動す
る識別点4を形成して、この識別点により受信信号の識
別を行い、識別出力信号を誤り測定器5に加えて誤り率
を測定するものである。
In the communication system test method that performs the eye pattern l aperture evaluation test, identification level 2 is used to identify received signals.
is modulated with a sine wave, and the identification phase 3 is modulated with a sine wave with a phase difference of π/2 from the sine wave to form an identification point 4 that moves in a circular or elliptical shape, and reception is performed by this identification point. The signal is identified and the identified output signal is applied to the error measuring device 5 to measure the error rate.

〔作用〕[Effect]

識別レベル2を正弦波で変調することにより、その識別
レベル2は、範囲A内を正弦波の周期に従って変化し、
又識別位相3を正弦波で変調することにより、その識別
位相3は、範囲B内を正弦波の周期に従って変化する。
By modulating the discrimination level 2 with a sine wave, the discrimination level 2 changes within the range A according to the period of the sine wave,
Further, by modulating the identification phase 3 with a sine wave, the identification phase 3 changes within the range B according to the period of the sine wave.

その場合にπ/2の位相差の正弦波で振幅変調するから
、合成された識別点4の軌跡は、円又は楕円状となる。
In this case, since amplitude modulation is performed using a sine wave with a phase difference of π/2, the locus of the combined identification point 4 becomes circular or elliptical.

この識別点4の移動方向は、正弦波の位相差の選定によ
り矢印方向又はその反対方向とすることができ、移動速
度は、正弦波の周波数に対応したものとなり、受信信号
の周波数に比較して充分に低い周波数が選定される。
The moving direction of this identification point 4 can be the arrow direction or the opposite direction depending on the selection of the phase difference of the sine wave, and the moving speed corresponds to the frequency of the sine wave and is compared to the frequency of the received signal. A sufficiently low frequency is selected.

この識別点4を用いて受信信号を識別し、その識別出力
信号を誤り測定器5に加えて、誤り率の測定を行うもの
であり、その誤り率が所望の誤り率以下であれば、アイ
パターンの開口度が所望の大きさであることが判る。従
って、所望の誤り率が得られる識別点4の軌跡(幅A、
B)により、アイパターン1の開口の大きさが判り、又
標準の識別点4の軌跡の場合の誤り率により、アイパタ
ーンlの開口が充分な大きさであるが否がが判ることに
なる。
This identification point 4 is used to identify the received signal, and the identified output signal is applied to the error measuring device 5 to measure the error rate.If the error rate is less than the desired error rate, the It can be seen that the opening degree of the pattern is a desired size. Therefore, the locus (width A,
From B), the size of the aperture of eye pattern 1 can be determined, and from the error rate in the case of the standard trajectory of discrimination point 4, it can be determined whether the aperture of eye pattern l is sufficiently large or not. .

〔実施例〕〔Example〕

以下図面を参照して本発明の実施例について詳細に説明
する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は本発明の実施例のブロック図であり、11は等
化増幅器、12は識別器、13はタイミング再生回路、
14は識別レベル変調回路、15は識別位相変調回路、
16は正弦波発振器、17は移相器、18は誤り測定器
である。
FIG. 2 is a block diagram of an embodiment of the present invention, in which 11 is an equalization amplifier, 12 is a discriminator, 13 is a timing recovery circuit,
14 is an identification level modulation circuit, 15 is an identification phase modulation circuit,
16 is a sine wave oscillator, 17 is a phase shifter, and 18 is an error measuring device.

受信信号aは等化増幅器11により等化増幅され、等化
増幅出力信号りは識別器12とタイミング再生回路13
とに加えられる。タイミング再生回路13からビットタ
イミング信号が再生され、識別位相信号Cとして識別位
相変調回路15に加えられる。又ディジタル光通信シス
テムに於いては、光信号が電気信号に変換されて前述の
受信信号aとなる。
The received signal a is equalized and amplified by an equalization amplifier 11, and the equalized amplified output signal is sent to a discriminator 12 and a timing recovery circuit 13.
added to. The bit timing signal is regenerated from the timing regeneration circuit 13 and applied as the identification phase signal C to the identification phase modulation circuit 15. Furthermore, in a digital optical communication system, an optical signal is converted into an electrical signal and becomes the above-mentioned received signal a.

