JP7336380B2 - Standard plate, calibration member, gloss meter, and method for manufacturing standard plate - Google Patents

Description

The present invention provides a reference plate that serves as a reference for glossiness in glossiness measurement, a calibration member to which the reference plate is fixed, a gloss meter to be used in combination with the calibration member to which the reference plate is fixed, and the reference plate. It relates to a manufacturing method.

2. Description of the Related Art Conventionally, there is known a gloss meter that measures the glossiness of the surface of an object to be measured (see Patent Literature 1, for example). This gloss meter calculates the degree of glossiness based on the intensity of reflected light generated by reflection of the inspection light from the surface when the surface of the object to be measured is irradiated with the inspection light. Calibration of this gloss meter is performed using a calibration plate whose glossiness is determined according to standards such as the JIS standard.

In addition, when the gloss meter is actually measured, the calibration plate is used to calibrate the gloss meter properly, and to evaluate whether the glossiness of the surface of the measurement target is properly measured, for example, the glossiness of the calibration plate Measure the gloss of a commercially available component (eg, a commercially available white tile surface) that has a known gloss to some extent different from the . If the measured value of the glossiness of the member showed a value close to the known glossiness to some extent, it was evaluated that the glossmeter was properly calibrated and that the glossiness was properly measured.

JP 2010-127661 A

However, commercially available members generally have unknown surface treatment conditions (e.g., coating conditions) on the surface to be measured, and there are variations in surface treatment conditions, so the glossiness is highly reliable. cannot be said to have Here, the term "glossiness with high reliability" means that there is no variation in glossiness for each member, as in the case of the above-mentioned calibration plate, or even if there is variation, it is within a predetermined error range. do. Therefore, in the evaluation using the commercially available member, the reliability of the evaluation result that the gloss meter is properly calibrated and the glossiness is properly measured is low.

SUMMARY OF THE INVENTION An object of the present invention is to provide a reference plate having a highly reliable and arbitrary glossiness.

A plurality of aspects will be described below as means for solving the problem. These aspects can be arbitrarily combined as needed.
A reference plate according to one aspect of the present invention includes a substrate, a first gloss surface, and a second gloss surface. A first gloss surface is formed on the surface of the substrate and has a first gloss and a first area. A second gloss surface is formed on the surface of the substrate and has a second gloss greater than the first gloss and a second area. On the surface of the substrate, one first gloss surface and one second gloss surface are arranged adjacent to each other. In addition, a plurality of units each composed of a set of one first glossiness surface and one second glossiness surface arranged adjacent to each other are arranged adjacent to each other on the surface of the substrate.
In the above reference plate, on the surface of the substrate, a first glossiness surface having a first glossiness and having a first area and a second glossiness surface having a second glossiness and having a second area are arranged adjacent to each other, and a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface are arranged adjacent to each other. As a result, the above-described reference plate has a highly reliable arbitrary glossiness determined by the first area, the second area, the first glossiness, and the second glossiness substantially uniformly over the entire surface of the reference plate. have

In the reference plate described above, there are a plurality of first glossiness surfaces. As a result, the glossiness can be made substantially uniform over the entire surface of the reference plate.

In the reference plate described above, there are a plurality of second glossiness surfaces. As a result, the glossiness can be substantially uniform over the entire surface of the reference plate.

In the reference plate described above, the first glossiness surface is a rectangle having a side length equal to a side length of the substrate and having the first area. The second gloss surface is a rectangle having a side the same length as a side of the substrate and having a second area.
Also, the first glossiness surface and the second glossiness surface are arranged side by side in a direction perpendicular to the direction in which the one side of the substrate extends.
As a result, the first glossiness surface and the second glossiness surface are arranged in stripes on the surface of the reference plate, so that the glossiness can be made substantially uniform over the entire surface of the reference plate.

The surface of the substrate has a high degree of gloss. In this case, the first glossiness surface has light-scattering minute irregularities formed on the surface of the substrate. On the other hand, the second glossiness surface is a surface with less unevenness.
As a result, the reference plate can be easily manufactured simply by forming a fine concave-convex structure on the surface of the substrate so as to correspond to the surface of the first glossiness.

The substrate is either an optical glass plate or a metal plate. This makes it possible to easily manufacture a reference plate having a specific glossiness.

A calibration member according to another aspect of the present invention is a calibration member used for calibrating a gloss meter having a measuring section for measuring glossiness. The calibration member includes a cover and a reference plate. The cover can be mounted on the gloss meter so as to face the measuring section. The reference plate is fixed on the cover at a position facing the measuring section when the cover is attached to the gloss meter.
The reference plate includes a substrate, a first gloss surface, and a plurality of second gloss surfaces. A first gloss surface is formed on the surface of the substrate and has a first gloss and a first area. A second gloss surface is formed on the surface of the substrate and has a second gloss greater than the first gloss and a second area.
On the surface of the substrate, one first gloss surface and one second gloss surface are arranged adjacent to each other. In addition, a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface arranged adjacent to each other are arranged adjacent to each other on the surface of the substrate.

In the above reference plate, on the surface of the substrate, a first glossiness surface having a first glossiness and having a first area and a second glossiness surface having a second glossiness and having a second area are arranged adjacent to each other, and a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface are arranged adjacent to each other.
As a result, the reference plate has an arbitrary glossiness determined by the first area, the second area, the first glossiness, and the second glossiness uniformly over the entire surface of the reference plate. . As a result, by using a calibration member having this reference plate, it is possible to calibrate a gloss meter with high reliability at any gloss level.

A gloss meter according to yet another aspect of the present invention includes a housing, a measuring section, a cover, and a reference plate. The measurement unit is provided in the housing and measures the glossiness of the object to be measured. The cover can be attached to the housing so as to face the measuring section. The reference plate is fixed on the cover at a position facing the measuring section when the cover is attached to the housing.
The reference plate includes a substrate, a first gloss surface, and a plurality of second gloss surfaces. A first gloss surface is formed on the surface of the substrate and has a first gloss and a first area. A second gloss surface is formed on the surface of the substrate and has a second gloss greater than the first gloss and a second area.
On the surface of the substrate, one first gloss surface and one second gloss surface are arranged adjacent to each other. In addition, a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface arranged adjacent to each other are arranged adjacent to each other on the surface of the substrate.

