JP6836610B2 - Error rate measuring device and error rate measuring method - Google Patents

Description

INDUSTRIAL APPLICABILITY The present invention transmits a test signal of a known pattern in a state where the object to be measured is transitioned to a signal pattern return state, and receives the input data by returning from the object to be measured along with the transmission of the test signal. The present invention relates to an error rate measuring device and an error rate measuring method for measuring the bit error rate of the above.

For example, as disclosed in Patent Document 1 below, the error rate measuring device transmits a test signal of a known pattern including fixed data to the object to be measured, and receives the test signal by returning from the object to be measured as the test signal is transmitted. It has been conventionally known as a device for measuring a bit error rate (BER) by comparing a measured signal and a reference reference signal on a bit-by-bit basis.

By the way, in the standard of high speed serial bus (High Speed Serial Bus) such as USB and PCIe, it has a state machine called LTSSM (Link Training & Status State Machine, hereinafter referred to as a link state management mechanism), and thereby between devices. It manages communication initialization and link speed adjustment.

In addition, the conventional error rate measuring device controls the link state management mechanism of PCIe Gen1 to 4, USB3.1 by switching the specific pattern defined by the standard from the pulse pattern generator (PPG) at high speed, and puts it in a specific state. It has a transition function (sequence pattern function). The pattern for transitioning the state of the object to be measured (DUT) is defined by the standard, and the output order of these patterns can be combined and output by the sequence pattern function.

Japanese Unexamined Patent Publication No. 2007-274474

However, there are a wide variety of patterns defined by the standard, and some of them have different properties depending on a specific bit in the pattern, so it is possible to have the device as preset data covering all these patterns and maintain the user's operability. was difficult.

For this reason, it is conceivable to use the existing pattern editing function that edits patterns using a binary-based or hexa-based editor. In this case, the specific bit that the user wants to change is included anywhere in the binary or hexadecimal number list. It is very difficult to determine whether or not the pattern is being edited, and not only is it time-consuming to edit the pattern, but there is also the risk of setting errors.

Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide an error rate measuring device and an error rate measuring method that can be freely edited by a user to create an intuitive transmission pattern. It is said.

In order to achieve the above object, the error rate measuring device according to claim 1 of the present invention uses an ordered set based on the high-speed serial bus standard for the measured object W equipped with the link state management mechanism. , A test signal of a known pattern is input in a state where the object to be measured is transitioned to the state defined by the standard, and the bit error rate of the input data received from the object to be measured is measured in accordance with the input of this test signal. Error rate measuring device 1
A display unit 5 for displaying a pattern editing screen 5c capable of editing a pattern for transitioning to a state defined by the standard on a binary basis or a hexabase, and a display unit 5.
A control unit that controls the display unit so as to switch to the ordered set editing screen 5a in which the ordered set can be edited in symbol units or the symbol editing screen 5b in which the symbol of the ordered set can be edited in bit units. 6 and
A storage unit that stores various information including the pattern editing screen, the ordered set editing screen, the symbol number of the ordered set based on the editing on the symbol editing screen, the special symbol, the 128-bit data, the K code, and the 8-bit data. 3 and
Editing an ordered set in symbol units on the ordered set editing screen, editing an ordered set in bit units on the symbol editing screen, editing a pattern on the pattern editing screen, and displaying various information to the storage unit. It is equipped with a setting operation unit 2 that is operated when saving and reading various information from the storage unit.
When the ordered set symbol on the ordered set edit screen is specified, the control unit displays a list of "0" or "1" data of each field of the specified symbol and a description of the bit contents. The display unit is controlled so as to be displayed on the symbol editing screen.

