JP2005037351A - Coil insulation inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a coil insulation inspection device capable of exactly obtaining test waveform and its characteristic values and accurately judging good or bad. <P>SOLUTION: Firstly, calibration is performed. Then the temperature and humidity of a test room and the temperature of the coil to be inspected are measured. Then, impulse voltage is impressed to the coil to be inspected and the voltage waveform (test waveform) obtained by it is measured. Then, compensation processing (averaging processing, smoothing processing and the like) are performed to the test waveform. Next, characteristic values are extracted based on the test waveform after the compensation processing. Then, compensation processing according to the variation of the temperature and the humidity is applied to the characteristic values. Finally, whether or not the characteristic values are in the range of specification control values is judged. The specification control values are those determined by statistical processing on the basis of the characteristic those of a plurality of coils. The judged results are stored together with the measured test waveform and the characteristic values. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a coil insulation inspection apparatus for detecting an insulation failure of a coil used in various motors. More specifically, the present invention relates to a coil insulation inspection apparatus capable of accurately determining the quality of a coil.

  In recent years, hybrid vehicles, electric vehicles, etc. have attracted attention from the viewpoint of low pollution. Conventionally, since vehicle drive motors mounted on these vehicles are required to have high-precision performance characteristics, various performance inspections have been performed on the components of the motors. As an insulation inspection of a coil that is one of the components of the motor, for example, an impulse voltage is applied to the coil to be inspected, and then a damped oscillation waveform of a voltage generated when both ends of the coil to be inspected are opened (hereinafter referred to as the following). A test method for determining pass / fail based on “test waveform” is disclosed (for example, a test method described in Patent Document 1).

  Specifically, the procedure is as shown in the flowchart of FIG. As a premise for starting inspection, it is assumed that a test waveform obtained from a non-defective coil is set in advance as a master waveform. First, an impulse voltage is applied to the coil to be inspected, and a test waveform obtained thereby is measured (S21). Next, A / D conversion of the test waveform is performed (S22). Next, necessary characteristic values are extracted from the test waveform and the master waveform (S23). Then, pass / fail judgment is performed by comparing the characteristic value of the test waveform with the characteristic value of the master waveform (S24). A coil with poor insulation is detected based on the result of the quality determination.

In addition, as a characteristic value, there exists what is calculated | required by the following formula | equation (1)-(4), for example (refer FIG. 23 about each variable in a formula).
・ Zero cross time difference (seconds) = tm−ts (1)
-Attenuation ratio = Test waveform attenuation rate / Master waveform attenuation rate (2)
Attenuation rate = ((V3 / V1) + (V4 / V2)) / 2 (3)
Generated voltage difference (V) = V1m−V1s (4)
In Expression (1), tm and ts are the time when the voltage of the master waveform becomes 0V and the time when the voltage of the test waveform becomes 0V, respectively. Further, V1 to V4 in the equation (3) are peak voltages of the test waveform or the master waveform. In the equation (4), V1m and V1s are the primary peak voltage of the master waveform and the primary peak voltage of the test waveform, respectively.

In addition, the area ratio in the determination section can be used as the characteristic value. Contrasting parts include a method in which the ratio between the area Sm of the master waveform and the area Ss of the test waveform is a characteristic value (area ratio) as shown in FIG. 24, and the master waveform and the test waveform as shown in FIG. There is a method in which the ratio of the difference area ΔS and the master waveform area Sm is a characteristic value (area difference ratio). Each characteristic value is calculated | required by following Formula (5)-(6).
Area ratio = (1- (Ss / Sm)) (5)
・ Area difference ratio = △ S / Sm (6)
JP 2001-215253 A

  However, the conventional test method described above has the following problems. That is, there is no confirmation that the coil that is the basis of the master waveform is a good product (Problem 1). Therefore, when the coil is a defective product, an appropriate quality determination is not made. Also, the concept of performance variation is not considered (Problem 2). That is, the coil that is the basis of the master waveform does not always exhibit the average characteristics of the coil. For this reason, the upper and lower limit values (hereinafter referred to as “standard management values”) that serve as a reference for determining pass / fail are not necessarily within an appropriate range. Therefore, there is no confirmation that an accurate pass / fail judgment has been made.

  In addition, since the test waveform is used as it is for characteristic value extraction and pass / fail judgment, it is susceptible to noise (Problem 3). In addition, since an accurate characteristic value cannot be obtained due to the influence of the noise, there is a risk of erroneous determination.

  In addition, repeated use may cause a fine adjustment of the measuring device. Also, sometimes it breaks down. For this reason, the set value of the impulse voltage and the peak value of the actually applied impulse voltage do not always match. In addition, measured values such as voltage and decay time when acquiring a test waveform may slightly deviate from actual values. However, there is no way to confirm these deviations (Problem 4). Furthermore, it does not have a correction function for the deviation. For this reason, there is no confirmation that accurate pass / fail judgment has been made.

  Further, it is known that the characteristics of the coil change depending on temperature and humidity. Specifically, the characteristics vary depending on the temperature of the coil to be inspected, the temperature of the inspection apparatus, the temperature in the inspection room, the humidity, the atmospheric pressure, and the like. However, the inspection apparatus used for the insulation test of the coil of the vehicle drive motor does not have a correction function for these changes. For this reason, test waveforms and characteristic values obtained with conventional inspection apparatuses are significantly affected by environmental changes (Problem 5). That is, the measured value may not be the characteristic value of the coil. Therefore, even if the coil itself is manufactured correctly, it can be erroneously determined depending on the measurement environment. Conversely, a defective coil may be erroneously determined as a good product.

  Further, the inspection device used for the insulation test of the coil of the vehicle drive motor does not have a function of changing the scale on the display (Problem 6). Therefore, especially in low-voltage tests, waveform changes may not be recognized accurately, and pass / fail judgments may not be made accurately.

  Further, it is known that individual coil characteristics (electric resistance R, inductance L, electric capacity C, etc.) of the coil to be inspected vary depending on manufacturing conditions at the time of forming the coil. Specifically, the characteristics vary due to the handling of the coil wire. However, the inspection apparatus used for the insulation inspection of the coil of the vehicle drive motor does not have a correction function for variations in coil characteristics. For this reason, test waveforms and characteristic values obtained with conventional inspection apparatuses are affected by differences in manufacturing conditions (Problem 7). That is, the determination may not be performed under the determination condition corresponding to the original characteristic value of the coil. Therefore, even if the coil itself is manufactured correctly, it can be erroneously determined due to a difference in manufacturing conditions.

  Further, in the test for determining pass / fail by the attenuation ratio of the test waveform, the attenuation ratio and the like are obtained with reference to the primary peak voltage and the primary zero cross time. Therefore, it is assumed that the primary peak voltage and primary zero cross time of the coil to be inspected are equal to the primary peak voltage and primary zero cross time of the master waveform. However, even if the same impulse voltage is applied to all the coils to be inspected, the calculation criteria for the peak voltage and the zero crossing time vary due to differences in the environment and variations in coil characteristics (Problem 8). Therefore, there is no confirmation that an accurate pass / fail judgment has been made.

