JP6768452B2 - ピクセル非一様性補正 - Google Patents
ピクセル非一様性補正 Download PDFInfo
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- JP6768452B2 JP6768452B2 JP2016217877A JP2016217877A JP6768452B2 JP 6768452 B2 JP6768452 B2 JP 6768452B2 JP 2016217877 A JP2016217877 A JP 2016217877A JP 2016217877 A JP2016217877 A JP 2016217877A JP 6768452 B2 JP6768452 B2 JP 6768452B2
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- 238000012937 correction Methods 0.000 title claims description 47
- 238000000034 method Methods 0.000 claims description 19
- 238000003384 imaging method Methods 0.000 claims description 18
- 238000009795 derivation Methods 0.000 claims description 9
- 238000001816 cooling Methods 0.000 claims description 6
- 230000001419 dependent effect Effects 0.000 claims description 5
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims description 4
- 238000004364 calculation method Methods 0.000 claims description 4
- 238000003331 infrared imaging Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000003491 array Methods 0.000 description 2
- 230000008030 elimination Effects 0.000 description 2
- 238000003379 elimination reaction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
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- 239000000737 potassium alginate Substances 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
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- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Studio Devices (AREA)
Description
この本発明は、米国海軍から授与された契約番号N00014−14−C−0061、及び、海兵隊システム・コマンド(MARCORSYSCOM)を通して授与された契約番号W15P7T−06−D−E402/S3及びW15P7T−10−D−D413/R23Gの下で、政府の支援を受けて達成された。米国政府は、本発明に特定の権利を有する。
101 レンズ光学系
102 焦点面アレイ(FPA)
104 読み出し集積回路(ROIC)
106 温度センサ
112 モジュール
Claims (11)
- 温度変化に対するピクセル非一様性の補正方法であって、
焦点面アレイ(FPA)の温度であるFPA温度を測定すること、
前記FPAに対してピクセル毎に非一様性補正マップを算出することであって、各ピクセルに対する非一様性補正が、前記FPA温度と実験的に導出された係数との関数であるよう前記非一様性補正マップを算出すること、及び
温度依存非一様性補正画像データを生成するために、前記FPAからのイメージング・データへ前記非一様性補正マップを適用することを含み、
各ピクセルに対する前記非一様性補正が前記FPA温度及び実験導出係数の関数となる前記算出が、次式によって支配され、
、方法。 - 前記非一様性補正マップを適用することが、前記FPAの前記温度を制御することなく実行される、請求項1に記載の方法。
- 前記FPA温度及び実験導出係数の前記関数が、前記FPA温度に基づき、各々のピクセルのレベルにおける変化を、所望の補正値へ近似することを含む、請求項1に記載の方法。
- 前記FPAが、バッファー付きカレント・ミラー・ピクセル・アーキテクチャを含む、請求項1に記載の方法。
- 前記FPAが、赤外イメージングのためのInGaAs材料を含む、請求項1に記載の方法。
- 焦点面アレイ(FPA)、
FPA温度を測定するために、作動可能に結合された温度センサ、及び
前記FPA及び温度センサへ作動可能に結合されたモジュールであって、前記FPA温度と実験的に導出された係数との関数として、前記FPAに対してピクセル毎に非一様性補正マップを適用する、及び、温度依存非一様性補正画像データを生成するために、前記FPAからの出力を調整するよう前記非一様性補正マップを適用する前記モジュールを含み、
前記モジュールが、次式に支配される前記FPA温度及び実験導出係数の関数として、前記FPAに対してピクセル毎に前記非一様性補正マップを算出するように構成され、
- 前記FPAの温度制御のために結合される熱電冷却デバイスが全く存在しない、請求項6に記載のシステム。
- 前記FPAの温度制御のために結合される温度制御デバイスが全く存在しない、請求項7に記載のシステム。
- 前記FPA温度及び実験導出係数の関数が、各々のピクセルの暗レベルにおける変化を、前記FPA温度での所望の補正値へ近似することを含む、請求項6に記載のシステム。
- 前記FPAが、バッファー付きカレント・ミラー・ピクセル・アーキテクチャを含む、請求項6に記載のシステム。
- 前記FPAが、赤外イメージングのためのInGaAs材料を含む、請求項6に記載のシステム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/939,449 US9936106B2 (en) | 2015-11-12 | 2015-11-12 | Pixel non-uniformity correction |
US14/939,449 | 2015-11-12 |
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JP2017090457A JP2017090457A (ja) | 2017-05-25 |
JP6768452B2 true JP6768452B2 (ja) | 2020-10-14 |
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US (1) | US9936106B2 (ja) |
EP (1) | EP3169055B1 (ja) |
JP (1) | JP6768452B2 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US10295230B2 (en) * | 2016-04-15 | 2019-05-21 | Sensors Unlimited, Inc. | Thermoelectric cooling management |
DE102016211821A1 (de) * | 2016-06-30 | 2018-01-04 | Robert Bosch Gmbh | Verfahren zur kontaktfreien Ermittlung einer Temperatur sowie Infrarot-Messsystem |
