JP7198782B2 - 直接変換放射線検出 - Google Patents

直接変換放射線検出 Download PDF

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Publication number
JP7198782B2
JP7198782B2 JP2019570819A JP2019570819A JP7198782B2 JP 7198782 B2 JP7198782 B2 JP 7198782B2 JP 2019570819 A JP2019570819 A JP 2019570819A JP 2019570819 A JP2019570819 A JP 2019570819A JP 7198782 B2 JP7198782 B2 JP 7198782B2
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Japan
Prior art keywords
cathode
light
direct conversion
radiation
conversion material
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JP2019570819A
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Japanese (ja)
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JP2020525768A (ja
JP2020525768A5 (enExample
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ブーケル ロヘル ステッドマン
クリストフ ヘルマン
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
JP2019570819A 2017-06-28 2018-06-21 直接変換放射線検出 Active JP7198782B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17178401.0A EP3422051A1 (en) 2017-06-28 2017-06-28 Direct conversion radiation detection
EP17178401.0 2017-06-28
PCT/EP2018/066671 WO2019002103A1 (en) 2017-06-28 2018-06-21 DETECTION OF RADIATION BY DIRECT CONVERSION

Publications (3)

Publication Number Publication Date
JP2020525768A JP2020525768A (ja) 2020-08-27
JP2020525768A5 JP2020525768A5 (enExample) 2021-07-26
JP7198782B2 true JP7198782B2 (ja) 2023-01-04

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JP2019570819A Active JP7198782B2 (ja) 2017-06-28 2018-06-21 直接変換放射線検出

Country Status (5)

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US (1) US11131780B2 (enExample)
EP (2) EP3422051A1 (enExample)
JP (1) JP7198782B2 (enExample)
CN (1) CN110869812B (enExample)
WO (1) WO2019002103A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118837935B (zh) * 2024-09-20 2025-02-14 陕西迪泰克新材料有限公司 一种α粒子探测器

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004146769A (ja) 2002-08-30 2004-05-20 Shimadzu Corp 放射線検出器
JP2007278792A (ja) 2006-04-05 2007-10-25 Canon Inc 放射線検出装置及び放射線検出システム
US20080164418A1 (en) 2007-01-08 2008-07-10 Arie Shahar Method, apparatus, and system of reducing polarization in radiation detectors
JP2010523997A (ja) 2007-04-12 2010-07-15 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ シンチレータの空間利得分布の決定
JP2016504567A (ja) 2012-11-09 2016-02-12 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器結晶のためのサブバンド赤外照射
JP2016510111A (ja) 2013-03-01 2016-04-04 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7223981B1 (en) 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
EP1620751B1 (en) 2003-04-24 2015-07-08 Philips Intellectual Property & Standards GmbH X-ray detector element
US20080016441A1 (en) 2006-01-06 2008-01-17 Tabin Joshua Z Method and Apparatus to Facilitate Altering a Presentation Order for Search Results
EP2707753B1 (en) * 2011-05-11 2019-06-12 Koninklijke Philips N.V. Ionizing radiation detection.
EP2715708A1 (en) * 2011-05-25 2014-04-09 Koninklijke Philips N.V. An identification system for a surface
US8824635B2 (en) 2011-10-27 2014-09-02 General Electric Company Detector modules for imaging systems and methods of manufacturing
RU2014128555A (ru) * 2011-12-13 2016-02-10 Конинклейке Филипс Н.В. Детектор излучения
DE102012213409B3 (de) * 2012-07-31 2014-11-13 Siemens Aktiengesellschaft Röntgenstrahlungsdetektor, CT-System und Verfahren hierzu
DE102012213411B4 (de) * 2012-07-31 2018-11-29 Siemens Healthcare Gmbh Verfahren zur Detektion von Röntgenstrahlung
DE102014217904B4 (de) 2014-09-08 2016-03-31 Siemens Aktiengesellschaft Röntgenstrahlungsdetektor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004146769A (ja) 2002-08-30 2004-05-20 Shimadzu Corp 放射線検出器
JP2007278792A (ja) 2006-04-05 2007-10-25 Canon Inc 放射線検出装置及び放射線検出システム
US20080164418A1 (en) 2007-01-08 2008-07-10 Arie Shahar Method, apparatus, and system of reducing polarization in radiation detectors
JP2010523997A (ja) 2007-04-12 2010-07-15 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ シンチレータの空間利得分布の決定
JP2016504567A (ja) 2012-11-09 2016-02-12 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器結晶のためのサブバンド赤外照射
JP2016510111A (ja) 2013-03-01 2016-04-04 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 検出器

Also Published As

Publication number Publication date
CN110869812A (zh) 2020-03-06
EP3646063B1 (en) 2024-08-21
CN110869812B (zh) 2024-01-02
US20200183023A1 (en) 2020-06-11
WO2019002103A1 (en) 2019-01-03
EP3646063A1 (en) 2020-05-06
JP2020525768A (ja) 2020-08-27
EP3422051A1 (en) 2019-01-02
US11131780B2 (en) 2021-09-28

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