The error rate measuring device according to claim 2 is the error rate measuring device according to claim 1.
At the initial stage, the control unit 6 displays the preset data of the ordered set defined by the standard of the high-speed serial bus on the ordered set editing screen 5a, and from the second time onward, the ordered set at the time of the previous end is ordered. The display unit 5 is controlled so as to be displayed on the set edit screen.
When the ordered set is a USB Gen2 ordered set, a description of the symbols of each block divided into blocks in the order of the symbol numbers and a list display of 128-bit data are displayed on the ordered set edit screen, and the ordered set is displayed. In the case of the SKP ordered set of USB Gen1, the display unit is controlled so that the explanation of the symbol of each block divided into blocks in the order of the symbol number, the K code, and the list display of 8-bit data are displayed on the ordered set edit screen. It is characterized by doing.
The error rate measuring device according to claim 3 is the error rate measuring device according to claim 1 or 2.
It is characterized in that a list of ordered set data stored in the storage unit 3 is displayed on the display unit 5, and the data of the ordered set to be edited is specified and read from the displayed data list.

The error rate measuring method according to claim 4 uses an ordered set based on a high-speed serial bus standard for a measured object (W) equipped with a link state management mechanism, and uses the measured object as the standard. This is an error rate measuring method in which a test signal of a known pattern is input in a state of transitioning to the state defined by, and the bit error rate of the input data received from the object to be measured is measured in connection with the input of the test signal.
A step of displaying a pattern editing screen 5c capable of editing a pattern for transitioning to the state defined by the standard on a binary base or a hexa base on the display unit 5,
A step of switching to an ordered set editing screen 5a in which the ordered set can be edited in symbol units or a symbol editing screen 5b in which the symbol of the ordered set can be edited in bit units and displaying it on the display unit
Various information including the pattern editing screen, the ordered set editing screen, the symbol number of the ordered set based on the editing on the symbol editing screen, the special symbol, the 128-bit data, the K code, and the 8-bit data are stored in the storage unit 3. Steps to remember and
Editing an ordered set in symbol units on the ordered set editing screen, editing an ordered set in bit units on the symbol editing screen, editing a pattern on the pattern editing screen, and displaying various information to the storage unit. A step of operating the setting operation unit 2 when saving and reading various information from the storage unit, and
When the symbol of the ordered set on the ordered set edit screen is specified, a list of "0" or "1", which is the data of each field of the specified symbol, and the description of the bit contents is displayed on the symbol edit screen. It is characterized by including a step to be displayed.

Error rate measuring method described in claim 5 is the error rate measuring method according to claim 4,
At the initial stage, the preset data of the ordered set defined by the standard of the high-speed serial bus is displayed on the ordered set editing screen 5a, and from the second time onward, the ordered set at the end of the previous time is displayed on the ordered set editing screen. Steps and
When the ordered set is a USB Gen2 ordered set, a description of the symbols of each block divided into blocks in the order of the symbol numbers and a list display of 128-bit data are displayed on the ordered set edit screen, and the ordered set is displayed. In the case of the SKP ordered set of USB Gen1, it is characterized by including a description of the symbol of each block divided into blocks in the order of the symbol number, a K code, and a step of displaying a list display of 8-bit data on the ordered set edit screen. And.
The error rate measuring method according to claim 6 is the error rate measuring method according to claim 4 or 5.
The display unit 5 displays a list of ordered set data stored in the storage unit 3, and includes a step of designating and reading the ordered set data to be edited from the displayed data list. ..

According to the present invention, the user can freely edit a desired symbol unit or a designated symbol of an ordered set in bit units according to the encoding rules of each standard such as PCIe and USB. As a result, it is possible to create intuitive transmission patterns that could not be achieved with binary-based or hexa-based editors.

It is a block diagram which shows the schematic structure of the error rate measuring apparatus which concerns on this invention. It is a figure which shows an example of the ordered set edit screen which displays the ordered set of USB Gen2 in a list. It is a figure which shows an example of the symbol edit screen at the time of designating a predetermined symbol of the order set edit screen of FIG. 2 and editing by a bit unit. It is a figure which shows an example of the ordered set edit screen which displays the SKP ordered set of USB Gen1 in a list. It is a figure which shows an example of the symbol edit screen at the time of designating a predetermined symbol of the order set edit screen of FIG. 4, and editing by a bit unit. (A), (b) It is a flowchart of the editing method of an ordered set. It is a figure which shows an example of the pattern edit screen.

Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the attached drawings.

The error rate measuring device and the error rate measuring method according to the present invention are applied to an object to be measured equipped with a link state management mechanism in a standard test of a high-speed serial bus (hereinafter, abbreviated as HSB) such as USB and PCIe. Using an ordered set (physical layer packet) based on the standard, a test signal of a known pattern is transmitted to the object to be measured in a state where the object to be measured is transitioned to the signal pattern folding state (loopback), and this test signal is transmitted. This is to measure the bit error rate of the input data received by returning from the object to be measured with the transmission of.

As shown in FIG. 1, the error rate measuring device 1 of the present embodiment is roughly configured to include a setting operation unit 2, a storage unit 3, a measuring unit 4, a display unit 5, and a control unit 6.

The setting operation unit 2 is operated by the user, and is, for example, the display screen of the display unit 5 (ordered set editing screen 5a of FIGS. 2 and 4, symbol editing screen 5b of FIGS. 3 and 5, and FIG. 7). In addition to various soft keys, cursor keys, and arrow keys on the pattern editing screen 5c), it is composed of keys, switches, buttons, etc. provided on the main body of the device.

The setting operation unit 2 gives an instruction to start or stop transmitting a specific pattern or a test signal to the object W to be measured, an instruction to start or stop measuring the error rate of the object W to be measured, and edits the ordered set shown in FIGS. 2 and 4. When editing an ordered set on a symbol-by-symbol or bit-by-bit basis on the screen 5a, the symbol editing screen 5b of FIGS. 3 or 5, and editing a binary-based or hexa-based pattern on the pattern editing screen 5c of FIG. Be manipulated.

For example, in the ordered set editing screen 5a of FIGS. 2 and 4, the soft keys of the operation setting unit 2 are "Add", "Copy", "Cut", "Paste", "Clear All", "OK", and "OK". The softkeys 2a, 2b, 2c, 2d, 2e, 2f, 2g, 2h, 2i, 2j of "Cancel", "Save", "Load", and "Pattern Edit" are displayed.

Then, by appropriately operating the above soft keys, the block-divided ordered set symbol (# 0 to # 15) can be edited, and the set information of the ordered set edited in symbol units can be stored in the storage unit 3. It is possible to save and read the setting information of the ordered set stored in the storage unit 3.

Further, on the ordered set editing screen 5a, when a symbol to be edited is specified from a plurality of symbols of the ordered set divided into blocks and the soft key 2j of "Pattern Edit" is pressed, the display screen is displayed, for example, in FIG. The screen switches to the symbol editing screen 5b of the display format shown in FIG.

On the symbol editing screen 5b of FIGS. 3 and 5, by appropriately operating the above soft keys, the ordered set symbol specified on the ordered set editing screen 5a can be edited in bit units as well as in bit units. It is possible to save the set ordered set setting information in the storage unit 3 and read out the ordered set setting information stored in the storage unit 3.

In the illustrated example, the soft keys on the display screen of the display unit 5 are configured as a part of the setting operation unit 2, but an external input device provided separately from the error rate measuring device 1 is set and operated. It can also be used as part 2.

The storage unit 3 contains various information (symbol number, special symbol, 128-bit data, etc.) of the specific pattern and the ordered set based on the editing on the editing screen (ordered set editing screen 5a, symbol editing screen 5b, pattern editing screen 5c). Information such as K code and 8-bit data), information on known test signals, various information on measurement conditions and measurement results of the error rate of the object W to be measured are stored.

The measurement unit 4 includes a pattern generation unit 4a and an error detection unit 4b, and includes an HSB standard test of the object W to be measured by controlling the control unit 6 based on the operation information of the setting operation unit 2 and the storage information of the storage unit 3. Make various measurements.