  The present invention has been made to solve at least one of the problems of the prior art described above. That is, an object of the present invention is to provide a coil insulation inspection apparatus that can obtain an accurate test waveform and its characteristic value and can perform a pass / fail judgment with high accuracy.

  A coil insulation inspection apparatus for solving this problem is a coil insulation inspection apparatus for detecting an insulation failure of a coil, and a voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to a coil to be inspected. A characteristic value extracting means for extracting the characteristic value from the voltage waveform of the coil to be inspected acquired by the voltage waveform acquiring means, and a characteristic value extracted by the characteristic value extracting means for each type of characteristic value. And an absolute evaluation means for performing an absolute evaluation of the quality of insulation depending on whether or not it is within a set management value range.

  That is, in this coil insulation inspection apparatus, the characteristic value is extracted from the voltage waveform acquired by the voltage waveform acquisition means, that is, the test waveform of the coil to be inspected. Then, pass / fail judgment is performed based on whether or not the characteristic value is within the range of the management value. The control value here is a value that defines the upper and lower limits of a reference range in order to judge whether the insulation is good or bad. That is, the pass / fail judgment is made only with the test waveform without setting the master waveform. Therefore, the problem (problem 1) of whether or not the master waveform is appropriate does not occur. Therefore, the coil insulation inspection apparatus of the present invention can make an appropriate quality determination.

  Another coil insulation inspection apparatus of the present invention is a coil insulation inspection apparatus for detecting a coil insulation failure, a voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to a coil to be inspected, Based on a plurality of master voltage waveforms, a waveform representative of those voltage waveforms is calculated, and from the results, a master waveform creating means for creating a master waveform as a reference for inspection, and a master waveform created by the master waveform creating means Characteristic value extracting means for extracting each characteristic value from the waveform and the voltage waveform of the coil to be inspected acquired by the voltage waveform acquiring means; the characteristic value of the master waveform extracted by the characteristic value extracting means; Relative evaluation means for comparing the characteristic value of the voltage waveform of the coil and performing a relative evaluation of the quality of the insulation based on the comparison result is provided.

  That is, in this coil insulation inspection apparatus, characteristic values are extracted from the master waveform created by the master waveform creating means and the voltage waveform (test waveform) obtained by the voltage waveform obtaining means. And the quality determination is performed by comparing those characteristic values. That is, the pass / fail judgment is performed by comparing the master waveform and the test waveform. Further, the master waveform is created based on a plurality of master voltage waveforms. The master voltage waveform here is a waveform of a coil other than the coil to be inspected, which may be acquired by the voltage waveform acquisition means, or prepared in advance as a waveform of a good product coil. Also good. Then, a waveform representative of the master voltage waveform is calculated. As a representative waveform, for example, there is a waveform obtained by averaging the master voltage waveform. In addition, a master waveform may be created from the median, mode, etc. As a result, the master waveform has typical characteristics of the coil. Therefore, the problem related to the master waveform (problem 1) and the problem related to performance variation (problem 2) are alleviated. Therefore, the coil insulation inspection apparatus of the present invention can make an appropriate quality determination.

  Another coil insulation inspection apparatus of the present invention is a coil insulation inspection apparatus for detecting a coil insulation failure, a voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to a coil to be inspected, A representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms for the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; The characteristic value extracting means for extracting the characteristic value from the representative waveform created by the representative waveform creating means, and the characteristic value extracted by the characteristic value extracting means is the management value set for each type of characteristic value. And an absolute evaluation means for performing an absolute evaluation of the quality of insulation depending on whether or not it is within the range.

  That is, in this coil insulation inspection apparatus, a representative waveform of the coil to be inspected is created from a plurality of voltage waveforms obtained by applying the impulse voltage a plurality of times by the representative waveform creating means. Thereby, the influence (problem 3) of noise generated in the voltage waveform is alleviated, and an accurate voltage waveform and its characteristic value can be obtained. Note that smoothing may be performed on the voltage waveform acquired by the voltage waveform acquisition means or the representative waveform of the coil to be inspected. Thereby, the waveform becomes smooth, and a more accurate waveform and its characteristic value can be acquired. Further, in this coil insulation inspection apparatus, since the pass / fail judgment is made only by the test waveform without setting the master waveform, the problem (problem 1) of whether the master waveform is appropriate does not occur. Therefore, the coil insulation inspection apparatus of the present invention can obtain an accurate test waveform, and the accuracy of the pass / fail judgment is high.

  Another coil insulation inspection apparatus of the present invention is a coil insulation inspection apparatus for detecting a coil insulation failure, a voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to a coil to be inspected, A representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms for the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; Based on a plurality of master voltage waveforms, a waveform representative of those voltage waveforms is calculated, and from the results, a master waveform creating means for creating a master waveform as a reference for inspection, and a master waveform created by the master waveform creating means A characteristic value extracting means for extracting each characteristic value from the waveform and the representative waveform created by the representative waveform creating means, and a master waveform extracted by the characteristic value extracting means. And comparing the characteristic value of sexual values representative waveform, and has a relative evaluation means for performing a relative assessment of the quality of the insulation on the basis of the comparison result.

  That is, in this coil insulation inspection apparatus, the influence of noise (Problem 3) is mitigated by creating a representative waveform of the coil to be inspected from a plurality of voltage waveforms by the representative waveform creating means. In addition, the master waveform creation means creates a master waveform from a plurality of master voltage waveforms, thereby alleviating the problem relating to the master waveform (problem 1) and the problem relating to performance variations (problem 2). Therefore, the coil insulation inspection apparatus of the present invention can obtain an accurate test waveform, and the accuracy of the pass / fail judgment is high.

  Further, these coil insulation inspection apparatuses of the present invention have calibration means for applying a voltage to a standard specimen, obtaining a voltage waveform obtained thereby, and performing calibration based on the voltage waveform. The means is better if the calibration is automatically performed before the impulse voltage is applied to the coil to be inspected. In other words, the problem (problem 4) related to the deviation of the measured value is alleviated by automatically performing fine adjustment of the measuring device. Therefore, the coil insulation inspection apparatus of the present invention can obtain an accurate measurement value.

  The coil insulation inspection apparatus according to the present invention further includes management value determining means for acquiring characteristic values of a plurality of coils and performing statistical processing based on these characteristic values to determine a management value necessary for pass / fail judgment. It is better to have it. That is, the management value required for pass / fail judgment is determined from the data of a plurality of coils. Thereby, the problem (problem 2) related to the variation in performance is alleviated. Therefore, the coil insulation inspection apparatus of the present invention can make an appropriate quality determination.

