JP7013131B2 - Measuring device, measuring device control method and measuring device control program - Google Patents

Description

The present invention relates to a measuring device for measuring the state of an object such as concrete, a control method of the measuring device, and a control program of the measuring device.

Conventionally, an apparatus for measuring a deteriorated state of, for example, concrete, which is an object, has been proposed (for example, Patent Document 1).
Such a measuring device cuts out a test piece directly from an object, detects the salt concentration and the like, and diagnoses the deterioration state of concrete.

Japanese Unexamined Patent Publication No. 2008-14779

However, conventionally, since the test piece is cut out directly from the concrete or the like which is the object, there is a problem that the concrete is damaged and it is difficult to measure repeatedly.
On the other hand, it is also conceivable to irradiate the object with near infrared rays or the like without cutting out the test piece and receive the reflected light for analysis.
However, when analyzing the received reflected light, there is a problem that an error or the like is generated due to the influence of noise or the like, and as a result, the accuracy of the measurement result is lowered.

Therefore, the present invention is a measuring device and a measuring device capable of obtaining highly accurate analysis results by irradiating an object with irradiation light and analyzing the reflected light without directly cutting out a test piece or the like from the object. It is an object of the present invention to provide a control method and a control program of a measuring device.

According to the present invention, the object is a spectroscopic unit that disperses the reflected light of the irradiation light irradiating the object without deforming the object and generates spectral information, and chemometrics based on the spectral information. A state information generation processing unit that analyzes by a method and generates state information of the object, a display unit that displays the state information, and the spectroscopic information as preprocessing before processing by the chemometric method. A measurement spectroscopic curve that has a filter processing unit that performs filter processing and a standardization processing unit that performs standardization processing as the pretreatment, and generates and stores measured spectral curve information from the received light intensity for each wavelength based on the spectral data. A generation processing unit, a storage unit that stores reference spectral curve information that is information on changes in the reference spectral curve corresponding to a specific measurement distance, and a storage unit that stores the measured spectral curve information based on the reference spectral curve information. The spectroscopic reflectance curve generation processing unit for generating and storing the spectral reflectance curve information is provided, and the spectral reflectance curve information is subjected to the filter processing and then the standardization processing . Chemometrics (Chemometrics) for the purpose of maximizing the amount of chemical information obtained from chemical data by applying a specific method or a statistical method, and the said chemometrics is PLS (Partial Rest Square) regression analysis. This is a method (partial minimum square method), in which the state information generation processing unit performs the filtering process and then multiplies the spectroscopic reflectance curve information subjected to the standardized processing, and the weighted regression coefficient for each wavelength. It is achieved by a measuring device characterized in that the reflectance spectrum after multiplication is obtained, all the information of the reflectance spectrum after multiplication of the regression coefficient is added, and the deterioration is judged by the added value. To.

According to the above configuration, the irradiation light is irradiated without deforming an object such as concrete, and the spectral information (for example, spectral data etc.) generated based on the reflected light is processed by a filtering process (for example, a high-pass filter). ), And then, after standardization processing, analysis by a chemometric method (for example, chemometrics, PLS regression analysis, etc.) enables highly accurate analysis with few errors.
Therefore, state information such as deterioration information of an object such as concrete generated by such analysis can be accurately generated (calculated or the like) and displayed on the display unit.
As described above, in this configuration, highly accurate analysis results can be obtained by irradiating the object with irradiation light and analyzing the reflected light without directly cutting out a test piece or the like from the object.

Preferably , the filter processing is a processing by a high-pass filter.

