JP6805433B2 - インラインディスペンスキャパシタシステム - Google Patents
インラインディスペンスキャパシタシステム Download PDFInfo
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- 239000003990 capacitor Substances 0.000 title description 20
- 239000012530 fluid Substances 0.000 claims description 318
- 238000012545 processing Methods 0.000 claims description 92
- 230000000670 limiting effect Effects 0.000 claims description 30
- 238000000034 method Methods 0.000 claims description 26
- 230000007423 decrease Effects 0.000 claims description 25
- 238000012546 transfer Methods 0.000 claims description 23
- 230000007246 mechanism Effects 0.000 claims description 19
- 230000008569 process Effects 0.000 claims description 10
- 239000000758 substrate Substances 0.000 description 21
- 239000007788 liquid Substances 0.000 description 19
- 239000000463 material Substances 0.000 description 19
- 239000000126 substance Substances 0.000 description 17
- 230000007547 defect Effects 0.000 description 13
- 229920001971 elastomer Polymers 0.000 description 10
- 238000001914 filtration Methods 0.000 description 10
- 230000032258 transport Effects 0.000 description 10
- 235000012431 wafers Nutrition 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 9
- 239000000806 elastomer Substances 0.000 description 7
- 230000003247 decreasing effect Effects 0.000 description 6
- 229920011301 perfluoro alkoxyl alkane Polymers 0.000 description 6
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 6
- 239000004810 polytetrafluoroethylene Substances 0.000 description 6
- 239000004813 Perfluoroalkoxy alkane Substances 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- 238000000059 patterning Methods 0.000 description 5
- 229920002120 photoresistant polymer Polymers 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 239000003708 ampul Substances 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 230000002829 reductive effect Effects 0.000 description 4
- 239000005060 rubber Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 3
- 230000008602 contraction Effects 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 229920003051 synthetic elastomer Polymers 0.000 description 3
- 229920006362 Teflon® Polymers 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000003251 chemically resistant material Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 230000002706 hydrostatic effect Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 239000005061 synthetic rubber Substances 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 230000002730 additional effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 150000001805 chlorine compounds Chemical class 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002480 mineral oil Substances 0.000 description 1
- 235000010446 mineral oil Nutrition 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 239000003208 petroleum Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008844 regulatory mechanism Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B13/00—Pumps specially modified to deliver fixed or variable measured quantities
- F04B13/02—Pumps specially modified to deliver fixed or variable measured quantities of two or more fluids at the same time
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C9/00—Apparatus or plant for applying liquid or other fluent material to surfaces by means not covered by any preceding group, or in which the means of applying the liquid or other fluent material is not important
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B13/00—Pumps specially modified to deliver fixed or variable measured quantities
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/0009—Special features
- F04B43/0054—Special features particularities of the flexible members
- F04B43/0072—Special features particularities of the flexible members of tubular flexible members
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/0009—Special features
- F04B43/0081—Special features systems, control, safety measures
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/08—Machines, pumps, or pumping installations having flexible working members having tubular flexible members
