JPH01118378U - - Google Patents
Info
- Publication number
- JPH01118378U JPH01118378U JP1163788U JP1163788U JPH01118378U JP H01118378 U JPH01118378 U JP H01118378U JP 1163788 U JP1163788 U JP 1163788U JP 1163788 U JP1163788 U JP 1163788U JP H01118378 U JPH01118378 U JP H01118378U
- Authority
- JP
- Japan
- Prior art keywords
- section
- measurement circuit
- pulse
- voltage
- diagram showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1163788U JPH01118378U (xx) | 1988-01-30 | 1988-01-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1163788U JPH01118378U (xx) | 1988-01-30 | 1988-01-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01118378U true JPH01118378U (xx) | 1989-08-10 |
Family
ID=31220366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1163788U Pending JPH01118378U (xx) | 1988-01-30 | 1988-01-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01118378U (xx) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007292675A (ja) * | 2006-04-27 | 2007-11-08 | Shindengen Electric Mfg Co Ltd | 信頼性試験装置 |
-
1988
- 1988-01-30 JP JP1163788U patent/JPH01118378U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007292675A (ja) * | 2006-04-27 | 2007-11-08 | Shindengen Electric Mfg Co Ltd | 信頼性試験装置 |
JP4640834B2 (ja) * | 2006-04-27 | 2011-03-02 | 新電元工業株式会社 | 信頼性試験装置 |