JP7112157B2 - Winding test equipment - Google Patents

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a winding test apparatus for testing windings wound on coils or the like. In particular, it relates to a test for judging the quality of windings in a motor or the like.

A motor stator, a transformer, and the like are examples of parts having a coil with multiple windings. The windings are coiled. In order to ensure the quality of the parts, it is important for the coil to ensure insulation between windings and to prevent breakage of the insulation.

So, for example, an impulse test is performed to determine whether the coil is well insulated. In the impulse test, an impulse current is passed through a master sample coil in which there is no abnormality in the winding, and damped oscillation waveform data of the transient response voltage generated in the coil is collected in advance. An impulse current is also passed through the coil of the device under test to obtain damped vibration waveform data. The damped vibration waveform of the coil of the master sample is compared with the damped vibration waveform of the coil of the device under test.

JP 2015-114195 A

However, for example, the coil transient response voltage waveform obtained in the impulse test is affected by the environment during the impulse test. For this reason, it is desirable that the state of the environment during the test can be detected with higher accuracy in order to perform the determination more accurately.

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a winding test apparatus capable of more accurately determining a test in order to solve the above problems.

A winding test apparatus according to the present invention is a winding test apparatus for testing insulation defects in a winding wound around a device under test, and includes a voltage generation control unit that applies a voltage to the winding and a a voltage detection unit that outputs the detected voltage, an environment detection unit that detects a physical quantity representing the environment of the device under test in the test, and a determination of the quality of the device under test based on the voltage detected by the voltage detection unit. The environment detection section has a device under test temperature sensor for detecting the temperature of the device under test, and the device under test temperature sensor has a mounting portion having a shape matching the shape of the device under test. The device under test is an armature of a motor, and the mounting portion has a curved surface shape that can be brought into close contact along the curved surface of the tooth portion of the armature core of the armature .

According to this aspect of the invention, the environment detection section has the test object temperature sensor including the pedestal having the mounting portion having a shape matching the shape of the test object, thereby detecting the temperature of the test object more accurately. Therefore, it is possible to judge the test with higher accuracy.

BRIEF DESCRIPTION OF THE DRAWINGS It is a figure which shows the structure of the winding test apparatus 100 which concerns on Embodiment 1 of this invention. 1 is a diagram illustrating a commutator motor having a device under test 200 according to Embodiment 1 of the present invention; FIG. FIG. 2 is a diagram illustrating the configuration of an armature 260 according to Embodiment 1 of the present invention; FIG. It is a figure which shows an example of the detection voltage waveform based on Embodiment 1 of this invention. FIG. 3 is a diagram illustrating attachment of the device-under-test temperature sensor 131 to the device-under-test 200 according to the first embodiment of the present invention; It is a figure explaining the difference of the discharge voltage by environment. It is a block diagram which shows the structure of the control processing part 141 based on Embodiment 2 of this invention. FIG. 10 is a diagram showing a procedure of processing relating to determination performed by a control processing unit 141 in the winding test apparatus 100 according to Embodiment 2 of the present invention; FIG. 10 is a diagram showing data related to correction of the winding test apparatus 100 according to Embodiment 2 of the present invention in a table format;

Embodiment 1.
FIG. 1 is a diagram showing the configuration of a winding test apparatus 100 according to Embodiment 1 of the present invention. As shown in FIG. 1, the winding test apparatus 100 and the device under test 200 are connected by a connection line, for example. Then, the winding test apparatus 100 applies an impulse voltage to the device under test 200 to be determined through the connection line. The impulse voltage is a high voltage pulse voltage with a short application time. In addition, the winding test apparatus 100 detects the voltage of the device under test 200 based on the detected voltage, which is the voltage across the device under test 200, by applying the impulse voltage. 200 is determined. The winding test apparatus 100 has a voltage generation control section 110 , a voltage detection section 120 , an environment detection section 130 and a test control section 140 .

The voltage generation control section 110 controls the application of the impulse voltage supplied to the device under test 200 . The voltage generation control unit 110 has a voltage generation circuit 111, a capacitor 112, a switching circuit 113 having a thyristor and the like, and a switching control circuit 114. FIG.