又正弦波発振器16からの正弦波信号dが識別変調回路
14に加えられて、識別レベル信号fが振幅変調される
。又移相器17によりπ/2移相された正弦波信号eが
識別位相変調回路15に加えられて、識別位相信号Cが
変調される。即ち、識別タイミング位相が正弦波信号e
に従って周期的に変化される。
Further, the sine wave signal d from the sine wave oscillator 16 is applied to the discrimination modulation circuit 14, and the discrimination level signal f is amplitude-modulated. Further, the sine wave signal e whose phase has been shifted by π/2 by the phase shifter 17 is applied to the identification phase modulation circuit 15, and the identification phase signal C is modulated. That is, the identification timing phase is the sine wave signal e
is changed periodically according to

識別器12には、変調識別レベル信号gと変調識別位相
信号りとが加えられ、それらの信号g。
The discriminator 12 receives a modulation identification level signal g and a modulation identification phase signal g.

hは直交関係にあるから、合成された識別点は第1図に
示すように円又は楕円状に移動するものとなる。等化増
幅出力信号すは、変化する識別点によって識別され、論
理“1”、“O”の識別出力信号iは誤り測定器18に
加えられて、誤り率が測定される。
Since h is in an orthogonal relationship, the combined identification points move in a circular or elliptical manner as shown in FIG. The equalized amplified output signal i is identified by a changing identification point, and the identified output signal i of logic "1", "O" is applied to an error meter 18 to measure the error rate.

アイパターン1の開口の中心に識別レベル2及び識別位
相3を設定し、且つ正弦波信号d、eの振幅を選定する
ことにより、第1図に於ける識別レベル2の変化の幅A
及び識別位相2の変化の幅Bを定めることができるから
、それらの幅A、  Bを設定して所望の誤り率以下と
なるアイパターン1の開口度を試験することができる。
By setting discrimination level 2 and discrimination phase 3 at the center of the aperture of eye pattern 1 and selecting the amplitudes of sine wave signals d and e, the width of change A of discrimination level 2 in FIG.
Since it is possible to determine the width B of the change in the identification phase 2, it is possible to set these widths A and B and test the aperture of the eye pattern 1 that is less than or equal to a desired error rate.

例えば、正弦波信号d、eの振幅を大きく設定して、幅
A、Bを大きくしても、所望の誤り率が得られる場合は
、アイパターン1の開口度が大きいことになり、反対に
、正弦波信号d、eの振幅を小さく設定して、幅A、B
を小さくしないと、所望の誤り率が得られない場合は、
アイパターン1の開口度が小さいことが判る。
For example, if the desired error rate is obtained even if the amplitudes of the sinusoidal signals d and e are set large and the widths A and B are made large, then the aperture of eye pattern 1 will be large; , the amplitudes of the sine wave signals d and e are set small to create widths A and B.
If the desired error rate cannot be obtained without reducing
It can be seen that the aperture of eye pattern 1 is small.

又アイパターンlの開口の中心に対して、識別点4の軌
跡の中心を偏倚させて試験することも可能である。即ち
、識別レベル2を上或いは下に設定すると、それに対応
して識別点4の軌跡の中心は上或いは下に移動すること
になる。同様に、識別位相3を右或いは左に設定すると
、それに対応して識別点4の軌跡の中心は右或いは左に
移動することになる。例えば、識別位相3を左側に偏倚
して、所望の誤り率が得られる識別位相の遅れの限度を
試験することも可能となる。
It is also possible to perform the test by shifting the center of the locus of the identification point 4 with respect to the center of the aperture of the eye pattern l. That is, when the discrimination level 2 is set upward or downward, the center of the locus of the discrimination point 4 moves upward or downward correspondingly. Similarly, when the identification phase 3 is set to the right or left, the center of the locus of the identification point 4 moves to the right or left correspondingly. For example, it is also possible to shift the identification phase 3 to the left and test the limit of the identification phase delay that provides a desired error rate.

