JP7775892B2 - 質量分析装置およびその制御方法 - Google Patents

質量分析装置およびその制御方法

Info

Publication number
JP7775892B2
JP7775892B2 JP2023562144A JP2023562144A JP7775892B2 JP 7775892 B2 JP7775892 B2 JP 7775892B2 JP 2023562144 A JP2023562144 A JP 2023562144A JP 2023562144 A JP2023562144 A JP 2023562144A JP 7775892 B2 JP7775892 B2 JP 7775892B2
Authority
JP
Japan
Prior art keywords
ion
collision cell
mass spectrometer
electrode
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023562144A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023089895A1 (https=
JPWO2023089895A5 (https=
Inventor
遼 藤田
知義 松下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of JPWO2023089895A1 publication Critical patent/JPWO2023089895A1/ja
Publication of JPWO2023089895A5 publication Critical patent/JPWO2023089895A5/ja
Application granted granted Critical
Publication of JP7775892B2 publication Critical patent/JP7775892B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2023562144A 2021-11-16 2022-08-26 質量分析装置およびその制御方法 Active JP7775892B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021186359 2021-11-16
JP2021186359 2021-11-16
PCT/JP2022/032134 WO2023089895A1 (ja) 2021-11-16 2022-08-26 質量分析装置およびその制御方法

Publications (3)

Publication Number Publication Date
JPWO2023089895A1 JPWO2023089895A1 (https=) 2023-05-25
JPWO2023089895A5 JPWO2023089895A5 (https=) 2024-06-28
JP7775892B2 true JP7775892B2 (ja) 2025-11-26

Family

ID=86396635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023562144A Active JP7775892B2 (ja) 2021-11-16 2022-08-26 質量分析装置およびその制御方法

Country Status (5)

Country Link
US (1) US20250037984A1 (https=)
EP (1) EP4435427A4 (https=)
JP (1) JP7775892B2 (https=)
CN (1) CN118251749A (https=)
WO (1) WO2023089895A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024064706A (ja) * 2022-10-28 2024-05-14 株式会社島津製作所 質量分析装置および分析条件の設定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014181396A1 (ja) 2013-05-08 2014-11-13 株式会社島津製作所 質量分析装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10241625A (ja) 1997-02-24 1998-09-11 Hitachi Ltd プラズマイオン源質量分析装置及び方法
CN109716484B (zh) * 2016-09-21 2021-02-09 株式会社岛津制作所 质谱分析装置
JP6927432B2 (ja) * 2018-05-31 2021-09-01 株式会社島津製作所 質量分析装置
JP7095579B2 (ja) * 2018-12-05 2022-07-05 株式会社島津製作所 質量分析装置
GB201904135D0 (en) * 2019-03-26 2019-05-08 Thermo Fisher Scient Bremen Gmbh Interference suppression in mass spectrometers

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014181396A1 (ja) 2013-05-08 2014-11-13 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
EP4435427A1 (en) 2024-09-25
US20250037984A1 (en) 2025-01-30
EP4435427A4 (en) 2025-12-17
CN118251749A (zh) 2024-06-25
JPWO2023089895A1 (https=) 2023-05-25
WO2023089895A1 (ja) 2023-05-25

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