JPH01151266U - - Google Patents
Info
- Publication number
- JPH01151266U JPH01151266U JP4857688U JP4857688U JPH01151266U JP H01151266 U JPH01151266 U JP H01151266U JP 4857688 U JP4857688 U JP 4857688U JP 4857688 U JP4857688 U JP 4857688U JP H01151266 U JPH01151266 U JP H01151266U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- testing apparatus
- space
- device testing
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 7
- 239000011810 insulating material Substances 0.000 claims description 2
- 230000005494 condensation Effects 0.000 claims 1
- 238000009833 condensation Methods 0.000 claims 1
- 230000008014 freezing Effects 0.000 claims 1
- 238000007710 freezing Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4857688U JPH01151266U (zh) | 1988-04-11 | 1988-04-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4857688U JPH01151266U (zh) | 1988-04-11 | 1988-04-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01151266U true JPH01151266U (zh) | 1989-10-19 |
Family
ID=31274717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4857688U Pending JPH01151266U (zh) | 1988-04-11 | 1988-04-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01151266U (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002046781A1 (fr) * | 2000-12-07 | 2002-06-13 | Advantest Corporation | Douille d'essai pour composants electroniques, et appareil d'essai pour composants electroniques utilisant cette douille |
-
1988
- 1988-04-11 JP JP4857688U patent/JPH01151266U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002046781A1 (fr) * | 2000-12-07 | 2002-06-13 | Advantest Corporation | Douille d'essai pour composants electroniques, et appareil d'essai pour composants electroniques utilisant cette douille |
US6932635B2 (en) | 2000-12-07 | 2005-08-23 | Advantest Corporation | Electronic component testing socket and electronic component testing apparatus using the same |
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