  Further, the management value determining means of the coil insulation inspection device described above is better to reuse the characteristic value of the coil evaluated as a non-defective product by the absolute evaluation means or the relative evaluation means as an element of statistical processing. That is, good coil data is automatically added as an element for determining the control value. As a result, the element for determining the management value increases each time the inspection is performed, and the more accurate the management value can be obtained as the inspection is performed.

  Further, these coil insulation inspection apparatuses of the present invention have environmental data acquisition means for detecting at least one of temperature and humidity, and environmental correction means for correcting the characteristic value according to the detection result of the environmental data acquisition means. It is better if it is. Alternatively, the environmental characteristic data acquisition means for detecting at least one of the temperature of the coil to be inspected, the temperature of the apparatus main body, the temperature in the test room, the humidity, and the atmospheric pressure, and the characteristic value or standard according to the detection result of the environmental characteristic data acquisition means It is better to have environmental characteristic correction means for correcting one of the control value and the voltage waveform of the coil to be inspected. That is, before the pass / fail judgment is made, the characteristic value is corrected based on the environmental data such as temperature and humidity by the environmental correction means or the environmental characteristic correction means. Then, the environmental problem (problem 5) is alleviated by performing pass / fail judgment based on the correction value. The target to be corrected is not limited to the characteristic value, but may be a management value, a test waveform, or the like. Further, fine adjustment of the measuring device may be performed. Thereby, the coil insulation test | inspection apparatus of this invention can perform an exact quality determination.

  The coil insulation inspection apparatus according to the present invention extracts a portion of the voltage waveform of the coil to be inspected necessary for inspection, and automatically adjusts the scale on the display according to the maximum value and the minimum value of the voltage in the extracted portion. It is better to have a scale changing means for changing to. That is, the coil insulation inspection apparatus according to the present invention extracts a part necessary for the inspection and automatically changes the scale on the display. This alleviates the problem related to resolution (Problem 6). The display scale may be changed according to the peak value of the impulse voltage applied to the coil to be inspected.

  These coil insulation inspection apparatuses of the present invention include coil characteristic data acquisition means for detecting the coil characteristics of the coil to be inspected, and characteristic values, standard control values, It is better to have a coil characteristic correcting means for correcting any one of the voltage waveforms. That is, before the pass / fail judgment is made, the characteristic value is corrected by the coil characteristic correcting means based on the data relating to the characteristic (LCR) of the coil to be inspected. And the problem (problem 7) about manufacturing conditions is eased by performing quality determination based on this correction value. The correction target is not limited to the characteristic value, but may be a management value, a test waveform, or the like. Further, fine adjustment of the measuring device may be performed. Thereby, the coil insulation test | inspection apparatus of this invention can perform a more appropriate quality determination.

  Further, these coil insulation inspection apparatuses of the present invention have standard characteristic data means for acquiring at least one of a peak voltage and a zero cross time obtained when a voltage is applied to a standard specimen, and the detection result of the standard characteristic data acquisition means. It is better to have standard characteristic correction means for correcting any one of the characteristic value, the standard control value, and the voltage waveform of the coil to be inspected according to the above. That is, before the pass / fail judgment is made, the characteristic value is corrected by the standard characteristic correcting means based on the peak voltage and the zero crossing time of the standard specimen. The problem (problem 8) related to the test conditions is alleviated by making a pass / fail judgment based on the correction value. The correction target is not limited to the characteristic value, but may be a management value, a test waveform, or the like. Further, fine adjustment of the measuring device may be performed. Thereby, the coil insulation test | inspection apparatus of this invention can perform a more appropriate quality determination.

  According to the present invention, at least one of the above problems 1 to 8 can be solved. Therefore, there is provided a coil insulation inspection apparatus that can obtain an accurate test waveform and its characteristic value and can perform a pass / fail judgment with high accuracy.

  DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments embodying the present invention will be described below in detail with reference to the accompanying drawings. In this embodiment, the present invention is applied to a coil insulation inspection device for a vehicle driving motor.

  As shown in FIG. 1, the coil insulation inspection apparatus 100 according to the embodiment includes an impulse tester 2, a data processing computer 3, a switching box 4, a noise filter 5, a control panel 6, and a workpiece temperature measuring device 7. And a temperature / humidity measuring device 8. The workpiece 1 to be inspected includes a coil to be inspected in each of the U, V, and W phases as a stator coil. The impulse tester 2 applies an impulse voltage to the workpiece 1 to be inspected. The impulse tester 2 is electrically connected to the work 1 to be inspected via the switching box 4. The data processing computer 3 determines pass / fail of the workpiece 1 to be inspected based on the damped oscillation waveform of the voltage obtained from the coil to be inspected by applying the impulse voltage. The determination result is output to output means such as a monitor 31 and a printer 33 attached to the data processing computer 3. The inspector can know the test result through the monitor 31, for example, as shown in FIG. Furthermore, the inspector can process the output contents by using input means such as a keyboard and a mouse 32. The switching box 4 switches the measurement location of the workpiece 1 to be inspected. Specifically, there are three measurement locations in this embodiment, between UV, between VW, and between WU. The workpiece temperature measuring device 7 measures the temperature of the motor in the workpiece 1 to be inspected. The measuring device may be a contact type or a non-contact type. The temperature / humidity measuring device 8 measures the temperature and humidity in the test chamber.

  Next, an inspection method using the coil insulation inspection apparatus 100 will be described. In this inspection, an impulse voltage is applied to the workpiece 1 to be inspected, and then a voltage waveform generated at both ends of the inspected coil is measured. Then, the quality of the coil is determined based on the characteristic value obtained from the waveform. In general, there are two evaluation methods for characteristic values: relative evaluation and absolute evaluation. Here, “relative evaluation” is a method in which a reference waveform (master waveform) is compared with a waveform (test waveform) obtained from a coil to be inspected, and quality is determined based on the comparison result. An example of relative evaluation is the test method described in the prior art. On the other hand, the “absolute evaluation” is a method for determining pass / fail only with a waveform (test waveform) obtained from a coil to be inspected. Since the master waveform is not used in the absolute evaluation, a problem related to the master waveform (problem 1) does not occur. Hereinafter, the procedure of the coil insulation inspection in the absolute evaluation will be described based on the flowchart of FIG.

[Form of absolute evaluation]
First, the coil insulation inspection apparatus 100 is calibrated (S11). That is, the set voltage is changed or the measuring device is finely adjusted as necessary. Specifically, as shown in FIG. 4, a predetermined peak voltage and a predetermined decay time (zero crossing time) are measured with a standard coil. The standard coil referred to here is a coil having general characteristics and is not used as a master for inspection. Next, it is determined whether or not each measured value is within an allowable range. In addition, as shown in FIG. 5, the peak voltage and the decay time may be measured with a standard resistor, and it may be determined whether or not the measured values are within an allowable range. In either case, make adjustments so that the measured value is within the allowable range. This calibration alleviates the problem (problem 4) related to the deviation of measured values. The calibration may be performed every time one coil is inspected, or may be performed every predetermined number of inspections. At any timing, it is automatically performed together with the coil insulation inspection. The inspector may be able to perform it at an arbitrary timing.

