JPH01134270U - - Google Patents

Info

Publication number
JPH01134270U
JPH01134270U JP3175288U JP3175288U JPH01134270U JP H01134270 U JPH01134270 U JP H01134270U JP 3175288 U JP3175288 U JP 3175288U JP 3175288 U JP3175288 U JP 3175288U JP H01134270 U JPH01134270 U JP H01134270U
Authority
JP
Japan
Prior art keywords
hybrid circuit
probe card
substrate
active parts
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3175288U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3175288U priority Critical patent/JPH01134270U/ja
Publication of JPH01134270U publication Critical patent/JPH01134270U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3175288U 1988-03-09 1988-03-09 Pending JPH01134270U (US20110009641A1-20110113-C00185.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3175288U JPH01134270U (US20110009641A1-20110113-C00185.png) 1988-03-09 1988-03-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3175288U JPH01134270U (US20110009641A1-20110113-C00185.png) 1988-03-09 1988-03-09

Publications (1)

Publication Number Publication Date
JPH01134270U true JPH01134270U (US20110009641A1-20110113-C00185.png) 1989-09-13

Family

ID=31257844

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3175288U Pending JPH01134270U (US20110009641A1-20110113-C00185.png) 1988-03-09 1988-03-09

Country Status (1)

Country Link
JP (1) JPH01134270U (US20110009641A1-20110113-C00185.png)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51121267A (en) * 1975-04-17 1976-10-23 Seiko Epson Corp Semiconductor wafer measuring device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51121267A (en) * 1975-04-17 1976-10-23 Seiko Epson Corp Semiconductor wafer measuring device

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