According to the present invention, the object is to disperse the reflected light of the irradiation light irradiating the object without deforming the object, generate spectral information, and analyze by a chemometric method based on the spectral information. Then, the state information of the object is generated, the state information of the generated object is displayed, and the spectroscopic information is filtered and standardized as a pretreatment before processing by the chemometric method. It is a control method of the measuring device to perform the processing, and the measurement spectroscopic curve generation processing unit generates and stores the measurement spectroscopic curve information from the light receiving intensity for each wavelength based on the spectroscopic data, and the reference spectroscopy corresponding to a specific measurement distance. The reference spectroscopic curve information which is the information of the change of the curve is stored, the spectral reflectance curve generation processing unit corrects the measured spectral curve information based on the reference spectral curve information, and generates and stores the spectral reflectance curve information. The spectral reflectance curve information is subjected to the filtering process and then the standardization process, and the cheometric method applies a mathematical method or a statistical method to obtain the amount of chemical information obtained from the chemical data. In Chemometrics for the purpose of maximization, the chemometrics is a PLS (Partial Rest Square) regression analysis method (partial minimum square method), and the state information generation processing unit is the filter. After processing, the spectroscopic reflectance curve information subjected to the standardized processing is multiplied to obtain the reflectance spectrum after multiplication of the regression coefficient for each weighted wavelength, and the information of the reflectance spectrum after the regression coefficient multiplication is obtained. It is achieved by the control method of the measuring device, which is characterized in that it is configured to add all of the above and judge the deterioration based on the added value.

According to the present invention, the object is a spectroscopic unit that disperses the reflected light of the irradiation light irradiating the object without deforming the object and generates spectral information, and chemometrics based on the spectral information. A state information generation processing unit that analyzes by a method and generates state information of the object, a display unit that displays the state information, and the spectroscopic information as preprocessing before processing by the chemometric method. The measurement spectroscopic curve generation processing unit measures from the light receiving intensity for each wavelength based on the spectroscopic data in a measuring device having a filter processing unit that performs filtering processing and a standardization processing unit that performs standardization processing as the pretreatment. The step of generating and storing the spectral curve information, the step of storing the reference spectral curve information which is the information of the change of the reference spectral curve corresponding to a specific measurement distance, and the spectral reflectance curve generation processing unit store the measured spectral curve information. The step of correcting based on the reference spectral curve information and generating and storing the spectral reflectance curve information, the step of applying the filter processing to the spectral reflectance curve information and then performing the standardization process, the chemometric method In Chemometrics (Chemometrics), which aims to maximize the amount of chemical information obtained from chemical data by applying mathematical and statistical methods, the chemometrics is a PLS (Partial Rest Square) regression. It is an analysis method (partial minimum square method), and the state information generation processing unit performs the filter processing, and then multiplies the spectroscopic reflectance curve information subjected to the standardization processing, and returns for each weighted wavelength. It is achieved by the control program of the measuring device that executes the step of obtaining the reflectance spectroscopic after multiplying by the coefficient, adding all the information of the reflectance spectrum after multiplying by the regression coefficient, and judging the deterioration by the added value. ..

The present invention controls a measuring device and a measuring device capable of obtaining highly accurate analysis results by irradiating an object with irradiation light and analyzing the reflected light without directly cutting out a test piece or the like from the object. It has the advantage of being able to provide control programs for methods and measuring devices.

It is a schematic diagram which shows the state which the measuring apparatus which concerns on this invention is measuring the state information of concrete, for example, Portland cement which is an object, for example, deterioration information. It is a schematic explanatory drawing which shows the main structure of the spectroscope which the measuring apparatus of FIG. 1 has. It is a schematic block diagram which shows the main structure of the measuring apparatus of FIG. It is a schematic block diagram which shows the main structure of the 1st various information storage part. It is a schematic block diagram which shows the main structure of the 2nd various information storage part. It is a schematic block diagram which shows the main structure of the 3rd various information storage part. It is a schematic flowchart which shows the main operation example of the measuring apparatus which concerns on this embodiment. It is a figure which shows an example of the spectral reflectance curve. It is a schematic diagram which shows the "standard deviation processed HPF processing spectral reflectance curve" information which is the data after performing "HPF processing" and "standardization processing" on "spectroscopic reflectance curve" data. It is a schematic diagram which shows an example of "PLS regression coefficient" information. It is a schematic diagram which shows an example of the "reflectance spectrum after a regression coefficient multiplication" information. It is a schematic diagram which shows the relationship between the latent variable which is the number of polynomials, and RMDES. It is a schematic diagram which shows the relationship between the latent variable which is the number of polynomials, and the contribution rate.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings and the like.
Since the embodiments described below are suitable specific examples of the present invention, various technically preferable limitations are attached, but the scope of the present invention is particularly limited to the present invention in the following description. Unless otherwise stated, the present invention is not limited to these aspects.