  Next, test environment data is acquired (S12). Specifically, the temperature and humidity in the test chamber are measured by the temperature / humidity measuring device 8. Further, the temperature of the workpiece 1 to be inspected is measured by the workpiece temperature measuring device 7. Specifically, the temperature of the stator around which the coil to be inspected is wound is measured. Factors that cause changes in temperature and humidity include temperature differences in summer / winter and day / night, and motor self-heating.

  Next, an impulse voltage is applied to the workpiece 1 to be inspected by the impulse tester 2. Then, a voltage waveform (test waveform) generated at both ends of the coil to be inspected is measured (S13). Further, an impulse voltage is applied to the inspection target work 1 a plurality of times. Each time, a test waveform is measured. That is, a plurality of test waveforms are acquired for one coil. Next, A / D conversion of each measured test waveform is performed (S14).

  Next, digitized test waveform correction processing is performed (S15). Specifically, averaging processing and smoothing processing are performed. In the averaging process, the test waveforms measured in S13 are averaged. That is, the plurality of test waveforms measured in the process of S13 do not necessarily match due to the influence of noise as shown in FIG. Therefore, an accurate characteristic value cannot always be obtained from one voltage waveform. Therefore, by performing the averaging process, one smooth waveform is created as shown in FIG. That is, a representative waveform obtained from the coil to be inspected is created. The process for creating the representative waveform is not limited to the averaging process. For example, it can be created from a representative value such as a median value or a mode value. On the other hand, in the smoothing process, smoothing is performed for each test waveform. That is, each test waveform measured in the process of S13 has some shakiness due to the influence of noise as shown in FIG. Therefore, a smooth waveform as shown in FIG. 7B is created by performing a smoothing process. The smoothing process may be performed on the representative waveform after the averaging process. These correction processes alleviate the noise problem (Problem 3). In addition, by smoothing the test waveform, it is possible to compensate for the lack of resolution of the coil insulation inspection apparatus 100 itself.

  The correction process described above is not necessarily performed on the entire test waveform measured in the process of S13. That is, it is possible to limit the portion to be inspected in the test waveform and perform the correction process only on the limited portion. In other words, correction processing may not be performed on a portion of the test waveform that is very susceptible to noise or that makes it difficult to extract characteristic values. In this embodiment, as shown in FIG. 8, a portion necessary for the inspection (inside the broken line in FIG. 8) is extracted, and correction processing is performed only on the extracted portion. That is, the voltage peak value immediately after the start of measurement is easily affected by noise, and is excluded from the inspection. Further, after a predetermined time has elapsed from the start of measurement, the voltage change is so small that it is difficult to extract the characteristic value, so it is excluded from the inspection. As a result, the noise problem (Problem 3) is further alleviated.

  Further, by extracting a portion necessary for the inspection and changing the scale on the display in accordance with the extracted portion, the lack of resolution of the coil insulation inspection apparatus 100 can be compensated. That is, when determining the entire test waveform, a scale in the range of ± 1500 V is required as shown in FIG. Therefore, in an inspection apparatus having a resolution of 8 bits (256 dots), 3000 / 256≈11.7 V per dot. On the other hand, when determining the extracted portion, a scale in the range of ± 500 V is sufficient as shown in FIG. Therefore, in an inspection apparatus having an 8-bit resolution, 1000 / 256≈3.9V per dot. That is, the voltage per dot is reduced. Of course, not only the voltage (V) but also the time ([mu] s) shortens the time per dot. Therefore, by extracting the portion to be judged and automatically changing the scale on the display, the resolution problem (Problem 6) is alleviated.

  Next, necessary characteristic values are extracted from the corrected test waveform (S16). As characteristic values, as shown in FIG. 9, there are a peak voltage (hereinafter, a positive peak voltage is referred to as a “plus peak voltage” and a negative peak voltage is referred to as a “negative peak voltage”), a zero cross time, and the like. In the present embodiment, as shown in FIG. 8, since the portion necessary for the inspection is limited, three characteristic values of the secondary plus peak voltage, the secondary minus peak voltage, and the third zero cross time are extracted. Here, since the test waveform has been subjected to correction processing, it has a smooth waveform without rattling. Therefore, accurate characteristic values are required.

  In particular, as shown in FIG. 10, when the zero crossing time (here, the third order) is obtained, a point a (9.80 μs) or a point b (9.85 μs) close to 0 V is extracted in the conventional inspection apparatus, and at that point Was regarded as the zero crossing time. For this reason, accurate inspections cannot be performed with conventional inspection apparatuses, particularly inspection apparatuses with low resolution. However, in this embodiment, as shown in FIG. 10, a positive point a and a negative point b approximating 0V are extracted, an equation of a straight line ab connecting these points a and b is obtained, and the equation is obtained. To calculate the time (approximately 9.84 μs) when the voltage is really 0V. Thereby, the lack of resolution of the coil insulation inspection apparatus 100 can be compensated, and a more accurate zero cross time is required.

  Next, characteristic value correction processing is performed based on the temperature and humidity data measured in S12 (S17). That is, correction processing is performed according to environmental changes. For example, the resistance value of the coil conductor is large when the temperature is high and small when the temperature is low. Therefore, the characteristic value such as peak voltage is corrected in consideration of the temperature of the measured value. Similarly, the parasitic capacitance inside the coil is also affected by temperature and humidity. The characteristic value is corrected in consideration of these. This alleviates the problem (problem 5) related to environmental changes.

  Next, a pass / fail determination for the corrected characteristic value is performed (S18). Specifically, it is determined whether or not there is a corrected characteristic value within the range of the standard management value set for each characteristic value. This standard management value is a value determined by performing statistical processing based on characteristic values obtained from a plurality of coils. For example, as shown in FIG. 11, the characteristic values of 30 good coils are acquired, and an average value is calculated for each characteristic value. Further, a standard deviation is calculated for each characteristic value, and a standard control value is determined from the standard deviation and the average value. In the example of FIG. 11, since the average value of the secondary plus peak voltage is 418 V and the allowable value (3σ) obtained from the standard deviation is 8 V, the standard management value is 418 ± 8 [V]. That is, an average characteristic of a coil is obtained from a plurality of non-defective coils, and a standard control value is determined from the characteristic. This alleviates the problem related to performance variation (Problem 2).

