JP6843902B2 - Error rate measuring device and error rate measuring method - Google Patents

Description

INDUSTRIAL APPLICABILITY The present invention transmits a test signal of a known pattern to the object to be measured in a state where the object to be measured is transitioned to the signal pattern return state, and the input data to be returned and received from the object to be measured with the transmission of this test signal. The present invention relates to an error rate measuring device and an error rate measuring method for measuring the bit error rate of the above.

For example, as disclosed in Patent Document 1 below, the error rate measuring device transmits a test signal of a known pattern including fixed data to the object to be measured, and receives the test signal by returning from the object to be measured as the test signal is transmitted. It has been conventionally known as a device for measuring a bit error rate (BER) by comparing a measured signal and a reference reference signal on a bit-by-bit basis.

By the way, in the standard test of a high speed serial bus (hereinafter, also referred to as HSB) such as USB, PCIe, etc. using the above-mentioned error rate measuring device, stress is applied based on (1) standard. A procedure of generating a pattern signal → (2) transitioning the object to be measured to the pattern signal folding state (loopback) specified by the standard → (3) measuring the error rate is required.

Then, in order to realize the above (2), a plurality of specific patterns defined by the standard are output to the object to be measured while switching from the signal generation module in units of several microseconds, as expected in the standard test. It is necessary to make a state transition.

For this reason, in the conventional error rate measuring device, the specific patterns defined by the standard are transmitted to the measured object in a fixed order for a time set in advance by the user to make the state transition of the measured object. The state transition was realized.

Therefore, in the conventional error rate measuring device, the transmission order of the patterns for state transitioning the object to be measured is fixed, and the transition procedure to the state (loopback) of the pattern signal loopback defined by each standard can be perfectly followed. The error rate could be measured only for the object to be measured.

Japanese Unexamined Patent Publication No. 2007-274474

However, it is often the case that the object under test in the actual early stage of development cannot undergo a complete state transition. However, with the conventional error rate measuring device, since it is not possible to set a flexible pattern order, it is not possible to measure the error rate of the object to be measured, which cannot perform a complete state transition, and improvement thereof has been required. ..

Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide an error rate measuring device and an error rate measuring method capable of flexible state transitions.

In order to achieve the above object, the error rate measuring device according to claim 1 according to the present invention inputs a specific pattern defined by a high-speed serial bus standard into the object to be measured W and outputs the object to be measured as a pattern signal. An error rate measuring device 1 that inputs a test signal of a known pattern in a state of transitioning to the folded state, and measures the bit error rate of the input data received from the object to be measured in accordance with the input of the test signal. ,
The setting operation unit 2 to be operated when selecting the standard of the high-speed serial bus and editing the block unit of the specific pattern defined by the selected standard, and
By operating the setting operation unit, the specific pattern defined by the standard selected from the high-speed serial bus standards is divided into blocks in the order of transmission, and the pattern hold is enabled / disabled for each block, the signal format, the pattern name, and the set time. Alternatively, the display unit 5 that displays a list of the set number of times on the pattern setting screen 5a, and
The display unit switches to a pattern editing screen 5b that can edit a specific pattern defined by a standard selected from the high-speed serial bus standards on the pattern setting screen by operating the setting operation unit. It is characterized in that it is provided with a control unit 6 for controlling the above.

The error rate measuring device according to claim 2 is the error rate measuring device according to claim 1.
The control unit 6 is characterized in that the display unit 5 is controlled so as to identify and display the currently transmitting block of the specific pattern on the pattern setting screen 5a.
The error rate measuring device according to claim 3 is the error rate measuring device according to claim 1 or 2.
When the pattern hold is enabled / disabled for each block by the operation of the setting operation unit 2, the switching of the specific pattern is stopped at the block in which the pattern hold is enabled.
The error rate measuring device according to claim 4 is the error rate measuring device according to claim 1 or 2.
A storage unit 3 for storing data of a specific pattern edited on the pattern editing screen 5b is provided.
The feature is that the data list of the specific pattern saved in the storage unit is displayed on the display unit 5 by the operation of the setting operation unit 2, and the data of the specific pattern to be edited is selected and read from the displayed data list. To do.

