JP6940675B1 - Joint application school selection support device, joint application school selection support method, computer program - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an apparatus for supporting selection of a concurrent application school. SOLUTION: The concurrent application school selection support device includes a school DB 40 that stores the passing difficulty level, an examination subject, an entrance examination date, and an application deadline of each of a plurality of schools, and an examinee DB 41 that stores an examinee's first choice school. , The entrance examination date is earlier than the entrance examination date of the student's first choice school, and the application deadline has passed, referring to the achievement DB 42 that stores the examination schools that each of the multiple past examinees took and the school DB 40. The school names of the candidates for the concurrent application school and the extracted school names of the candidates for the concurrent application school are selected according to the difficulty of passing. A control unit 3 for displaying on the output device 3 in order is provided. The control unit 103 displays the school name of the past examinee who has taken the first-choice school of the examinee as a candidate for the concurrent application school in preference to the other school names. [Selection diagram] Fig. 2

Description

The present invention relates to a technology for supporting the selection of a concurrent application school for supporting the selection of a concurrent application school to be examined in addition to the first-choice school when taking an examination at a university or the like.

It is common for examinees to select the school of their choice when they go on to school and study for the entrance examination with the goal of passing the selected school. In many cases, the examinees select the first-choice school, which is their favorite, and one or more schools, which are so-called non-slip protection schools. Candidates will aim to pass at least one concurrent application school while aiming to improve the pass rate for the first-choice school.
As a technique for supporting the selection of a school of choice by an examinee, for example, a career guidance support program disclosed in Patent Document 1 is known. This career guidance support program is a program that supports career guidance for students who wish to take an examination, and displays a possibility deviation value band for each of a plurality of candidate schools for the examination. The probability deviation value band is determined based on a plurality of possibility deviation value ranges to which a pass / fail probability determination is assigned to a predetermined deviation value range. In addition, the student deviation value band which shows the maximum deviation value and the minimum deviation value of the past multiple deviation values of the student in a band shape is also displayed. It is said that the career instructor can provide career guidance such as selection of the student's desired school based on the possibility deviation value band and the student deviation value band.

Patent Document 2 discloses a learning support system that determines a student's desired school (academic ability school, target school, appropriate school, challenging school) and supports the progress of learning to pass the desired school. Achievement school is a school that can be passed only by the ability of the students at the time of enrollment. The target school is, for example, a school determined to provide enrollees in a cram school with a guarantee that they will be able to pass the target school if they study at this cram school. The academic ability school and the target school are determined based on the deviation value at the time of enrollment. An appropriate school is, for example, a school where students can finally pass if they continue studying at this school at the same pace. The appropriate school is determined based on the current deviation value obtained by the regular test after enrollment. A challenge school is a school that evaluates the motivation of students, exceeds the target school that can be passed by studying at this school, and can pass depending on the motivation of the students. The challenge school is determined based on the deviation value at the time of enrollment or the deviation value obtained by adding the motivation estimated value to the current deviation value.

Japanese Unexamined Patent Publication No. 2018-180833 JP-A-2017-90554

Candidates carefully investigate and examine the first-choice school and select a school that suits their wishes and suitability, but for concurrent applicants, select a school with the same degree of care as the first-choice school. Often not. In addition, although the examinees study for the first-choice school, it is unlikely that they will study for the concurrent application school exclusively.

The present invention has been made in view of the above problems, and a main object of the present invention is to provide a technique for efficiently supporting the selection of a joint application school.

The concurrent application school selection support device, which is one aspect of the present invention, provides a first storage means for memorizing the passing difficulty level, examination subject, entrance examination date, and application deadline of each of a plurality of schools, and the first choice school of the examinee. From the entrance examination date of the first-choice school of the examinee, referring to the second storage means for storing, the third storage means for storing the examination school taken by each of the plurality of past examinees, and the first storage means. Also, the entrance examination date is before, the application deadline has not passed, and the schools that can take the examination by the examination subject of the first choice school of the examinee are extracted as candidates for the concurrent application school, and the extracted joint application school A display control means for displaying the candidate school names on a predetermined display in an order according to the degree of difficulty of passing is provided, and the display control means is the past in which the candidate for the concurrent application has taken the first choice school of the examinee. If there is an examinee's examination school, the school name is displayed with priority over other school names.

