JP7437337B2 - 内部状態画像化装置および内部状態画像化方法 - Google Patents

内部状態画像化装置および内部状態画像化方法 Download PDF

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JP7437337B2
JP7437337B2 JP2021032888A JP2021032888A JP7437337B2 JP 7437337 B2 JP7437337 B2 JP 7437337B2 JP 2021032888 A JP2021032888 A JP 2021032888A JP 2021032888 A JP2021032888 A JP 2021032888A JP 7437337 B2 JP7437337 B2 JP 7437337B2
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internal state
detector
state imaging
radiation
radiation source
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JP2022133928A (ja
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雅則 北岡
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Hitachi Ltd
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008302212A (ja) 2007-04-11 2008-12-18 Searete Llc 容積測定タイプコンプトン散乱Ｘ線深度視覚化、画像化、または情報プロバイダ（ＶｏｌｕｍｅｔｒｉｃＴｙｐｅＣｏｍｐｔｏｎＳｃａｔｔｅｒｅｄＸ−ＲａｙＤｅｐｔｈＶｉｓｕａｌｉｚａｔｉｏｎ，Ｉｍａｇｉｎｇ，ｏｒＩｎｆｏｒｍａｔｉｏｎＰｒｏｖｉｄｅｒ）
JP2010249785A (ja) 2009-04-20 2010-11-04 Central Res Inst Of Electric Power Ind 非破壊検査方法及びその装置
JP2019090619A (ja) 2017-11-10 2019-06-13 シャープ株式会社 Ｘ線測定装置
WO2019117147A1 (ja) 2017-12-13 2019-06-20 株式会社ニコン Ｘ線装置および構造物の製造方法
JP2020046231A (ja) 2018-09-14 2020-03-26 株式会社千代田テクノル 放射線分布の３次元表示方法及び装置
JP2020180816A (ja) 2019-04-24 2020-11-05 国立大学法人千葉大学 反射型断層撮影装置

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JPH09159767A (ja) * 1995-12-04 1997-06-20 Toshiba Corp シンチレーションカメラ

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008302212A (ja) 2007-04-11 2008-12-18 Searete Llc 容積測定タイプコンプトン散乱Ｘ線深度視覚化、画像化、または情報プロバイダ（ＶｏｌｕｍｅｔｒｉｃＴｙｐｅＣｏｍｐｔｏｎＳｃａｔｔｅｒｅｄＸ−ＲａｙＤｅｐｔｈＶｉｓｕａｌｉｚａｔｉｏｎ，Ｉｍａｇｉｎｇ，ｏｒＩｎｆｏｒｍａｔｉｏｎＰｒｏｖｉｄｅｒ）
JP2010249785A (ja) 2009-04-20 2010-11-04 Central Res Inst Of Electric Power Ind 非破壊検査方法及びその装置
JP2019090619A (ja) 2017-11-10 2019-06-13 シャープ株式会社 Ｘ線測定装置
WO2019117147A1 (ja) 2017-12-13 2019-06-20 株式会社ニコン Ｘ線装置および構造物の製造方法
JP2020046231A (ja) 2018-09-14 2020-03-26 株式会社千代田テクノル 放射線分布の３次元表示方法及び装置
JP2020180816A (ja) 2019-04-24 2020-11-05 国立大学法人千葉大学 反射型断層撮影装置

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