The error rate measuring method according to claim 5 is a known pattern in a state where a specific pattern defined by a high-speed serial bus standard is input to the measured object W and the measured object is transitioned to a pattern signal folding state. This is an error rate measuring method for inputting the test signal of the above and measuring the bit error rate of the input data received from the object to be measured in connection with the input of the test signal.
The step of operating the setting operation unit 2 when selecting the standard of the high-speed serial bus and editing the block unit of the specific pattern defined by the selected standard, and
By operating the setting operation unit, the specific pattern defined by the standard selected from the high-speed serial bus standards is divided into blocks in the order of transmission, and the pattern hold is enabled / disabled for each block, the signal format, the pattern name, and the set time. Alternatively, a step of displaying a list of set times on the pattern setting screen 5a and
It includes a step of switching and displaying a specific pattern defined by a standard selected from the high-speed serial bus standards on the pattern setting screen by operating the setting operation unit on the pattern editing screen 5b that can be edited in block units. It is characterized by.

The error rate measuring method according to claim 6 is the error rate measuring method according to claim 5.
It is characterized by including a step of identifying and displaying a block currently being transmitted of the specific pattern on the pattern setting screen 5a.
The error rate measuring method according to claim 7 is the error rate measuring method according to claim 5 or 6.
It is characterized by including a step of stopping the switching of the specific pattern in the block in which the pattern hold is set to be valid when the pattern hold for each block is enabled / disabled by the operation of the setting operation unit 2. And.
The error rate measuring method according to claim 8 is the error rate measuring method according to claim 5 or 6.
A step of saving the data of the specific pattern edited on the pattern editing screen 5b in the storage unit 3 and
The data list of the specific pattern stored in the storage unit by the operation of the setting operation section 2 Shows, characterized in that it comprises the steps of reading selected data for a specific pattern to be edited from the displayed data list ..

According to the present invention, flexible state transitions are possible, and it is possible to measure the error rate of a wide variety of objects to be measured, including the objects to be measured in the initial stage of development.

It is a block diagram which shows the schematic structure of the error rate measuring apparatus which concerns on this invention. It is a figure which shows an example of the pattern setting screen of a specific pattern. It is a figure which shows an example of the pattern edit screen of a specific pattern. It is a figure which shows an example of the pattern setting screen which identifies and displays the block during transmission of a specific pattern. It is a flowchart of the editing method of the specific pattern by the error rate measuring apparatus which concerns on this invention.

Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the attached drawings.

The error rate measuring device and the error rate measuring method according to the present invention put the object to be measured into a signal pattern folding state (loopback) according to a specific pattern in a standard test of a high-speed serial bus (HSB) such as USB or PCIe. A test signal of a known pattern is transmitted to an object to be measured in a transitioned state, and the bit error rate of input data received by returning from the object to be measured with the transmission of this test signal is measured. The specific pattern is a sequence pattern defined by the HSB standard required for transitioning the object to be measured to the signal pattern folding state (loopback).

As shown in FIG. 1, the error rate measuring device 1 of the present embodiment is roughly configured to include a setting operation unit 2, a storage unit 3, a measuring unit 4, a display unit 5, and a control unit 6.

The setting operation unit 2 is operated by the user, for example, various soft keys, cursor keys, and arrow keys on the display screen of the display unit 5 (pattern setting screen 5a in FIG. 2 and pattern editing screen 5b in FIG. 3). In addition, it consists of keys, switches, buttons, etc. provided on the main body of the device.

When the setting operation unit 2 gives an instruction to start or stop transmitting a specific pattern or a test signal to the object W to be measured, an instruction to start or stop the measurement of the error rate of the object W to be measured, or to set or edit a specific pattern. Is operated by.

For example, as the soft keys of the setting operation unit 2 operated when setting a specific pattern, the soft keys 2a of "Sequence Edit", "Transmit", and "Manual" displayed on the pattern setting screen 5a of FIG. 2 are used. There are 2b and 2c. On the pattern setting screen 5a of FIG. 2, when the soft key 2a of "Sequence Edit" is pressed, the display screen is switched to, for example, the pattern editing screen 5b of FIG. Further, when the soft key 2b of "Transmit" on the pattern setting screen 5a of FIG. 2 is pressed, transmission of a specific pattern based on the setting information is started. Further, when the soft key 5c of "Manual" on the pattern setting screen 5a of FIG. 2 is pressed, the output of the pattern of the block next to the block whose pattern hold is set to "Manual" is started.