According to the present invention, when there is an examination school of a past examinee who has taken the first choice school as a candidate for a concurrent application school, the school name of the candidate for the concurrent application school is displayed with priority over other school names. It is possible to provide useful information to students and facilitate the selection of concurrent application schools.

Configuration diagram of the information processing device. Functional block diagram of the information processing device. (A) to (c) are explanatory views of data stored in a large-capacity storage device. (A) and (b) are illustrations of selection support images. An example diagram of a selection support image. An example diagram of a selection support image. An example diagram of a selection support image. A flowchart showing the process of supporting the selection of a concurrent application school. (A) is an explanatory diagram of school data, and (b) is an explanatory diagram of examinee data.

Hereinafter, embodiments will be described in detail with reference to the drawings.
(composition)
FIG. 1 is a configuration diagram of an information processing device that functions as a concurrent application school selection support device of the present embodiment. The information processing device 1 of the present embodiment is, for example, a database system having a plurality of types of databases (hereinafter, referred to as "DB"), and is configured to output data searched from a large amount of data based on predetermined conditions. Has been done.

The information processing device 1 includes a CPU (Central Processing Unit) 10, a ROM (Read Only Memory) 11, a RAM (Random Access Memory) 12, and an I / O interface 13. The CPU 10, ROM 11, RAM 12, and I / O interface 13 are communicably connected via the bus 14. An input device 2, an output device 3, and a large-capacity storage device 4 are connected to the I / O interface 13.

The input device 2 is, for example, a keyboard, a mouse, a touch panel, or the like. The output device 3 is, for example, a display, a printer, or the like. The large-capacity storage device 4 is a rewritable storage device such as an HDD (Hard Disk Drive) or an SSD (Solid State Drive). The large-capacity storage device 4 may have a configuration provided inside the information processing device 1, or may be an external device connected via a communication cable. Further, the large-capacity storage device 4 may be an online storage provided in the cloud. In the large-capacity storage device 4 of the present embodiment, a database is constructed for the examinee to provide useful information for selecting a joint application school.

The CPU 10 controls the operation of the information processing device 1 by executing a computer program stored in the ROM 11. The RAM 12 provides a work area for the CPU 10 to perform processing. The CPU 10 receives data and instructions input from the input device 2 via the I / O interface 13. The CPU 10 outputs information by the output device 3 via the I / O interface 13. The CPU 10 accesses (writes and reads) the large-capacity storage device 4 via the I / O interface 13.

FIG. 2 is a functional block diagram of the information processing device 1. The information processing device 1 operates as each functional block when, for example, the CPU 10 executes a computer program.
The information processing device 1 functions as an input unit 101, an output unit 102, a control unit 103, a school DB management unit 104, an examinee DB management unit 105, a concurrent application school candidate extraction unit 106, and a pass possibility determination unit 107. A school DB 40, an examinee DB 41, and an achievement DB 42 are constructed in the large-capacity storage device 4. FIG. 3 is an explanatory diagram of data stored in the large-capacity storage device 4.

The control unit 103 controls the school DB management unit 104, the examinee DB management unit 105, the concurrent application school candidate extraction unit 106, and the pass possibility determination unit 107. By controlling these, the control unit 103 extracts information useful when the examinee selects a concurrent application school based on the school DB 40, the examinee DB 41, and the achievement DB 42.

The input unit 101 receives data and instructions input from the input device 2 and transmits them to the control unit 103. The output unit 102 outputs information from the output device 3 under the control of the control unit 103. In the present embodiment, the output unit 102 outputs information useful for the examinee to select a joint application school as an image from the output device 3.

The school DB management unit 104 creates, deletes, updates, reads, and the like the school data stored in the school DB 40 based on the control of the control unit 103.
FIG. 3A is an explanatory diagram of school data. School data is saved with a school ID that identifies the school for each school name, and the passing difficulty level (passable deviation value) for each faculty and department of the school, application deadline date, entrance examination date, and acceptance announcement date. , Exam subjects, and items such as the actual magnification of the previous year. Since the school data is stored for each department, the school data of one school is stored for the number of departments of the school. The faculty is identified by the faculty ID, and the department is identified by the department ID.