The pattern generation unit 4a is known for performing various measurements of the specific pattern and the object W to be measured based on the setting information (information reflecting the editing on the ordered set editing screen 5a, the symbol editing screen 5b, and the pattern editing screen 5c). Generates a pattern test signal.

The error detection unit 4b transmits a test signal from the pattern generation unit 4a in a state where the object W to be measured is transitioned to the signal pattern folding state (loopback) according to the specific pattern generated by the pattern generation unit 4a. An error in the input data returned from the object W to be measured is detected, and various measurements including the HSB standard test of the object W to be measured are performed.

The display unit 5 is composed of, for example, a liquid crystal display mounted on the main body of the device. Under the control of the control unit 6, the display unit 5 selectively displays the ordered set editing screen 5a, the symbol editing screen 5b, and the pattern editing screen 5c on the display screen, or displays a setting screen of a specific pattern (not shown). , The results of various measurements based on the detection of an error in the input data returned from the object W to be measured when the test signal is transmitted to the object W to be measured are displayed.

Here, FIG. 2 shows an example of the ordered set editing screen 5a that displays a list of the ordered sets of the USB Gen2. In this ordered set editing screen 5a, the ordered set is divided into blocks for each symbol defined by USB Gen2 (standard), and the ordered set is displayed in a list in the order of symbol numbers (Symbol no.). Specifically, the ordered set of USB Gen2 is # 0, # 1, # 2, # 3, # 4, # 5, # 6, # 7, # 8, # 9, # 10, in the order of symbol numbers. It is divided into 16 blocks of # 11, # 12, # 13, # 14, and # 15, and the symbol description (Symbol Description) and 128-bit data of each block are displayed in a list on the ordered set edit screen 5a.

Further, FIG. 4 shows an example of the ordered set editing screen 5a for displaying a list of SKP ordered sets of USB Gen1. In this ordered set editing screen 5a, the ordered set of USB Gen1 is divided into five blocks of symbol numbers (Symbol no.) # 0, # 1, # 2, # 3, # 4, and each of them is divided into five blocks. List the block symbol description (Symbol Description), K code, and 8-bit data.

At the initial stage, the preset data of the ordered set defined by the predetermined standard of HSB (for example, USB Gen1) is displayed on the ordered set editing screen 5a. Further, from the second time onward, the ordered set at the end of the previous time is displayed on the ordered set editing screen 5a.

Further, FIG. 3 shows an example of a symbol editing screen when a predetermined symbol of the ordered set editing screen 5a of FIG. 2 is designated and edited in bit units. On this symbol editing screen 5b, the data (“0” or “1”, bit content description) of each field (Field) of the symbol specified on the ordered set editing screen 5a of FIG. 2 can be edited bit by bit. Display a list.

Further, FIG. 5 shows an example of a symbol editing screen when a predetermined symbol of the ordered set editing screen 5a of FIG. 4 is designated and edited in bit units. On the symbol editing screen 5b, the data (“0” or “1”) of each field (Field) of the symbol specified on the ordered set editing screen 5a of FIG. 4 is displayed in a bit-wise editable list.

The control unit 6 controls the measurement unit 4 based on the operation information of the setting operation unit 2 and the storage information of the storage unit 3, and controls each unit in an integrated manner in order to perform various measurements of the object W to be measured. The display control means 6a for controlling the display unit 5 when editing the set in symbol units or bit units is included.

Further, the display control means 6a controls the display unit 5 so as to display the ordered set editing screen 5a of FIGS. 2 and 4 when the ordered set is edited in symbol units.

Further, when the display control means 6a specifies the symbol of the ordered set to be edited on the ordered set editing screen 5a of FIGS. 2 and 4, and the soft key 2j of "Pattern Edit" is pressed, the display control means 6a is shown in FIGS. 3 and 4. The display unit 5 is controlled so as to display the symbol editing screen 5b of 5.