Voltage generation circuit 111 charges capacitor 112 . The voltage generating circuit 111 generates a high voltage (usually several kV) that enables a general coil insulation test. The capacitor 112 accumulates charges supplied from the voltage generation circuit 111 . The switching circuit 113 performs a switching operation. When the switching circuit 113 shifts from the off state to the on state, the electric charge accumulated in the capacitor 112 is instantaneously released, and an impulse voltage is applied to the device under test 200 . The switching control circuit 114 controls switching operations performed by the switching circuit 113 .

Voltage detection unit 120 is, for example, a circuit having a voltage divider. The voltage detection section 120 detects, as a detection voltage, the voltage between the terminals of the device under test 200 when the impulse voltage generated by the voltage generation control section 110 is applied to the device under test 200 .

The environment detection unit 130 detects a physical quantity representing a difference in environment between the master sample device under test 200 and the device under test 200 to be determined during the impulse test. The environment detection section 130 has a temperature sensor 131 of the device under test, a humidity sensor 132 and an atmospheric pressure sensor 133 . The device under test temperature sensor 131 detects the temperature of the device under test 200 during the impulse test. Humidity sensor 132 detects the humidity in the impulse test environment. An air pressure sensor 133 detects the air pressure in the impulse test environment. The environment detection unit 130 will be detailed later.

The test control section 140 controls the winding test apparatus 100 . In particular, in the first embodiment, the timing of generating the impulse voltage of voltage generation control section 110 is controlled. Also, based on the detected voltage of the device under test 200 and the like, waveform processing, determination processing, waveform display processing, and the like are executed. The test control section 140 includes a control processing section 141 , an impulse voltage control section 142 , an operation input section 143 , a display section 144 and a storage section 145 .

The impulse voltage control section 142 outputs a control signal to the voltage generation circuit 111 based on the control signal from the control processing section 141 . The operation input unit 143 has input devices such as buttons, dials, and switches. The operation input unit 143 sends an input signal to the control processing unit 141 , for example, when the operator of the winding test apparatus 100 inputs settings and operations for testing the device under test 200 . Display unit 144 has a display device such as an LCD, for example. The display unit 144 displays the waveform of the voltage applied to the device under test 200, the waveform of the terminal voltage obtained by performing the impulse test, the determination result, and the like based on the display signal sent from the control processing unit 141. FIG.

The control processing unit 141 controls devices in the winding testing apparatus 100 and controls the entire apparatus. In particular, it controls impulse tests. Also, based on the data obtained by the impulse test, the quality of the device under test 200 is determined. The control processing unit 141 is configured by, for example, a microcomputer having a control processing unit such as a CPU (Central Processing Unit) as hardware.

The storage unit 145 is a device that stores data required when the control processing unit 141 performs processing. The storage unit 145 includes, for example, a volatile storage device (not shown) such as a random access memory (RAM) capable of temporarily storing data, a hard disk, and a non-volatile auxiliary storage such as a flash memory capable of long-term data storage. It has a device (not shown) and the like. The storage unit 145 has data in which the processing procedure performed by the control processing unit 141 is a program. Then, the control arithmetic processing unit executes processing based on the data of the program to realize the processing of each section.

FIG. 2 is a diagram illustrating a commutator motor having a device under test 200 according to Embodiment 1 of the present invention. As shown in FIG. 2, in the first embodiment, the device under test 200 is an armature 260 of a commutator motor used in vacuum cleaners, hand dryers, and the like. Here, in Embodiment 1, the commutator motor having armature 260 is assumed to be a three-phase motor. Then, the winding test apparatus 100 determines the insulation state of the windings between the phases of the armature 260 and the like. Of the devices under test 200, the device under test 200 that is used as a reference for judging quality is the master sample. Prior to the impulse test of the device under test 200 to be determined, the master sample is subjected to measurement by the impulse test in advance. Based on the data obtained when the impulse test is performed with the master sample as the device under test 200, the data of the judgment reference value, which is the reference for judging the device under test 200 to be judged, is obtained. The determination reference value data is stored in the storage section 145 of the test control section 140 described above. In the following description of Embodiment 1, the device under test 200 is the armature 260 .