Further, as soft keys of the setting operation unit 2 operated when editing a specific pattern, "Save", "Load", "Add", "Delete", etc. displayed on the pattern editing screen 5b of FIG. 3 are used. There are softkeys 2d, 2e, 2f, 2g, 2h, 2i, 2j, 2k, 2l, 2m of "Copy", "Cut", "Paste", "Clear All", "OK", and "Cancel". Then, by operating these softkeys 2d to 2m, the HSB standard (PCIe Gen1,2,3,4, USB3.1 Gen1,2) is selected, and the block (# 0 to # 6) of the specific pattern defined by the selected standard is selected. ) Units can be edited, specific pattern setting information can be saved in the storage unit 3, and specific pattern setting information stored in the storage unit 3 can be read out.

In the illustrated example, the soft keys on the display screen of the display unit 5 are configured as a part of the setting operation unit 2, but an external input device provided separately from the error rate measuring device 1 is set and operated. It can also be used as part 2.

The storage unit 3 has various information of a specific pattern based on the setting information of the pattern setting screen 5a and the editing information of the pattern editing screen 5b (information such as the type of the specific pattern, the transmission order, the transmission time, the number of transmissions, etc. defined by the HSB standard). , Information on known test signals, various information on measurement conditions and measurement results of the error rate of the object W to be measured are stored.

The measurement unit 4 includes a pattern generation unit 4a and an error detection unit 4b, and includes an HSB standard test of the object W to be measured by controlling the control unit 6 based on the operation information of the setting operation unit 2 and the storage information of the storage unit 3. Make various measurements.

The pattern generation unit 4a is a test signal of a specific pattern based on the setting information set on the pattern setting screen 5a (information reflecting the editing on the pattern editing screen 5b) and a known pattern for performing various measurements of the object W to be measured. Occurs.

The error detection unit 4b transmits a test signal from the pattern generation unit 4a in a state where the object W to be measured is transitioned to the signal pattern folding state (loopback) according to the specific pattern generated by the pattern generation unit 4a. An error in the input data returned from the object W to be measured is detected, and various measurements including the HSB standard test of the object W to be measured are performed.

The display unit 5 is composed of, for example, a liquid crystal display mounted on the main body of the device. Under the control of the control unit 6, the display unit 5 sets a pattern setting screen 5a for setting a specific pattern for transitioning the state (loopback) of the pattern signal folding back of the object W to be measured, and pattern editing for editing the specific pattern. The screen 5b is displayed on the display screen, and the results of various measurements based on the detection of an error in the input data returned from the object W to be measured when the test signal is transmitted to the object W to be measured are displayed.

Here, as shown in FIG. 2, the pattern setting screen 5a blocks a specific pattern defined by a standard selected from a plurality of HSB standards (PCIe Gen1,2,3,4, USB3.1 Gen1,2). Display separately. Further explaining, on the pattern setting screen 5a of FIG. 2, seven specific patterns by USB Gen1 are transmitted in the order of # 0, # 1, # 2, # 3, # 4, # 5, # 6 (Block No.). It is divided into blocks, and the valid / invalid (Pattern Hold), signal format (Type), pattern name (Pattern), set time or set number of times (Time / Nu, Unit) of the pattern hold for each block is displayed in a list.

At the initial stage, preset data of a specific pattern defined by a predetermined HSB standard (for example, USB Gen1) is displayed on the pattern setting screen 5a. The preset data of the specific pattern is sequence data for state transition in which the object W to be measured is transitioned to the signal pattern return state (loopback) in accordance with the standard. Further, from the second time onward, the data of the specific pattern at the end of the previous time is displayed on the pattern setting screen 5a.

Further, as shown in FIG. 3, the pattern editing screen 5b displays a list of specific patterns displayed on the pattern setting screen 5a of FIG. 2 in a block-by-block manner.

When the block is enabled on the pattern editing screen 5b of FIG. 3, the check box is clicked to input the check of the check mark. Further, the pattern hold (Pattern Hold) of the pattern editing screen 5b of FIG. 3 is effective when "Manual" is selected, and the switching of a specific pattern is once stopped at that block.

The control unit 6 controls the measurement unit 4 based on the operation information of the setting operation unit 2 and the storage information of the storage unit 3, and controls each unit in an integrated manner in order to perform various measurements of the object W to be measured. Includes a display control means 6a that controls the display unit 5 when setting or editing the above.