第3図は本発明の実施例の試験接続説明図であり、(A
)は送信装置21の変調特性を試験する場合を示し、送
信装置21に試験装置22を接続する。この試験装置2
2は、例えば、第2図に示す構成を有するものであり、
送信装置21の出力信号を直接或いは減衰器を介して試
験装置22に入力し、前述のように、所望のアイパター
ンの開口度が得られているか否か試験する。
FIG. 3 is an explanatory diagram of the test connection of the embodiment of the present invention, (A
) shows a case where the modulation characteristics of the transmitting device 21 are tested, and the testing device 22 is connected to the transmitting device 21. This test device 2
2 has the configuration shown in FIG. 2, for example,
The output signal of the transmitting device 21 is input directly or through an attenuator to the testing device 22, and as described above, it is tested whether the desired eye pattern aperture is obtained.

この場合、比較的低い確率のアイパターンの劣化が生じ
る変調特性の場合でも、誤り率測定により見つけること
ができるから、送信装置21の変調器の異常等を検出す
ることができる。又光信号を送出する光送信装置の場合
は、試験袋[22側に光信号を電気信号に変換する受光
素子等を設ければ良いことになる。
In this case, even in the case of modulation characteristics that cause eye pattern deterioration with a relatively low probability, it can be detected by error rate measurement, so it is possible to detect abnormalities in the modulator of the transmitter 21. In the case of an optical transmitter that sends out optical signals, it is sufficient to provide a light-receiving element or the like on the test bag [22 side] for converting optical signals into electrical signals.

又(B)は伝送特性の試験を行う場合を示し、送信部f
21の出力信号を伝送路23を介して試験装置22に入
力し、所望の誤り率以下となるアイパターンの開口度が
得られるか否か試験するものであり、前述の誤り率特性
試験のように、送信装置21から擬似ランダムパターン
の試験信号を送出し、試験装置22では、第2図に於け
る識別器12に於いて移動する識別点で識別し、その識
別出力信号を擬似ランダムパターンと比較して誤り率を
求めることになる。そして、所定の幅A。
In addition, (B) shows the case of testing the transmission characteristics, and the transmitter f
The output signal of 21 is input to the test device 22 via the transmission line 23, and it is tested whether or not the eye pattern aperture that is less than or equal to the desired error rate can be obtained, and is similar to the error rate characteristic test described above. Then, a test signal of a pseudo-random pattern is sent from the transmitting device 21, and the test device 22 performs discrimination using a moving discrimination point in the discriminator 12 in FIG. The error rate will be determined by comparison. And a predetermined width A.

Bの軌跡となる識別点4で識別した時の誤り率が所望の
値以下となれば、アイパターンの開口度が所望の大きさ
であると判定することになる。
If the error rate when identifying at the identification point 4, which is the locus of B, is less than or equal to a desired value, it is determined that the eye pattern opening degree is the desired size.

又(C)は中継器24を含む試験を行う場合を示し、中
継器24の受信部24Aに試験装置22Aを接続し、送
信装置21からの試験信号を伝送路23Aを介して中継
器24の受信部24Aに入力し、受信部24Aの識別再
生を行う為の識別器の入力信号を試験装置22Aに入力
して、前述のような誤り率測定を行い、アイパターンの
開口度が所望の大きさであるか否か誤り率で評価するも
のである。
Further, (C) shows a case where a test including the repeater 24 is performed, in which the test device 22A is connected to the receiving section 24A of the repeater 24, and the test signal from the transmitter 21 is transmitted to the repeater 24 via the transmission path 23A. The input signal of the discriminator for performing identification reproduction of the receiving section 24A is input to the receiving section 24A, and the error rate measurement as described above is performed, and the aperture of the eye pattern is determined to be as large as desired. The error rate is used to evaluate whether the error rate is accurate or not.