In the above reference plate, on the surface of the substrate, a first glossiness surface having a first glossiness and having a first area and a second glossiness surface having a second glossiness and having a second area are arranged adjacent to each other, and a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface are arranged adjacent to each other.
As a result, the reference plate has an arbitrary glossiness determined by the first area, the second area, the first glossiness, and the second glossiness uniformly over the entire surface of the reference plate. . As a result, a gloss meter having this reference plate can be appropriately calibrated for any gloss level.

In the above gloss meter, at least two sets of one first gloss surface and one second gloss surface arranged adjacent to each other are included in the gloss measurement target range of the measuring unit. . As a result, even if the gloss meter measures the gloss at different positions on the reference plate, it is possible to obtain substantially the same gloss measurement result.

A method of manufacturing a reference plate according to still another aspect of the present invention includes the following steps.
A first glossiness surface having a first glossiness and a first area on a surface of a substrate having a second glossiness greater than the first glossiness, and one first glossiness surface having the other forming the first gloss surface and not adjacent to each other;
Thus, an arbitrary glossiness determined by the first area of the first glossiness surface having the first glossiness and the remaining area on the surface of the substrate having a second glossiness greater than the first glossiness It is possible to easily manufacture a reference plate having

Forming the first gloss surface includes either blasting the surface of the substrate, etching the surface of the substrate, or milling the surface of the substrate. This makes it possible to easily form a first gloss surface with a low gloss by forming an uneven structure that scatters light on the first gloss surface.

It is possible to provide a reference plate having an arbitrary degree of gloss with high reliability.

A perspective view of a gloss meter. The figure which shows the structure inside a gloss meter. The figure which shows the structure of a measurement part. FIG. 4 is a diagram showing an example of a measurement target range on a calibration reference plate or a reference plate; FIG. 3 is a perspective view of a reference plate; Top view of the reference plate. FIG. 4 is a diagram schematically showing the definition of the side lengths of the first glossiness surface and the second glossiness surface; FIG. 5 is a diagram schematically showing reference plates having different surface area ratios of the first glossiness; FIG. 10 is a diagram showing the relationship between the surface area ratio of the surface with the first glossiness and the glossiness of the reference plate; FIG. 4 is a diagram schematically showing the relationship between the size of a unit surface and the range to be measured by a gloss meter; 4 is a flow chart showing a method of manufacturing a reference plate; FIG. 10 is a top view of a reference plate according to Modification 1; FIG. 11 is a top view of a reference plate according to Modification 2; FIG. 10 is a diagram showing an example of another embodiment of the reference plate; FIG. 10 is a diagram showing an example of still another embodiment of the reference plate;

1. First Embodiment (1) Configuration of Gloss Meter A gloss meter 100 using a reference plate according to the first embodiment will be described below with reference to FIGS. 1 and 2. FIG. FIG. 1 is a perspective view of a gloss meter. FIG. 2 is a diagram showing the internal configuration of the gloss meter. The gloss meter 100 is a device that measures the glossiness of a surface to be measured (hereinafter referred to as a surface to be measured SU). The gloss meter 100 of this embodiment is a portable gloss meter that can be held and moved by a user. Glossiness is measured based on the intensity of the reflected light L2 (FIG. 3) generated by reflection at . Objects that can be measured by the gloss meter 100 include, for example, tiles, floors, walls, and desks.

The gloss meter 100 includes a housing 1 , a measurement section 2 , a display section 3 , a control section 4 , a battery 5 , a first operation section 6 and a protective cover 7 . The housing 1 constitutes the main body of the gloss meter 100 . In this embodiment, the housing 1 has a size and shape that allows the user to hold it with one hand. That is, the gloss meter 100 is a portable measuring device that can change the measurement target and/or the measurement position by being held and moved by the user.

The measurement unit 2 is provided inside the housing 1 and on the bottom BO, and measures data (intensity of the reflected light L2) for calculating the glossiness of the measurement target surface SU in contact with the bottom BO of the housing 1. . By holding and moving the housing 1 by the user, it becomes easy to change the measurement target in the gloss meter 100 and change the measurement position on the same target.

Although the detailed configuration will be described later, the measurement unit 2 irradiates the inspection light L1 toward the surface SU to be measured that is in contact with the bottom BO of the housing 1, and the inspection light L1 is reflected by the surface SU to be measured. is detected. The glossiness is calculated based on the intensity of the reflected light L2 detected by the measurement unit 2. FIG.

The display unit 3 is provided on the upper surface of the housing 1 and displays various information regarding the gloss meter 100 . The information displayed on the display unit 3 includes, for example, the glossiness of the surface currently being measured, the remaining amount of the battery 5, the current time, the state of the gloss meter 100, and the like. The display unit 3 is, for example, a thin display device such as a liquid crystal display or an organic EL display.

The control unit 4 is a computer system including a CPU, a storage device (for example, RAM, ROM, etc.), and various interfaces, and controls each component of the gloss meter 100 (measurement unit 2, display unit 3, first operation unit, second control panel, etc.). Further, the control unit 4 calculates the glossiness of the measurement target surface SU based on the intensity of the reflected light L2 measured by the measurement unit 2 and displays it on the display unit 3 .
The control unit 4 may be a system including a CPU, a storage device, and various interfaces as individual components, or may be an SoC (System on Chip) in which all or part of these are integrated on one chip. good too. A battery 5 is a power supply source for operating the gloss meter 100 .

The first operation unit 6 is provided on the upper surface of the housing 1 and includes a plurality of buttons for operating the gloss meter 100 . Specifically, the first operation unit 6 has a power button 61 for starting power supply to each component of the gloss meter 100 and a calibration button 62 for calibrating the gloss meter 100 . In addition, the first operation unit 6 may be provided with, for example, buttons for saving and deleting measured values of glossiness, buttons for setting the gloss meter 100, and the like.
The first operation unit 6 is connected to the control unit 4, and when any one of the buttons of the first operation unit 6 is pressed, the control unit 4 executes the function corresponding to the pressed button.