FIG. 1 is a schematic view showing a state in which the measuring device 1 according to the present invention is measuring state information of concrete such as Portland cement, which is an object, for example, deterioration information.
The measuring device 1 in FIG. 1 is a device capable of accurately measuring and displaying this deterioration information because concrete such as Portland cement used in buildings deteriorates due to salt content and the depth of neutralization. It has become.
Further, as will be described later, the measuring device 1 has a configuration capable of measuring deterioration information of Portland cement such as a building without taking out a test piece from the building.

FIG. 2 is a schematic explanatory view showing a main configuration of a spectroscope 10 included in the measuring device 1 of FIG.
As shown in FIG. 2, the spectrometer 10 has a halogen lamp 11 that irradiates irradiation light including near infrared rays, a relay lens 12, a mirror 13, and an objective lens 14.
Therefore, the irradiation light including the near infrared rays emitted from the halogen lamp 11 is applied to the Portland cement 100 via the relay lens 12, the mirror 13 and the objective lens 14, as shown in FIG.
Therefore, the halogen lamp 11, the relay lens 12, the mirror 13, and the objective lens 14 are arranged on the light projection axis 16.

Further, as shown in FIG. 2, the spectroscope 10 includes an imaging lens 17, a light receiving fiber 19, a condenser 18, a spectroscopic unit such as a spectroscope plate 20, and a light receiving unit such as a light receiving element 21. ing.
Therefore, the reflected light reflected by the Portland cement 100 in FIG. 2 is guided to the objective lens 14, the mirror 13, the imaging lens 17, the light receiving fiber 19, and the condenser 18.
The reflected light is converted into a parallel light flux by the condenser 18, and is incident on the spectroscopic plate 20. The spectrum reflected by the spectroscope 20 is received by the light receiving element 21.
Therefore, the imaging lens 17, the light receiving fiber 19, the condenser 18, and the like are arranged on the light receiving optical axis 22.

Based on the spectroscopy received by the light receiving element 21 in this way, the measuring device 1 of FIG. 1 is analyzed and the like as described later, and deterioration information of the Portland cement 100 of FIG. 2 is generated and displayed.

Further, the measuring device 1 of FIG. 1 has a computer, and the computer has a CPU (Central Processing Unit), a RAM (Random Access Memory), a ROM (Read Only Memory), etc. (not shown), and these are buses and the like. It is connected via.

FIG. 3 is a schematic block diagram showing a main configuration of the measuring device 1 of FIG.
As shown in FIG. 3, the measuring device 1 has a “measuring device control unit 31”, and the measuring device control unit 31 is a spectroscope 10 shown in FIG. 2, a display unit for displaying various information, for example, a display. It controls 32 and an input device 33 for inputting various information.

The measuring device control unit 31 also controls the "first various information storage units 40", the "second various information storage units 50", and the "third various information storage units 60" shown in FIG.
4 to 6 are schematic block diagrams showing the main configurations of the "first various information storage units 40", the "second various information storage units 50", and the "third various information storage units 60", respectively. be. The contents of each of these storage units 40 and the like will be described later.

FIG. 7 is a schematic flowchart showing a main operation example of the measuring device 1 according to the present embodiment.
In the present embodiment, the salt content and the neutralization depth of the Portland cement 100 of the building shown in FIG. 1 are measured, and the deterioration information thereof will be described below with an example of measuring with the measuring device 1.

First, in step 1 of FIG. 7 (hereinafter referred to as “ST”) 1, the spectroscope 10 of FIG. 2 irradiates the Portoland cement 100, which is the object to be measured, with irradiation light including near infrared rays, and the reflected light is emitted to the spectroscope 18. For example, "spectral data" which is spectral information is generated and stored in the "spectral data storage unit 41" of FIG.

