JPH01135375U - - Google Patents

Info

Publication number
JPH01135375U
JPH01135375U JP1988029322U JP2932288U JPH01135375U JP H01135375 U JPH01135375 U JP H01135375U JP 1988029322 U JP1988029322 U JP 1988029322U JP 2932288 U JP2932288 U JP 2932288U JP H01135375 U JPH01135375 U JP H01135375U
Authority
JP
Japan
Prior art keywords
under test
device under
pseudo
inductor
diagram showing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1988029322U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0714916Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988029322U priority Critical patent/JPH0714916Y2/ja
Priority to GB8904008A priority patent/GB2217466B/en
Priority to US07/318,286 priority patent/US4885528A/en
Publication of JPH01135375U publication Critical patent/JPH01135375U/ja
Application granted granted Critical
Publication of JPH0714916Y2 publication Critical patent/JPH0714916Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/48—Analogue computers for specific processes, systems or devices, e.g. simulators
    • G06G7/62—Analogue computers for specific processes, systems or devices, e.g. simulators for electric systems or apparatus
    • G06G7/625—Analogue computers for specific processes, systems or devices, e.g. simulators for electric systems or apparatus for filters; for delay lines
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00—Networks using active elements
    • H03H11/46—One-port networks
    • H03H11/48—One-port networks simulating reactances
    • H03H11/485—Simulating inductances using operational amplifiers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP1988029322U 1988-03-04 1988-03-04 回路定数測定装置 Expired - Lifetime JPH0714916Y2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1988029322U JPH0714916Y2 (ja) 1988-03-04 1988-03-04 回路定数測定装置
GB8904008A GB2217466B (en) 1988-03-04 1989-02-22 Apparatus for measuring an ac electrical parameter of a device
US07/318,286 US4885528A (en) 1988-03-04 1989-03-03 Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988029322U JPH0714916Y2 (ja) 1988-03-04 1988-03-04 回路定数測定装置

Publications (2)

Publication Number Publication Date
JPH01135375U true JPH01135375U (US20030157025A1-20030821-C00031.png) 1989-09-18
JPH0714916Y2 JPH0714916Y2 (ja) 1995-04-10

Family

ID=12272991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988029322U Expired - Lifetime JPH0714916Y2 (ja) 1988-03-04 1988-03-04 回路定数測定装置

Country Status (3)

Country Link
US (1) US4885528A (US20030157025A1-20030821-C00031.png)
JP (1) JPH0714916Y2 (US20030157025A1-20030821-C00031.png)
GB (1) GB2217466B (US20030157025A1-20030821-C00031.png)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH026268U (US20030157025A1-20030821-C00031.png) * 1988-06-28 1990-01-16
US5057772A (en) * 1990-05-29 1991-10-15 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
WO1992004669A1 (en) * 1990-09-06 1992-03-19 Drexelbrook Controls Inc. Improved imstrumentation system
US5303179A (en) * 1992-01-03 1994-04-12 Simmonds Precision Products, Inc. Method and apparatus for electronically simulating capacitors
US5485115A (en) * 1993-12-02 1996-01-16 Fluke Corporation Impedance synthesizer
US6281699B1 (en) * 2000-03-15 2001-08-28 Teradyne, Inc. Detector with common mode comparator for automatic test equipment
US7253680B2 (en) * 2003-05-21 2007-08-07 World Energy Labs (2), Inc. Amplifier system with current-mode servo feedback
US8896331B2 (en) * 2008-02-01 2014-11-25 Keithley Instruments, Inc. Impedance measuring instrument
US8365703B2 (en) * 2010-01-22 2013-02-05 Continental Automotive Systems Us, Inc. Switch-mode synthetic power inductor
US8884198B2 (en) * 2010-01-22 2014-11-11 Continental Automotive Systems, Inc. Parametric temperature regulation of induction heated load
US9829520B2 (en) * 2011-08-22 2017-11-28 Keithley Instruments, Llc Low frequency impedance measurement with source measure units
JP5773102B2 (ja) * 2013-05-14 2015-09-02 株式会社村田製作所 インダクタのシミュレーション方法並びにインダクタのシミュレーション装置およびその使用方法
GB2527572A (en) * 2014-06-26 2015-12-30 Voltech Instr Ltd DC Bias unit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60231178A (ja) * 1984-05-01 1985-11-16 Kanto Marubishi Denshi:Kk インピ−ダンス測定器
JPS62139130U (US20030157025A1-20030821-C00031.png) * 1986-02-25 1987-09-02

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2310657A1 (fr) * 1975-05-06 1976-12-03 Ibm France Transformateur a elements actifs
US3993968A (en) * 1975-12-24 1976-11-23 Gte Automatic Electric Laboratories Incorporated Single amplifier network for simulating an inductor
SU714425A1 (ru) * 1977-11-24 1980-02-05 Ордена Октябрьской Революции Всесоюзный Государственный Проектно- Изыскательский И Научно-Исследовательский Институт Энергетических Систем И Электрических Сетей "Энергосетьпроект" Устройство дл моделировани незаземленной индуктивности
EP0024011B1 (de) * 1979-08-09 1983-08-31 Siemens Aktiengesellschaft Elektrische Filterschaltung unter Verwendung von wenigstens einer simulierten Induktivität, die gesteuerte Schalter, Kondensatoren und Verstärker enthält
US4333157A (en) * 1980-06-25 1982-06-01 Gte Automatic Electric Laboratories, Inc. Switched-capacitor floating-inductor simulation circuit
US4383305A (en) * 1980-12-22 1983-05-10 Gte Automatic Electric Laboratories, Inc. Simulation circuit employing switched capacitors
SU1038954A1 (ru) * 1982-03-17 1983-08-30 Одесский ордена Трудового Красного Знамени политехнический институт Устройство дл моделировани нелинейной характеристики индуктивного элемента

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60231178A (ja) * 1984-05-01 1985-11-16 Kanto Marubishi Denshi:Kk インピ−ダンス測定器
JPS62139130U (US20030157025A1-20030821-C00031.png) * 1986-02-25 1987-09-02

Also Published As

Publication number Publication date
GB2217466A (en) 1989-10-25
JPH0714916Y2 (ja) 1995-04-10
GB8904008D0 (en) 1989-04-05
US4885528A (en) 1989-12-05
GB2217466B (en) 1992-06-17

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