JPH01105842U

JPH01105842U -

Info

Publication number: JPH01105842U
Application number: JP192788U
Authority: JP
Priority date: 1988-01-11
Filing date: 1988-01-11
Publication date: 1989-07-17

Description

[Brief explanation of the drawing]

第１図は本考案に係る偏心測定装置の実施例を
示す光学配置図、第２図は同上実施例による異な
る測定態様を示す光学配置図である。２……指標、６，６′……第１レンズ群、７，
７′……第２レンズ群、２０……コリメータレン
ズ、２１，２１′……対物レンズ、８……被測定
レンズ、８１，８２，８３……測定面。 FIG. 1 is an optical layout diagram showing an embodiment of the eccentricity measuring device according to the present invention, and FIG. 2 is an optical layout diagram showing different measurement modes according to the same embodiment. 2... Index, 6, 6'... First lens group, 7,
7'... Second lens group, 20... Collimator lens, 21, 21'... Objective lens, 8... Lens to be measured, 81, 82, 83... Measurement surface.

Claims

[Claims for Utility Model Registration] An index light image is projected onto the center of curvature of the lens surface to be measured through a collimator lens and an objective lens, and the amount of deviation of the reflected image of the index light image by the lens surface to be measured is measured. In an eccentricity measuring device for measuring the amount of eccentricity of a surface, the objective lens is composed of a first lens group and a second lens group whose mutual spacing can be changed, and the first lens group has a positive refractive power and a second lens group has a positive refractive power. An eccentricity measuring device characterized in that it is capable of converting between a state in which the lens group has negative refractive power and a state in which the first lens group has negative refractive power and the second lens group has positive refractive power.