Next, in ST2, the "measurement spectroscopic curve generation processing unit (program) 42" of FIG. 4 operates, and based on the spectral data of the "spectral data storage unit 41", "measurement spectroscopy" is performed based on the light receiving intensity for each wavelength. A "curve" is generated and stored in the "measurement spectroscopic curve storage unit 43" of FIG.
In this measurement spectroscopic curve, for example, the vertical axis is the “light receiving intensity” and the horizontal axis is the wavelength (nm).

Then, proceed to ST3. In ST3, the “spectral reflectance curve generation processing unit (program) 44” of FIG. 4 operates, and first, the “reference spectral curve” information of the “reference spectral curve information storage unit 45” of FIG. 4 is referred to.

This reference spectroscopic curve information is information on changes in the reference spectroscopic curve corresponding to a specific measurement distance, and the measuring device 1 of the present embodiment emits near infrared rays at a distance close to the object Portorland cement 100. The measurement distance is set extremely short because it is configured to irradiate the irradiation light including it.

Then, the program 44 corrects the information of the measured spectral curve of the “measured spectral curve storage unit 43” of FIG. 4 based on the reference spectral curve information of the “reference spectral curve information storage unit 45”, and “spectral reflectivity”. A "curve" is generated and stored in the "spectral reflectance curve information storage unit 51" of FIG.

FIG. 8 is a diagram showing an example of a spectral reflectance curve.
As shown in FIG. 8, for example, the spectroscopic spectrum, which is spectroscopic data, contains noise and is data that does not correspond to the fluctuation of the baseline.
Therefore, even if the PLS regression analysis described later is performed based on the data in this state, it is difficult to obtain highly accurate information on the deterioration of the Portland cement 100, which is the object.
Therefore, in the present embodiment, the following pretreatment is performed on the data of the spectral reflectance curve.

Specifically, ST4 processing is performed. In ST4, the filter processing unit of FIG. 5, for example, the “high-pass filter processing unit (program) 52” operates, and the filter processing, for example, the high-pass filter (HPF) coefficient information is stored in the “HPF” of FIG. The HPF coefficient of the coefficient storage unit 53 ”is acquired.
Since a predetermined high frequency component can be removed by this high-pass filter (HPF) coefficient, noise and the like contained in the data can be removed.

Then, the processing unit (program) 52 performs high-pass filter processing (for example, removing high-frequency components) on the spectral reflectance curve information of the “spectral reflectance curve information storage unit 51” in FIG. 5, and high-pass filter-processed spectral reflection. The rate curve information is stored in the “HPF-processed spectral reflectance curve information storage unit 54” of FIG.
The filter is not limited to the high-pass filter, and may be another filter.

Then, the process proceeds to ST5. In ST5, the "spectral reflectance curve" data from which the high-frequency component is removed by the high-pass filter is further standardized.
Specifically, for example, the "standardization processing unit (program) 55" which is the standardization processing unit of FIG. 5 operates, and the "high-pass filter processed" of the "HPF-processed spectral reflectance curve information storage unit 51" of FIG. 5 operates. "Spectroscopic reflectance curve information" is acquired.
Then, standardization processing is performed on this "high-pass filtered spectral reflectance curve information", for example, the reflectance is standardized to an average of 0 and a standard deviation of 1, and the processed "standardized HPF-processed spectral reflectance curve information" is generated. , Is stored in the "standardized HPF-processed spectral reflectance curve information storage unit 56" of FIG.

FIG. 9 is a schematic diagram showing "standardized HPF-processed spectral reflectance curve" information which is data after "HPF processing" and "standardization processing" are applied to "spectral reflectance curve" data.
As shown in FIG. 9, by performing "HPF processing" and "standardization processing" on the "spectral reflectance curve" data, noise is removed and noise is removed in the "standardized HPF processed spectral reflectance curve". It can be seen that the fluctuation of the baseline is also well removed.

Next, using this "standardized HPF-treated spectral reflectance curve" data, it is analyzed whether or not the Portland cement 100, which is the object, has deteriorated due to salt content or neutralization.
Specifically, it is a chemometric method, and one of the "Chemometrics" analyzes in which multivariate analysis is systematized, "PLS regression analysis method (Partial Least Squares) (partial least squares). The analysis is performed by the square method).