The protective cover 7 is a member that can be attached to the bottom BO of the housing 1 . When attached to the bottom BO of the housing 1, the protective cover 7 isolates the measuring unit 2 from the outside, preventing the optical system (light irradiation unit 21, light detection unit 23) of the measuring unit 2 from becoming dirty with dust. It is possible to prevent damage caused by contact with other members.
Further, a calibration reference plate 71 is provided inside the protective cover 7 (the surface facing the bottom BO of the housing 1) and at a position facing the measuring unit 2 when attached to the bottom BO of the housing 1. It is The calibration reference plate 71 is a plate-shaped member having a standard glossiness determined by the JIS standard, for example, a plate-shaped borosilicate glass (for example, BK7, glossiness: about 90).

When the protective cover 7 is attached to the bottom BO of the housing 1 , the measuring section 2 faces the calibration reference plate 71 . That is, the measurement unit 2 irradiates the calibration reference plate 71 with the inspection light L<b>1 and detects the reflected light L<b>2 generated by the reflection of the inspection light L<b>1 from the calibration reference plate 71 .
Therefore, for example, with the protective cover 7 attached to the bottom BO of the housing 1, the calibration button 62 is pressed while the measurement unit 2 is measuring the intensity of the reflected light L2, and the reflected light L2 at the timing when the calibration button 62 is pressed. , and the glossiness (for example, about 90) of the calibration reference plate 71 are stored in association with each other, so that the gloss meter 100 can be calibrated.

In the calibration of the gloss meter 100 using only the calibration reference plate 71, the gloss meter 100 can be appropriately calibrated for the measurement of the measurement target surface SU having a glossiness close to that of the calibration reference plate 71. For the measurement of the surface SU to be measured, which has a glossiness different from that of 71 by a certain amount or more, there is a possibility that the calibration using the calibration reference plate 71 will not perform appropriate calibration.
Therefore, in the gloss meter 100 of the present embodiment, a calibration member having a glossiness different from that of the calibration reference plate 71 by a certain amount or more is fixed in order to enable calibration with a glossiness other than the glossiness of the calibration reference plate 71. A spare cover 7' (an example of a cover) is further provided. The spare cover 7 ′ is a member that can be attached to the bottom BO of the housing 1 . When attached to the bottom BO of the housing 1 , the inner side of the spare cover 7 ′ faces the bottom BO of the housing 1 .

On the inner side facing the bottom part BO of the spare cover 7′ and at the position facing the measuring unit 2 when the spare cover 7′ is attached to the bottom part BO of the housing 1, there is a glossiness different from that of the calibration reference plate 71. A member having a certain difference or more (hereinafter referred to as a reference plate 71') is fixed.

With the preliminary cover 7′ attached to the bottom BO of the housing 1, the calibration button 62 is pressed while the intensity of the reflected light L2 is being measured by the measurement unit 2, and the intensity of the reflected light L2 at the timing when the calibration button 62 is pressed. , and the glossiness of the reference plate 71′ fixed to the spare cover 7′ are stored in association with each other, so that the glossiness of the reference plate 71′, that is, the glossiness of the calibration reference plate 71 is higher than a certain level. The gloss meter 100 can be properly calibrated in the vicinity of the differential gloss.

A plurality of spare covers 7' may exist. In this case, a reference plate 71' having a different glossiness is fixed to each of the plurality of spare covers 7'. As a result, since the gloss meter 100 can be properly calibrated in a wider range of glossiness using the plurality of spare covers 7', the gloss meter can be appropriately calibrated for measuring the glossiness of any measurement target surface SU. 100 can be calibrated.
In addition, it is preferable that the glossiness of the reference plates 71' provided on the plurality of spare covers 7' is different to the extent that each has a certain difference.

Gloss meter 100 may have other configurations than those described above. Specifically, the gloss meter 100 may include a second operating section 8 . The second operation unit 8 is a button provided on the side surface of the housing 1 and can cause the control unit 4 to execute additional functions other than the functions that can be executed using the first operation unit 6 . For example, the current glossiness measurement value can be stored by operating the second operation unit 8 (pressing a button).

Furthermore, the gloss meter 100 may comprise an external connection terminal 9 . The external connection terminal 9 is a terminal for connecting an external device (for example, a computer) and the gloss meter 100 . By providing the external connection terminal 9, for example, the gloss meter 100 can be controlled using an external device and/or the glossiness measurement value stored in the gloss meter 100 can be transferred to the external device. The external connection terminal 9 is, for example, a USB terminal.

(2) Specific Configuration of Measurement Unit Next, a specific configuration of the measurement unit 2 will be described with reference to FIG. FIG. 3 is a diagram showing the configuration of the measurement unit. The measurement unit 2 detects reflected light L2 that is generated when the surface SU to be measured is irradiated with the inspection light L1. Specifically, the measurement unit 2 has a light irradiation unit 21 and a light detection unit 23 .
The light irradiation unit 21 is fixed inside the housing 1 while being inclined at an angle α with respect to the normal direction of the bottom BO of the housing 1, and irradiates the surface SU to be measured with the inspection light L1. Since it is fixed in a state inclined at an angle α with respect to the normal direction of the bottom BO of the housing 1, the light irradiation unit 21 causes the inspection light L1 to be incident on the measurement target surface SU at the incident angle α.

The light irradiation unit 21 includes a light-emitting diode that generates light having a specific wavelength or a certain range of wavelengths (for example, near-infrared light having a wavelength of 800 nm or more), and a mechanism that applies appropriate processing to the light (for example, , and a parallel lens that converts the light output from the light emitting diode into parallel light to obtain the inspection light L1.