Each information is input from the input device 2, for example, and the school data is created by the school DB management unit 104 in response to an instruction from the control unit 103 based on this information. When there is a change in the content of the school data, the changed content is input from the input device 2. The school DB management unit 104 updates the school data according to the changed contents in response to the instruction of the control unit 103. Further, the school DB management unit 104 refers to the school DB 40 under the control of the control unit 103, and reads out necessary information.

The examinee DB management unit 105 creates, deletes, updates, reads, and the like creates, deletes, updates, and reads the examinee data stored in the examinee DB 41 based on the control of the control unit 103.
FIG. 3B is an explanatory diagram of examinee data. The examinee data is stored with an examinee ID that identifies the examinee for each examinee name, and includes items such as the student's current school name, first-choice school information, and grade history. The school name is identified by the school ID. The first-choice school information includes the school ID, the faculty ID, and the department ID representing the first-choice school, faculty, and department of the examinee at that time. The grade history includes at least the result (deviation value, etc.) of the latest mock examination, etc. of the examinee as the grade.

For example, each information is input from the input device 2 and the examinee data is created by the examinee DB management unit 105 in response to an instruction from the control unit 103 based on this information. If there is a change in the content of the examinee data, the changed content is input from the input device 2. The examinee DB management unit 105 changes the examinee data according to the change contents according to the instruction of the control unit 103. Further, the examinee DB management unit 105 refers to the examinee DB 41 under the control of the control unit 103, and reads out necessary information.

Under the control of the control unit 103, the examinee DB management unit 105 generates actual data based on the examinee data of past examinees (hereinafter referred to as “graduates”) who have completed the examination. The performance data stores the examination schools that the graduates took. FIG. 3C is an explanatory diagram of actual data. Achievement data is generated by extracting the examinee name, the examinee ID, the school ID, and the grade history from the examinee data, and adding the entrance examination achievement information to this. After the achievement data is generated, the original examinee data is deleted. The entrance examination record information includes the school ID, the faculty ID, the department ID, and the examination result of the examination school. The examination schools are the graduate's first choice school and the concurrent application school. In the example of FIG. 3C, the examination results of each examination school are included in the entrance examination record information, with the first choice school and the two schools applying together as the examination schools.

The concurrent application school candidate extraction unit 106 refers to the school DB 40 and compares the school data of the first-choice school of the examinee with other school data, and compares the school data of the first-choice school with the other school data. Extract school candidates. The joint application school candidate extraction unit 106 acquires the entrance examination date and the examination subject from the school data of the first choice school of the examinee by the school DB 40. The joint application school candidate extraction department 106 searches the school DB 40 by the school DB management department 104, and the entrance examination date is earlier than the entrance examination date of the first choice school, the application deadline has not passed, and the first choice school. Schools that can take the examination according to the examination subjects of are selected as candidates for concurrent applications. Schools that can take the exam according to the exam subjects of the first choice school are schools that have exactly the same exam subjects, schools that include the exam subjects in the exam subjects of the first choice school, and some schools that have the same exam subjects but others. Schools, etc., which are fields related to examination subjects. The joint application school candidate extraction unit 106 transmits the extracted school ID, faculty ID, and department ID of the joint application school candidate to the control unit 103.

The passability determination unit 107 determines the passability of the examinee based on the grade history of the examinee data and the passability deviation value of the school data. The pass possibility determination unit 107 acquires the information of the first choice school of the examinee and the grade history from the examinee data of the examinee DB 41 by the examinee DB management unit 105. Based on the school ID, faculty ID, and department ID of the concurrent application school candidates extracted by the first-choice school information and the concurrent application school candidate extraction unit 106, the pass possibility determination unit 107 is subjected to the first from the school DB 40 by the school DB management unit 104. (1) Obtain the passable deviation value of the desired school and the candidates for the concurrent application school. The passability determination unit 107 compares the latest grades of the examinee with the passable deviation values of the first-choice school and the candidate for the concurrent application school, and determines the passability of the examinee according to the comparison result. The pass probability is represented by, for example, the pass probability (percentage) and the ranks such as A judgment and B judgment.