PLS regression calculates a score (latent variable, also called a component, for example, the number of polynomials) without using the data as it is, and returns to that score (dependent variable (objective variable) of continuous scale and independent variable (independent variable). Apply the model between the explanatory variables)).
The weights in calculating the score are sequentially calculated so that the covariance between the score and the dependent variable is the highest and the scores are uncorrelated with each other, and for a part of the obtained scores. It is a method of estimating the coefficient by the least squares method.

By analyzing in this way, the deterioration data of the Portland cement 100, which is the object, becomes clearer, and the diagnosis of deterioration can be facilitated.

Specifically, the following processing is performed. In ST6, for example, the “deterioration diagnosis processing unit (program) 61” which is the state information generation processing unit of FIG. 6 operates, and the “deterioration” stored in the “PLS regression type storage unit 57 for deterioration diagnosis” of FIG. Using the "diagnostic PLS regression equation", the "standardized HPF-processed spectral reflectance curve information" of the "standardized HPF-processed spectral reflectance curve information storage unit 56" of FIG. 5 is processed.

For example, the PLS regression coefficient is multiplied by the "standardized HPF-processed spectral reflectance curve information" to obtain the "reflectance spectrum after multiplication by the regression coefficient" for each weighted wavelength.
Then, the "reflectance spectrum after multiplication by the regression coefficient" is stored in the "reflectance spectrum storage unit 62 after multiplication by the regression coefficient".
That is, the "reflectance spectrum after multiplication by the regression coefficient" information for each weighted wavelength is stored.

FIG. 10 is a schematic diagram showing an example of “PLS regression coefficient” information, and FIG. 11 is a schematic diagram showing an example of “reflectance spectrum after multiplication by regression coefficient” information.
As shown in FIG. 11, the spectrum and the like of the reflectance of a specific wavelength are emphasized.

Then, the process proceeds to ST7. In ST7, the “deterioration index determination processing unit (program) 64” of FIG. 6 operates to acquire the “reflectance spectrum after multiplication of the regression coefficient” information of the “reflectance spectrum storage unit 62 after multiplication of the regression coefficient”.

In this "deterioration index determination processing unit (program) 64", all the "reflectance spectrum after regression coefficient multiplication" information is added. The larger the added value, the more the deterioration progresses.

Then, the processing unit (program) 64 calculates the "deterioration index information" corresponding to the added values and stores it in the "deterioration index information storage unit 65" of FIG.

Then, the process proceeds to ST8. In ST8, the deterioration index information of the “deterioration index information storage unit 65” of FIG. 6, for example, “1” is displayed on the display 32 of the measuring device 1.
The use of the measuring device 1 that visually recognizes the display 32 recognizes the numerical value "1" displayed on the display 32, and easily grasps that the depth of deterioration of the Portland cement 100, which is the object concerned, is serious. can do.
In addition, this index information may be a word such as "serious deterioration".

As described above, in the present embodiment, the Portland cement 100 is irradiated with the irradiation light and the reflected light is analyzed without directly cutting out the test piece or the like from the object, the Portland cement 100, so that the analysis result is highly accurate. Can be obtained.

As described above, in the present embodiment, the "standard deviation processed HPF processed spectral reflectance curve" which is the data after "HPF processing" and "standardization processing" are applied to the "spectral reflectance curve" data as preprocessing. By performing PLS regression analysis based on the information, highly accurate deterioration information can be obtained.

Below, in comparison with the case of "raw data" without such preprocessing, the case of applying only "HPF processing", the case of applying only "standardization processing", and the case of applying only "first derivative". The superiority of this embodiment will be described.

First, prepare a test piece. That is, test pieces of a plurality of concretes (for example, Portland cement) having different amounts of added salt are prepared.
For example, the test pieces have a salt content of 0 kg, 4 kg, 8 kg, 12 kg, 16 kg, and 20 kg.

