JP7446725B2 - 測定装置、測定方法、および、プログラム - Google Patents

測定装置、測定方法、および、プログラム Download PDF

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Publication number
JP7446725B2
JP7446725B2 JP2019121611A JP2019121611A JP7446725B2 JP 7446725 B2 JP7446725 B2 JP 7446725B2 JP 2019121611 A JP2019121611 A JP 2019121611A JP 2019121611 A JP2019121611 A JP 2019121611A JP 7446725 B2 JP7446725 B2 JP 7446725B2
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light
value
information
reflected light
measuring device
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JP2021009030A (ja
JP2021009030A5 (enExample
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成樹 加藤
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Canon Inc
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Canon Inc
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Priority to JP2019121611A priority Critical patent/JP7446725B2/ja
Priority to US16/906,402 priority patent/US20200408684A1/en
Priority to EP20181558.6A priority patent/EP3757548A1/en
Publication of JP2021009030A publication Critical patent/JP2021009030A/ja
Publication of JP2021009030A5 publication Critical patent/JP2021009030A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2019121611A 2019-06-28 2019-06-28 測定装置、測定方法、および、プログラム Active JP7446725B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2019121611A JP7446725B2 (ja) 2019-06-28 2019-06-28 測定装置、測定方法、および、プログラム
US16/906,402 US20200408684A1 (en) 2019-06-28 2020-06-19 Measurement device, measurement method, and non-transitory storage medium
EP20181558.6A EP3757548A1 (en) 2019-06-28 2020-06-23 Reflection characteristic measurement device, corresponding method and non-transitory storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019121611A JP7446725B2 (ja) 2019-06-28 2019-06-28 測定装置、測定方法、および、プログラム

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JP2021009030A JP2021009030A (ja) 2021-01-28
JP2021009030A5 JP2021009030A5 (enExample) 2022-06-24
JP7446725B2 true JP7446725B2 (ja) 2024-03-11

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JP2019121611A Active JP7446725B2 (ja) 2019-06-28 2019-06-28 測定装置、測定方法、および、プログラム

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US (1) US20200408684A1 (enExample)
EP (1) EP3757548A1 (enExample)
JP (1) JP7446725B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7696852B2 (ja) * 2022-03-22 2025-06-23 株式会社東芝 光学検査方法、光学検査プログラム、処理装置、及び、光学検査装置
CN119509925A (zh) * 2024-12-06 2025-02-25 佛山电器照明股份有限公司 一种护眼台灯的清晰度测试卡及测试方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170782A (ja) 2004-12-15 2006-06-29 Seiko Epson Corp 写像性予測装置、写像性予測方法、およびプログラム
JP2007033099A (ja) 2005-07-25 2007-02-08 Fuji Xerox Co Ltd 光沢特性評価方法および光沢特性評価装置並びにプログラム
JP2011218563A (ja) 2010-04-02 2011-11-04 Canon Inc 色分解テーブルの作成方法およびその装置、並びに、画像形成装置
JP2014126408A (ja) 2012-12-25 2014-07-07 Canon Inc 反射特性の測定装置
JP2017026466A (ja) 2015-07-22 2017-02-02 キヤノン株式会社 光学特性の測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3245306A (en) * 1961-10-05 1966-04-12 Aluminum Co Of America Photometer and method
JP6635674B2 (ja) * 2015-05-11 2020-01-29 キヤノン株式会社 計測装置、計測方法およびプログラム
JP2019121611A (ja) 2018-01-10 2019-07-22 マツダ株式会社 リチウムイオン二次電池用電解液及びリチウムイオン二次電池

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170782A (ja) 2004-12-15 2006-06-29 Seiko Epson Corp 写像性予測装置、写像性予測方法、およびプログラム
JP2007033099A (ja) 2005-07-25 2007-02-08 Fuji Xerox Co Ltd 光沢特性評価方法および光沢特性評価装置並びにプログラム
JP2011218563A (ja) 2010-04-02 2011-11-04 Canon Inc 色分解テーブルの作成方法およびその装置、並びに、画像形成装置
JP2014126408A (ja) 2012-12-25 2014-07-07 Canon Inc 反射特性の測定装置
JP2017026466A (ja) 2015-07-22 2017-02-02 キヤノン株式会社 光学特性の測定装置

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US20200408684A1 (en) 2020-12-31
JP2021009030A (ja) 2021-01-28
EP3757548A1 (en) 2020-12-30

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