The control unit 103 controls the operations of the concurrent application school candidate extraction unit 106 and the pass possibility determination unit 107 as described above. In addition, the control unit 103 acquires the processing results of the concurrent application school candidate extraction unit 106 and the pass possibility determination unit 107, and generates a selection support image of the concurrent application school. The control unit 103 visually outputs the generated selection support image from the output device 3 via the output unit 102. When the output device 3 is a display, the selection support image is displayed on the display. When the output device 3 is a printer, the selection support image is printed on paper. As a result, the selection support image is presented to the examinee. The control unit 103 functions as a display control means for outputting an image from the output device 3.

(Selection support image)
FIG. 4 is an example diagram of the selection support image. In the selection support images of FIGS. 4 (a) and 4 (b), the candidates for the concurrent application schools extracted by the concurrent application school candidate extraction unit 106 are displayed in the order according to the difficulty of passing (passable deviation value). The number to the left of the school name indicates the difficulty level of passing (passable deviation value). When the user selects "more" of the selection support image of FIG. 4A by the input device 2, the selection support image of FIG. 4B is output. Therefore, in the example of FIG. 4, the school displayed in FIG. 4A is a school having a higher degree of difficulty in passing than the school displayed in FIG. 4B. That is, in FIGS. 4 (a) and 4 (b), "A1 university A2 faculty A3 department" is displayed with priority over other concurrent application school candidates at the school with the highest degree of difficulty in passing. "T1 University T2 Faculty T3 Department" is the school with the lowest degree of difficulty in passing, and has the lowest priority over other candidates for concurrent applications. Schools with passing difficulty in the meantime are displayed in order according to passing difficulty.

When performing such a display, the control unit 103 acquires the school ID, faculty ID, and department ID of the concurrent application school candidate from the concurrent application school candidate extraction unit 106. The control unit 103 acquires the school name, faculty name, department name, and passable deviation value of the school corresponding to the school ID, faculty ID, and department ID of the candidate school for concurrent application from the school DB 40 by the school DB management unit 104. The control unit 103 sorts the acquired school name, faculty name, and department name in order of passable deviation value to generate a selection support image. The control unit 103 displays on the display a selection support image including the school name, the faculty name, and the department name of a predetermined number (5 schools in FIG. 4A) from the top. When the output device 3 is a printer, a selection support image including the school name, faculty name, and department name of all the candidates for the concurrent application school is output from the printer.

In addition, the control unit 103 acquires the school ID, faculty ID, and department ID of the student's first choice school from the student DB 41 by the student DB management unit 105. The control unit 103 extracts, from the achievement DB 42, the achievement data of the graduates including the school ID, the faculty ID, and the department ID of the first-choice school of the examinee in the entrance examination achievement information by the examinee DB management unit 105. The control unit 103 acquires the school ID, faculty ID, and department ID that the graduate has taken, which is included in the information on the achievements of the graduates that have been extracted.

The control unit 103 determines whether or not the school ID, faculty ID, and department ID taken by the graduate are among the candidates for the concurrent application school. If there is a candidate for a concurrent application school, the control unit 103 displays the school name of the candidate for the concurrent application school in preference to the school name of the other candidate for the concurrent application school. For example, the control unit 103 displays the school name of the candidate school for which the graduate has taken the examination higher than the other school names. For example, in the case of FIG. 4A, "C1 University C2 Faculty C3 Department" and "D1 University D2 Faculty D3 Department" have the same pass difficulty level (passable deviation value 68). Here, since there are graduates who have taken the "C1 University C2 Faculty C3 Department", the "C1 University C2 Faculty C3 Department" is displayed with priority over the "D1 University D2 Faculty D3 Department". At this time, the control unit 103 may highlight the school name of the school, faculty, or department candidate for which the graduate has taken the examination by enlarging, changing the color, highlighting, or the like.

Further, for example, as in the selection support image illustrated in FIG. 5, the school names of the candidates for the concurrent application school that the graduates took the examination may be displayed in the order of the passing difficulty level, higher than the order according to the passing difficulty level. In the example of FIG. 5, "C1 University C2 Faculty C3 Department", "F1 University F2 Faculty F3 Department", "J1 University J2 Faculty J3 Department", and "K1 University K2 Faculty K3 Department" are candidates for concurrent applications taken by graduates. Is. These school names are displayed higher than the candidates for concurrent applications (“A1 University, A2 Faculty, A3 Department”), which have the highest degree of difficulty in passing. The school name of the candidate for the concurrent application school that the graduate took the examination and the school name of the other candidate for the concurrent application school are separated by a partition line. As a result, the examinees can easily confirm the candidates for the concurrent application school that the graduates have taken.

