JP7205446B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP7205446B2
JP7205446B2 JP2019209483A JP2019209483A JP7205446B2 JP 7205446 B2 JP7205446 B2 JP 7205446B2 JP 2019209483 A JP2019209483 A JP 2019209483A JP 2019209483 A JP2019209483 A JP 2019209483A JP 7205446 B2 JP7205446 B2 JP 7205446B2
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Japan
Prior art keywords
vacuum chamber
mass spectrometer
pedestal
optical element
ion optical
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Application number
JP2019209483A
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English (en)
Japanese (ja)
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JP2021082496A (ja
JP2021082496A5 (enExample
Inventor
学 上田
尚嗣 梅本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2019209483A priority Critical patent/JP7205446B2/ja
Priority to US17/022,899 priority patent/US11217439B2/en
Publication of JP2021082496A publication Critical patent/JP2021082496A/ja
Publication of JP2021082496A5 publication Critical patent/JP2021082496A5/ja
Application granted granted Critical
Publication of JP7205446B2 publication Critical patent/JP7205446B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/068—Mounting, supporting, spacing, or insulating electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N2030/022—Column chromatography characterised by the kind of separation mechanism
    • G01N2030/027—Liquid chromatography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2019209483A 2019-11-20 2019-11-20 質量分析装置 Active JP7205446B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2019209483A JP7205446B2 (ja) 2019-11-20 2019-11-20 質量分析装置
US17/022,899 US11217439B2 (en) 2019-11-20 2020-09-16 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019209483A JP7205446B2 (ja) 2019-11-20 2019-11-20 質量分析装置

Publications (3)

Publication Number Publication Date
JP2021082496A JP2021082496A (ja) 2021-05-27
JP2021082496A5 JP2021082496A5 (enExample) 2022-03-02
JP7205446B2 true JP7205446B2 (ja) 2023-01-17

Family

ID=75909217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019209483A Active JP7205446B2 (ja) 2019-11-20 2019-11-20 質量分析装置

Country Status (2)

Country Link
US (1) US11217439B2 (enExample)
JP (1) JP7205446B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD946431S1 (en) * 2019-05-29 2022-03-22 Micromass Uk Limited Mass spectrometer
USD954574S1 (en) * 2019-05-29 2022-06-14 Micromass Uk Limited Mass spectrometer
USD963499S1 (en) * 2019-05-29 2022-09-13 Micromass Uk Limited Mass spectrometer
USD983682S1 (en) * 2020-01-17 2023-04-18 Nicoya Lifesciences, Inc. Chemical analysis instrument
USD1048907S1 (en) * 2021-04-23 2024-10-29 Micromass Uk Limited Mass spectrometer
WO2023013274A1 (ja) * 2021-08-06 2023-02-09 株式会社日立ハイテク 質量分析装置
USD1023804S1 (en) * 2021-12-23 2024-04-23 Micromass Uk Limited Mass spectrometer
US20250157804A1 (en) 2022-02-15 2025-05-15 Shimadzu Corporation Mass spectrometer
USD1011941S1 (en) * 2022-04-29 2024-01-23 Micromass Uk Limited Mass spectrometer
USD1026244S1 (en) * 2022-08-12 2024-05-07 Cepheid Diagnostic assay system
USD1105941S1 (en) * 2022-11-10 2025-12-16 Beckman Coulter Biotechnology (Suzhou) Co., Ltd. Flow cytometer
EP4641614A1 (en) * 2022-12-20 2025-10-29 Hitachi High-Tech Corporation Mass spectrometry device
WO2024150552A1 (ja) 2023-01-10 2024-07-18 株式会社日立ハイテク 質量分析装置、および質量分析装置の分解方法
CN120457518A (zh) * 2023-01-27 2025-08-08 株式会社日立高新技术 质量分析装置
JP1765588S (ja) * 2023-08-28 2024-03-14 質量分析機

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000338088A (ja) 1999-05-31 2000-12-08 Hitachi Ltd 試料の質量分析方法および装置、並びに水質の分析を行う質量分析方法
US20130015347A1 (en) 2011-07-14 2013-01-17 Bruker Daltonics, Inc. Mass spectrometer with precisely aligned ion optic assemblies
WO2019155543A1 (ja) 2018-02-07 2019-08-15 株式会社島津製作所 質量分析装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8492713B2 (en) * 2011-07-14 2013-07-23 Bruker Daltonics, Inc. Multipole assembly and method for its fabrication
JP6911948B2 (ja) * 2018-02-07 2021-07-28 株式会社島津製作所 質量分析装置
JP6860092B2 (ja) * 2018-02-07 2021-04-14 株式会社島津製作所 質量分析装置
JP6835264B2 (ja) * 2018-02-07 2021-02-24 株式会社島津製作所 質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000338088A (ja) 1999-05-31 2000-12-08 Hitachi Ltd 試料の質量分析方法および装置、並びに水質の分析を行う質量分析方法
US20130015347A1 (en) 2011-07-14 2013-01-17 Bruker Daltonics, Inc. Mass spectrometer with precisely aligned ion optic assemblies
WO2019155543A1 (ja) 2018-02-07 2019-08-15 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
JP2021082496A (ja) 2021-05-27
US11217439B2 (en) 2022-01-04
US20210151313A1 (en) 2021-05-20

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