  Next, the determination result is output to the monitor 31 or the like. Further, the data (test waveform, characteristic value, temperature / humidity, etc.) obtained in the process of the inspection so far are stored together with the determination result (S19). The standard management value described above is updated every time a predetermined number of inspections are performed. Therefore, stored data can be used when updating the standard management value. That is, the characteristic value of the coil determined to be non-defective by the inspection apparatus of this embodiment can be reused as an element of statistical processing when determining the standard management value. As a result, the number of samples at the time of determining the standard control value increases every time inspection is performed. Therefore, every time the standard management value is updated, the standard management value approaches an appropriate value. In addition, the history of examination can be displayed by saving the data. That is, time series management of characteristic values and the like can be performed. This data storage process completes the coil insulation inspection in the absolute evaluation.

[Relative evaluation form]
Next, the coil insulation inspection by relative evaluation will be described. Even in the relative evaluation, the device configuration is not different from the absolute evaluation configuration shown in FIG. However, in relative evaluation, it is necessary to create a master waveform that is a criterion for pass / fail judgment in advance. This master waveform is created by averaging voltage waveforms obtained from a plurality of coils. That is, even if the voltage waveform is obtained from a non-defective coil as shown in FIG. Therefore, a voltage waveform of a typical coil is calculated by performing an averaging process as shown in FIG. By using this averaged waveform as the master waveform, the problem relating to the master waveform (problem 1) and the problem relating to performance variations (problem 2) are alleviated. Of course, smoothing processing may be performed when creating the master waveform. The value calculated when creating the master waveform is not limited to the average value, but may be a representative value such as a median value or a mode value. Hereinafter, the procedure of the coil insulation inspection in the relative evaluation will be described again based on the flowchart of FIG.

  First, calibration is performed as in the absolute evaluation (S11). This alleviates the problem (problem 4) related to the deviation of the measured value. Next, temperature and humidity are measured (S12). Next, a voltage waveform obtained from the coil to be inspected, that is, a test waveform is measured (S13). The test waveform is measured each time an impulse voltage is applied multiple times. Next, A / D conversion of the measured test waveform is performed (S14). Next, correction processing such as averaging and smoothing processing is performed on the test waveform (S15). This alleviates the noise problem (Problem 3). Next, necessary characteristic values are extracted from the master waveform and the test waveform (S16). In addition, temperature and humidity correction processing is performed on the extracted characteristic values (S17). This alleviates the problem (problem 5) related to environmental changes. Next, pass / fail judgment is performed by comparing the characteristic value of the master waveform with the characteristic value of the test waveform (S18). Next, the determination result is output to the monitor 31 or the like. Further, the data obtained so far is stored together with the determination result (S19). The coil insulation inspection in the relative evaluation is completed by this data storage process.

  Next, an example of determination result output will be described. FIG. 13 shows a screen that displays a list of determination results when absolute evaluation and relative evaluation are performed simultaneously. On this screen, the judgment result is displayed for each characteristic value (plus peak voltage, zero cross time, etc.). Further, among the characteristic values, for each peak voltage and zero crossing time, a determination result is displayed for each order (see FIG. 9). Furthermore, the result of comprehensive evaluation based on the determination result of each determination item is displayed. Each test waveform can be displayed as necessary. As a result, the inspection result can be easily confirmed.

  In addition, the upper limit value and the lower limit value of the standard control value are displayed for each characteristic value (for each order for each peak voltage and zero cross time). The cell in which the standard management value is displayed can be input, and the standard management value can be changed to an arbitrary value by the input. In addition, it is possible to select whether or not to perform pass / fail judgment for each characteristic value (for each peak voltage and zero cross time, for each order). That is, it is possible to specify a part to be determined. As a result, it is possible to exclude a part that is susceptible to noise and a part that does not affect performance evaluation from the determination target. In addition, for an item for which no pass / fail judgment is made, the cell of the item is color-coded. Thereby, an inspection object item can be identified easily.

  Further, data such as characteristic values and test waveforms are recorded in the built-in HD. The characteristic value data includes date, control number, measurement location, standard control value for each characteristic value, etc., and these data are collected in one file and stored in a predetermined format. The test waveform data includes date, control number, measurement location, sampling time, voltage value for each time, etc., and these data are also collected in one file and stored in a predetermined format. In addition, temperature and humidity data may be added to these files. When relative evaluation is performed, master waveform information is added. As a file storage format, for example, there is a CSV format. Since the stored file can be easily read out, the inspection result can be easily reused. In addition, since the history of inspection can be known, it is possible to easily detect abnormal parts of equipment.

The file name for storage includes the date, control number, measurement location, and the like. For example, the file name of the test waveform is defined as follows: The “Serial Number” in the definition is a numerical value that is assigned sequentially from the start of the inspection.
“File name” = “Master waveform name” + “ "+" Date "+" "+" Serial number "+" "+" Measurement location "

For example, the master waveform name is “StatorA” If the date is January 30, 2003, the serial number is 005, and the measurement location is between UVs, the file name of the test waveform is as follows.
“File name” = “StatorA 1.4kV 030130 005 UV ”

  As described above, since the date, serial number, and measurement location are attached to the file name, a specific test waveform or the like can be extracted based on the file name. FIG. 14 shows a file search screen. When searching, specify the master waveform, date, measurement location, etc. Then, by pressing the search start button, a file corresponding to the designated item, that is, a characteristic value, a test waveform, etc. corresponding to the file are extracted. Thereby, necessary information can be easily extracted from the recorded data.

  In the coil insulation inspection apparatus 100 of the present embodiment, correction processing related to a change in temperature or the like is performed on the characteristic value, but correction related to the environment is not limited to that performed on the characteristic value. For example, correction processing may be performed on the standard management value, and pass / fail judgment may be performed based on the standard management value after correction. Further, correction processing may be performed on the test waveform, and pass / fail determination may be performed based on the corrected test waveform. When performing relative evaluation, correction processing is performed not only on the test waveform but also on the master waveform. In addition, correction processing related to the environment may be performed when performing calibration. In other words, the measurement device or the like may be adjusted according to changes in the environment. Any means can alleviate the problem (problem 5) related to environmental changes.

  Further, in the coil insulation inspection apparatus 100 of this embodiment, the resolution is improved by extracting the portion to be judged and changing the scale on the display, but in addition to this, the scale is changed following the peak value of the impulse voltage. May be. For example, as shown in FIG. 15A, when an impulse voltage of 500 V is applied to an inspection device whose full scale is in the range of ± 1500 V, it is difficult to recognize the change in the voltage waveform obtained thereby. Therefore, by changing the scale on the display according to the peak value of the impulse voltage, the full scale is in the range of ± 500 V as shown in FIG. 15B, and the voltage per dot is reduced. As a result, the change in the waveform appears conspicuously. Therefore, the resolution problem (Problem 6) can be alleviated by automatically changing the scale according to the peak value of the impulse voltage.