The light irradiation unit 21 having the above configuration can irradiate the measurement target surface SU with the inspection light L1 having an elliptical shape (for example, the minor axis is 3 mm and the major axis is 6 mm). That is, in the present embodiment, the glossiness measurement range (hereinafter referred to as the measurement target range MA) is the elliptical range of the measurement target surface SU irradiated with the inspection light L1. The size of this elliptical shape, that is, the measurement target range MA can be adjusted, for example, by adjusting the distance between the light irradiation unit 21 and the bottom BO of the housing 1 (measurement target surface SU).

When the protective cover 7 or the spare cover 7' is attached to the housing 1, the light irradiation unit 21 emits an elliptical inspection light L1 near the center of the calibration reference plate 71 or the reference plate 71', as shown in FIG. is applied to the surface. That is, the measurement target range MA on the calibration reference plate 71 or the reference plate 71' is an elliptical range near the center of the calibration reference plate 71 or the reference plate 71'. FIG. 4 is a diagram showing an example of a measurement target range on a calibration reference plate or reference plate.

The light detection unit 23 is fixed inside the housing 1 in a state inclined at an angle β with respect to the normal direction of the bottom BO of the housing 1, and the inspection light L1 irradiated by the light irradiation unit 21 is the object to be measured. A reflected light L2 generated by being reflected by the surface SU is detected. Since it is fixed in a state inclined at an angle β in the normal direction of the bottom BO of the housing 1, the light detection unit 23 mainly detects the reflected light L2 reflected at the reflection angle β on the measurement target surface SU. .
The light detection unit 23 is a photodetector capable of detecting a specific wavelength or wavelength range of the inspection light L1 emitted from the light irradiation unit 21 (in the above example, for example, near-infrared light is detected and a mechanism for appropriately processing the reflected light L2 (for example, a condenser lens for condensing light onto the light receiving surface of the photodetector).

The angle α at which the light irradiation unit 21 is fixed to the housing 1 and the angle β at which the light detection unit 23 is fixed to the housing 1 are set equal (for example, set to 60°). In general, the incident angle of incident light (inspection light L1 in this embodiment) and the reflection angle of reflected light (reflected light L2 in this embodiment) are equal. , the reflected light L2 generated by the reflection of the inspection light L1 can be reliably detected.

(3) Reference Plate A reference plate 71' used in the gloss meter 100 having the configuration described above will be described below with reference to FIGS. 5 and 6. FIG. FIG. 5 is a perspective view of the reference plate. FIG. 6 is a top view of the reference plate. As shown in FIGS. 5 and 6, the reference plate 71 ′ includes a substrate B, a plurality of first glossiness surfaces 73 and a plurality of second glossiness surfaces 75 . The substrate B is a plate-like member forming the entire reference plate 71'. Substrate B is, for example, an optical glass plate such as borosilicate crown optical glass (BK7), a glossy metal plate, or the like. That is, it is preferable that the surface of the substrate B is flat with few irregularities, and has a glossiness higher than that of the surface SU to be measured that can be measured by the gloss meter 100 .
In addition, in this embodiment, the board|substrate B has a rectangle which has a long side and a short side. 5 and 6, the direction of the short side of the substrate B is the X direction, and the direction of the long side is the Y direction, which are indicated by arrows. In addition, the surface on which the first glossiness surface 73 and the second glossiness surface 75 are formed on the substrate B is the measurement target to be measured by the gloss meter.

The plurality of first glossiness surfaces 73 are surfaces formed on the surface of the substrate B and having a first glossiness lower than the glossiness of the substrate B surface. Specifically, each of the plurality of first glossiness surfaces 73 has minute unevenness that scatters light. When measuring the glossiness of the reference plate 71′ with a glossmeter, the first glossiness surface 73 scatters the incident inspection light by minute irregularities, so the glossmeter measures the reflected light from the first glossiness surface 73. hardly detected. As a result, the first gloss surface 73 is a low gloss surface for a gloss meter that measures gloss based on the intensity of reflected light.

The first glossiness surface 73 having fine unevenness that scatters the inspection light can be obtained, for example, by blasting the surface of the substrate B by spraying fine particles to form unevenness on the surface, or by blasting the surface of the substrate B. It can be formed by chemical etching that corrodes by a chemical reaction to form unevenness.
Alternatively, the first glossy surface 73 can be formed by milling, in which the surface is cut with a tool called a “milling cutter” having many blades.

The plurality of second glossiness surfaces 75 is preferably greater than the glossiness of the measurement target surface SU that can be measured by the gloss meter 100, and the glossiness of the plurality of first glossiness surfaces 73 is greater than the glossiness of the plurality of first glossiness surfaces 73. It is a glossy surface. In this embodiment, the plurality of second glossiness surfaces 75 have the same glossiness as the surface of the substrate B having the higher glossiness. That is, the plurality of second glossiness surfaces 75 correspond to the remainder of the entire surface of the substrate B where the plurality of first glossiness surfaces 73 are formed by the process of forming unevenness on the surface of the substrate B. FIG. More specifically, the plurality of second glossy surfaces 75 are formed using the surface of the substrate B as it is.

In this way, the plurality of second glossiness surfaces 75 have less unevenness (including minute ones and relatively smooth ones) than the first glossiness surface 73, and preferably have a higher glossiness than the surface SU to be measured. By using the surface of the substrate B having a high degree of glossiness as it is, the substrate B is processed to form the second glossiness surface 75, which is a surface with less unevenness and preferably a degree of glossiness higher than that of the surface SU to be measured. no longer need to be applied. In other words, the reference plate 71 ′ can be easily manufactured only by performing the process for forming the plurality of first glossiness surfaces 73 on the surface of the substrate B.

A second glossy surface 75 with a high glossiness reflects most of the incident inspection light when the glossiness of the reference plate 71' is measured with a glossmeter. As a result, most of the reflected light generated at the second glossiness surface 75 is detected by the glossmeter.