Further, the display control means 6a displays the pattern setting screen 5a of FIG. 2 when setting a specific pattern for transitioning the state (loopback) of the pattern signal folding back of the object W to be measured. The display unit 5 is controlled.

Further, the display control means 6a controls the display unit 5 so as to display the pattern editing screen 5b of FIG. 3 when the soft key 2a of the “Sequence Edit” of the pattern setting screen 5a of FIG. 2 is pressed.

Further, the display control means 6a controls the display unit 5 so as to identify and display the currently transmitting block of the specific pattern on the pattern setting screen 5a of FIG. 4 during the transmission of the specific pattern. Specifically, the setting area of the block currently being transmitted is highlighted with a backlight. In FIG. 4, the setting area of the block # 2 indicated by the diagonal line is highlighted by the backlight, and the block # 2 is highlighted as the block currently being transmitted. This makes it possible to check at a glance which blocks are currently being transmitted for a specific pattern.

The above-mentioned identification display of the block currently being transmitted is not limited to the one that highlights the entire setting area of the block as shown in FIG. 4 with a backlight, and a part of the setting area of the block (for example, Block No. It may be a display form that can be distinguished from other blocks, such as highlighting (only) or changing the color of characters.

Further, although the display control means 6a is not particularly shown, when the soft key for displaying the measurement result of the object to be measured W is pressed, the measurement result of the object to be measured W based on the detection result of the error detection unit 4b is pressed. The display unit 5 is controlled so as to display the screen.

Next, a method of editing a specific pattern by the error rate measuring device 1 configured as described above will be described with reference to FIG.

When editing a specific pattern, the pattern setting screen 5a of FIG. 2 is displayed (ST1). At the initial stage, preset data of a specific pattern defined by a predetermined HSB standard (for example, USB Gen1) is displayed on the pattern setting screen 5a. If it is the second time or later, the data of the specific pattern at the end of the previous time is displayed on the pattern setting screen 5a.

Then, when the soft key 2a of the "Sequence Edit" of the pattern setting screen 5a is pressed, the screen switches to the pattern editing screen 5b of FIG. 3 based on the preset data of the pattern setting screen 5a of FIG. 2 or the data of the specific pattern at the end of the previous time. (ST2).

Next, on the pattern editing screen 5b, when one standard is selected from a plurality of HSB standards (PCIe Gen1,2,3,4, USB3.1 Gen1,2) displayed as a pull-down menu (ST3), The pattern editing screen 5b based on the selected standard is displayed (ST4). For example, when "USB Gen1" is selected from the pull-down menu, the pattern editing screen 5b of FIG. 3 is displayed.

Then, on the pattern editing screen 5b, the soft keys 2f, 2g, 2h, 2i of "Add", "Delete", "Copy", "Cut", "Paste", "Clear All", "OK", and "Cancel" are displayed. , 2j, 2k, 2l, 2m are appropriately operated, and editing is freely performed in units of blocks (# 0 to # 6) of a specific pattern defined by a selected standard (for example, USB Gen1) (ST5).

When the above-mentioned editing of the specific pattern in block units is completed and the soft key 2d of "Save" is pressed, the data of the specific pattern edited on the pattern editing screen 5b is saved in the storage unit 3.

Further, in the above-mentioned editing of the specific pattern, the soft key 2e of "Load" is pressed to display the data list (not shown) of the specific pattern saved in the storage unit 3, and the specific pattern to be edited from this data list is displayed. You can also select and read the data.

Then, when performing the HSB standard test, when the soft key 2b of "Transmit" on the pattern setting screen 5a of FIG. 2 is pressed, the pattern generation unit 4a is set on the pattern setting screen 5a under the control of the control unit 6. The specific pattern (# 0 to # 6) is transmitted to the object W to be measured. During the transmission of this specific pattern, as shown by the diagonal lines in FIG. 4, the currently transmitting block of the specific pattern is identified and displayed. Then, when the object W to be measured transitions to the signal pattern folding state due to this specific pattern, the pattern generation unit 4a transmits a test signal of a known pattern to the object W under the control of the control unit 6, and the error detection unit 4b Detects an error in the input data returned from the object W to be measured, and performs various measurements including the HSB standard test of the object W to be measured.