- F04B43/086—Machines, pumps, or pumping installations having flexible working members having tubular flexible members with two or more tubular flexible members in parallel
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B43/00—Machines, pumps, or pumping installations having flexible working members
- F04B43/08—Machines, pumps, or pumping installations having flexible working members having tubular flexible members
- F04B43/10—Pumps having fluid drive
- F04B43/107—Pumps having fluid drive the fluid being actuated directly by a piston
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B43/23—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B43/27—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04B—POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
- F04B7/00—Piston machines or pumps characterised by having positively-driven valving
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Coating Apparatus (AREA)
- Reciprocating Pumps (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Materials For Photolithography (AREA)
Description
Claims (14)
- 流体搬送のための装置であって、
圧力制御チャンバを規定する加圧流体ハウジングであって、該加圧流体ハウジングは、共通の圧力制御流体を収容するように構成された、加圧流体ハウジングと、
前記圧力制御チャンバ内に位置する複数のブラダであって、該複数のブラダは、それぞれブラダ処理流体入口とブラダ処理流体出口とを有し、各ブラダ処理流体入口は、前記圧力制御チャンバの対応するチャンバ処理流体入口に接続され、各ブラダ処理流体出口は、前記圧力制御チャンバの対応するチャンバ処理流体出口に接続され、各ブラダは、それぞれのブラダ処理流体入口と対応するブラダ処理流体出口と間に線形流路を規定し、各ブラダは、各ブラダにより規定される体積が変更可能なように前記圧力制御チャンバ内で膨張及び収縮するように構成され、各ブラダは、各ブラダに搬送される処理流体の流体圧を制御可能に調整するように構成されたそれぞれの圧力制御搬送システムから処理流体を受けるように構成された、複数のブラダと、
前記圧力制御チャンバであって、前記圧力制御チャンバは、共通の圧力制御流体を収容するように構成され、前記圧力制御チャンバが前記共通の圧力制御流体で満たされたときに、前記共通の圧力制御流体が前記複数のブラダの各ブラダの外面と接触するようにし、前記圧力制御チャンバは、前記共通の圧力制御流体の流体圧を選択的に増減させて、各ブラダの外面にかかる圧力の増減をもたらすチャンバ圧力制御機構を含む、圧力制御チャンバと、
各ブラダの膨張をそれぞれの最大ブラダ体積に物理的に制限するように構成されたブラダ膨張制限部と、
前記チャンバ圧力制御機構を作動させ、各ブラダにかかる前記圧力制御流体の流体圧を選択的に増減させて、各ブラダによって規定される前記体積が各ブラダ内の処理流体圧に応じて選択的に増減するように構成されたコントローラと、を含む装置。 - 前記ブラダ膨張制限部は、共通の圧力制御流体が各ブラダと前記ブラダ膨張制限部のブラダ対向面との間を移動することを許容する1つ以上の開口をそれぞれ規定する、請求項1に記載の装置。
- 前記ブラダ膨張制限部は、各ブラダの外面との接触のための表面を規定する、請求項1に記載の装置。
- 前記圧力制御チャンバは、各ブラダを取り囲み、ブラダ膨張を物理的に抑制するのに十分なブラダ接触面領域でブラダ膨張形状を規定するブラダ対向面を規定する、請求項3に記載の装置。
- 前記ブラダ膨張制限部は、前記ブラダ膨張制限部の端部部分と比較して、より大きなキャビティ直径を規定する中央部分を有する細長い形状を有する、請求項1に記載の装置。
- 前記ブラダ膨張制限部は複数のブラダスリーブを含み、それぞれのブラダスリーブは各ブラダの周りに位置し、各ブラダスリーブは対応する膨張したブラダの形状に実質的に一致する、請求項1に記載の装置。
- 前記ブラダ膨張制限部は、それぞれのブラダが前記ブラダ膨張制限部と完全に接触した後は、前記ブラダの追加の体積膨張が前記ブラダ膨張制限部との完全接触時のブラダ体積の1%未満に制限されるような十分な表面積及び剛性で構成された、請求項1に記載の装置。
- 前記複数のブラダのうちの少なくとも1つブラダは、前記チャンバ圧力制御機構としての使用のために構成された、請求項1に記載の装置。
- 前記コントローラは、前記複数のブラダのうちの第2の一部を膨張させることなく前記複数のブラダのうちの第1の一部を選択的に膨張させるように構成された、請求項1に記載の装置。
- 前記コントローラは、1つ以上の残りのブラダ内に1チャージ分の処理流体を蓄積しながら、1つ以上のブラダから同時にディスペンスするように前記共通の圧力制御流体の流体圧を調整するように構成された、請求項9に記載の装置。
- 前記コントローラは、前記複数のブラダのうちの第2の一部を収縮させることなく1つ以上のブラダを選択的に収縮させるように構成された、請求項1に記載の装置。
- 前記コントローラは、各ブラダに対してそれぞれの圧力制御搬送システムを選択的に制御するように構成された、請求項1に記載の装置。
- 前記コントローラは、前記圧力制御流体の流体圧を増加させながら、それぞれの圧力制御搬送システムを介して前記複数のブラダのうちの第2の一部の各ブラダ内にある処理流体圧の対応する増加を同時に生じさせるように構成された、請求項11に記載の装置。
- 流体搬送のための装置であって、
圧力制御チャンバを規定する加圧流体ハウジングであって、該加圧流体ハウジングは、共通の圧力制御流体を収容するように構成された、加圧流体ハウジングと、
前記圧力制御チャンバ内に位置する複数のブラダであって、該複数のブラダは、それぞれブラダ処理流体入口とブラダ処理流体出口とを有し、各ブラダ処理流体入口は、前記圧力制御チャンバの対応するチャンバ処理流体入口に接続され、各ブラダ処理流体出口は、前記圧力制御チャンバの対応するチャンバ処理流体出口に接続され、各ブラダは、それぞれのブラダ処理流体入口と対応するブラダ処理流体出口と間に線形流路を規定し、各ブラダは、各ブラダにより規定される体積が変更可能なように前記圧力制御チャンバ内で膨張及び収縮するように構成され、各ブラダは、各ブラダに搬送される処理流体の流体圧を制御可能に調整するように構成されたそれぞれの圧力制御搬送システムから処理流体を受けるように構成された、複数のブラダと、
前記圧力制御チャンバであって、前記圧力制御チャンバは、共通の圧力制御流体を収容するように構成され、前記圧力制御チャンバが前記共通の圧力制御流体で満たされたときに、前記共通の圧力制御流体が前記複数のブラダの各ブラダの外面と接触するようにし、前記圧力制御チャンバは、前記共通の圧力制御流体の流体圧を選択的に増減させて、各ブラダの外面にかかる圧力の増減をもたらすチャンバ圧力制御機構を含む、圧力制御チャンバと、
各ブラダの膨張をそれぞれの最大ブラダ体積に物理的に制限するように構成されたブラダ膨張制限部であって、共通の圧力制御流体が各ブラダと、該ブラダ膨張制限部のブラダ対向面との間を移動することを許容する1つ以上の開口を規定する、ブラダ膨張制限部と、
前記チャンバ圧力制御機構を作動させ、各ブラダにかかる前記圧力制御流体の流体圧を選択的に増減させて、各ブラダによって規定される前記体積が各ブラダ内の処理流体圧に応じて選択的に増減するように構成されたコントローラと、を含む装置。
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PCT/US2016/038684 WO2016209908A1 (en) | 2015-06-26 | 2016-06-22 | Inline dispense capacitor system |
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JP7321755B2 (ja) * | 2019-04-26 | 2023-08-07 | キヤノン株式会社 | 吐出材充填装置 |
KR102469772B1 (ko) | 2021-07-30 | 2022-11-22 | 한성대학교 산학협력단 | 복합링크구조를 도입한 로봇보행시스템 |
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