Further, although the display control means 6a is not particularly shown, when the soft key for displaying the measurement result of the object W to be measured is pressed, the measurement result of the object W to be measured based on the detection result of the error detection unit 4b is pressed. The display unit 5 is controlled so as to display the screen.

Next, a method of editing the ordered set by the error rate measuring device 1 configured as described above will be described with reference to FIGS. 6 (a) and 6 (b).

As shown in FIG. 6A, when the ordered set is edited in symbol units, the ordered set editing screen 5a of FIGS. 2 and 4 is displayed (ST1). Then, on the ordered set editing screen 5a, a setting operation unit including soft keys 2a to 2g of "Add", "Copy", "Cut", "Paste", "Clear All", "OK", and "Cancel". By the operation of 2, the ordered set can be freely edited in symbol units (ST2).

As shown in FIG. 6B, when the symbol of the ordered set specified on the ordered set editing screen 5a is edited in bit units, the ordered set editing screen 5a of FIGS. 2 and 4 is displayed ( ST11). Then, the symbol to be edited is selected from the ordered set editing screen 5a, and the soft key of "Pattern Edit" is pressed (ST12) to display the symbol editing screen 5b of FIGS. 3 and 4 (ST13). Then, on the symbol editing screen 5b, the setting operation unit 2 including the soft keys 2a to 2g of "Add", "Copy", "Cut", "Paste", "Clear All", "OK", and "Cancel" By the operation, the symbol of the ordered set can be freely edited bit by bit (ST14).

The ordered set data edited in symbol units or bit units on the above-mentioned ordered set editing screen 5a or symbol editing screen 5b is saved in the storage unit 3 by pressing the "Save" soft key 2h. To.

Further, on the ordered set editing screen 5a, press the soft key 2i of "Load" to display the ordered set data list (not shown) saved in the storage unit 3, and the ordered data to be edited from this data list. It is also possible to specify and read the set data.

As described above, in the present embodiment, the desired symbol unit of the ordered set or the designated symbol is bit-bitted by the ordered set editing screen 5a and the symbol editing screen 5b according to the encoding rules of each standard such as PCIe and USB. The user can freely edit in units. This allows the user to specify the symbol of the ordered set that he / she wants to edit and to change and edit a specific bit in the specified symbol. As a result, it is possible to create intuitive transmission patterns that could not be achieved with binary-based or hexa-based editors.

Although the best form of the error rate measuring device and the error rate measuring method according to the present invention has been described above, the present invention is not limited by the description and drawings in this form. That is, it goes without saying that all other forms, examples, operational techniques, and the like made by those skilled in the art based on this form are included in the scope of the present invention.

1 Error rate measuring device 2 Setting operation unit 2a to 2j Soft key 3 Storage unit 4 Measuring unit 4a Pattern generation unit 4b Error detection unit 5 Display unit 5a Ordered set editing screen 5b Symbol editing screen 5c Pattern editing screen 6 Control unit W Measurement object (DUT)

Claims (6)

