JP7529151B2 - 検査システム - Google Patents

検査システム Download PDF

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Publication number
JP7529151B2
JP7529151B2 JP2023522022A JP2023522022A JP7529151B2 JP 7529151 B2 JP7529151 B2 JP 7529151B2 JP 2023522022 A JP2023522022 A JP 2023522022A JP 2023522022 A JP2023522022 A JP 2023522022A JP 7529151 B2 JP7529151 B2 JP 7529151B2
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observation
series data
time series
movement trajectory
model
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Japanese (ja)
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JPWO2022244075A5 (https=
JPWO2022244075A1 (https=
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あずさ 澤田
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
    • G06T7/248—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments involving reference images or patches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30241—Trajectory

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Medical Informatics (AREA)
  • Evolutionary Computation (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP2023522022A 2021-05-17 2021-05-17 検査システム Active JP7529151B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/018652 WO2022244075A1 (ja) 2021-05-17 2021-05-17 検査システム

Publications (3)

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JPWO2022244075A1 JPWO2022244075A1 (https=) 2022-11-24
JPWO2022244075A5 JPWO2022244075A5 (https=) 2024-02-07
JP7529151B2 true JP7529151B2 (ja) 2024-08-06

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JP2023522022A Active JP7529151B2 (ja) 2021-05-17 2021-05-17 検査システム

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US (1) US12555251B2 (https=)
JP (1) JP7529151B2 (https=)
WO (1) WO2022244075A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116630947B (zh) * 2023-03-08 2026-01-20 京东方科技集团股份有限公司 异物检测方法及装置、非瞬态计算机可读存储介质
KR102723094B1 (ko) * 2023-05-11 2024-10-31 (주)빅아이 제품 검사장치
JP2026059450A (ja) * 2024-09-26 2026-04-07 ジオインサイト合同会社 容器内に封入された液体内の異物の有無を判定するためのシステム及び方法
JP7659257B1 (ja) 2024-10-04 2025-04-09 ＡＩ ｉｎｓｉｄｅ株式会社 情報処理装置、方法、及びプログラム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011153944A (ja) 2010-01-28 2011-08-11 Hitachi High-Technologies Corp 自動分析装置
CN104215584A (zh) 2014-08-29 2014-12-17 华南理工大学 一种基于高光谱图像技术区分大米产地的检测方法
US20180322660A1 (en) 2017-05-02 2018-11-08 Techcyte, Inc. Machine learning classification and training for digital microscopy images
JP2019174346A (ja) 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム
JP2019529882A (ja) 2016-08-22 2019-10-17 アイリス インターナショナル， インコーポレイテッド 生体粒子の分類のシステム及び方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4724182B2 (ja) * 2004-07-30 2011-07-13 イーグル・ヴィジョン・システムズ・ベスローテン・フェンノートシャップ 容器を検査する方法及び装置
TWI648532B (zh) 2011-08-29 2019-01-21 美商安美基公司 用於非破壞性檢測-流體中未溶解粒子之方法及裝置
EP3475692A1 (en) * 2016-06-28 2019-05-01 H. Hoffnabb-La Roche Ag Inspection device
WO2019180868A1 (ja) * 2018-03-22 2019-09-26 日本電気株式会社 画像生成装置、画像生成方法および画像生成プログラム
WO2021214994A1 (ja) * 2020-04-24 2021-10-28 日本電気株式会社 検査システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011153944A (ja) 2010-01-28 2011-08-11 Hitachi High-Technologies Corp 自動分析装置
CN104215584A (zh) 2014-08-29 2014-12-17 华南理工大学 一种基于高光谱图像技术区分大米产地的检测方法
JP2019529882A (ja) 2016-08-22 2019-10-17 アイリス インターナショナル， インコーポレイテッド 生体粒子の分類のシステム及び方法
US20180322660A1 (en) 2017-05-02 2018-11-08 Techcyte, Inc. Machine learning classification and training for digital microscopy images
JP2019174346A (ja) 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム

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WO2022244075A1 (ja) 2022-11-24
JPWO2022244075A1 (https=) 2022-11-24
US12555251B2 (en) 2026-02-17
US20250078289A1 (en) 2025-03-06

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