Regarding the shapes of the first glossiness surface 73 and the second glossiness surface 75 of the reference plate 71' according to the first embodiment, as shown in FIGS. 75 has a rectangular shape extending in the X direction (that is, the short side direction of the substrate B). Specifically, the first glossiness surface 73 and the second glossiness surface 75 have a rectangular shape whose sides in the X direction have the same length as the short sides of the substrate B. As shown in FIG.
On the other hand, the length of the side of the first glossiness surface 73 and the second glossiness surface 75 in the Y direction (long side direction of the substrate B) is Glossiness is determined by the number of surfaces. Regarding the relationship between the glossiness of the reference plate 71′ and the length of the sides in the Y direction of the first glossiness surface 73 and the second glossiness surface 75, and the number of glossiness surfaces to be formed on the surface of the substrate B, A detailed description will be given later.

On the other hand, regarding the arrangement of the first glossiness surface 73 and the second glossiness surface 75 of the reference plate 71' according to the first embodiment, as shown in FIGS. The degree surfaces 75 are alternately arranged side by side in the Y direction (long side direction of the substrate B) on the surface of the substrate B. As shown in FIG. That is, on the surface of the substrate B, there is no place where the first glossiness surface 73 is continuously arranged or where the second glossiness surface 75 is continuously arranged.

By alternately arranging the first glossiness surface 73 and the second glossiness surface 75 in this manner, the ratio between the first glossiness surface 73 and the second glossiness surface 75 varies greatly depending on the location of the substrate B. can be suppressed. As described below, the ratio of the first glossiness surface 73 to the second glossiness surface 75 determines the glossiness of the reference plate 71', so the first glossiness surface 73 and the second glossiness surface 75 are alternated. , it is possible to prevent the degree of glossiness from greatly differing depending on the location of the substrate B.

The arrangement of the plurality of first glossiness surfaces 73 and the plurality of second glossiness surfaces 75 alternately in the Y direction means that one first glossiness surface 73 and one second glossiness surface 75 are arranged alternately. It can also be seen that a plurality of units formed by a set of are arranged side by side in the Y direction. In the following description, a unit formed by a set of one first glossiness surface 73 and one second glossiness surface 75 is called a "unit surface A" for convenience.

(3) Relationship between the ratio of the first glossiness surface and the second glossiness surface and the glossiness Next, the ratio between one first glossiness surface 73 and the second glossiness surface 75 in the unit surface A, and the reference The relationship between the glossiness of the plate 71' and the glossiness will be specifically described. Before describing the relationship between the ratio of the first glossiness surface 73 and the second glossiness surface 75 and the glossiness, the side lengths of the first glossiness surface 73 and the second glossiness surface 75 are Define.
Specifically, as shown in FIG. 7, the length of the Y-direction side of the first glossiness surface 73 in the unit surface A is d1, and the length of the Y-direction side of the second glossiness surface 75 is d2. , defined as Also, let W be the length of the X-direction side of the first glossiness surface 73 and the second glossiness surface 75, that is, the length of the short side of the substrate B. As shown in FIG. FIG. 7 is a diagram schematically showing the definition of the side lengths of the first glossiness surface and the second glossiness surface.

According to the definition shown in FIG. 7, the unit surface A has an area of W*(d1+d2) because the length of the side in the X direction is W and the length of the side in the Y direction is d1+d2.
On the other hand, the first glossiness surface 73 has a side length of W in the X direction and a side length of d1 in the Y direction, and thus has an area of W*d1. Therefore, within one unit surface A, the first glossy surface 73 occupies an area of the entire unit surface A with a ratio of (W*d1)/{W*(d1+d2)}=d1/(d1+d2). The ratio represented by the above expression d1/(d1+d2) is called the "first ratio".

Also, the second glossiness surface 75 has a side length of W in the X direction and a side length of d2 in the Y direction, and thus has an area of W*d2. Therefore, within one unit surface A, the second glossy surface 75 occupies an area of the entire unit surface A with a ratio of (W*d2)/{W*(d1+d2)}=d2/(d1+d2). The ratio represented by the above expression d2/(d1+d2) is called the "second ratio".
As shown in the above formula, the sum of the first percentage and the second percentage is 1 (100%). Also, within one unit surface A, the first glossiness surface 73 and the second glossiness surface 75 do not overlap. That is, the second glossiness surface 75 occupies a second proportion of the entire unit surface A by occupying the surface other than the surface occupied by the first glossiness surface 73 in one unit surface A.

In the following description, the ratio of the first glossiness surface 73 and the second glossiness surface 75 in the unit surface A is defined as the ratio of the area of the first glossiness surface 73 included in one unit surface A (first ratio ) as a reference, it is defined as d1/(d1+d2). In the following description, this ratio is called "area ratio".

Next, the relationship between the area ratio and the glossiness of the reference plate 71' will be specifically described. The reference plate 71' of this embodiment is a reflection light generated by reflection of the inspection light L1 on the surface of the object to be measured when the surface of the object to be measured is irradiated with the inspection light L1 at a predetermined incident angle. Used for gloss meter 100 that measures gloss based on the intensity of L2. Further, the intensity of the reflected light L2 generated from the first glossiness surface 73 having a low glossiness is weak, while the intensity of the reflected light L2 generated from the second glossiness surface 75 having a high glossiness is strong.

Based on the measurement principle of the gloss meter and the properties of the first glossiness surface 73 and the second glossiness surface 75, the area ratio of the first glossiness surface 73 in one unit surface A (d1/(d1+d2 )) so that the reflected light L2 generated from the one unit surface A has a predetermined intensity, the glossiness of the entire reference plate 71′ can be determined.

Specifically, as shown in FIG. 8, in the case of the reference plate 71′ having a small area ratio (d1/(d1+d2)) of the first glossiness surface 73, the second glossiness surface 75 on the entire surface of the substrate B is The occupied ratio (second ratio) increases ((1) in FIG. 8). As a result, while the ratio of the second glossy surface 75 that generates reflected light L2 with high intensity is large, the ratio of the first glossy surface 73 that generates very little reflected light L2 is small. The intensity of the reflected light L2 generated from is increased. Therefore, when this reference plate 71' is measured with the gloss meter 100, a high glossiness is obtained as a measurement result. FIG. 8 is a diagram schematically showing reference plates having different surface area ratios of the first glossiness.

