JP7664919B2 - 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム - Google Patents

異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム Download PDF

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JP7664919B2
JP7664919B2 JP2022526581A JP2022526581A JP7664919B2 JP 7664919 B2 JP7664919 B2 JP 7664919B2 JP 2022526581 A JP2022526581 A JP 2022526581A JP 2022526581 A JP2022526581 A JP 2022526581A JP 7664919 B2 JP7664919 B2 JP 7664919B2
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cause
modulation
degree
abnormality
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JPWO2021241578A1 (https=
Inventor
洋輝 岡
幸一 山野
史浩 三好
英俊 小園
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Daicel Corp
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Daicel Corp
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Program-control systems
    • G05B19/02Program-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
    • G05B19/406Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by monitoring or safety
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/34Director, elements to supervisory
    • G05B2219/34465Safety, control of correct operation, abnormal states
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2022526581A 2020-05-29 2021-05-25 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム Active JP7664919B2 (ja)

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JP2020095038 2020-05-29
JP2020095038 2020-05-29
PCT/JP2021/019800 WO2021241578A1 (ja) 2020-05-29 2021-05-25 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

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JPWO2021241578A1 JPWO2021241578A1 (https=) 2021-12-02
JP7664919B2 true JP7664919B2 (ja) 2025-04-18

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US (1) US20230229136A1 (https=)
EP (1) EP4160341A4 (https=)
JP (1) JP7664919B2 (https=)
CN (1) CN115917460B (https=)
WO (1) WO2021241578A1 (https=)

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Publication number Priority date Publication date Assignee Title
US20230059561A1 (en) * 2021-08-23 2023-02-23 Lawrence Livermore National Security, Llc Identification of arcing hazards in power distribution systems
JP7800113B2 (ja) * 2021-12-21 2026-01-16 オムロン株式会社 情報処理装置、情報処理方法および情報処理プログラム
WO2024053030A1 (ja) * 2022-09-08 2024-03-14 三菱電機株式会社 異常要因推定装置、学習装置、精密診断システム、および、異常要因推定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006276924A (ja) 2005-03-28 2006-10-12 Hitachi Ltd 設備機器診断装置及び設備機器診断プログラム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02236199A (ja) * 1989-03-09 1990-09-19 Toshiba Corp プロセス診断装置
JPH06309584A (ja) * 1993-04-27 1994-11-04 Toshiba Corp プラント運転支援装置
WO2011104760A1 (ja) * 2010-02-26 2011-09-01 株式会社 日立製作所 故障原因診断システムおよびその方法
JP2014056598A (ja) * 2013-11-14 2014-03-27 Hitachi Ltd 異常検知方法及びそのシステム
JPWO2017109903A1 (ja) * 2015-12-24 2018-03-22 株式会社東芝 異常原因推定装置及び異常原因推定方法
US20210116331A1 (en) * 2016-12-08 2021-04-22 Nec Corporation Anomaly analysis method, program, and system
JP6842299B2 (ja) 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
JP6862190B2 (ja) 2017-01-24 2021-04-21 株式会社東芝 プロセス診断装置、プロセス診断方法及びプロセス診断システム
JP6711323B2 (ja) * 2017-07-04 2020-06-17 Jfeスチール株式会社 プロセスの異常状態診断方法および異常状態診断装置
JP6884078B2 (ja) 2017-09-21 2021-06-09 三菱パワー株式会社 プラント異常監視システム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006276924A (ja) 2005-03-28 2006-10-12 Hitachi Ltd 設備機器診断装置及び設備機器診断プログラム

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EP4160341A1 (en) 2023-04-05
EP4160341A4 (en) 2024-07-17
CN115917460B (zh) 2025-09-30
US20230229136A1 (en) 2023-07-20
WO2021241578A1 (ja) 2021-12-02
CN115917460A (zh) 2023-04-04
JPWO2021241578A1 (https=) 2021-12-02

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