JPH01115349U - - Google Patents

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Publication number
JPH01115349U
JPH01115349U JP1988008856U JP885688U JPH01115349U JP H01115349 U JPH01115349 U JP H01115349U JP 1988008856 U JP1988008856 U JP 1988008856U JP 885688 U JP885688 U JP 885688U JP H01115349 U JPH01115349 U JP H01115349U
Authority
JP
Japan
Prior art keywords
injection device
noise injection
view
electromagnetic noise
center conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1988008856U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988008856U priority Critical patent/JPH01115349U/ja
Publication of JPH01115349U publication Critical patent/JPH01115349U/ja
Pending legal-status Critical Current

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  • Monitoring And Testing Of Transmission In General (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例に係る測定系の構成図
、第2図は中心導体の詳細斜視図、第3図はTE
Mセルに被試験体を載置した状態を示す側面図、
第4図はTEMセル内に被試験体が存在すること
によりインピーダンスが変化する状態を示す図、
第5図は他の実施例のTEMセルの平面図、第6
図は電磁波の伝播を示す図、第7図は従来のTE
Mセルの平面図、第8図はその横断面図、第9図
はその縦断面図、第10図は測定系全体の側面図
、第11図は中心導体の幅が変化したとき、イン
ピーダンスが変化する状態を示す図、第12図は
TEMセル内に被試験体を載置した状態を示す側
面図である。 1……TEMセル、11……中心導体、12…
…板体。
Fig. 1 is a configuration diagram of a measurement system according to an embodiment of the present invention, Fig. 2 is a detailed perspective view of the center conductor, and Fig. 3 is a TE
A side view showing a state where the test object is placed on the M cell,
FIG. 4 is a diagram showing a state in which impedance changes due to the presence of a test object in a TEM cell,
FIG. 5 is a plan view of a TEM cell according to another embodiment, and FIG.
The figure shows the propagation of electromagnetic waves, and Figure 7 shows the conventional TE
A plan view of the M cell, Figure 8 is its cross-sectional view, Figure 9 is its longitudinal cross-sectional view, Figure 10 is a side view of the entire measurement system, and Figure 11 shows the impedance as the width of the center conductor changes. FIG. 12 is a side view showing the state in which the test object is placed in the TEM cell. 1...TEM cell, 11...center conductor, 12...
...Plate body.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器の電磁波障害評価に用いられる電磁ノ
イズ注入装置において、該電磁ノイズ注入装置の
中心導体を、面積形状が変化しうる板体によつて
構成した電磁ノイズ注入装置。
An electromagnetic noise injection device used for evaluating electromagnetic interference in electronic equipment, wherein a center conductor of the electromagnetic noise injection device is constituted by a plate whose area shape can be changed.
JP1988008856U 1988-01-28 1988-01-28 Pending JPH01115349U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988008856U JPH01115349U (en) 1988-01-28 1988-01-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988008856U JPH01115349U (en) 1988-01-28 1988-01-28

Publications (1)

Publication Number Publication Date
JPH01115349U true JPH01115349U (en) 1989-08-03

Family

ID=31215085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988008856U Pending JPH01115349U (en) 1988-01-28 1988-01-28

Country Status (1)

Country Link
JP (1) JPH01115349U (en)

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