On the other hand, as the area ratio of the first glossy surface 73 increases, the ratio (second ratio) of the second glossy surface 75 to the entire surface of the substrate B decreases ((2) and (3) in FIG. 8). ). As a result, the proportion of the second glossy surface 75 that generates reflected light L2 of high intensity decreases, while the proportion of the first glossy surface 73 that generates very little reflected light L2 increases. 'The intensity of the reflected light L2 generated from the whole is reduced. Therefore, when this reference plate 71' is measured with the gloss meter 100, a small glossiness is obtained as a measurement result.

FIG. 9 is a graph showing the relationship between the area ratio and the glossiness. Specifically, when the entire surface of the substrate B is only the second glossiness surface 75 (area ratio: 0%), the glossiness of the reference plate 71′ is the second glossiness of the second glossiness surface 75, That is, it becomes the same as the glossiness of the surface of the substrate B (represented as K2 in FIG. 9). For example, when BK7 is used as the substrate B, the glossiness of the reference plate 71' is about 90 when the area ratio is 0%. FIG. 9 is a diagram showing the relationship between the surface area ratio of the surface with the first glossiness and the glossiness of the reference plate.

On the other hand, as the ratio of the first glossiness surface 73 to the surface of the substrate B increases, that is, as the area ratio increases, the glossiness of the reference plate 71′ decreases linearly, and the entire surface of the substrate B becomes the first glossiness surface. When there is only one glossiness surface 73 (area ratio: 100%), the glossiness of the reference plate 71′ is the same as the first glossiness of the first glossiness surface 73 (represented by K1 in FIG. 9). there). For example, when BK7 is used as the substrate B and the first glossiness surface 73 is formed by blasting, the glossiness of the reference plate 71' is approximately 0 when the area ratio is 100%.

Thus, by determining the area ratio of the first glossiness surface 73 and the second glossiness surface 75 with reference to the graph shown in FIG. 9, K1 (first glossiness) to K2 (second glossiness) A reference plate 71' can be manufactured with any glossiness up to .
The graph shown in FIG. 9 shows, for example, the first glossiness when the entire surface of the substrate B is the second glossiness surface 75 (area ratio: 0%), and the first glossiness when the entire surface of the substrate B is the first glossiness surface 75. In the case of 73 (area ratio: 100%), the second glossiness is measured with a gloss meter, and the second glossiness when the area ratio is 0% and the first glossiness when the area ratio is 100%. (Y=aX+B, Y: glossiness, X: area ratio).

In this way, since the glossiness of the reference plate 71′ and the area ratio (first ratio) of the first glossiness surface 73 can be represented by the relationship shown in FIG. 71′ states that “on the entire surface of the substrate B, the portion having the first glossiness occupies the first proportion, and the portion having the second glossiness occupies the remaining second proportion. It is a reference plate that can theoretically explain the glossiness by saying, "It has a specific glossiness determined by the parameters of the 1st ratio, the second glossiness, and the second ratio."

(4) Relationship between the unit surface and the measurement range of the gloss meter Next, using FIG. The relationship between the glossiness measurement target range MA and the measurement unit 2 of the gloss meter 100 described with reference to FIG. 4 will be described. FIG. 10 is a diagram schematically showing the relationship between the size of the unit surface and the range to be measured.
In the reference plate 71' according to the first embodiment, the sum of the intensity of the reflected light from the first glossiness surface 73 and the intensity of the reflected light from the second glossiness surface 75 gives is determined. Therefore, in order to reduce the error between the result of measuring the glossiness of the reference plate 71' by the gloss meter and the intended glossiness of the reference plate 71', the inspection light L1 with which the gloss meter irradiates the reference plate 71' The ratio of the area of the first glossiness surface 73 and the area of the second glossiness surface 75 included in the irradiation range (that is, the measurement target range MA), and the first glossiness surface 73 in one unit surface A and the ratio of the second glossiness surface 75 should be small.

The ratio of the area of the first glossiness surface 73 and the area of the second glossiness surface 75 included in the irradiation range (measurement target range MA) of the inspection light L1 that the gloss meter irradiates to the reference plate 71 ′, and one In order to reduce the error between the ratio of the first glossiness surface 73 and the second glossiness surface 75 in the unit surface A, the first glossiness surface 73 (a part of ) and (part of) the second glossiness surface 75 (at least two or more).

Specifically, as shown in (1) and (2) of FIG. 10, by reducing the area of the unit surface A and reducing the areas of the first glossiness surface 73 and the second glossiness surface 75, It is preferable to include more pairs of the first glossiness surface 73 and the second glossiness surface 75 within the measurement target range MA.
Further, by reducing the areas of the first glossiness surface 73 and the second glossiness surface 75, even if the measurement target range MA moves and the glossiness measurement position changes, The ratio between the area of the first glossiness surface 73 and the area of the second glossiness surface 75 is less likely to change. As a result, it is possible to prevent the glossiness from greatly differing depending on the measurement position of the reference plate 71'.

On the other hand, as shown in (3) of FIG. 10, when the area of the unit surface A becomes excessive compared to the measurement target range MA, the first glossiness surface 73 and the second glossiness surface 73 included in the measurement target range MA 75, the ratio between the area of the first glossiness surface 73 and the area of the second glossiness surface 75 included in the measurement target range MA, and the first glossiness in the unit surface A The error between the area of the surface 73 and the ratio of the area of the second glossiness surface 75 increases.
For example, as shown in (3) of FIG. 10, the area of the first glossiness surface 73 included in the upper end of the measurement target range MA and the area of the second glossiness surface 75 included in the lower end of the measurement target range MA is different from the ratio between the area of the first glossy surface 73 and the area of the second glossy surface 75 in the unit surface A.

Further, if the area of the unit surface A is excessively large, and the measurement target range MA moves and the glossiness measurement position changes, the area of the first glossiness surface 73 and the second glossiness The ratio to the area of the surface 75 varies greatly. As a result, the glossiness greatly differs depending on the measurement position of the reference plate 71'.