[Modification 1]
Next, a modification of the coil insulation inspection apparatus that performs correction processing related to environmental changes will be described. As shown in FIG. 16, the coil insulation inspection device 101 of this embodiment includes an atmospheric pressure measuring device 81 and a device temperature measuring device 82. That is, the coil insulation inspection apparatus 101 of this embodiment can measure the temperature of the coil to be inspected, the temperature and humidity in the inspection room, and can also measure the pressure in the inspection room and the temperature of the inspection apparatus. This is different from the coil insulation inspection apparatus 100 described above. By correcting characteristic values, standard control values, or test waveforms based on these measurement results, it is possible to cope with changes in the environment more precisely. Therefore, the problem (problem 5) related to environmental change is further alleviated.

  FIG. 17 is a flowchart showing an inspection procedure when the characteristic value is corrected based on the environmental data. In FIG. 17, steps having the same numbers as those in the flowchart shown in FIG. 3 indicate the same procedures as those steps (the same applies to FIGS. 18 and 19 described later). First, environmental data is acquired (S12-1). The environmental data here refers to the temperature of the coil to be inspected, the temperature of the coil insulation inspection apparatus 101, the temperature in the inspection room, the humidity, the atmospheric pressure, and the like. Note that it is not always necessary to acquire all of these data, and it is sufficient to acquire them according to the items to be corrected. Next, an impulse waveform is measured (S13), and a characteristic value is extracted from the obtained impulse waveform (S16). Next, the characteristic value extracted in the process of S16 is corrected based on the environmental data acquired in the process of S12-1 (S17-1). Next, pass / fail judgment of the inspected coil is performed based on the corrected characteristic value (S18). As a result, inspections corresponding to environmental changes are performed. The environmental data may be acquired at any time prior to the characteristic value correction process (S17-1).

  FIG. 18 is a flowchart showing an inspection procedure when the standard management value is corrected based on the environmental data. First, environmental data is acquired (S12-1). Next, an impulse waveform is measured (S13), and a characteristic value is extracted from the obtained impulse waveform (S16). Next, the standard management value is corrected based on the environmental data acquired in the process of S12-1 (S17-2). Next, it is determined whether or not the characteristic value extracted in the process of S16 satisfies the condition of the standard management value after the correction process (S18). As a result, inspections corresponding to environmental changes are performed. The environmental data may be acquired at any time prior to the standard management value correction process (S17-2). The standard management value correction process may be performed at any stage prior to the pass / fail determination process (S18).

  FIG. 19 is a flowchart showing an inspection procedure when a test waveform is corrected based on environmental data. First, environmental data is acquired (S12-1). Next, the impulse waveform is measured (S13). Next, the impulse waveform (test waveform) is corrected based on the environmental data acquired in the process of S12-1 (S13-1). Next, a characteristic value is extracted from the impulse waveform after the correction process (S16). Next, the pass / fail determination of the coil to be inspected is performed based on the characteristic value extracted in the process of S16 (S18). As a result, inspections corresponding to environmental changes are performed. The environmental data may be acquired at any time prior to the impulse waveform correction process (S13-1).

[Modification 2]
Next, a modification of the coil insulation inspection apparatus that performs correction processing related to variations in manufacturing conditions will be described. The coil insulation inspection apparatus 102 according to this embodiment includes an LCR meter 21 as shown in FIG. That is, the coil insulation inspection apparatus 102 of this embodiment is different from the coil insulation inspection apparatus 100 described above in that it can measure the electric capacity of the coil to be inspected, the electric resistance between the coil to be inspected and the stator core, and the like. By correcting the characteristic value, standard control value, or test waveform based on these measurement results, it is possible to cope with variations in coil characteristics of the coil to be inspected. Accordingly, the problem (problem 7) related to variations in manufacturing conditions is further alleviated.

  The inspection procedure is the same as the inspection procedure for correcting characteristic values and the like based on the environmental data shown in FIGS. In other words, the environment data acquisition process is replaced with the coil characteristic acquisition process, and correction is performed based on the acquired coil characteristics, whereby inspection corresponding to variations in manufacturing conditions is performed.

[Modification 3]
Next, a modified example of the coil insulation inspection apparatus that performs correction processing regarding variations in calculation criteria such as peak voltage and zero cross time will be described. The coil insulation inspection apparatus of the present embodiment is not structurally different from the coil insulation inspection apparatus 100 described above, but the processing contents of the data processing computer 3 are different. In this embodiment, the primary peak voltage and primary zero-crossing time of the standard resistor or standard coil are compared with the primary peak voltage and primary zero-crossing time of the coil to be inspected, and the characteristic value is based on the comparison result. Correct one of the standard control value or test waveform. As a result, it is possible to cope with variations in the peak voltage and zero crossing time of the coil to be inspected. Therefore, the problem (problem 8) related to variations in calculation criteria is alleviated.

  FIG. 21 is a flowchart showing an inspection procedure when the characteristic value is corrected based on the data of the standard coil. In FIG. 21, steps having the same numbers as those in the flowchart shown in FIG. 3 indicate the same procedures as those steps. First, standard coil data is acquired (S12-2). The data of the standard coil here is an impulse waveform of the standard coil, and a primary peak voltage and a primary zero-cross time obtained from the waveform. Note that it is not always necessary to acquire all of these data, and it is sufficient to acquire them according to the items to be corrected. Next, an impulse waveform is measured (S13), and a characteristic value is extracted from the obtained impulse waveform (S16). Next, the characteristic value extracted in the process of S16 is corrected based on the data of the standard coil acquired in the process of S12-2 (S17-3). Next, pass / fail judgment of the inspected coil is performed based on the corrected characteristic value (S18). As a result, inspection corresponding to variations in peak voltage and zero crossing time is performed. The standard coil data may be acquired at any stage prior to the characteristic value correction process (S17-3). The standard coil data may be acquired by applying an impulse voltage to the standard coil at each inspection, or the standard coil data may be recorded in advance and read out at each inspection. Also good.

  As described in detail above, in the coil insulation inspection apparatus 100 according to the present embodiment, as a countermeasure for the problem (problem 1) related to the master waveform, an absolute evaluation is performed in which pass / fail judgment is performed from the test waveform itself. As a result, the problem related to the master waveform does not occur. Even in the case of performing a relative evaluation, an average of voltage waveforms (master voltage waveforms) obtained from a plurality of coils is adopted as the master waveform. Therefore, the waveform of the defective coil is not used as the master waveform. In addition, since the master waveform is a waveform having typical characteristics of the coils, the problem of performance variation is alleviated. Therefore, a coil insulation inspection device capable of performing high-accuracy determination is realized.

  In addition, as a countermeasure for the problem relating to performance variation (Problem 2), the standard management value is determined based on the characteristic values obtained from a plurality of coils. Specifically, an average value and a standard deviation are calculated for each characteristic value, and an accurate standard management value of the coil is calculated based on these values. For this reason, the accuracy of the pass / fail judgment is high. Further, the characteristic value of the coil determined to be non-defective in the inspection of this embodiment is automatically added to the characteristic value data when the standard management value is updated. Then, the standard management value reflecting the data is updated periodically. Thereby, the more the inspection is performed, the more data for determining the standard management value is obtained, and the more accurate standard management value can be calculated. Therefore, the accuracy of pass / fail judgment is higher as the number of inspections is larger.

