JP6889772B2 - 噴霧チャンバ及びそれらを利用する方法 - Google Patents

噴霧チャンバ及びそれらを利用する方法 Download PDF

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Publication number
JP6889772B2
JP6889772B2 JP2019512942A JP2019512942A JP6889772B2 JP 6889772 B2 JP6889772 B2 JP 6889772B2 JP 2019512942 A JP2019512942 A JP 2019512942A JP 2019512942 A JP2019512942 A JP 2019512942A JP 6889772 B2 JP6889772 B2 JP 6889772B2
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Prior art keywords
cells
outer chamber
chamber
spray chamber
spray
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Expired - Fee Related
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JP2019512942A
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English (en)
Japanese (ja)
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JP2019521366A5 (enExample
JP2019521366A (ja
Inventor
スティーブン,チャディー
バディエイ,ハミド
サウチェンコ,セルゲイ
バザルガン,サマド
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PerkinElmer Health Sciences Canada Inc
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PerkinElmer Health Sciences Canada Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/107Arrangements for using several ion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273Desolvation chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165Electrospray ionisation
    • H01J49/167Capillaries and nozzles specially adapted therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Plasma Technology (AREA)
JP2019512942A 2016-05-18 2017-05-17 噴霧チャンバ及びそれらを利用する方法 Expired - Fee Related JP6889772B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662337997P 2016-05-18 2016-05-18
US62/337,997 2016-05-18
PCT/US2017/033063 WO2017201143A1 (en) 2016-05-18 2017-05-17 Spray chambers and methods of using them

Publications (3)

Publication Number Publication Date
JP2019521366A JP2019521366A (ja) 2019-07-25
JP2019521366A5 JP2019521366A5 (enExample) 2020-06-25
JP6889772B2 true JP6889772B2 (ja) 2021-06-18

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Family Applications (1)

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JP2019512942A Expired - Fee Related JP6889772B2 (ja) 2016-05-18 2017-05-17 噴霧チャンバ及びそれらを利用する方法

Country Status (8)

Country Link
US (4) US10147592B2 (enExample)
EP (1) EP3459323A4 (enExample)
JP (1) JP6889772B2 (enExample)
KR (1) KR102042436B1 (enExample)
CN (1) CN109964541B (enExample)
AU (1) AU2017268310B8 (enExample)
CA (1) CA3024740A1 (enExample)
WO (1) WO2017201143A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10804091B2 (en) * 2016-05-18 2020-10-13 Perkinelmer Health Sciences Canada, Inc. Single particle analysis using optical detection
JP6784986B2 (ja) * 2017-05-12 2020-11-18 株式会社Sumco スプレーチャンバー、試料霧化導入装置、分析装置および試料中の成分分析方法
US11630039B1 (en) * 2018-08-07 2023-04-18 Elemental Scientific, Inc. Spray chamber having dual input ports for impingement gas and sensitivity enhancement gas addition
US11075066B2 (en) * 2018-10-26 2021-07-27 Agilent Technologies, Inc. Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
WO2020150126A1 (en) 2019-01-14 2020-07-23 Agilent Technologies, Inc. Versatile tube-free jet for gc detector
US12068146B2 (en) * 2019-02-04 2024-08-20 Glass Expansion Pty. Limited Analytic nebuliser
WO2020202008A1 (en) * 2019-04-01 2020-10-08 Perkinelmer Health Sciences Canada, Inc. Devices and methods to improve background equivalent concentrations of elemental species
KR102137911B1 (ko) * 2019-09-16 2020-07-27 강원대학교산학협력단 형질전환 정원줄기세포의 생산방법
CN113237942B (zh) * 2021-05-07 2023-09-26 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
KR102571890B1 (ko) * 2021-11-29 2023-08-30 한국생산기술연구원 표면증폭 라만산란을 위한 금속나노입자 수집장치
AU2023202154A1 (en) * 2022-04-08 2023-10-26 Glass Expansion Pty. Limited A flow control device
WO2025133161A1 (en) * 2023-12-20 2025-06-26 Thermo Fisher Scientific (Bremen) Gmbh Connecting element for spectrometry

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US4990740A (en) 1989-03-06 1991-02-05 The Dow Chemical Company Intra-microspray ICP torch
US5012065A (en) * 1989-11-20 1991-04-30 New Mexico State University Technology Transfer Corporation Inductively coupled plasma torch with laminar flow cooling
US4958529A (en) * 1989-11-22 1990-09-25 Vestec Corporation Interface for coupling liquid chromatography to solid or gas phase detectors
JP2633974B2 (ja) * 1990-04-18 1997-07-23 株式会社日立製作所 試料のイオン化および質量分析のための装置
EP0560537A1 (en) * 1992-03-10 1993-09-15 Mds Health Group Limited Apparatus and method for liquid sample introduction
JP2852838B2 (ja) 1992-09-10 1999-02-03 セイコーインスツルメンツ株式会社 誘導結合プラズマ質量分析装置
US5868322A (en) * 1996-01-31 1999-02-09 Hewlett-Packard Company Apparatus for forming liquid droplets having a mechanically fixed inner microtube
US5969352A (en) * 1997-01-03 1999-10-19 Mds Inc. Spray chamber with dryer
EP1012871A1 (en) 1997-01-03 2000-06-28 MDS Inc. Spray chamber with dryer
JPH11326165A (ja) * 1998-05-18 1999-11-26 Yokogawa Analytical Systems Inc 試料液の霧化導入装置
JP3836693B2 (ja) * 2001-07-30 2006-10-25 独立行政法人科学技術振興機構 Icp質量分析用クロスフロー型マイクロネブライザー
JP3809099B2 (ja) * 2001-12-12 2006-08-16 株式会社堀場製作所 乾式粒径分布測定装置
JP2006038729A (ja) * 2004-07-29 2006-02-09 National Institute Of Advanced Industrial & Technology 誘導結合プラズマトーチ
US20070023677A1 (en) * 2005-06-29 2007-02-01 Perkins Patrick D Multimode ionization source and method for screening molecules
JP2008157895A (ja) * 2006-12-26 2008-07-10 Horiba Ltd 試料導入装置
US7595487B2 (en) * 2007-08-24 2009-09-29 Georgia Tech Research Corporation Confining/focusing vortex flow transmission structure, mass spectrometry systems, and methods of transmitting particles, droplets, and ions
WO2009120642A1 (en) 2008-03-26 2009-10-01 Massachusetts Institute Of Technology Methods for fabricating electrokinetic concentration devices
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Also Published As

Publication number Publication date
US20200161117A1 (en) 2020-05-21
US10395912B2 (en) 2019-08-27
KR20190040135A (ko) 2019-04-17
CN109964541B (zh) 2021-01-01
JP2019521366A (ja) 2019-07-25
KR102042436B1 (ko) 2019-11-08
AU2017268310A8 (en) 2022-12-08
US20170338092A1 (en) 2017-11-23
EP3459323A4 (en) 2020-01-01
US10796895B2 (en) 2020-10-06
AU2017268310B8 (en) 2022-12-08
US20210090872A1 (en) 2021-03-25
CA3024740A1 (en) 2017-11-23
US10147592B2 (en) 2018-12-04
US20190189416A1 (en) 2019-06-20
AU2017268310B2 (en) 2022-12-01
EP3459323A1 (en) 2019-03-27
WO2017201143A1 (en) 2017-11-23
AU2017268310A1 (en) 2019-01-03
CN109964541A (zh) 2019-07-02
US11315778B2 (en) 2022-04-26

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