(5) Method for Manufacturing Reference Plate Next, a method for manufacturing the reference plate 71' having the above configuration will be described with reference to FIG. FIG. 11 is a flow chart showing a method of manufacturing a reference plate.
First, in step S1, for example, using the graph shown in FIG. Determine the ratio with the glossiness surface. That is, the above first and second proportions are determined.
Next, in step S2, the size of one unit surface A is determined according to the size of the measurement target range MA of the glossiness of the glossmeter whose measurement value is to be evaluated using the reference plate 71'. Also, the arrangement of the plurality of unit surfaces A on the surface of the substrate B is determined.

After that, in step S3, a substrate B with a high glossiness (for example, an optical glass plate such as BK7) is prepared, and the first glossiness surface in the plurality of unit surfaces A whose size and arrangement are determined in step S2 above The surface of the substrate B corresponding to 73 is subjected to a process of forming fine irregularities so that the two first glossiness surfaces 73 are not adjacent to each other.
At this time, the unevenness forming process is performed on the area of the first ratio determined in step S1 of the entire unit surface A to be subjected to the unevenness forming process. In the case of the reference plate 71' of this embodiment, the length in the Y direction is d1 and the length in the X direction is W (the same length as the short side of the substrate B) in the unit surface A to be processed. A certain rectangular area is subjected to a process of forming minute unevenness.

When performing the process of forming unevenness|corrugation of step S3 by a blasting process, specifically, fine unevenness|corrugation is formed as follows.
First, an opening is formed in the mask member corresponding to the dimensions of the first gloss surface 73 determined by performing steps S1 and S2. The mask member is a plate-shaped member that covers the surface of the substrate B during the blasting process, and is a member that prevents the blasting process from being performed on the portion of the surface of the substrate B that is covered by the mask member.

Next, the mask member having the openings formed as described above is placed on the surface of the substrate B serving as the reference plate 71', and the substrate B is subjected to blasting. As a result, the portion of the mask member where the opening is provided, that is, the portion corresponding to the first glossiness surface 73 on the surface of the substrate B is subjected to blasting to form minute unevenness. On the other hand, the portion of the mask member where the opening is not provided, that is, the portion corresponding to the second glossiness surface 75 on the surface of the substrate B is not subjected to the blasting treatment, and the glossiness of the portion is the same as the glossiness of the substrate B. be the same as the degree

By executing the above steps S1 to S3, the surface of the substrate B which has less unevenness and preferably has a higher glossiness than the surface SU to be measured has two first glossinesses only at locations corresponding to the first glossiness surface 73. Only by performing a process of forming fine unevenness so that the surface 73 is not adjacent to each other, only the first glossiness surface 73 having fine unevenness that scatters light is formed by blasting or the like, and the second glossiness is performed. As for the surface 75, the surface of the substrate B having a high glossiness is used as it is without processing, so that the reference plate 71' having the intended glossiness can be easily manufactured.

(6) Modifications Hereinafter, modifications of the reference plate 71' according to the first embodiment will be described. In the first embodiment described above, the first glossiness surface 73 and the second glossiness surface 75 have long rectangles in the X direction (the short side of the substrate B) and are arranged side by side in the Y direction. Accordingly, it is possible to prevent the glossiness measurement value from greatly differing depending on the glossiness measurement position (measurement target range MA) of the reference plate 71′.
However, the shape and arrangement of the first glossiness surface 73 and the second glossiness surface are not limited to this, and as shown in FIG. The second gloss surfaces 75' have a rectangular shape and are staggered so that they are not adjacent to each other. That is, in the reference plate 71'' according to Modification 1, the first glossiness surface 73' and the second glossiness surface 75' form a checkered pattern on the surface of the substrate B. FIG. 12A is a top view of a reference plate according to Modification 1. FIG.

Further, as shown in FIG. 12B, the first glossiness surface 73'' and the second glossiness surface 75'' of the reference plate 71''' according to Modification 2 are Y It has a rectangular shape that is long in the direction (the long side of the substrate B) and is arranged side by side in the X direction. 12B is a top view of a reference plate according to Modification 2. FIG.

Even if the first glossiness surface and the second glossiness surface are arranged as in the above modification 1 and modification 2, there are a plurality of first glossiness surfaces and second glossiness surfaces within the measurement target range MA of the gloss meter. If a set of glossiness surfaces is included, it is possible to provide a highly reliable reference plate that can output the intended glossiness as a measurement result.

(7) Summary The first embodiment described above has the following functions and effects.
In the reference plate 71' according to the first embodiment, on the surface of the substrate B, a first glossiness surface 73 having a first glossiness and having a first area, and a first glossiness surface 73 having a second glossiness and a second A second glossiness surface 75 having an area is arranged adjacent to each other, and a plurality of units constituted by a set of one first glossiness surface 73 and one second glossiness surface 75 are mutually placed adjacent to each other. As a result, the reference plate 71' has a reliability determined by the first area, the second area, the first glossiness, and the second glossiness substantially uniformly over the entire surface of the reference plate 71'. Has a high optional gloss.

In the reference plate 71', the first glossiness surface 73 is a rectangle having a side length equal to a side length of the substrate B and having a first area. Also, the second glossiness surface 75 is a rectangle having one side the same length as the length of one side of the substrate B and having a second area. Also, the first glossy surface 73 and the second glossy surface 75 are arranged side by side in a direction perpendicular to the direction in which the one side of the substrate B extends.
As a result, the first glossiness surface 73 and the second glossiness surface 75 are arranged in stripes on the surface of the reference plate 71', so that the glossiness can be substantially uniform over the entire surface of the reference plate 71'.

The first glossiness surface 73 has fine unevenness for diffusing light formed on the surface of the substrate B, and the second glossiness surface 75 is formed using the substrate B as it is, so that the reference plate 71' can be easily manufactured.

By using either an optical glass plate or a metal plate as the substrate B, it is possible to easily manufacture the reference plate 71' having a specific glossiness.