As shown in FIG. 2, the commutator motor has a frame 210, bearings 220, a rotating shaft 230, a commutator 240, brushes 250, an armature (rotor) 260, a stator 270, and the like.

A frame 210 covers and protects the motor body portion. Further, the frame 210 is provided with a bearing 220 that rotatably supports the rotating shaft 230 . Further, the rotating shaft 230 is provided with an armature core 261 having a plurality of teeth formed on the outer peripheral portion thereof. An armature winding 262 is wound around each tooth to form an armature 260 . A commutator 240 composed of a plurality of commutator segments is installed on the rotating shaft 230 . An armature winding 262 wound around the teeth of an armature core 261 is connected to each commutator segment. The commutator 240 is in contact with two brushes 250 that supply current to the armature winding 262 via commutator bars. The brush 250 is attached to a brush holder 251 provided on the frame 210 .

On the other hand, a stator 270 is installed on the inner peripheral portion of the frame 210 with a predetermined gap from the outer peripheral portion of the armature 260 . Two pole pieces 271 (not shown) facing each other are formed on the inner periphery of the stator 270 . A field winding 272 is wound around each pole piece 271 to form a magnetic pole. Each field winding 272 has one end connected to the terminals (not shown) of the commutator motor and the other end connected to the brushes 250 .

FIG. 3 is a diagram illustrating the configuration of armature 260 according to Embodiment 1 of the present invention. FIG. 3 shows a view of the armature 260 viewed from the direction along the rotating shaft 230 . As shown in FIG. 3, the armature core 261 has a substantially circular shape, and a plurality of teeth are formed on the outer peripheral portion. A through-hole 264 into which the rotating shaft 230 is inserted is formed at substantially the center of the armature core 261 . In addition, the armature core 261 is configured by circularly arranging n armature pieces 263-1 to 263-n each having a fan shape, one piece corresponding to one pole, and being circularly arranged around the through-hole. be done. Each of the armature pieces 263-1 to 263-n is a grain-oriented magnetic steel plate, and can be formed by laminating thin plates punched out by a press or the like. The outer peripheral portions of the armature pieces 263 - 1 to 263 -n form the tooth portions of the armature core 261 . An armature winding 262 is wound around the armature core 261 . In Embodiment 1, an impulse test is performed by applying an impulse voltage to the armature winding 262 or the like.

FIG. 4 is a diagram showing an example of detected voltage waveforms according to Embodiment 1 of the present invention. When an impulse voltage is applied to the windings of the device under test 200, the detected voltage undergoes damped oscillation and has a waveform as shown in FIG.

Next, the relationship between the device under test 200 and the environment detection section 130 will be described. As described above, the device under test 200 and the environment in the vicinity of the device under test 200 during the impulse test affect the voltage value related to detection and the like. Therefore, it is better to arrange the environment in which the impulse test is performed on the armature 260 serving as the master sample and the environment in which the impulse test is performed on the armature 260 to be determined. In order to prepare the environment, it is better to be able to detect the environment in the impulse test more accurately.

5A and 5B are diagrams illustrating attachment of the device-under-test temperature sensor 131 to the device-under-test 200 according to the first embodiment of the present invention. The temperature of the device under test 200 is the temperature of the winding. The windings change resistivity with temperature. Therefore, it is necessary to accurately detect the temperature of the device under test 200 . Here, if the temperature sensor is brought into direct contact with the windings, the windings may be damaged. In addition, since the adhesion and heat transferability are impaired, there is a possibility that the temperature detection accuracy will rather deteriorate. Therefore, in Embodiment 1, the device under test temperature sensor 131 is attached in close contact with the armature core 261 of the armature 260 serving as the device under test 200 to detect the temperature of the armature winding 262 .

