JPH0115014B2 - - Google Patents

Info

Publication number
JPH0115014B2
JPH0115014B2 JP57170473A JP17047382A JPH0115014B2 JP H0115014 B2 JPH0115014 B2 JP H0115014B2 JP 57170473 A JP57170473 A JP 57170473A JP 17047382 A JP17047382 A JP 17047382A JP H0115014 B2 JPH0115014 B2 JP H0115014B2
Authority
JP
Japan
Prior art keywords
filter paper
sample
ray analysis
fluorescence
surrounded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57170473A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5958344A (ja
Inventor
Takeshi Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP17047382A priority Critical patent/JPS5958344A/ja
Publication of JPS5958344A publication Critical patent/JPS5958344A/ja
Publication of JPH0115014B2 publication Critical patent/JPH0115014B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Filtering Materials (AREA)
JP17047382A 1982-09-28 1982-09-28 けい光ｘ線分析供試用ろ紙 Granted JPS5958344A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17047382A JPS5958344A (ja) 1982-09-28 1982-09-28 けい光ｘ線分析供試用ろ紙

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17047382A JPS5958344A (ja) 1982-09-28 1982-09-28 けい光ｘ線分析供試用ろ紙

Publications (2)

Publication Number Publication Date
JPS5958344A JPS5958344A (ja) 1984-04-04
JPH0115014B2 true JPH0115014B2 (enExample) 1989-03-15

Family

ID=15905591

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17047382A Granted JPS5958344A (ja) 1982-09-28 1982-09-28 けい光ｘ線分析供試用ろ紙

Country Status (1)

Country Link
JP (1) JPS5958344A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60214262A (ja) * 1984-04-10 1985-10-26 Kawasaki Steel Corp 自動定量点滴装置
US20030068829A1 (en) * 2001-06-25 2003-04-10 Symyx Technologies, Inc. High throughput crystallographic screening of materials
WO2005012889A1 (ja) * 2003-08-01 2005-02-10 Rigaku Industrial Corporation 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48104386U (enExample) * 1972-03-06 1973-12-05
JPS6219967Y2 (enExample) * 1978-02-21 1987-05-21

Also Published As

Publication number Publication date
JPS5958344A (ja) 1984-04-04

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