JP6727124B2 - ランダム波長計測器 - Google Patents
ランダム波長計測器 Download PDFInfo
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- JP6727124B2 JP6727124B2 JP2016527442A JP2016527442A JP6727124B2 JP 6727124 B2 JP6727124 B2 JP 6727124B2 JP 2016527442 A JP2016527442 A JP 2016527442A JP 2016527442 A JP2016527442 A JP 2016527442A JP 6727124 B2 JP6727124 B2 JP 6727124B2
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- 230000003287 optical effect Effects 0.000 claims description 45
- 230000008859 change Effects 0.000 claims description 31
- 230000001427 coherent effect Effects 0.000 claims description 18
- 230000006641 stabilisation Effects 0.000 claims description 11
- 238000011105 stabilization Methods 0.000 claims description 11
- 230000000087 stabilizing effect Effects 0.000 claims description 8
- 239000000835 fiber Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 17
- 238000012549 training Methods 0.000 description 15
- 239000002245 particle Substances 0.000 description 13
- 238000013459 approach Methods 0.000 description 11
- 239000011159 matrix material Substances 0.000 description 11
- 238000010586 diagram Methods 0.000 description 10
- 238000000513 principal component analysis Methods 0.000 description 10
- 238000000354 decomposition reaction Methods 0.000 description 9
- 230000035945 sensitivity Effects 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 230000010287 polarization Effects 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 230000000737 periodic effect Effects 0.000 description 6
- 238000012795 verification Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000010238 partial least squares regression Methods 0.000 description 4
- 238000007493 shaping process Methods 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000013590 bulk material Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 230000000739 chaotic effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000004038 photonic crystal Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 230000036962 time dependent Effects 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 238000010200 validation analysis Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000656145 Thyrsites atun Species 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000012620 biological material Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000008713 feedback mechanism Effects 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000012417 linear regression Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000491 multivariate analysis Methods 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000012847 principal component analysis method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J2001/0481—Preset integrating sphere or cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Lasers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
Claims (17)
- 制御可能なレーザ源と、該制御可能なレーザ源から出力され次いでランダマイザに入射する光をランダム化してスペックルパターンを生成するための前記ランダマイザと、前記スペックルパターンを検出して光の1つ以上の特性及び/又は光の1つ以上の特性における変化を求めるための検出器と、求められた光の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて制御可能なレーザ源を制御するためのコントローラと、を備えるレーザシステム。
- 前記ランダマイザは、光を散乱させることでランダム化させ、スペックルパターンを生成するための、複数のランダムに配置された散乱体を備える、請求項1に記載のレーザシステム。
- 前記ランダマイザは透過型である、請求項1又は2に記載のレーザシステム。
- 前記ランダマイザは反射型である、請求項1から3のいずれか一項に記載のレーザシステム。
- 前記ランダマイザは、光を内部反射させ、ランダム化させてスペックルパターンを生成するための中空要素を備える、請求項4に記載のレーザシステム。
- 前記ランダマイザは積分球、中空球体、及び中空管の少なくとも1つを備える、請求項5に記載のレーザシステム。
- 前記コントローラは、レーザキャビティ及びレーザ利得媒体の長さのうち少なくとも一方を制御又は変化するように動作可能である、請求項1から6のいずれか一項に記載のレーザシステム。