As shown in FIG. 5, the device under test temperature sensor 131 has a pedestal 131A with a mounting portion 131B. The mounting portion 131B has a curved surface shape that can be brought into close contact along the curved surface of the tooth portion of the armature core 261 . A sensor body (not shown) is embedded in the pedestal 131A. Then, the mounting portion 131B of the pedestal 131A is mounted in close contact with the armature core 261, and an impulse test is performed. Therefore, the temperature of the armature 260 that is the device under test 200, which is the temperature of the armature winding 262, can be detected more accurately. For example, grease or the like may be applied to the pedestal 131A to further enhance adhesion and heat transfer with the armature core 261 serving as the device under test 200 .

Here, the armature 260 has a plurality of windings with different phases. Then, when testing insulation between different phases, a voltage is applied between windings at different positions on the armature 260 . Different positions on the armature 260 can also result in different winding temperatures. Moreover, the temperature of the armature 260 may change by performing the test a plurality of times on the armature 260 serving as the device under test 200 .

Therefore, the winding test apparatus 100 of Embodiment 1 has a plurality of device-under-test temperature sensors 131 . Then, a plurality of temperature sensors 131 of the device under test detect temperatures at a plurality of locations near the windings of the armature core 261 to be tested. In FIG. 5, the device under test temperature sensors 131 are attached at two locations.

FIG. 6 is a diagram for explaining the difference in discharge voltage depending on the environment. FIG. 6 shows the Paschen curve. The Paschen curve is a curve showing the relationship between voltage and gas pressure×distance when insulation breaks down and discharge occurs, based on Paschen's law. In the impulse test, the winding test apparatus 100 applies an impulse voltage to the device under test 200 to be tested through a connection line. When the distance between windings is short, discharge occurs as shown in FIG. 4 described above. At this time, for example, if the winding is damaged and not insulated, discharge is likely to occur. Therefore, the state of the winding can be known from the amount of discharge, the number of times of discharge, etc. appearing in the voltage waveform.

Here, assuming that the inter-electrode distance is the same, as shown in FIG. 6, the voltage to be discharged varies depending on the air pressure at which the impulse test is performed. Also, the humidity and the temperature of the device under test 200 affect the discharge. Therefore, the winding test apparatus 100 of Embodiment 1 preferably has not only the device-under-test temperature sensor 131 but also the humidity sensor 132 and the atmospheric pressure sensor 133 . In the winding test apparatus 100, the humidity sensor 132 and the air pressure sensor 133 are arranged as close as possible to the armature 260, which is the device under test 200. for more accurate detection.

As described above, according to the winding test apparatus 100 of Embodiment 1, by including the environment detection section 130, the environment such as the temperature of the device under test during the impulse test can be detected and recorded as data. . In particular, the device-under-test temperature sensor 131 has a pedestal 131A having a mounting portion 131B that conforms to the curved surface of the armature core 261 at a position where the temperature of the winding can be detected. can be installed. Therefore, the temperature of the armature 260, which is the device under test 200, can be detected more accurately. Moreover, by arranging the humidity sensor 132 and the atmospheric pressure sensor 133 as close as possible to the armature 260 which is the device under test 200, the atmospheric pressure and humidity at the armature 260 can be detected more accurately.

Embodiment 2.
FIG. 7 is a block diagram showing the configuration of control processing section 141 according to Embodiment 2 of the present invention. In the winding testing apparatus 100 of the second embodiment, the control processing section 141 includes a test control processing section 141A, a detection control processing section 141B, an arithmetic processing section 141C, a determination reference value correction processing section 141D, a determination processing section 141E and display processing. It has a portion 141F.

