JP7511191B2 - データ作成システム、学習システム、推定システム、処理装置、データ作成方法、及びプログラム - Google Patents
データ作成システム、学習システム、推定システム、処理装置、データ作成方法、及びプログラム Download PDFInfo
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- JP7511191B2 JP7511191B2 JP2022561866A JP2022561866A JP7511191B2 JP 7511191 B2 JP7511191 B2 JP 7511191B2 JP 2022561866 A JP2022561866 A JP 2022561866A JP 2022561866 A JP2022561866 A JP 2022561866A JP 7511191 B2 JP7511191 B2 JP 7511191B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
- G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T3/00—Geometric image transformations in the plane of the image
- G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/13—Edge detection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
- G06V10/761—Proximity, similarity or dissimilarity measures
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20084—Artificial neural networks [ANN]
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30136—Metal
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30152—Solder
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- General Physics & Mathematics (AREA)
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- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Evolutionary Computation (AREA)
- Computing Systems (AREA)
- Medical Informatics (AREA)
- Software Systems (AREA)
- General Health & Medical Sciences (AREA)
- Databases & Information Systems (AREA)
- Health & Medical Sciences (AREA)
- Artificial Intelligence (AREA)
- Quality & Reliability (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020187508 | 2020-11-10 | ||
| JP2020187508 | 2020-11-10 | ||
| PCT/JP2021/040713 WO2022102522A1 (ja) | 2020-11-10 | 2021-11-05 | データ作成システム、学習システム、推定システム、処理装置、評価システム、データ作成方法、及びプログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022102522A1 JPWO2022102522A1 (https=) | 2022-05-19 |
| JP7511191B2 true JP7511191B2 (ja) | 2024-07-05 |
Family
ID=81601267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022561866A Active JP7511191B2 (ja) | 2020-11-10 | 2021-11-05 | データ作成システム、学習システム、推定システム、処理装置、データ作成方法、及びプログラム |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230386182A1 (https=) |
| JP (1) | JP7511191B2 (https=) |
| CN (1) | CN116368519A (https=) |
| WO (1) | WO2022102522A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7381708B1 (ja) * | 2022-12-23 | 2023-11-15 | 楽天グループ株式会社 | 情報処理装置、情報処理方法及び情報処理プログラム |
| CN118687533B (zh) * | 2024-08-23 | 2024-11-01 | 成都嘉新科技集团有限公司 | 一种坚基路面工程的下沉检测方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018045608A (ja) | 2016-09-16 | 2018-03-22 | キヤノン株式会社 | 情報処理装置、物体認識装置、情報処理装置の制御方法及びプログラム |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5076744B2 (ja) * | 2007-08-30 | 2012-11-21 | セイコーエプソン株式会社 | 画像処理装置 |
| JP6543468B2 (ja) * | 2015-01-07 | 2019-07-10 | 株式会社ワイテック | 溶接部の検査装置 |
| KR102333066B1 (ko) * | 2015-11-10 | 2021-12-01 | 대우조선해양 주식회사 | 용접 캐리지 및 용접 영역 측정 방법 |
| CN111344102A (zh) * | 2018-11-29 | 2020-06-26 | 合刃科技(深圳)有限公司 | 焊接轨迹跟踪方法、装置及系统 |
| WO2020129617A1 (ja) * | 2018-12-19 | 2020-06-25 | パナソニックIpマネジメント株式会社 | 外観検査装置及びそれを用いた溶接箇所の形状不良の有無及び種類の判定精度の向上方法、溶接システム及びそれを用いたワークの溶接方法 |
-
2021
- 2021-11-05 JP JP2022561866A patent/JP7511191B2/ja active Active
- 2021-11-05 WO PCT/JP2021/040713 patent/WO2022102522A1/ja not_active Ceased
- 2021-11-05 US US18/249,918 patent/US20230386182A1/en active Pending
- 2021-11-05 CN CN202180070302.4A patent/CN116368519A/zh active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018045608A (ja) | 2016-09-16 | 2018-03-22 | キヤノン株式会社 | 情報処理装置、物体認識装置、情報処理装置の制御方法及びプログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022102522A1 (ja) | 2022-05-19 |
| JPWO2022102522A1 (https=) | 2022-05-19 |
| US20230386182A1 (en) | 2023-11-30 |
| CN116368519A (zh) | 2023-06-30 |
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