Next, each test piece is irradiated with the irradiation light of the spectroscope, the reflected irradiation light is received, the "spectral data" is generated as described above, and the "measurement spectroscopic curve" is generated from the light receiving intensity for each wavelength.
Then, a "spectral reflectance curve" is generated from the "measured spectral curve".

That is, a plurality of "spectral reflectance curve" data are generated for each test piece of 0 kg to 20 kg.
A plurality of different types of pretreatment are applied to these "plurality of" spectral reflectance curve "data generated for each test piece of 0 kg to 20 kg".

Specific types of pre-processing are "high-pass filter (HPF) processing" only, "standardization processing" only, "high-pass filter (HPF) and standardization processing", "first-order differential processing" only, and "no processing". be.

Next, PLS regression analysis is performed on the pretreated data (including untreated data) that has undergone various pretreatments, and a comparison with the true value (0 kg to 20 kg) of the salt content of the various test pieces is performed. RMSEP (Root Mean Square Error of Prediction) (root mean square error of prediction) was obtained.

FIG. 12 is a schematic diagram showing the relationship between a latent variable, which is the number of polynomials, and RMSEP.
The lower the RMSEP value, the smaller the error from the true value (0 kg to 20 kg). Therefore, as shown in FIG. 12, the method in which "high-pass filter (HPF) and standardization treatment" is applied as the pretreatment is the most true value. It can be seen that the processing method has a small error with.

In addition, PLS regression analysis is performed on the pretreated data subjected to the above-mentioned various pretreatments, and the comparison with the true value (0 kg to 20 kg) of the salt content of the various test pieces is performed. ) ”.

FIG. 13 is a schematic diagram showing the relationship between the latent variable, which is the number of polynomials, and the contribution rate.
The higher the "contribution rate (%)", the smaller the error from the true value. Therefore, as shown in FIG. 13, the "high-pass filter (HPF) and standardization process" has the smallest error from the true value as preprocessing. It turns out to be the method.

The present invention is not limited to the above-described embodiment.

1 ... Measuring device, 10 ... Spectrometer, 11 ... Halogen lamp, 12 ... Relay lens, 13 ... Mirror, 14 ... Objective lens, 16 ... Floodlight axis, 17 ... Imaging lens, 18 ... Condenser, 19 ... Light receiving fiber, 20 ... Spectroscopic plate, 21 ... Light receiving element, 22 ... Light receiving optical axis, 31 ... Measurement Device control unit, 32 ... Display, 33 ... Input device, 40 ... First various information storage units, 41 ... Spectroscopic data storage unit, 42 ... Measurement spectral curve generation processing unit (program) ), 43 ... Measurement spectroscopic curve storage unit, 44 ... Spectral reflectance curve generation processing unit (program), 45 ... Reference spectroscopic curve information storage unit, 50 ... Second various information storage units, 51 ... Spectral reflectance curve information storage unit, 52 ... "High pass filter processing unit (program), 53 ... HPF coefficient storage unit, 54 ... HPF processed spectral reflectance curve information storage unit, 55. ... Standardized processing unit (program), 56 ... Standardized HPF processed spectral reflectance curve information storage unit, 57 ... PLS regression type storage unit for deterioration diagnosis, 60 ... Third various information storage Unit, 61 ... Deterioration diagnosis processing unit (program), 62 ... Regression coefficient multiplied reflectance spectrum storage unit, 64 ... Deterioration index judgment processing unit (program), 65 ... Deterioration index information storage Department, 100 ... Portoland Cement

Claims (4)