The test control processing section 141A performs processing for controlling devices in the winding testing apparatus 100 . In particular, a control signal is sent to the impulse voltage control section 142 to cause the voltage generation control section 110 to control impulse voltage generation. The detection control processing unit 141B controls detection of voltage by the voltage detection unit 120 and detection of temperature, humidity, and atmospheric pressure by the environment detection unit 130 . Then, a process of storing the detected voltage and the like in the storage unit 145 as data is performed. Further, the arithmetic processing unit 141C calculates the determination value of the device under test 200 based on the data of the detected voltage of the device under test 200 to be tested, which is detected by the voltage detection unit 120 by, for example, an impulse test. The determination reference value correction processing unit 141D performs processing for correcting the determination reference value stored in the storage unit 145 based on data related to detection by the environment detection unit 130 and the like. The determination processing unit 141E performs processing such as comparing the determination value calculated by the arithmetic processing unit 141C and the determination reference value corrected by the determination reference value correction processing unit 141D, and determines the quality of the device under test 200. conduct. The display processing unit 141F performs a process of sending a display signal to the display unit 144 and displaying data such as the result of pass/fail determination of the device under test 200 and the detected voltage of the device under test 200 .

The storage unit 145 stores determination reference values obtained based on data obtained by performing an impulse test on the master sample. As described above, the environment in which the impulse test is performed on the master sample may differ from the environment in which the impulse test is performed on the test object. At this time, it is sufficient to eliminate the difference in the judgment result due to the difference from the environment in the impulse test of the master sample.

Therefore, the winding test apparatus 100 of the second embodiment performs the impulse test on the device under test 200 to be tested, based on the temperature, humidity, and air pressure data detected by the environment detection unit 130, Correct the judgment reference value. Then, the judgment value of the device under test 200 to be tested is compared with the corrected judgment reference value to make a pass/fail judgment. Based on the environment of the impulse test of the device under test 200 to be tested, the judgment reference value is corrected instead of the voltage value or the like related to the measurement, so that the judgment processing can be performed quickly.

FIG. 8 is a diagram showing a procedure of processing relating to determination performed by the control processing section 141 in the winding test apparatus 100 according to Embodiment 2 of the present invention. The detection control processing unit 141B stores environmental data such as temperature, humidity, and atmospheric pressure detected by the environment detection unit 130 in the storage unit 145 (step S1).

Then, the test control processing section 141A controls the voltage generation control section 110 to perform an impulse test on the device under test 200 (step S2). Then, the detection control processing unit 141B stores the voltage related to the detection by the voltage detection unit 120 as data in the storage unit 145 (step S3). The arithmetic processing unit 141C calculates the determination value of the device under test 200 to be determined based on the data of the detected voltage of the device under test 200 to be tested (step S4).

FIG. 9 is a table showing data relating to correction of the winding test apparatus 100 according to Embodiment 2 of the present invention. Data related to correction are stored in the storage unit 145 in the same manner as the determination reference value. In FIG. 9, the temperature, humidity, and air pressure of the device under test 200 are divided into three categories based on the difference from the environment in the impulse test of the master sample, and correction values are determined. The central division includes the case where the difference is 0 for each of the temperature, humidity, and air pressure of the device under test 200, and the correction value when the environmental difference, which is the difference in the values related to the environment, is within a predetermined range. represent. In addition, the division on the right side represents correction values for humidity and atmospheric pressure when the values related to the environment of the impulse test of the device under test 200 to be tested are larger. On the other hand, the division on the left side is for the correction when the impulse test environment of the master sample is larger for each of the humidity and atmospheric pressure (when the values related to the impulse test environment of the device under test 200 to be tested are smaller). represents a value. Although the correction values are set for three divisions here, it may be divided into more divisions. By dividing into many categories, the judgment reference value can be finely corrected. In addition, even if the number of digits of the correction value including the judgment reference value and the judgment value is increased, the judgment reference value can be finely corrected.

In the second embodiment, the determination reference value correction processing unit 141D derives the correction value for the corresponding category from the data in the table format shown in FIG. 9 based on the environmental data stored in the storage unit 145, Addition and subtraction are performed to perform correction processing (step S5).