Among the candidates for the concurrent application schools that the graduates have taken the examination, the candidates for the concurrent application schools with the same difficulty of passing may be determined by the following processing to preferentially determine the candidates for the concurrent application schools to be displayed.
The control unit 103 counts the number of applicants for graduates for each candidate for a concurrent application school. In this case, the control unit 103 can display the school names of the concurrent application school candidates having the same pass difficulty level in descending order of the number of counted applicants.
The control unit 103 can confirm the name of the school that the graduate has passed from the acquired information on the academic achievement. Therefore, the control unit 103 can count the number of successful graduates for each school. For example, the control unit 103 counts the number of successful graduates who have been enrolled in the same school as the examinee in the past for each school. The control unit 103 can display the school names of the candidates for concurrent applications with the same degree of difficulty of passing in descending order of the number of successful applicants.
The control unit 103 can obtain the previous year's actual magnification of the school that is a candidate for a concurrent application from the school DB 40 by the school DB management unit 104. In this case, the control unit 103 can display the school names of the candidates for concurrent applications with the same number of successful applicants in ascending order of the actual magnification in the previous year.
The control unit 103 may preferentially display the candidates for the concurrent application school in which the first-choice school has passed the same graduates as the examinees.

The control unit 103 may determine the display order of a plurality of concurrent application school candidates having the same pass difficulty level by combining these. For example, the control unit 103 counts the number of applicants for graduates for each candidate for a concurrent application school having the same pass difficulty level, and displays the candidates for the concurrent application school in descending order of the number of applicants. If the number of applicants is also the same, the control unit 103 counts the number of successful graduates who have been enrolled in the same school as the examinee in the past for the candidates of the concurrent application school with the same number of applicants, in descending order of the number of successful applicants. Display candidates for concurrent applications. If the number of successful applicants is also the same, the control unit 103 confirms the actual magnification of the previous year for the candidates of the concurrent application schools with the same number of successful applicants, and displays the candidates of the concurrent application schools in ascending order of the actual magnification. If the actual magnification is the same, the candidates for concurrent applications that the same graduates of the first choice school have passed are displayed at the top.

In the selection support image illustrated in Fig. 5, among the candidates for the concurrent application schools that the graduates have taken, "J1 University J2 Faculty J3 Department" and "K1 University K2 Faculty K3 Department" have the same pass difficulty (passable deviation). The value is 66). In FIG. 5, "J1 University J2 Faculty J3 Department" is displayed higher than "K1 University K2 Faculty K3 Department". Therefore, the number of applicants for "J1 University J2 Faculty J3 Department" is larger than that for "K1 University K2 Faculty K3 Department". If the number of applicants is the same, the number of successful applicants in "J1 University J2 Faculty J3 Department" is larger than that in "K1 University K2 Faculty K3 Department". If the applicants and successful applicants are the same, the actual ratio of "J1 University J2 Faculty J3 Department" will be lower than that of "K1 University K2 Faculty K3 Department" in the previous year. If the actual magnification of the previous year is the same, the number of successful graduates of "J1 University J2 Faculty J3 Department" is larger than that of "K1 University K2 Faculty K3 Department".

The control unit 103 may generate a selection support image that displays candidates for concurrent applications in an order based on the determination result of the pass possibility determination unit 107. The control unit 103 acquires the pass possibility determination result of the examinee's first choice school and the concurrent application school candidate from the pass possibility determination unit 107. Based on the acquired determination result, the control unit 103 identifies a candidate for a concurrent application school that is determined to have a lower possibility of passing than the possibility of passing the first choice school. When generating the selection support image, the control unit 103 excludes the school names of the concurrent application school candidates determined to be less likely to pass than the specified first-choice school from the selection support image. As a result, the school names of the candidates for concurrent applications that are judged to be less likely to pass than the first-choice school will not be displayed. Candidates will be able to select a concurrent application school from candidates for concurrent application schools that are likely to pass.

FIG. 6 is an example diagram of a selection support image that reflects the determination result of passability. The passable deviation value of the first choice school (“X1 University X2 Faculty X3 Department”) is 67. In this case, the pass probability of the examinee for a school with a passable deviation value of 68 or more is lower than the pass probability of the first-choice candidate. Therefore, the selection support image of FIG. 6 is an image in which schools having a passable deviation value of 68 or more are deleted from the selection support image of FIG.

