JP7841542B2 - ガス濃度測定装置、ガス濃度測定方法、およびプログラム - Google Patents

ガス濃度測定装置、ガス濃度測定方法、およびプログラム

Info

Publication number
JP7841542B2
JP7841542B2 JP2023566091A JP2023566091A JP7841542B2 JP 7841542 B2 JP7841542 B2 JP 7841542B2 JP 2023566091 A JP2023566091 A JP 2023566091A JP 2023566091 A JP2023566091 A JP 2023566091A JP 7841542 B2 JP7841542 B2 JP 7841542B2
Authority
JP
Japan
Prior art keywords
time
series
gas
data
target pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023566091A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023105856A1 (https=
JPWO2023105856A5 (https=
Inventor
基広 浅野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Publication of JPWO2023105856A1 publication Critical patent/JPWO2023105856A1/ja
Publication of JPWO2023105856A5 publication Critical patent/JPWO2023105856A5/ja
Application granted granted Critical
Publication of JP7841542B2 publication Critical patent/JP7841542B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/026—Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/002—Investigating fluid-tightness of structures by using thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/38—Investigating fluid-tightness of structures by using light
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/143—Sensing or illuminating at different wavelengths
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/62—Extraction of image or video features relating to a temporal dimension, e.g. time-based feature extraction; Pattern tracking
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/50—Context or environment of the image
    • G06V20/52—Surveillance or monitoring of activities, e.g. for recognising suspicious objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0031—General constructional details of gas analysers, e.g. portable test equipment concerning the detector comprising two or more sensors, e.g. a sensor array
    • G01N33/0034—General constructional details of gas analysers, e.g. portable test equipment concerning the detector comprising two or more sensors, e.g. a sensor array comprising neural networks or related mathematical techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Radiation Pyrometers (AREA)
JP2023566091A 2021-12-10 2022-08-23 ガス濃度測定装置、ガス濃度測定方法、およびプログラム Active JP7841542B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021200885 2021-12-10
JP2021200885 2021-12-10
PCT/JP2022/031650 WO2023105856A1 (ja) 2021-12-10 2022-08-23 ガス濃度測定装置、ガス濃度測定方法、およびプログラム

Publications (3)

Publication Number Publication Date
JPWO2023105856A1 JPWO2023105856A1 (https=) 2023-06-15
JPWO2023105856A5 JPWO2023105856A5 (https=) 2024-08-21
JP7841542B2 true JP7841542B2 (ja) 2026-04-07

Family

ID=86730121

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023566091A Active JP7841542B2 (ja) 2021-12-10 2022-08-23 ガス濃度測定装置、ガス濃度測定方法、およびプログラム

Country Status (4)

Country Link
US (1) US20250362226A1 (https=)
EP (1) EP4446717A4 (https=)
JP (1) JP7841542B2 (https=)
WO (1) WO2023105856A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118538016B (zh) * 2024-07-26 2024-09-27 浙江万胜智能科技股份有限公司 基于图像监视的电网安全预警方法及装置
CN120831384B (zh) * 2025-09-22 2025-11-25 浙江红谱科技有限公司 基于多光谱特征融合的气体泄漏定量标定方法及系统
CN120907082B (zh) * 2025-10-09 2025-12-12 益通天然气股份有限公司 基于多传感器反馈的天然气储罐安全监测系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017073430A1 (ja) 2015-10-29 2017-05-04 コニカミノルタ株式会社 ガス検知用画像処理装置、ガス検知用画像処理方法及びガス検知用画像処理プログラム
WO2017104617A1 (ja) 2015-12-15 2017-06-22 コニカミノルタ株式会社 ガス検知用画像処理装置、ガス検知用画像処理方法、ガス検知用画像処理プログラム、ガス検知用画像処理プログラムを記録したコンピュータ読み取り可能な記録媒体、及び、ガス検知システム
JP2017181067A (ja) 2016-03-28 2017-10-05 株式会社日立アドバンストシステムズ ガス可視化システム、ガス可視化方法
US20170363541A1 (en) 2015-03-02 2017-12-21 Flir Systems Ab Quantifying gas in passive optical gas imaging
JP2019066465A (ja) 2017-09-29 2019-04-25 コニカ ミノルタ ラボラトリー ユー．エス．エー．，インコーポレイテッド 光学式気体撮像カメラ用の背景放射輝度推定および気体濃度・長定量の方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5343054B2 (ja) 2010-09-09 2013-11-13 三菱電機ビルテクノサービス株式会社 ガス漏れ検出装置
US9225915B2 (en) * 2012-07-06 2015-12-29 Providence Photonics, Llc Calibration and quantification method for gas imaging camera
JP6344533B2 (ja) 2015-12-15 2018-06-20 コニカミノルタ株式会社 ガス濃度厚み積測定装置、ガス濃度厚み積測定方法、ガス濃度厚み積測定プログラム、及び、ガス濃度厚み積測定プログラムを記録したコンピュータ読み取り可能な記録媒体