For example, when the temperature detected by the device under test temperature sensor 131 is high, the electrical resistance of the windings increases. In FIG. 9, the correction value is lower in the right section than in the left section. Therefore, when the temperature of the device under test 200 is higher in the impulse test of the device under test 200 to be tested, the judgment reference value is corrected to lower the judgment reference value. Similarly, high humidity will lower the discharge voltage. Therefore, when the humidity is high, the criterion value is lowered. Furthermore, regarding the air pressure, the Paschen curve as shown in FIG. It tends to increase with distance and atmospheric pressure. Therefore, when the air pressure is low, the discharge voltage is low, and when the air pressure is high, the discharge voltage is high. Therefore, when the air pressure is low, the judgment reference value is lowered.

The determination processing unit 141E compares the determination value and the determination reference value, and determines whether the determination value is equal to or greater than the determination reference value (step S6). If the judgment value is equal to or greater than the judgment reference value, the judgment result is judged to be good (step S7). If the determination value is not equal to or greater than the determination reference value but is lower than the determination reference value, the determination result is negative (step S8). The display processing unit 141F sends a display signal to the display unit 144 to display the determination result of the determination processing unit 141E (step S9).

As described above, in the winding test apparatus 100 of the second embodiment, the determination reference value correction processing unit 141D corrects the determination reference value based on the environmental data detected by the environment detection unit 130, and the determination processing unit 141E However, the judgment process is performed based on the corrected judgment reference value. Therefore, it is possible to eliminate the difference in the determination result due to the environment when the impulse test is performed on the master sample and when the device under test 200 to be determined is subjected to the impulse test. In particular, the process can be simpler than the case where the impulse test data for the device under test 200 to be tested is corrected based on the environment and then the judgment value is calculated again.

Reference Signs List 100 winding tester, 110 voltage generation control unit, 111 voltage generation circuit, 112 capacitor, 113 switching circuit, 114 switching control circuit, 120 voltage detection unit, 130 environment detection unit, 131 test object temperature sensor, 131A pedestal, 131B Mounting unit 132 Humidity sensor 133 Atmospheric pressure sensor 140 Test control unit 141 Control processing unit 141A Test control processing unit 141B Detection control processing unit 141C Operation processing unit 141D Judgment reference value correction processing unit 141E Judgment processing unit , 141F display processing unit, 142 impulse voltage control unit, 143 operation input unit, 144 display unit, 145 storage unit, 200 device under test, 210 frame, 220 bearing, 230 rotating shaft, 240 commutator, 250 brush, 251 brush holder , 260 armature, 261 armature core, 262 armature winding, 263-1 to 263-n armature pieces, 264 through hole, 270 stator, 271 magnetic pole piece, 272 field winding.

Claims (5)

A winding test device for testing insulation defects in windings wound around a device under test,
a voltage generation control unit that applies a voltage to the winding;
a voltage detection unit that outputs a detected voltage detected in the winding;
an environment detection unit that detects a physical quantity representing the environment of the device under test in the test;
a test control unit that determines the quality of the device under test based on the detected voltage related to the detection of the voltage detection unit;
The environment detection unit has a device under test temperature sensor that detects the temperature of the device under test,
The device under test temperature sensor comprises a pedestal having a mounting portion having a shape matching the shape of the device under test ,
The device under test is an armature of a motor, and the mounting portion has a curved surface shape that can be brought into close contact along the curved surface of the tooth portion of the armature core of the armature . 2. The winding test apparatus according to claim 1, wherein the environment detection unit detects a difference between the environment during the test of the device under test and the environment used as a reference for the determination. 3. The winding test apparatus according to claim 1, wherein the environment detection section has a plurality of temperature sensors for the device under test, and detects temperatures at a plurality of locations of the device under test. The winding test apparatus according to any one of claims 1 to 3, wherein the environment detection section further includes a humidity sensor and an air pressure sensor. The test control unit
an arithmetic processing unit that calculates a judgment value based on the detected voltage related to detection by the voltage detection unit;
a reference value correction processing unit that corrects a set judgment reference value based on data related to detection by the environment detection unit;
2. A judgment processing unit for judging the quality of the device under test based on a comparison between the judgment reference value corrected by the reference value correction processing unit and the judgment value calculated by the arithmetic processing unit. The winding test device according to any one of claims 4 to 5.

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