  Further, as a countermeasure for the noise problem (Problem 3), an impulse voltage is applied to the coil to be inspected a plurality of times. Then, correction processing is performed on a plurality of test waveforms obtained thereby. Specifically, averaging processing and smoothing processing are performed. Furthermore, a part where the influence of noise is small is extracted, and the quality is determined based on the characteristic value included in the part. As a result, the influence of noise can be reduced. Therefore, an accurate test waveform and its characteristic value can be obtained, and the pass / fail judgment is highly accurate.

  In addition, as a countermeasure for the problem of measurement value deviation (problem 4), calibration is performed before measuring a test waveform. Furthermore, calibration is performed automatically. Thereby, an accurate value can be measured and erroneous determination is suppressed.

  In addition, as a countermeasure for the problem related to environmental changes (Problem 5), the temperature of the workpiece, the temperature in the test room, the humidity, the atmospheric pressure, etc. are measured. Then, the characteristic value is corrected based on the measured temperature or the like. The target to be corrected is not limited to the characteristic value but may be a standard management value, a test waveform, or the like. Then, the quality of the inspected coil is determined based on the corrected data. Thereby, even if the environment changes, an accurate determination can be made.

  In addition, as a countermeasure for the problem related to resolution (problem 6), a part necessary for inspection is extracted. Then, the scale on the display is changed in accordance with the maximum value and the minimum value of the voltage in the extracted portion. Alternatively, the scale on the display is changed according to the peak value of the applied impulse voltage. As a result, the resolution is improved, and the quality determination can be performed with higher accuracy.

  Further, as a countermeasure for the problem (problem 7) related to variations in manufacturing conditions, individual characteristic values (LCR) of the coil to be inspected are measured. Then, the characteristic value is corrected based on the measured temperature or the like, and the quality of the inspected coil is determined based on the corrected data. The target to be corrected is not limited to the characteristic value but may be a standard management value, a test waveform, or the like. Thereby, even if the coil characteristics are different for each coil to be inspected, an accurate determination can be made.

  In addition, as a countermeasure for the problem (problem 8) related to variations in test conditions such as primary peak voltage and primary zero-crossing time, the primary peak voltage and primary zero-crossing time of the standard coil or standard resistance are obtained. . Then, the characteristic value is corrected based on the acquired data, and pass / fail judgment of the inspected coil is performed based on the corrected data. The target to be corrected is not limited to the characteristic value but may be a standard management value, a test waveform, or the like. As a result, the problem of variations in the primary peak voltage and the primary zero-crossing time can be alleviated, and more accurate determination can be performed.

  Note that this embodiment is merely an example, and does not limit the present invention. Therefore, the present invention can naturally be improved and modified in various ways without departing from the gist thereof. For example, in the present embodiment, the inspection of the coil of the vehicle drive motor is performed, but the present invention is not limited to this. That is, you may apply this invention to the coil insulation test | inspection apparatus of the coil utilized for the motor for household appliances.

  In addition to the inventions described in the claims, the embodiments of the present invention described above include inventions as shown in the following supplementary notes.

[Appendix 1] In a coil insulation inspection device for detecting a coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms of the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; ,
Characteristic value extracting means for extracting characteristic values from the representative waveform created by the representative waveform creating means;
Absolute evaluation means for performing an absolute evaluation of the quality of insulation according to whether or not the characteristic value extracted by the characteristic value extraction means is within the range of the management value set for each type of the characteristic value. Coil insulation inspection device characterized by

[Appendix 2] In a coil insulation inspection device for detecting a coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms of the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; ,
Master waveform creation means for calculating a waveform representative of those voltage waveforms based on a plurality of master voltage waveforms, and creating a master waveform as a reference for inspection from the result,
Characteristic value extracting means for extracting respective characteristic values from the master waveform created by the master waveform creating means and the representative waveform created by the representative waveform creating means;
Relative evaluation means for comparing the characteristic value of the master waveform extracted by the characteristic value extraction means with the characteristic value of the representative waveform and performing a relative evaluation of the quality of insulation based on the comparison result. Coil insulation inspection device.

[Appendix 3] In the coil insulation inspection apparatus described in Appendix 2,
The coil insulation inspection apparatus, wherein the master waveform creating means averages the master voltage waveform and creates a master waveform from the result.

[Appendix 4] In the coil insulation inspection apparatus described in Appendix 2 or Appendix 3,
The coil insulation inspecting apparatus, wherein the master waveform creating means performs smoothing on each master voltage waveform or the created master waveform.

[Appendix 5] In the coil insulation inspection apparatus described in any one of Appendix 1 to Appendix 4,
The inspected waveform creating means averages a plurality of acquired voltage waveforms, and creates a to-be-inspected waveform from the result, and a coil insulation inspection apparatus characterized in that:

[Appendix 6] In the coil insulation inspection apparatus described in any one of Appendix 1 to Appendix 5,
The inspected waveform generating means performs smoothing on each voltage waveform or the generated inspected waveform.

[Appendix 7] In the coil insulation inspection apparatus described in Appendix 1 or Appendix 2,
Environmental data acquisition means for detecting at least one of temperature and humidity;
A coil insulation inspection apparatus comprising: an environment correction unit that performs a correction process of a standard management value according to a detection result of the environment data acquisition unit.

[Appendix 8] In the coil insulation inspection apparatus described in Appendix 1 or Appendix 2,
Environmental data acquisition means for detecting at least one of temperature and humidity;
A coil insulation inspection apparatus comprising: environment correction means for performing correction processing of a voltage waveform in accordance with a detection result of the environment data acquisition means.

[Appendix 9] In the coil insulation inspection apparatus described in Appendix 1 or Appendix 2,
Environmental data acquisition means for detecting at least one of temperature and humidity;
A coil insulation inspection apparatus comprising: an environment correction unit that adjusts a measurement device in accordance with a detection result of the environment data acquisition unit.

[Appendix 10] In the coil insulation inspection apparatus described in Appendix 1 or Appendix 2,
A coil insulation inspection apparatus comprising scale follow-up changing means for automatically changing a scale on a display in accordance with a peak value of an impulse voltage applied to a coil to be inspected.