A spectroscopic unit that disperses the reflected light of the irradiation light irradiating the object without deforming the object and generates spectral information.
A state information generation processing unit that analyzes the object by a chemometric method based on the spectral information and generates state information of the object.
A display unit that displays the status information and
Prior to the treatment by the chemometric method, the pretreatment includes a filter processing unit for filtering the spectral information and a standardization processing unit for performing a standardization treatment as the pretreatment.
A measurement spectral curve generation processing unit that generates and stores measured spectral curve information from the light receiving intensity of each wavelength based on the spectral data.
A storage unit that stores reference spectroscopic curve information, which is information on changes in the reference spectroscopic curve corresponding to a specific measurement distance, and a storage unit.
A spectral reflectance curve generation processing unit that corrects the measured spectral curve information based on the reference spectral curve information and generates and stores the spectral reflectance curve information is provided.
The spectral reflectance curve information is subjected to the filter processing, and then the standardization processing is performed.
The chemometrics method is Chemometrics (Chemometrics) for the purpose of maximizing the amount of chemical information obtained from chemical data by applying mathematical methods and statistical methods.
The chemometrics is a PLS (Partial Rest Square) regression analysis method (partial least squares method).
The state information generation processing unit performs the filter processing, and then multiplies the spectroscopic reflectance curve information subjected to the standardization processing to obtain a reflectance spectrum after multiplication by a regression coefficient for each weighted wavelength. A measuring device characterized in that all the information of the reflectance spectrum after multiplication by the regression coefficient is added and the deterioration is judged by the added value. The measuring device according to claim 1, wherein the filter processing is a processing by a high-pass filter. The reflected light of the irradiation light radiated to the object is separated without deforming the object, and spectral information is generated.
Based on this spectral information, it is analyzed by a chemometric method to generate state information of the object.
The state information of the generated object is displayed, and the state information is displayed.
It is a control method of a measuring device that filters and standardizes the spectroscopic information as a pretreatment before the treatment by the chemometric method.
The measurement spectroscopic curve generation processing unit generates and stores the measurement spectroscopic curve information from the light receiving intensity for each wavelength based on the spectroscopic data.
Stores reference spectroscopic curve information, which is information on changes in the reference spectroscopic curve corresponding to a specific measurement distance.
The spectral reflectance curve generation processing unit corrects the measured spectral curve information based on the reference spectral curve information, and generates and stores the spectral reflectance curve information.
The spectral reflectance curve information is subjected to the filter processing, and then the standardization processing is performed.
The chemometrics method is Chemometrics (Chemometrics) for the purpose of maximizing the amount of chemical information obtained from chemical data by applying mathematical methods and statistical methods, and the chemometrics is PLS. (Partial Rest Quaare) Regression analysis method (partial minimum square method),
The state information generation processing unit performs the filter processing, and then multiplies the spectroscopic reflectance curve information subjected to the standardization processing to obtain a reflectance spectrum after multiplication by a regression coefficient for each weighted wavelength. A control method for a measuring device, characterized in that all the information of the reflectance spectrum after multiplication by the regression coefficient is added and the deterioration is judged by the added value. The state of the object is analyzed by a spectroscopic unit that disperses the reflected light of the irradiation light irradiating the object without deforming the object and generates spectral information, and by a chemometric method based on the spectral information. A state information generation processing unit that generates information, a display unit that displays the state information, and a filter processing unit that filters the spectral information as preprocessing before processing by the chemometric method. A measuring device having a standardization processing unit that performs standardization processing as the pretreatment.
A step in which the measurement spectral curve generation processing unit generates and stores measurement spectral curve information from the light receiving intensity for each wavelength based on the spectral data.
A process of storing reference spectroscopic curve information, which is information on changes in the reference spectroscopic curve corresponding to a specific measurement distance.
A step in which the spectral reflectance curve generation processing unit corrects the measured spectral curve information based on the reference spectral curve information, and generates and stores the spectral reflectance curve information.
A step of applying the filter processing to the spectral reflectance curve information and then performing the standardization process.
The chemometrics method is Chemometrics (Chemometrics) for the purpose of maximizing the amount of chemical information obtained from chemical data by applying mathematical methods and statistical methods, and the chemometrics is PLS. (Partial Rest Square) Regression analysis method (partial minimum square method), in which the state information generation processing unit performs the filtering process and then multiplies and weights the spectroscopic reflectance curve information subjected to the standardized processing. A measuring device for performing a step of obtaining a reflectance spectrum after multiplying the regression coefficient for each wavelength, adding all the information of the reflectance spectrum after multiplying the regression coefficient, and determining deterioration based on the added value. Control program.

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