JP7537502B2 - 監視システム、方法、及びプログラム - Google Patents

監視システム、方法、及びプログラム Download PDF

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Publication number
JP7537502B2
JP7537502B2 JP2022550091A JP2022550091A JP7537502B2 JP 7537502 B2 JP7537502 B2 JP 7537502B2 JP 2022550091 A JP2022550091 A JP 2022550091A JP 2022550091 A JP2022550091 A JP 2022550091A JP 7537502 B2 JP7537502 B2 JP 7537502B2
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Japan
Prior art keywords
dimensional
point cloud
invalid area
cloud data
monitoring
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JP2022550091A
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Japanese (ja)
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JPWO2022059093A5 (ja
JPWO2022059093A1 (https=
Inventor
善将 小野
淳一 安部
栄実 野口
聡 辻
次朗 安倍
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NEC Corp
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NEC Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497Means for monitoring or calibrating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/66Tracking systems using electromagnetic waves other than radio waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88Lidar systems specially adapted for specific applications
    • G01S17/89Lidar systems specially adapted for specific applications for mapping or imaging

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022550091A 2020-09-16 2020-09-16 監視システム、方法、及びプログラム Active JP7537502B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/035087 WO2022059093A1 (ja) 2020-09-16 2020-09-16 監視システム、方法、及びプログラムが格納された非一時的なコンピュータ可読媒体

Publications (3)

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JPWO2022059093A1 JPWO2022059093A1 (https=) 2022-03-24
JPWO2022059093A5 JPWO2022059093A5 (ja) 2023-05-24
JP7537502B2 true JP7537502B2 (ja) 2024-08-21

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JP2022550091A Active JP7537502B2 (ja) 2020-09-16 2020-09-16 監視システム、方法、及びプログラム

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US (1) US20230333250A1 (https=)
JP (1) JP7537502B2 (https=)
WO (1) WO2022059093A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005249743A (ja) 2004-03-08 2005-09-15 Omron Corp レーダ装置
JP2006023178A (ja) 2004-07-07 2006-01-26 Olympus Corp 3次元計測方法及び装置
JP2011205399A (ja) 2010-03-25 2011-10-13 Fujifilm Corp 画像処理装置および方法,ならびに画像処理プログラム
JP2017009558A (ja) 2015-06-26 2017-01-12 株式会社トプコン レーザスキャナ制御装置、レーザスキャナ制御方法およびレーザスキャナ制御用プログラム
JP2018165726A (ja) 2014-11-19 2018-10-25 首都高技術株式会社 点群データ利用システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005249743A (ja) 2004-03-08 2005-09-15 Omron Corp レーダ装置
JP2006023178A (ja) 2004-07-07 2006-01-26 Olympus Corp 3次元計測方法及び装置
JP2011205399A (ja) 2010-03-25 2011-10-13 Fujifilm Corp 画像処理装置および方法,ならびに画像処理プログラム
JP2018165726A (ja) 2014-11-19 2018-10-25 首都高技術株式会社 点群データ利用システム
JP2017009558A (ja) 2015-06-26 2017-01-12 株式会社トプコン レーザスキャナ制御装置、レーザスキャナ制御方法およびレーザスキャナ制御用プログラム

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JPWO2022059093A1 (https=) 2022-03-24
WO2022059093A1 (ja) 2022-03-24
US20230333250A1 (en) 2023-10-19

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