CN112781724B (zh) * | 2020-12-22 | 2022-11-29 | 上海微波技术研究所(中国电子科技集团公司第五十研究所) | 基于两点法的探测器非均匀性实时校正方法、系统及介质 |
CN113194251B (zh) * | 2021-04-28 | 2022-05-27 | 烟台艾睿光电科技有限公司 | 一种用于红外热成像设备校正的方法、装置、设备、介质 |
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US4587563A (en) | 1984-09-28 | 1986-05-06 | Rca Corporation | Cooler control for a solid-state imager camera |
JP3573040B2 (ja) | 1999-05-07 | 2004-10-06 | 三菱電機株式会社 | 赤外線カメラ及び赤外線カメラシステム |
US6433333B1 (en) * | 2000-03-03 | 2002-08-13 | Drs Sensors & Targeting Systems, Inc. | Infrared sensor temperature compensated response and offset correction |
WO2001084118A2 (en) * | 2000-05-01 | 2001-11-08 | Bae Systems Information And Electronic Systems Integration Inc. | Methods and apparatus for compensating a radiation sensor for temperature variations of the sensor |
US7235785B2 (en) | 2001-05-11 | 2007-06-26 | Irvine Sensors Corp. | Imaging device with multiple fields of view incorporating memory-based temperature compensation of an uncooled focal plane array |
US6476392B1 (en) | 2001-05-11 | 2002-11-05 | Irvine Sensors Corporation | Method and apparatus for temperature compensation of an uncooled focal plane array |
US20020166968A1 (en) | 2001-05-11 | 2002-11-14 | Bradley Martin G. | Apparatus and method of measuring bolometric resistance changes in an uncooled and thermally unstabilized focal plane array over a wide temperature range |
JP2005236550A (ja) * | 2004-02-18 | 2005-09-02 | Mitsubishi Electric Corp | 赤外線カメラ |
JP2006013885A (ja) * | 2004-06-25 | 2006-01-12 | Fuji Photo Film Co Ltd | カメラ |
US20080179520A1 (en) | 2007-01-30 | 2008-07-31 | Northrop Grumman Corporation | Direct-view focal plane array |
EP2143141A4 (en) | 2007-04-18 | 2011-04-13 | Invisage Technologies Inc | MATERIAL SYSTEMS AND METHOD FOR OPTOELECTRONIC ARRANGEMENTS |
US7679048B1 (en) | 2008-04-18 | 2010-03-16 | Flir Systems, Inc. | Systems and methods for selecting microbolometers within microbolometer focal plane arrays |
WO2010128509A1 (en) | 2009-05-06 | 2010-11-11 | Real Imaging Ltd. | Camera having a temperature balancing feature |
US10091439B2 (en) | 2009-06-03 | 2018-10-02 | Flir Systems, Inc. | Imager with array of multiple infrared imaging modules |
US8569684B2 (en) * | 2009-11-06 | 2013-10-29 | Steven J. Olson | Infrared sensor control architecture |
US9450001B2 (en) * | 2009-12-03 | 2016-09-20 | Technion Research & Development Foundation Limited | Method and system for detecting light and designing a light detector |
EA024855B1 (ru) | 2012-07-10 | 2016-10-31 | Закрытое Акционерное Общество "Импульс" | Способ получения субтракционного ангиографического изображения |
US8987667B2 (en) | 2013-05-15 | 2015-03-24 | Sensors Unlimited, Inc. | Systems and methods for image lag mitigation for buffered direct injection readout with current mirror |
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2015
- 2015-11-12 US US14/939,449 patent/US9936106B2/en active Active
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2016
- 2016-11-08 JP JP2016217877A patent/JP6768452B2/ja active Active
- 2016-11-11 EP EP16198324.2A patent/EP3169055B1/en active Active
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Publication number | Publication date |
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EP3169055A1 (en) | 2017-05-17 |
EP3169055B1 (en) | 2019-07-24 |
US20170142297A1 (en) | 2017-05-18 |
US9936106B2 (en) | 2018-04-03 |
JP2017090457A (ja) | 2017-05-25 |
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