JP7846512B2 - 画像処理装置、画像処理方法及びプログラム - Google Patents

画像処理装置、画像処理方法及びプログラム

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Publication number
JP7846512B2
JP7846512B2 JP2021173413A JP2021173413A JP7846512B2 JP 7846512 B2 JP7846512 B2 JP 7846512B2 JP 2021173413 A JP2021173413 A JP 2021173413A JP 2021173413 A JP2021173413 A JP 2021173413A JP 7846512 B2 JP7846512 B2 JP 7846512B2
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Japan
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deformation
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actual size
image
attributes
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2021173413A
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English (en)
Japanese (ja)
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JP2023063112A (ja
JP2023063112A5 (https=
Inventor
雄一 日塔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2021173413A priority Critical patent/JP7846512B2/ja
Priority to US17/966,123 priority patent/US12361533B2/en
Publication of JP2023063112A publication Critical patent/JP2023063112A/ja
Publication of JP2023063112A5 publication Critical patent/JP2023063112A5/ja
Application granted granted Critical
Publication of JP7846512B2 publication Critical patent/JP7846512B2/ja
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/77—Retouching; Inpainting; Scratch removal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Image Analysis (AREA)
JP2021173413A 2021-10-22 2021-10-22 画像処理装置、画像処理方法及びプログラム Active JP7846512B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2021173413A JP7846512B2 (ja) 2021-10-22 2021-10-22 画像処理装置、画像処理方法及びプログラム
US17/966,123 US12361533B2 (en) 2021-10-22 2022-10-14 Image processing apparatus and image processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021173413A JP7846512B2 (ja) 2021-10-22 2021-10-22 画像処理装置、画像処理方法及びプログラム

Publications (3)

Publication Number Publication Date
JP2023063112A JP2023063112A (ja) 2023-05-09
JP2023063112A5 JP2023063112A5 (https=) 2024-10-07
JP7846512B2 true JP7846512B2 (ja) 2026-04-15

Family

ID=86055764

Family Applications (1)

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JP2021173413A Active JP7846512B2 (ja) 2021-10-22 2021-10-22 画像処理装置、画像処理方法及びプログラム

Country Status (2)

Country Link
US (1) US12361533B2 (https=)
JP (1) JP7846512B2 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120105001A (zh) * 2025-02-13 2025-06-06 长江勘测规划设计研究有限责任公司 隧道挤压变形预测方法及装置、设备及存储介质

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018198053A (ja) 2017-05-22 2018-12-13 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11580398B2 (en) * 2016-10-14 2023-02-14 KLA-Tenor Corp. Diagnostic systems and methods for deep learning models configured for semiconductor applications
JP6474946B1 (ja) 2017-06-28 2019-02-27 株式会社オプティム 画像解析結果提供システム、画像解析結果提供方法、およびプログラム
WO2020059706A1 (ja) * 2018-09-20 2020-03-26 富士フイルム株式会社 学習用データ収集装置、学習用データ収集方法、及びプログラム
JP7547069B2 (ja) * 2020-04-06 2024-09-09 キヤノン株式会社 情報処理装置、情報処理装置の情報処理方法およびプログラム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018198053A (ja) 2017-05-22 2018-12-13 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム

Also Published As

Publication number Publication date
US12361533B2 (en) 2025-07-15
US20230130917A1 (en) 2023-04-27
JP2023063112A (ja) 2023-05-09

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