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170363541A1 (en) 2015-03-02 2017-12-21 Flir Systems Ab Quantifying gas in passive optical gas imaging
WO2017073430A1 (ja) 2015-10-29 2017-05-04 コニカミノルタ株式会社 ガス検知用画像処理装置、ガス検知用画像処理方法及びガス検知用画像処理プログラム
WO2017104617A1 (ja) 2015-12-15 2017-06-22 コニカミノルタ株式会社 ガス検知用画像処理装置、ガス検知用画像処理方法、ガス検知用画像処理プログラム、ガス検知用画像処理プログラムを記録したコンピュータ読み取り可能な記録媒体、及び、ガス検知システム
JP2017181067A (ja) 2016-03-28 2017-10-05 株式会社日立アドバンストシステムズ ガス可視化システム、ガス可視化方法
JP2019066465A (ja) 2017-09-29 2019-04-25 コニカ ミノルタ ラボラトリー ユー．エス．エー．，インコーポレイテッド 光学式気体撮像カメラ用の背景放射輝度推定および気体濃度・長定量の方法

Also Published As

Publication number Publication date
WO2023105856A1 (ja) 2023-06-15
US20250362226A1 (en) 2025-11-27
JPWO2023105856A1 (https=) 2023-06-15
EP4446717A4 (en) 2025-05-21
EP4446717A1 (en) 2024-10-16

Similar Documents

Publication Publication Date Title
JP7841542B2 (ja) ガス濃度測定装置、ガス濃度測定方法、およびプログラム
CN111968080A (zh) 一种基于高光谱和深度学习的肥城桃内外品质检测方法
CN111047568A (zh) 一种漏汽缺陷检测识别方法及系统
CN102589705B (zh) 热成像仪单黑体温控mrtd野外在线自动检测装置及检测方法
CN109752721B (zh) 具有扫描和分析能力的便携式声学成像工具
JP2019203879A (ja) 光学式気体撮像カメラ用の気体のマルチスペクトル定量・識別方法
CN115187553B (zh) 基于显示散斑图像的dic应变检测装置及方法
CN117541483B (zh) 一种扩散板的结构性能评估方法及系统
US11378521B2 (en) Optical condition determination system and optical condition determination method
JP2017090190A (ja) ガス検知用画像処理装置、ガス検知用画像処理方法及びガス検知用画像処理プログラム
US20220067514A1 (en) Inference apparatus, method, non-transitory computer readable medium and learning apparatus
JP7772067B2 (ja) ガス濃度特徴量推定装置、ガス濃度特徴量推定方法、プログラム、およびガス濃度特徴量推論モデル生成装置
CN119224001A (zh) 一种薄膜表面缺陷检测方法及系统
CN118747731A (zh) 一种基于ai的面料瑕疵识别系统
JPWO2023105856A5 (https=)
Yang et al. Steerable pyramid with subpixel compensation for remotely measuring and magnifying dynamic vibration of moving objects
Fleury et al. A new approach based on computer vision and non-linear Kalman filtering to monitor the nebulization quality of oil flames
CN116910489B (zh) 基于人工智能的墙体防渗检测方法及相关装置
JP2007170961A (ja) 検査装置及び検査方法
CN118861689A (zh) 基于机器学习的智能炒菜加工工艺数据监控方法及系统
CN106323514A (zh) 一种基于ips-dgs方法的透明材料应力测量装置
TWI494549B (zh) 利用多核心支援向量迴歸之背光模組輝度檢測方法及檢測器
WO2021095112A1 (ja) ガス検知装置、画像処理制御方法および画像処理制御プログラム
CN119942709B (zh) 声光热联合感知的森林火灾实时监测预警装置及方法
CN120121121B (zh) 气体流量检测方法及装置、设备、存储介质

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240626

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20250326

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20260106

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20260209

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20260224

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20260309

R150 Certificate of patent or registration of utility model

Ref document number: 7841542

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150