It is a block diagram which shows the system configuration | structure of the coil insulation inspection apparatus which concerns on embodiment. It is a figure which shows the external appearance of the coil insulation inspection apparatus which concerns on embodiment. It is a flowchart which shows the test | inspection procedure which concerns on embodiment. It is a figure which shows the voltage waveform generate | occur | produced when a voltage is applied to a standard coil. It is a figure which shows the voltage waveform generate | occur | produced when a voltage is applied to a standard resistance. It is a figure which shows the example of averaging of a test waveform. It is a figure which shows the example of smoothing of a test waveform. It is a figure which shows the example of extraction of a test waveform. It is a figure which shows the example of the characteristic value of a test waveform. It is a figure which shows the detail of 3rd zero crossing time vicinity of a test waveform. It is a figure which shows the example of the statistical processing result for determining a standard management value. It is a figure which shows the example of averaging of a master waveform. It is a figure which shows the example of the display screen of a determination result. It is a figure which shows the example of the search screen of saved data. It is a figure which shows the example which changes a full scale following an applied voltage. It is a block diagram which shows the system configuration | structure of the coil insulation inspection apparatus which concerns on the modification 1. It is a flowchart which shows the test | inspection procedure in the case of correct | amending a characteristic value with respect to the change of an environment. It is a flowchart which shows the test | inspection procedure when correct | amending a standard management value with respect to the change of an environment. It is a flowchart which shows the test | inspection procedure in the case of correct | amending a test waveform with respect to the change of an environment. It is a block diagram which shows the system configuration | structure of the coil insulation inspection apparatus which concerns on the modification 2. It is a flowchart which shows the test | inspection procedure in the case of correct | amending a characteristic value with respect to the dispersion | variation in test conditions. It is a flowchart which shows the test | inspection procedure which concerns on the conventional test | inspection method. It is a figure which shows the example (waveform) of the characteristic value which concerns on the conventional inspection method. It is a figure which shows the example (area ratio) of the characteristic value which concerns on the conventional inspection method. It is a figure which shows the example (area difference ratio) of the characteristic value which concerns on the conventional inspection method.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Test object 2 Impulse tester 3 Data processing computer 7 Work temperature measuring device 8 Temperature / humidity measuring device 21 LCR meter 81 Barometric pressure measuring device 82 Apparatus temperature measuring device 100 Coil insulation inspection device

Claims (12)

In a coil insulation inspection device that detects coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Characteristic value extraction means for extracting the characteristic value from the voltage waveform of the coil to be inspected acquired by the voltage waveform acquisition means;
Absolute evaluation means for performing an absolute evaluation of the quality of insulation according to whether or not the characteristic value extracted by the characteristic value extraction means is within the range of the management value set for each type of the characteristic value. Coil insulation inspection device characterized by In a coil insulation inspection device that detects coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Master waveform creation means for calculating a waveform representative of those voltage waveforms based on a plurality of master voltage waveforms, and creating a master waveform as a reference for inspection from the result,
Characteristic value extracting means for extracting respective characteristic values from the master waveform created by the master waveform creating means and the voltage waveform of the coil to be inspected obtained by the voltage waveform obtaining means;
Relative evaluation means for comparing the characteristic value of the master waveform extracted by the characteristic value extraction means with the characteristic value of the voltage waveform of the coil to be inspected and performing a relative evaluation of the quality of insulation based on the comparison result Coil insulation inspection device characterized by the above. In a coil insulation inspection device that detects coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms of the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; ,
Characteristic value extracting means for extracting characteristic values from the representative waveform created by the representative waveform creating means;
Absolute evaluation means for performing an absolute evaluation of the quality of insulation according to whether or not the characteristic value extracted by the characteristic value extraction means is within the range of the management value set for each type of the characteristic value. Coil insulation inspection device characterized by In a coil insulation inspection device that detects coil insulation failure,
Voltage waveform acquisition means for acquiring a voltage waveform when an impulse voltage is applied to the coil to be inspected;
Representative waveform generating means for calculating a waveform representative of the voltage waveform based on a plurality of voltage waveforms of the coil to be inspected obtained from the voltage waveform acquiring means, and generating a representative waveform of the coil to be inspected from the result; ,
Master waveform creation means for calculating a waveform representative of those voltage waveforms based on a plurality of master voltage waveforms, and creating a master waveform as a reference for inspection from the result,
Characteristic value extracting means for extracting respective characteristic values from the master waveform created by the master waveform creating means and the representative waveform created by the representative waveform creating means;
Relative evaluation means for comparing the characteristic value of the master waveform extracted by the characteristic value extraction means with the characteristic value of the representative waveform and performing a relative evaluation of the quality of insulation based on the comparison result. Coil insulation inspection device. In the coil insulation inspection apparatus according to any one of claims 1 to 4,
Having a calibration means for applying a voltage to a standard specimen, obtaining a voltage waveform obtained thereby, and performing calibration based on the voltage waveform;
The coil insulation inspection apparatus, wherein the calibration means automatically performs calibration before applying an impulse voltage to the coil to be inspected. In the coil insulation inspection apparatus according to any one of claims 1 to 5,
A coil insulation inspection apparatus comprising management value determining means for acquiring characteristic values of a plurality of coils and determining a management value necessary for pass / fail judgment by performing statistical processing based on the characteristic values. In the coil insulation inspection apparatus according to claim 6,
The coil insulation inspection apparatus, wherein the management value determining means reuses the characteristic value of the coil evaluated as a non-defective product by the absolute evaluation means or the relative evaluation means as an element of statistical processing. In the coil insulation inspection apparatus according to any one of claims 1 to 7,
Environmental data acquisition means for detecting at least one of temperature and humidity;
A coil insulation inspection apparatus comprising: an environment correction unit that performs a correction process of a characteristic value according to a detection result of the environment data acquisition unit. In the coil insulation inspection apparatus according to any one of claims 1 to 7,
Environmental characteristic data acquisition means for detecting at least one of the temperature of the coil to be inspected, the temperature of the apparatus body, the temperature in the inspection room, the humidity, and the atmospheric pressure;
A coil insulation inspection apparatus comprising environmental characteristic correction means for correcting any one of a characteristic value, a standard control value, and a voltage waveform of a coil to be inspected according to a detection result of the environmental characteristic data acquisition means. . In the coil insulation inspection apparatus according to any one of claims 1 to 9,
It is characterized by having a scale changing means for extracting a part necessary for the inspection from the voltage waveform of the coil to be inspected and automatically changing the scale on the display in accordance with the maximum value and the minimum value of the voltage in the extracted part. Coil insulation inspection device. In the coil insulation inspection apparatus according to any one of claims 1 to 10,
Coil characteristic data acquisition means for detecting the coil characteristic of the coil to be inspected;
Coil insulation inspection apparatus comprising: coil characteristic correction means for correcting any one of a characteristic value, a standard control value, and a voltage waveform of a coil to be inspected according to a detection result of the coil characteristic data acquisition means. . In the coil insulation inspection apparatus according to any one of claims 1 to 11,
A standard characteristic data means for obtaining at least one of a peak voltage and a zero-crossing time obtained when a voltage is applied to a standard specimen;
Coil insulation inspection apparatus comprising standard characteristic correction means for correcting any one of a characteristic value, a standard control value, and a voltage waveform of a coil to be inspected according to a detection result of the standard characteristic data acquisition means .

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