JP7359297B2 - 検査システム - Google Patents

検査システム Download PDF

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Publication number
JP7359297B2
JP7359297B2 JP2022516807A JP2022516807A JP7359297B2 JP 7359297 B2 JP7359297 B2 JP 7359297B2 JP 2022516807 A JP2022516807 A JP 2022516807A JP 2022516807 A JP2022516807 A JP 2022516807A JP 7359297 B2 JP7359297 B2 JP 7359297B2
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Japan
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container
information
determination
inspection
movement trajectory
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JP2022516807A
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Japanese (ja)
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JPWO2021214994A1 (https=
JPWO2021214994A5 (https=
Inventor
尚司 谷内田
恵子 井上
あずさ 澤田
利憲 細井
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/215—Motion-based segmentation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/254—Analysis of motion involving subtraction of images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022516807A 2020-04-24 2020-04-24 検査システム Active JP7359297B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017749 WO2021214994A1 (ja) 2020-04-24 2020-04-24 検査システム

Publications (3)

Publication Number Publication Date
JPWO2021214994A1 JPWO2021214994A1 (https=) 2021-10-28
JPWO2021214994A5 JPWO2021214994A5 (https=) 2022-12-22
JP7359297B2 true JP7359297B2 (ja) 2023-10-11

Family

ID=78270676

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022516807A Active JP7359297B2 (ja) 2020-04-24 2020-04-24 検査システム

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Country Link
US (1) US12360054B2 (https=)
EP (1) EP4141421A4 (https=)
JP (1) JP7359297B2 (https=)
WO (1) WO2021214994A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025154143A1 (ja) * 2024-01-15 2025-07-24 日本電気株式会社 検査装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12555251B2 (en) * 2021-05-17 2026-02-17 Nec Corporation Inspection system for decision making support
JP2023125640A (ja) * 2022-02-28 2023-09-07 キヤノンマーケティングジャパン株式会社 異物検知システム、異物検知システムの制御方法、電子機器、撮影システム、撮影方法、コンピュータプログラム及び記憶媒体
WO2023175943A1 (ja) 2022-03-18 2023-09-21 日本電気株式会社 異物検査装置
WO2024127554A1 (ja) * 2022-12-14 2024-06-20 日本電気株式会社 情報処理装置、推論方法、推論プログラム、および特徴量生成モデルの生成方法
JPWO2024161565A1 (https=) * 2023-02-01 2024-08-08
EP4692772A1 (en) * 2024-08-06 2026-02-11 G.D S.p.A. Method for calculating a parameter representing the impurities in a liquid product inside a container, related calculating apparatus and computer program
JP2026059450A (ja) * 2024-09-26 2026-04-07 ジオインサイト合同会社 容器内に封入された液体内の異物の有無を判定するためのシステム及び方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004354100A (ja) 2003-05-27 2004-12-16 Matsushita Electric Works Ltd 容器内液体中の異物検出方法及びその装置
JP2013044688A (ja) 2011-08-25 2013-03-04 Mutual Corp 気泡判別検査装置および気泡判別検査方法
CN108414534A (zh) 2018-05-04 2018-08-17 无锡恩特卫自动化检测设备有限公司 一种白酒低密度极轻异物自动检测方法及装置
JP2019174346A (ja) 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0954047A (ja) 1995-08-18 1997-02-25 Takara Shuzo Co Ltd 瓶検査方法及び装置
JP4724182B2 (ja) * 2004-07-30 2011-07-13 イーグル・ヴィジョン・システムズ・ベスローテン・フェンノートシャップ 容器を検査する方法及び装置
TWI648532B (zh) * 2011-08-29 2019-01-21 美商安美基公司 用於非破壞性檢測-流體中未溶解粒子之方法及裝置
JP5974870B2 (ja) 2012-12-03 2016-08-23 株式会社 日立産業制御ソリューションズ 製品画像検査装置および製品画像検査方法
EP3475692A1 (en) * 2016-06-28 2019-05-01 H. Hoffnabb-La Roche Ag Inspection device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004354100A (ja) 2003-05-27 2004-12-16 Matsushita Electric Works Ltd 容器内液体中の異物検出方法及びその装置
JP2013044688A (ja) 2011-08-25 2013-03-04 Mutual Corp 気泡判別検査装置および気泡判別検査方法
JP2019174346A (ja) 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム
CN108414534A (zh) 2018-05-04 2018-08-17 无锡恩特卫自动化检测设备有限公司 一种白酒低密度极轻异物自动检测方法及装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025154143A1 (ja) * 2024-01-15 2025-07-24 日本電気株式会社 検査装置

Also Published As

Publication number Publication date
EP4141421A4 (en) 2023-06-21
JPWO2021214994A1 (https=) 2021-10-28
WO2021214994A1 (ja) 2021-10-28
US12360054B2 (en) 2025-07-15
US20230175975A1 (en) 2023-06-08
EP4141421A1 (en) 2023-03-01

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