Further, the control unit 103 may refer to the school DB 40 to confirm the entrance examination dates of the concurrent application school candidates, and output the selection support image for displaying the concurrent application school candidates separately according to the entrance examination date from the output device 3. good. FIG. 7 is an example diagram of the selection support image in this case. In this selection support image, the entrance examination date of the first choice school is February 23, and the candidates for the concurrent application school are displayed separately for one week before and after February 9 according to the entrance examination date. Such a selection support image may display candidates for concurrent applications over more than two weeks. The number of candidates for concurrent applications each week is 5, but the number is not limited to this. Further, when the user selects "more" of the selection support image by the input device 2, other candidates for the concurrent application school of the week are output in a form as illustrated in the selection support image of FIG. 4B, for example. Will be done. In addition, the candidates for concurrent applications may be displayed not every week but every 10 days, for example. As shown in FIG. 5, the candidates for the concurrent application schools for each week are displayed higher than the other candidates for the concurrent application schools that the graduates have taken.

(Simultaneous application school selection support processing)
FIG. 8 is a flowchart showing the concurrent application school selection support process of the present embodiment. This process is started, for example, when the control unit 103 receives an instruction to start the joint application school selection support process from the input device 2 via the input unit 101. The start instruction includes the examinee ID.

The control unit 103 that has received the start instruction confirms the first choice school of the examinee corresponding to the examinee ID included in the start instruction (S101). The control unit 103 can confirm the first choice school (school ID, faculty ID, and department ID) of the examinee by referring to the examinee data of the examinee ID of the examinee DB 41 by the examinee DB management unit 105.

The control unit 103 that has confirmed the first choice school extracts the joint application school candidates according to the first choice school by the joint application school candidate extraction unit 106 (S102). The joint application school candidate extraction unit 106 refers to the school DB 40 by the school DB management unit 104, and extracts the joint application school candidates by comparing the school data of the first choice school with the school data of other schools. For that purpose, the concurrent application school candidate extraction unit 106 first acquires the entrance examination date and the examination subject from the school data of the first school of choice. The joint application school candidate extraction department 106 searches the school DB 40 by the school DB management department 104, and the entrance examination date is earlier than the entrance examination date of the first choice school, the application deadline has not passed, and the first choice school. Schools that can take the examination according to the examination subjects of are selected as candidates for concurrent applications. The joint application school candidate extraction unit 106 transmits the extracted school ID, faculty ID, and department ID of the joint application school candidate to the control unit 103.

The control unit 103 extracts graduates who have taken the entrance examination for the first school of choice (S103). The control unit 103 searches all the achievement data of the achievement DB 42 by the examinee DB management unit 105, and extracts the achievement data including the school ID, the faculty ID, and the department ID of the first school of choice in the entrance examination achievement information. The extracted performance data is the performance data of the graduates who took the first choice school.

The control unit 103 confirms the school in which the graduate has taken the examination based on the information on the academic achievement of the extracted graduate's achievement data (S104). The control unit 103 generates the selection support images illustrated in FIGS. 4 to 7 based on the candidates for the concurrent application school and the schools in which the graduates took the examination, and outputs the selection support image from the output device 3 via the output unit 102 ( S105).

Through the above processing, it is possible to provide the examinees with information that supports the selection of the most suitable concurrent application school according to the first-choice school. Candidates will be able to easily select a joint application school according to their wishes by using the selection support image. In addition, all of the candidates for concurrent applications presented are schools that can be taken according to the examination subjects of the first-choice school. By studying for the first-choice school, the examinees will study for the concurrent application school at the same time, so there is no need to specially study for the concurrent application school. Therefore, the examinee can reduce the burden of studying for the examination.

When the examinee selects a concurrent application school, the control unit 103 has a probability of passing any one school based on the passing probability of the examinee's first choice school and the concurrent application school selected by the examinee, or The output device 3 may output the probability of not passing any school. For example, the control unit 103 multiplies the passing probabilities of the concurrent application school selected by the examinee from the concurrent application school candidates and the first-choice school of the examinee to pass any one school, or to which school. Also calculate the probability of not passing.
The control unit 103 outputs the calculated probability from the output device 3. In such a process, the examinee can select the concurrent application school while confirming the combination of the first-choice school and the concurrent application school that are more likely to pass.

