JP7646620B2 - 処理装置、光電変換システム - Google Patents

処理装置、光電変換システム Download PDF

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Publication number
JP7646620B2
JP7646620B2 JP2022188829A JP2022188829A JP7646620B2 JP 7646620 B2 JP7646620 B2 JP 7646620B2 JP 2022188829 A JP2022188829 A JP 2022188829A JP 2022188829 A JP2022188829 A JP 2022188829A JP 7646620 B2 JP7646620 B2 JP 7646620B2
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Prior art keywords
pixel
data
correction
unit
pixels
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JP2022188829A
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Japanese (ja)
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JP2023118661A (ja
JP2023118661A5 (https=
Inventor
和浩 森本
寛 関根
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to EP23153141.9A priority Critical patent/EP4228278B1/en
Priority to US18/167,004 priority patent/US12219278B2/en
Priority to CN202310125610.3A priority patent/CN116614725A/zh
Publication of JP2023118661A publication Critical patent/JP2023118661A/ja
Publication of JP2023118661A5 publication Critical patent/JP2023118661A5/ja
Priority to US18/948,255 priority patent/US20250071440A1/en
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Publication of JP7646620B2 publication Critical patent/JP7646620B2/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H04N25/674—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources based on the scene itself, e.g. defocusing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2022188829A 2022-02-15 2022-11-28 処理装置、光電変換システム Active JP7646620B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP23153141.9A EP4228278B1 (en) 2022-02-15 2023-01-24 Pixel array correction and photoelectric conversion system
US18/167,004 US12219278B2 (en) 2022-02-15 2023-02-09 Processing apparatus and photoelectric conversion system
CN202310125610.3A CN116614725A (zh) 2022-02-15 2023-02-15 处理装置和光电转换系统
US18/948,255 US20250071440A1 (en) 2022-02-15 2024-11-14 Processing apparatus and photoelectric conversion system

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2022021461 2022-02-15
JP2022021461 2022-02-15
JP2022034577 2022-03-07
JP2022034577 2022-03-07

Publications (3)

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JP2023118661A JP2023118661A (ja) 2023-08-25
JP2023118661A5 JP2023118661A5 (https=) 2024-06-28
JP7646620B2 true JP7646620B2 (ja) 2025-03-17

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2025177027A (ja) 2024-05-22 2025-12-05 キヤノン株式会社 処理装置、光電変換装置、処理方法、および、プログラム

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000092397A (ja) 1998-09-08 2000-03-31 Sharp Corp 固体撮像素子の画素欠陥検出装置
JP2001307079A (ja) 2000-04-26 2001-11-02 Seiko Epson Corp 画像処理装置、画像処理方法および記録媒体
JP2004187163A (ja) 2002-12-05 2004-07-02 Victor Co Of Japan Ltd 画素欠陥補正機能を備えた固体撮像装置
US20070030365A1 (en) 2005-08-03 2007-02-08 Micron Technology, Inc. Correction of cluster defects in imagers
US20070194249A1 (en) 2004-07-29 2007-08-23 Gavrilov Dmitri N System And Method For Cross-Talk Cancellation In A Multilane Fluorescence Detector
JP2011066800A (ja) 2009-09-18 2011-03-31 Canon Inc 画像処理装置及び撮像システム
US20170070692A1 (en) 2015-09-04 2017-03-09 Apple Inc. Correcting pixel defects based on defect history in an image processing pipeline
WO2017130281A1 (ja) 2016-01-25 2017-08-03 オリンパス株式会社 画像処理装置、画像処理方法およびプログラム
WO2018020687A1 (ja) 2016-07-29 2018-02-01 オリンパス株式会社 画像処理装置、画像処理方法およびプログラム
WO2019228944A1 (en) 2018-05-28 2019-12-05 Universitat De Barcelona REDUCING OPTICAL CROSSTALK EFFECTS IN SiPMs
JP2020088654A (ja) 2018-11-27 2020-06-04 キヤノン株式会社 放射線撮像装置、放射線撮像システム、放射線撮像装置の制御方法、および、プログラム
JP2020198601A (ja) 2019-06-05 2020-12-10 キヤノン株式会社 撮像装置及びその制御方法
JP2021090134A (ja) 2019-12-03 2021-06-10 キヤノン株式会社 撮像装置およびその制御方法
WO2021172216A1 (ja) 2020-02-27 2021-09-02 ソニーセミコンダクタソリューションズ株式会社 受光素子、光学デバイス、及び電子機器

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06151801A (ja) * 1992-11-13 1994-05-31 Canon Inc 光電変換装置及び光電変換装置の製造方法

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000092397A (ja) 1998-09-08 2000-03-31 Sharp Corp 固体撮像素子の画素欠陥検出装置
JP2001307079A (ja) 2000-04-26 2001-11-02 Seiko Epson Corp 画像処理装置、画像処理方法および記録媒体
JP2004187163A (ja) 2002-12-05 2004-07-02 Victor Co Of Japan Ltd 画素欠陥補正機能を備えた固体撮像装置
US20070194249A1 (en) 2004-07-29 2007-08-23 Gavrilov Dmitri N System And Method For Cross-Talk Cancellation In A Multilane Fluorescence Detector
US20070030365A1 (en) 2005-08-03 2007-02-08 Micron Technology, Inc. Correction of cluster defects in imagers
JP2011066800A (ja) 2009-09-18 2011-03-31 Canon Inc 画像処理装置及び撮像システム
US20170070692A1 (en) 2015-09-04 2017-03-09 Apple Inc. Correcting pixel defects based on defect history in an image processing pipeline
WO2017130281A1 (ja) 2016-01-25 2017-08-03 オリンパス株式会社 画像処理装置、画像処理方法およびプログラム
WO2018020687A1 (ja) 2016-07-29 2018-02-01 オリンパス株式会社 画像処理装置、画像処理方法およびプログラム
WO2019228944A1 (en) 2018-05-28 2019-12-05 Universitat De Barcelona REDUCING OPTICAL CROSSTALK EFFECTS IN SiPMs
JP2020088654A (ja) 2018-11-27 2020-06-04 キヤノン株式会社 放射線撮像装置、放射線撮像システム、放射線撮像装置の制御方法、および、プログラム
JP2020198601A (ja) 2019-06-05 2020-12-10 キヤノン株式会社 撮像装置及びその制御方法
JP2021090134A (ja) 2019-12-03 2021-06-10 キヤノン株式会社 撮像装置およびその制御方法
WO2021172216A1 (ja) 2020-02-27 2021-09-02 ソニーセミコンダクタソリューションズ株式会社 受光素子、光学デバイス、及び電子機器

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