JPH01128109U - - Google Patents
Info
- Publication number
- JPH01128109U JPH01128109U JP2353988U JP2353988U JPH01128109U JP H01128109 U JPH01128109 U JP H01128109U JP 2353988 U JP2353988 U JP 2353988U JP 2353988 U JP2353988 U JP 2353988U JP H01128109 U JPH01128109 U JP H01128109U
- Authority
- JP
- Japan
- Prior art keywords
- relationship
- distance
- amount
- phase delay
- wavelengths
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 101100028789 Arabidopsis thaliana PBS1 gene Proteins 0.000 description 1
- 101100139907 Arabidopsis thaliana RAR1 gene Proteins 0.000 description 1
- 101100028790 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) PBS2 gene Proteins 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Description
第１図は本考案の測長器の光源の一実施例を示
す構成図、第２図は従来の測長器の光源の一実施
例を示す構成図である。
１……波長安定化レーザ光源、２……波長可変
レーザ、３……位相検出回路、４……演算回路、
５ａ，５ｂ……安定化回路、Ｐ１〜ｐ２……λ／
２板、ＣＣ１，ＣＣ２……キユーブコーナ、ＨＭ
Ｒ１……ハーフミラー、Ｍ……ミラー、ＰＢＳ１
〜ＰＢＳ２……偏光ビームスプリツタ、ＡＯＭ…
…音響光学変調器。
FIG. 1 is a block diagram showing an embodiment of a light source of a length measuring device according to the present invention, and FIG. 2 is a block diagram showing an embodiment of a light source of a conventional length measuring instrument. 1... Wavelength stabilized laser light source, 2... Tunable wavelength laser, 3... Phase detection circuit, 4... Arithmetic circuit,
5a, 5b...Stabilization circuit, P1-p2...λ/
2 boards, CC1, CC2...cube corner, HM
R1...Half mirror, M...Mirror, PBS1
~PBS2...Polarizing beam splitter, AOM...
...acousto-optic modulator.
Claims (1)
の波長の異なる光を使用して測定対象までの距離
に応じた光の位相遅れ量をそれぞれ測定するとと
もに、これらの波長と位相遅れ量との関係から前
記測定対象までの距離を求めるようにした測長器
の光源において、前記光源は一方が波長安定化レ
ーザ、他方が波長可変レーザからなることを特徴
とする測長器の光源。 Using Michelson's interference optical system, we use two or more lights with different wavelengths to measure the amount of phase delay of each light depending on the distance to the measurement target, and also calculate the relationship between these wavelengths and the amount of phase delay. A light source for a length measuring device that determines the distance to the object to be measured from a relationship, wherein one of the light sources is a wavelength stabilized laser and the other is a wavelength tunable laser.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2353988U JPH01128109U (en) | 1988-02-24 | 1988-02-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2353988U JPH01128109U (en) | 1988-02-24 | 1988-02-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01128109U true JPH01128109U (en) | 1989-09-01 |
Family
ID=31242614
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2353988U Pending JPH01128109U (en) | 1988-02-24 | 1988-02-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01128109U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS578402A (en) * | 1980-06-20 | 1982-01-16 | Hitachi Ltd | Checking device for aspherical shape |
| JPS5990003A (en) * | 1982-09-01 | 1984-05-24 | ベブ・カ−ル・ツアイス・イエ−ナ | Measuring device for interference |
-
1988
- 1988-02-24 JP JP2353988U patent/JPH01128109U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS578402A (en) * | 1980-06-20 | 1982-01-16 | Hitachi Ltd | Checking device for aspherical shape |
| JPS5990003A (en) * | 1982-09-01 | 1984-05-24 | ベブ・カ−ル・ツアイス・イエ−ナ | Measuring device for interference |
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