(Modification example)
The information processing device 1 of the present embodiment may preferentially display a school having a large score in the special subject / field based on the strong subject / field of the examinee. FIG. 9 is an explanatory diagram of school data and examinee data when such processing is performed.

FIG. 9A is an explanatory diagram of school data. In this school data, the items of the examination subjects of the school data of FIG. 3A are subdivided, and the points allocation ratio of each of the examination subjects A to C is included. In the example of FIG. 9A, the score ratio of the test subject A is 40%, and the score ratio of the test subjects B and C is 30%.
FIG. 9B is an explanatory diagram of examinee data. This examinee data is subdivided into items of the grade history of the examinee data shown in FIG. 3 (b), and includes the grade history for each examination subject. In the example of FIG. 9B, the grade history of each of the examination subjects A to E is included in the examinee data.

For example, if the grades of the examination subject A are better than those of other examination subjects, it is considered that this examinee is likely to pass the school shown in FIG. 9A in which the score ratio of the examination subject A is large. By comparing the grades of each test subject of the examinee with the score allocation ratio of each test subject of the school in this way, it is possible to recommend the school with a high possibility of passing to the examinee.

The control unit 103 confirms the point allocation ratio for each examination subject from the school data of the school DB 40 for the joint application school candidates acquired from the joint application school candidate extraction unit 106. The control unit 103 analyzes the examinee's specialty subject / specialty field based on the grade history of each examination subject in the examinee data. For example, the control unit 103 determines the subject or field in which the examinee is good at, based on the latest grades for each test subject and the tendency of changes in grades. Subjects with a high average of multiple test results and subjects with a high rate of increase from past grades are the subjects and fields that the examinees are good at.

The control unit 103 confirms the point allocation ratio for each examination subject regarding the subject or field that the examinee is good at for each candidate for the concurrent application school. As a result, the control unit 103 can display the school names of the candidates for the concurrent application school in descending order of the points assigned to the examinees' favorite subjects and specialty fields. For example, examinees who are good at science subjects tend to have high scores in mathematics and science. Therefore, the control unit 103 can display the candidates for the concurrent application school with a high score ratio of mathematics and science at the top of the selection support image, and preferentially display the candidates for the concurrent application school with a high possibility of passing the examinee.

The selection support image itself is the same as the images illustrated in FIGS. 4 to 7. The selection support image generated based on the subject or field that the examinee is good at is displayed with priority given to the candidates for the concurrent application school that are easy for the examinee to pass. Therefore, it becomes easier for the examinees to select a joint application school with a high possibility of passing.

Claims (12)