Using an ordered set based on the high-speed serial bus standard for the object to be measured (W) equipped with a link state management mechanism, a known pattern test is performed while the object to be measured is transitioned to the state specified by the standard. An error rate measuring device (1) that inputs a signal and measures the bit error rate of the input data received from the object to be measured in connection with the input of the test signal.
A display unit (5) that displays a pattern editing screen (5c) that allows the pattern for transitioning to the state defined by the standard to be edited on a binary basis or a hexabase.
The display unit is displayed by switching to the ordered set editing screen (5a) in which the ordered set can be edited in symbol units or the symbol editing screen (5b) in which the symbols of the ordered set can be edited in bit units. Control unit (6) to control and
A storage unit that stores various information including the pattern editing screen, the ordered set editing screen, the symbol number of the ordered set based on the editing on the symbol editing screen, the special symbol, the 128-bit data, the K code, and the 8-bit data. (3) and
Editing an ordered set in symbol units on the ordered set editing screen, editing an ordered set in bit units on the symbol editing screen, editing a pattern on the pattern editing screen, and displaying various information to the storage unit. It is equipped with a setting operation unit (2) that is operated when saving and reading various information from the storage unit.
When the symbol of the ordered set is specified on the ordered set edit screen, the control unit displays a list of "0" or "1", which is the data of each field of the specified symbol, and a description of the bit contents. An error rate measuring device, characterized in that the display unit is controlled so as to be displayed on the symbol editing screen. The control unit (6) initially displays the preset data of the ordered set defined by the standard of the high-speed serial bus on the ordered set edit screen (5a), and the second and subsequent times are the ordered set at the end of the previous time. Is controlled on the ordered set edit screen so that the display unit (5) is displayed.
When the ordered set is a USB Gen2 ordered set, a description of the symbols of each block divided into blocks in the order of the symbol numbers and a list display of 128-bit data are displayed on the ordered set edit screen, and the ordered set is displayed. In the case of the SKP ordered set of USB Gen1, the display unit is controlled so that the description of the symbol of each block divided into blocks in the order of the symbol number, the K code, and the list display of 8-bit data are displayed on the ordered set edit screen. The error rate measuring device according to claim 1, wherein the error rate measuring device is characterized. It is characterized in that the data list of the ordered set stored in the storage unit (3) is displayed on the display unit (5), and the data of the ordered set to be edited is specified and read from the displayed data list. The error rate measuring device according to claim 1 or 2. Using an ordered set based on the high-speed serial bus standard for the object to be measured (W) equipped with a link state management mechanism, a known pattern test is performed while the object to be measured is transitioned to the state specified by the standard. It is an error rate measuring method that inputs a signal and measures the bit error rate of the input data received from the object to be measured in connection with the input of the test signal.
A step of displaying a pattern editing screen (5c) capable of editing a pattern for transitioning to the state defined by the standard on a binary base or a hexa base on the display unit (5), and
A step of switching to an ordered set editing screen (5a) in which the ordered set can be edited in symbol units or a symbol editing screen (5b) in which the symbol of the ordered set can be edited in bit units and displaying it on the display unit. ,
The storage unit (3) stores various information including the pattern edit screen, the ordered set edit screen, the symbol number of the ordered set based on the editing on the symbol edit screen, the special symbol, the 128-bit data, the K code, and the 8-bit data. ) And the steps to remember
Editing an ordered set in symbol units on the ordered set editing screen, editing an ordered set in bit units on the symbol editing screen, editing a pattern on the pattern editing screen, and displaying various information to the storage unit. A step of operating the setting operation unit (2) when saving and reading various information from the storage unit, and
When the symbol of the ordered set on the ordered set edit screen is specified, a list of "0" or "1", which is the data of each field of the specified symbol, and the description of the bit contents is displayed on the symbol edit screen. An error rate measuring method comprising displaying steps. At the initial stage, the preset data of the ordered set defined by the standard of the high-speed serial bus is displayed on the ordered set editing screen (5a), and from the second time onward, the ordered set at the end of the previous time is displayed on the ordered set editing screen. Steps to display and
When the ordered set is a USB Gen2 ordered set, a description of the symbols of each block divided into blocks in the order of the symbol numbers and a list display of 128-bit data are displayed on the ordered set edit screen, and the ordered set is displayed. In the case of the SKP ordered set of USB Gen1, it is characterized by including a description of the symbol of each block divided into blocks in the order of the symbol number, a K code, and a step of displaying a list display of 8-bit data on the ordered set edit screen. The error rate measuring method according to claim 4. The step of displaying the data list of the ordered set stored in the storage unit (3) on the display unit (5) and designating and reading the data of the ordered set to be edited from the displayed data list is included. The error rate measuring method according to claim 4 or 5.

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