As described above, in the present embodiment, the user can freely set the type of the specific pattern, the transmission order, the transmission time, the number of transmissions, and the like defined by the HSB standard for transmission. This makes it possible to measure the error rate even for an object to be measured that cannot undergo a complete state transition, and to measure the error rate of a wide variety of objects to be measured, including the object to be measured in the early stages of development. Can be done.

Although the best form of the error rate measuring device and the error rate measuring method according to the present invention has been described above, the present invention is not limited by the description and drawings in this form. That is, it goes without saying that all other forms, examples, operational techniques, and the like made by those skilled in the art based on this form are included in the scope of the present invention.

1 Error rate measuring device 2 Setting operation unit 2a to 2m Softkey 3 Storage unit 4 Measuring unit 4a Pattern generation unit 4b Error detection unit 5 Display unit 6 Control unit W Measured object (DUT)

Claims (8)

A specific pattern defined by the standard of the high-speed serial bus is input to the object to be measured (W), and a test signal of a known pattern is input in a state where the object to be measured is transitioned to the pattern signal folding state, and the test signal of this test signal is input. An error rate measuring device (1) that measures the bit error rate of input data received from the object to be measured in response to input.
The setting operation unit (2) to be operated when selecting the standard of the high-speed serial bus and editing the block unit of the specific pattern defined by the selected standard, and
By operating the setting operation unit, the specific pattern defined by the standard selected from the high-speed serial bus standards is divided into blocks in the order of transmission, and the pattern hold is enabled / disabled for each block, the signal format, the pattern name, and the set time. Alternatively, a display unit (5) that displays a list of set times on the pattern setting screen (5a), and
By operating the setting operation unit, the specific pattern defined by the standard selected from the high-speed serial bus standards on the pattern setting screen is switched to the pattern editing screen (5b) that can be edited in block units and displayed. An error rate measuring device including a control unit (6) for controlling a display unit. The first aspect of claim 1, wherein the control unit (6) controls the display unit (5) so as to identify and display the currently transmitting block of the specific pattern on the pattern setting screen (5a). Error rate measuring device. When the pattern hold is enabled / disabled for each block by the operation of the setting operation unit (2), the switching of the specific pattern is stopped at the block in which the pattern hold is enabled. The error rate measuring device according to claim 1 or 2. A storage unit (3) for storing data of a specific pattern edited on the pattern editing screen (5b) is provided.
The data list of the specific pattern saved in the storage unit is displayed on the display unit (5) by the operation of the setting operation unit (2), and the data of the specific pattern to be edited is selected and read from the displayed data list. The error rate measuring apparatus according to claim 1 or 2. A specific pattern defined by the standard of the high-speed serial bus is input to the object to be measured (W), and a test signal of a known pattern is input in a state where the object to be measured is transitioned to the pattern signal folding state, and the test signal of this test signal is input. It is an error rate measuring method for measuring the bit error rate of the input data received from the object to be measured with the input.
The step of operating the setting operation unit (2) when selecting the standard of the high-speed serial bus and editing the block unit of the specific pattern defined by the selected standard, and
By operating the setting operation unit, the specific pattern defined by the standard selected from the high-speed serial bus standards is divided into blocks in the order of transmission, and the pattern hold is enabled / disabled for each block, the signal format, the pattern name, and the set time. Alternatively, a step of displaying a list of set times on the pattern setting screen (5a) and
By operating the setting operation unit, a step of switching and displaying a specific pattern defined by a standard selected from the high-speed serial bus standards on the pattern setting screen to a pattern editing screen (5b) that can be edited in block units is displayed. An error rate measuring method characterized by including. The error rate measuring method according to claim 5, further comprising a step of identifying and displaying the currently transmitting block of the specific pattern on the pattern setting screen (5a). When the enable / disable of the pattern hold for each block is set by the operation of the setting operation unit (2), the step of stopping the switching of the specific pattern in the block in which the pattern hold is enabled is included. The error rate measuring method according to claim 5 or 6, wherein the error rate is measured. A step of saving the data of the specific pattern edited on the pattern editing screen (5b) in the storage unit (3), and
Characterized in that it comprises the steps of reading selected data for a specific pattern to be edited the data list of the specific pattern stored in the storage unit by the operation of the setting operation unit (2) shown in Table, from the displayed data list The error rate measuring method according to claim 5 or 6.

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