A first storage method for memorizing the passing difficulty level, examination subject, entrance examination date, and application deadline of each of multiple schools,
A second memory means to memorize the student's first choice school,
A third storage means for storing the examination schools that each of the multiple past examinees took,
With reference to the first storage means, the entrance examination date is earlier than the entrance examination date of the first-choice school of the examinee, the application deadline has not passed, and the examination subject of the first-choice school of the examinee An extraction method that extracts schools that can take the examination as candidates for concurrent applications,
It is provided with a display control means for displaying the extracted school names of the concurrent application school candidates on a predetermined display in an order according to the degree of difficulty of passing.
The display control means is characterized in that, if the candidate for the concurrent application school includes an examination school of the past examinee who has taken the examination of the first choice school of the examinee, the school name is displayed with priority over other school names. do,
Joint application school selection support device. With reference to the third storage means, a first counting means for counting the number of applicants of the past examinees is further provided for each examination school taken by the past examinees who took the examination of the first choice school of the examinee.
The display control means is characterized in that the school names of the concurrent application school candidates having the same pass difficulty level are displayed in an order according to the number of applicants counted by the first counting means.
The concurrent application school selection support device according to claim 1. The second storage means stores the school name of the examinee's school.
The third storage means stores the examination result of the examination school that the past examinee took and the school name of the school that graduated.
With reference to the third storage means, a second counting means is provided in which past examinees who have graduated from the same school as the examinee's current school count the number of successful applicants for each examination school.
The display control means is characterized in that the school names of schools having the same number of applicants are displayed in an order according to the number of successful applicants counted by the second counting means.
The concurrent application school selection support device according to claim 2. The first storage means stores the actual magnification of each of the plurality of schools in the previous year.
The display control means is characterized in that the school names of schools having the same number of successful applicants are displayed in an order according to the actual magnification.
The concurrent application school selection support device according to claim 3. The display control means displays a predetermined number of school names of concurrent application school candidates, and displays a larger number of school names of concurrent application school candidates in response to an instruction from a user.
The concurrent application school selection support device according to any one of claims 1 to 4. The second storage means stores the grades of the examinee and stores the results of the examinee.
Based on the degree of difficulty of passing the first-choice school and the candidate for the concurrent application school of the examinee and the results of the examinee, a determination means for determining the passability of the examinee for the first-choice school and the candidate for the concurrent application school is further provided. I have
As a result of the determination by the determination means, the display control means does not display the school name of the candidate school for the concurrent application, which is less likely to pass than the first choice school of the examinee.
The concurrent application school selection support device according to any one of claims 1 to 5. The control means is based on the pass probability indicating the pass probability of each of the first-choice school of the examinee and the concurrent application school selected by the examinee when the examinee selects the concurrent application school from the concurrent application school candidates. It is characterized in that the probability of passing any one school or the probability of not passing any school is calculated and the calculated result is output.
The concurrent application school selection support device according to claim 6. The display control means is used when the school name of the past examinee whose first choice school is the same as that of the examinee, when the examinee school to which the past examinee has passed is included in the candidates for the concurrent application school. Is characterized by giving priority to display,
The concurrent application school selection support device according to claim 1 or 2. The first storage means stores the points assigned to the examination subjects of the plurality of schools.
The second storage means stores the grades of each test subject of the examinee.
The display control means determines the subject of the examinee's specialty from the results of each examination subject of the examinee, and selects the school names of the candidates for the concurrent application school having the same degree of difficulty of passing in the order according to the points assigned to the subject of the examinee's specialty. Characterized by displaying with,
The concurrent application school selection support device according to claim 1. The display control means is characterized in that the entrance examination date of the concurrent application school candidate is confirmed with reference to the first storage means, and the school name of the concurrent application school candidate is displayed separately according to the entrance examination date. do,
The concurrent application school selection support device according to any one of claims 1 to 9. A first storage means for memorizing the passing difficulty level, examination subject, entrance examination date, and application deadline of each of the multiple schools, a second storage means for memorizing the first choice school of the examinee, and a plurality of past examinees. A method performed by a device communicatively connected to a large-capacity storage device, each of which has a third storage means for storing the test school in which the test was taken.
The device
With reference to the second storage means, the first school of choice of the examinee is confirmed.
With reference to the first storage means, the entrance examination date is earlier than the entrance examination date of the first-choice school of the examinee, the application deadline has not passed, and the examination subject of the first-choice school of the examinee Schools that can take the examination are selected as candidates for concurrent applications,
With reference to the third storage means, the past examinees who took the examination of the first choice school of the examinee are extracted, and the examination school where the past examinee took the examination is confirmed.
The school names of the candidates for the concurrent application are displayed on a predetermined display in the order according to the difficulty of passing, and if the candidate for the concurrent application includes the schools of the past examinees who have taken the first-choice school of the examinee, the schools thereof. The feature is that the school name is displayed with priority over other school names.
How to support the selection of concurrent application schools. A first memory means for memorizing the passing difficulty level, examination subject, entrance examination date, and application deadline of each of the multiple schools, a second memory means for memorizing the first choice school of the examinee, and a plurality of past examinees. A computer communicatively connected to a large-capacity storage device equipped with a third storage means for storing the examination schools, each of which has taken an examination.
With reference to the first storage means, the entrance examination date is earlier than the entrance examination date of the first-choice school of the examinee, the application deadline has not passed, and the examination subject of the first-choice school of the examinee An extraction method that extracts schools that can take the examination as candidates for concurrent applications,
It is made to function as a display control means for displaying the extracted school names of the concurrent application school candidates on a predetermined display in an order according to the degree of difficulty of passing.
If the display control means includes a school of the past examinee who has taken the first choice school of the examinee as a candidate for the concurrent application school, the school name is displayed with priority over other school names.
Computer program.

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