又中継器24の受信部24Aで受信した試験信号を送信
部24Bから伝送路23Bを介して試験装置22Bに伝
送し、この試験装置22Bにより前述と同様に誤り率測
定を行って、アイパターンの開口度が所望の大きさであ
るか否か誤り率で評価するものである。
In addition, the test signal received by the receiving section 24A of the repeater 24 is transmitted from the transmitting section 24B to the test device 22B via the transmission path 23B, and the test device 22B measures the error rate in the same manner as described above to determine the eye pattern. This is to evaluate whether the opening degree is a desired size or not based on the error rate.

又(D)は受信装置26の試験を行う場合を示し、試験
装置25からの試験信号のレベルを調整して受信装置2
6に入力し、受信装置26の識別器の入力信号について
試験装置25で前述の誤り率測定によるアイパターン開
口度の評価を行うものであり、又受信装置26の受信識
別出力信号を試験装置25の誤り測定器に加えて誤り率
を測定して試験する。この場合の試験装置25は試験信
号を出力する構成を試験装置22に付加した構成となる
Further, (D) shows a case where the receiving device 26 is tested, and the level of the test signal from the testing device 25 is adjusted and the receiving device 26 is tested.
6, and the input signal of the discriminator of the receiving device 26 is used to evaluate the eye pattern aperture by the above-mentioned error rate measurement in the testing device 25. In addition to the error measuring instrument, the error rate is also measured and tested. The test device 25 in this case has a configuration in which a configuration for outputting a test signal is added to the test device 22.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明は、識別レベル2と識別位
相3とをそれぞれπ/2の位相差の正弦波で変調して、
円又は楕円状に移動する識別点4を形成し、この識゛別
点4により受信信号を識別した識別出力信号の誤り率を
測定するものであり、識別レベル2と識別位相3との変
化範囲を大きくしても、所望の誤り率が得られる場合は
、アイパターン1の開口度が大きいと判定されるから、
誤り率でアイパターン1の開口度を評価することができ
る。従って、このアイパターン1の開口度評価試験を用
いて通信システムの各部の試験を簡単な操作で行うこと
ができる。
As explained above, the present invention modulates the discrimination level 2 and the discrimination phase 3 with a sine wave with a phase difference of π/2,
A discrimination point 4 that moves in a circle or an ellipse is formed, and the error rate of the discrimination output signal that identifies the received signal using the discrimination point 4 is measured.The range of change between discrimination level 2 and discrimination phase 3 is measured. If the desired error rate is obtained even if the value is increased, it is determined that the opening degree of eye pattern 1 is large.
The degree of aperture of the eye pattern 1 can be evaluated based on the error rate. Therefore, using this eye pattern 1 aperture evaluation test, each part of the communication system can be tested with simple operations.

又アイパターン1の開口の振幅方向と時間方向とについ
て独立的に試験を行うことができる。即ち、識別レベル
2とそれを変調する正弦波とを設定して振幅方向につい
ての開口度評価を行い、これとは独立的に、識別位相3
とそれを変調する正弦波とを設定して時間方向について
の開口度評価を行うことできる。従って、信号レベルに
よる特性の変化は勿論、遅延特性等による特性の変化に
ついても試験を行うことができることになる。
Further, it is possible to independently test the amplitude direction and the time direction of the aperture of the eye pattern 1. That is, the aperture evaluation in the amplitude direction is performed by setting the discrimination level 2 and the sine wave that modulates it, and independently from this, the discrimination phase 3 is set.
It is possible to evaluate the degree of aperture in the time direction by setting the sine wave and the sine wave that modulates it. Therefore, it is possible to test not only changes in characteristics due to signal levels but also changes in characteristics due to delay characteristics and the like.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理説明図、第2図は本発明の実施例
のブロック図、第3図(A)〜(D)は本発明の実施例
の試験接続説明図である。 1はアイパターン、2は識別レベル、3は識別位相、4
は識別点、5は誤り測定器、11は等化増幅器、12は
識別器、13はタイミング再生回路、14は識別レベル
変調回路、15は識別位相変調回路、16は正弦波発振
器、17は移相器、18は誤り測定器である。
FIG. 1 is a diagram illustrating the principle of the present invention, FIG. 2 is a block diagram of an embodiment of the present invention, and FIGS. 3(A) to 3(D) are diagrams illustrating test connections of the embodiment of the present invention. 1 is the eye pattern, 2 is the discrimination level, 3 is the discrimination phase, 4
is a discrimination point, 5 is an error measuring device, 11 is an equalization amplifier, 12 is a discriminator, 13 is a timing recovery circuit, 14 is a discrimination level modulation circuit, 15 is a discrimination phase modulation circuit, 16 is a sine wave oscillator, and 17 is a shifter. Phase device 18 is an error measuring device.