Since the glossiness measurement target range MA of the gloss meter 100 includes a plurality of sets of the first glossiness surface 73 and the second glossiness surface 75, the glossiness is measured by the glossmeter 100 depending on the glossiness measurement position. It is possible to suppress the difference in glossiness.

The step of forming minute unevenness on the first glossiness surface 73 is any one of blasting the surface of the substrate B, etching the surface of the substrate B, or milling the surface of the substrate B. , the first glossiness surface 73 having a low glossiness can be easily formed.

2. Other Embodiments Although one embodiment of the present invention has been described above, the present invention is not limited to the above-described embodiment, and various modifications are possible without departing from the gist of the invention. In particular, multiple embodiments and modifications described herein can be arbitrarily combined as needed.
(A) In the reference plate 71′, the average of the ratios of the first glossiness surface 73 and the second glossiness surface 75 included in the measurement target range MA of the gloss meter is the intended ratio (the graph shown in FIG. ratio determined using ), highly reliable glossiness can be obtained as a measurement result. Therefore, for example, when a large number of pairs of the first glossiness surface 73 and the second glossiness surface 75 are included in the measurement target range MA, a part of the first glossiness surface 73 and the second glossiness surface 75 may not be arranged alternately. That is, the first glossiness surface 73 may be arranged continuously in part, and the second glossiness surface 75 may be arranged continuously.

(B) The shape of the first glossiness surface 73 and the second glossiness surface 75 can be any shape other than a square. Also, as long as the ratio between the first glossiness surface 73 and the second glossiness surface 75 can be substantially the same within the unit surface A, the shapes of these surfaces may be different. For example, the first glossy surface having a shape other than a square (eg, triangular, polygonal, circular, etc.) may be formed in the central portion of the second glossy surface having a square shape.

(C) In the above-described first embodiment, minute unevenness is formed on a part of the surface of the substrate B, which has less unevenness and preferably has a higher glossiness than the surface SU to be measured, so that the first glossiness surface 73 and the A second glossy surface 75 was formed. On the contrary, for example, by flattening a part of the surface of the substrate B, which is formed with minute unevenness on the whole and has a low glossiness, to form a part with a high glossiness, the first glossiness surface 73 and the first glossiness surface 73 are formed. A dual gloss surface 75 can also be formed.
For example, a surface having fine irregularities is coated with diamond paste or the like to fill in the fine irregularities and flatten the surface, thereby forming a high gloss surface on a low gloss surface.

(D) The reference plate 71' described above can be used for evaluation of measurement results of a surface roughness meter, a scanning probe microscope (SPM), a radiation thermometer, or the like. For example, when used in a radiation thermometer, the emissivity of the first glossiness surface 73 with low glossiness is greater than the emissivity of the second glossiness surface 75, and the measurement result of the radiation thermometer using this principle can be evaluated.

(E) As shown in FIG. 13, the end portion of the substrate B in the X direction may also be formed with minute unevenness by blasting. That is, the first glossy surfaces 73 extending in the X direction and arranged side by side in the Y direction may be connected by the above-described blasted surface to form one first glossy surface 73 . FIG. 13 is a diagram showing an example of another embodiment of the reference plate.

(F) As shown in FIG. 14, the end portion of the substrate B in the X direction may be made to have a surface with less unevenness without blasting or the like. That is, the second glossiness surfaces 75 extending in the X direction and arranged side by side in the Y direction may be connected by a surface with less unevenness so that there is only one second glossiness surface 75 . FIG. 14 is a diagram showing an example of still another embodiment of the reference plate.

INDUSTRIAL APPLICABILITY The present invention can be widely applied to a reference plate that serves as a reference for glossiness in glossiness measurement.

100 Gloss meter 1 Case 2 Measurement unit 21 Light irradiation unit 23 Light detection unit 3 Display unit 4 Control unit 5 Battery 6 First operation unit 61 Power button 62 Calibration button 7 Protective cover 71 Calibration standard plate 7' Spare cover 71', 71'', 71''' Reference plate B Substrate A Unit surfaces 73, 73', 73'' First glossy surfaces 75, 75', 75'' Second glossy surface 8 Second operation unit 9 External connection terminal BO Bottom L1 Inspection light L2 Reflected light MA Range to be measured SU Surface to be measured

Claims (6)

a substrate ;
a first glossiness surface having a first glossiness and a first area formed on the surface of the substrate;
a second glossiness surface formed on the surface of the substrate, having a glossiness greater than the first glossiness and having a second area;
one said first glossiness surface and one said second glossiness surface are arranged adjacent to each other on the surface of said substrate;
A criterion in which a plurality of units constituted by a set of one first glossiness surface and one second glossiness surface arranged adjacent to each other are arranged adjacent to each other on the surface of the substrate. A method for measuring glossiness using a plate,
irradiating the inspection light so as to include at least two sets of one of the first glossiness surfaces and one of the second glossiness surfaces arranged adjacent to each other in the irradiation range;
measuring reflected light generated by irradiating the irradiation range with the inspection light;
calculating glossiness of the reference plate based on the intensity of the reflected light;
A method of measurement comprising: 2. The measuring method according to claim 1, wherein there are a plurality of said first glossiness surfaces. 3. The measuring method according to claim 1, wherein there are a plurality of said second glossiness surfaces. the first glossiness surface is a rectangle having one side the same length as the length of one side of the substrate and the first area;
the second glossiness surface is a rectangle having one side the same length as the length of one side of the substrate and the second area;
The measuring method according to any one of claims 1 to 3, wherein the first glossiness surface and the second glossiness surface are arranged side by side in a direction perpendicular to a direction in which one side of the substrate extends. The surface of the substrate has a high degree of gloss,
The first glossiness surface has minute unevenness that scatters light formed on the surface of the substrate,
The second glossiness surface is a surface with less unevenness,
The measuring method according to any one of claims 1 to 4. The measuring method according to any one of claims 1 to 5, wherein the substrate is either an optical glass plate or a metal plate.

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