JPH01124574U - - Google Patents
Info
- Publication number
- JPH01124574U JPH01124574U JP1886488U JP1886488U JPH01124574U JP H01124574 U JPH01124574 U JP H01124574U JP 1886488 U JP1886488 U JP 1886488U JP 1886488 U JP1886488 U JP 1886488U JP H01124574 U JPH01124574 U JP H01124574U
- Authority
- JP
- Japan
- Prior art keywords
- test probe
- tip
- conductive attachment
- pin
- movable support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 10
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1886488U JPH0755505Y2 (ja) | 1988-02-16 | 1988-02-16 | インサーキットテスタ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1886488U JPH0755505Y2 (ja) | 1988-02-16 | 1988-02-16 | インサーキットテスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01124574U true JPH01124574U (ru) | 1989-08-24 |
JPH0755505Y2 JPH0755505Y2 (ja) | 1995-12-20 |
Family
ID=31233880
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1886488U Expired - Lifetime JPH0755505Y2 (ja) | 1988-02-16 | 1988-02-16 | インサーキットテスタ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0755505Y2 (ru) |
-
1988
- 1988-02-16 JP JP1886488U patent/JPH0755505Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0755505Y2 (ja) | 1995-12-20 |
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