Claims (1)

【特許請求の範囲】 アイパターン(1)の開口度評価試験を行う通信システ
ムの試験方法に於いて、 受信信号の識別を行う識別レベル(2)を正弦波で変調
し、且つ識別位相(3)を前記正弦波と位相差がπ/2
の正弦波で変調して、円又は楕円状に移動する識別点(
4)を形成し、該識別点(4)により前記受信信号を識
別し、識別出力信号の誤り率を測定する ことを特徴とする通信システムの試験方法。
[Claims] In a communication system testing method that performs an eye pattern (1) aperture evaluation test, an identification level (2) for identifying received signals is modulated with a sine wave, and an identification phase (3) is modulated with a sine wave. ) has a phase difference of π/2 from the sine wave.
Discrimination point (
4), identifying the received signal using the identification point (4), and measuring an error rate of the identification output signal.
JP62312316A 1987-12-11 1987-12-11 Test methods for communication systems Expired - Lifetime JP2571408B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62312316A JP2571408B2 (en) 1987-12-11 1987-12-11 Test methods for communication systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62312316A JP2571408B2 (en) 1987-12-11 1987-12-11 Test methods for communication systems

Publications (2)

Publication Number Publication Date
JPH01154660A true JPH01154660A (en) 1989-06-16
JP2571408B2 JP2571408B2 (en) 1997-01-16

Family

ID=18027779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62312316A Expired - Lifetime JP2571408B2 (en) 1987-12-11 1987-12-11 Test methods for communication systems

Country Status (1)

Country Link
JP (1) JP2571408B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005013573A1 (en) * 2003-08-04 2005-02-10 Advantest Corporation Testing method, communication device and testing system
US7218686B2 (en) 2001-03-16 2007-05-15 Nec Corporation Decision threshold voltage control circuit and decision threshold voltage controlling method of clock and data recovery circuit, optical receiver, and decision threshold voltage control program
US8345736B2 (en) 2009-07-01 2013-01-01 Shinko Electric Industries Co., Ltd. Sampling point detection circuit, transmission system, pre-emphasis intensity adjustment method, logic analyzer, and evaluation method for evaluating transmission path
JP2020515843A (en) * 2017-03-30 2020-05-28 ザイリンクス インコーポレイテッドXilinx Incorporated Optical receiver electrical test

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7218686B2 (en) 2001-03-16 2007-05-15 Nec Corporation Decision threshold voltage control circuit and decision threshold voltage controlling method of clock and data recovery circuit, optical receiver, and decision threshold voltage control program
WO2005013573A1 (en) * 2003-08-04 2005-02-10 Advantest Corporation Testing method, communication device and testing system
US7477684B2 (en) 2003-08-04 2009-01-13 Advantest Corporation Testing method, communication device, and testing system
US8345736B2 (en) 2009-07-01 2013-01-01 Shinko Electric Industries Co., Ltd. Sampling point detection circuit, transmission system, pre-emphasis intensity adjustment method, logic analyzer, and evaluation method for evaluating transmission path
JP2020515843A (en) * 2017-03-30 2020-05-28 ザイリンクス インコーポレイテッドXilinx Incorporated Optical receiver electrical test

Also Published As

Publication number Publication date
JP2571408B2 (en) 1997-01-16

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