- 前記コントローラは、イントラキャビティ素子の少なくとも1つの特性を制御又は変化するように動作可能である、請求項1から7のいずれか一項に記載のレーザシステム。
- 制御可能なコヒーレント光源又はレーザ源の出力を安定させるための安定システムであって、前記制御可能なコヒーレント光源又はレーザ源から出力され次いでランダマイザに入射する光をランダム化してスペックルパターンを生成するための前記ランダマイザと、スペックルパターンを検出し分析して前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化を求めるための検出器と、求められた前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて前記制御可能なコヒーレント光源又はレーザ源を制御するためのコントローラと、を備える安定システム。
- 複数の検出器を備え、スペックルパターンの少なくとも一部は、前記複数の検出器に入射する、請求項9に記載の安定システム。
- スペックルパターンの異なる部分は異なる検出器に入射する、請求項10に記載の安定システム。
- 前記制御可能なコヒーレント光源又はレーザ源からの光出力の異なる特性を求めるのに、異なる検出器が動作可能である、請求項10又は11に記載の安定システム。
- 前記制御可能なコヒーレント光源又はレーザ源からの光出力の異なる特性を同時に求めるのに、異なる検出器が動作可能である、請求項12に記載の安定システム。
- 前記コントローラは、求められた前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて、前記制御可能なコヒーレント光源又はレーザ源の少なくとも1つの動作パラメータを制御又は変化させるように構成されている、請求項9から13のいずれか一項に記載の安定システム。
- 前記コントローラは、求められた前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて、前記制御可能なコヒーレント光源又はレーザ源の動作温度又はポンプ電流を制御又は変化させるように構成されている、請求項14に記載の安定システム。
- 前記コントローラは、求められた前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて、前記制御可能なコヒーレント光源又はレーザ源のレーザキャビティの長さ及びレーザ利得媒体の特性の少なくとも1つを制御又は変化させるように構成されている、請求項14又は15に記載の安定システム。
- 前記コントローラは、求められた前記制御可能なコヒーレント光源又はレーザ源からの光出力の1つ以上の特性及び/又は光の1つ以上の特性における変化に基づいて、前記制御可能なコヒーレント光源又はレーザ源のビーム整形器、1つ以上のフィルタ、及びイントラキャビティ素子の少なくとも1つの特性を制御又は変化させるように構成されている、請求項14から16のいずれか一項に記載の安定システム。
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JP2019128772A JP6983836B2 (ja) | 2013-10-29 | 2019-07-10 | ランダム波長計測器 |
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GB201319079A GB201319079D0 (en) | 2013-10-29 | 2013-10-29 | Random Wavelength Meter |
GB1319079.8 | 2013-10-29 | ||
PCT/GB2014/053218 WO2015063481A2 (en) | 2013-10-29 | 2014-10-29 | Random wavelength meter |
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JP2017501385A JP2017501385A (ja) | 2017-01-12 |
JP6727124B2 true JP6727124B2 (ja) | 2020-07-22 |
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JP2016527442A Active JP6727124B2 (ja) | 2013-10-29 | 2014-10-29 | ランダム波長計測器 |
JP2019128772A Active JP6983836B2 (ja) | 2013-10-29 | 2019-07-10 | ランダム波長計測器 |
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US (2) | US10006811B2 (ja) |
EP (2) | EP3225962B1 (ja) |
JP (2) | JP6727124B2 (ja) |
KR (1) | KR102376180B1 (ja) |
CN (1) | CN105705922B (ja) |
AU (1) | AU2014343422B2 (ja) |
CA (2) | CA3237478A1 (ja) |
ES (2) | ES2912116T3 (ja) |
GB (1) | GB201319079D0 (ja) |
WO (1) | WO2015063481A2 (ja) |
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DE102013209104A1 (de) * | 2013-05-16 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Vorrichtung und Verfahren zur spektroskopischen Analyse |
GB201319079D0 (en) | 2013-10-29 | 2013-12-11 | Univ St Andrews | Random Wavelength Meter |
GB2528633B (en) * | 2014-05-08 | 2018-10-10 | Mbda Uk Ltd | Method and apparatus for detecting light |
KR101766328B1 (ko) * | 2015-05-28 | 2017-08-08 | 광주과학기술원 | 현미경 |
KR101638016B1 (ko) * | 2015-05-28 | 2016-07-08 | 광주과학기술원 | 내시경 |
KR102009370B1 (ko) * | 2017-11-02 | 2019-08-09 | 주식회사 더웨이브톡 | 스펙클 검사 장치 및 스펙클 증폭 장치 |
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KR102207041B1 (ko) * | 2019-05-17 | 2021-01-25 | 주식회사 더웨이브톡 | 광학 측정 장치 |
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Also Published As
Publication number | Publication date |
---|---|
GB201319079D0 (en) | 2013-12-11 |
US10429245B2 (en) | 2019-10-01 |
WO2015063481A3 (en) | 2015-07-23 |
EP3225962B1 (en) | 2022-02-23 |
EP3063515A2 (en) | 2016-09-07 |
CA3237478A1 (en) | 2015-05-07 |
KR102376180B1 (ko) | 2022-03-21 |
US20180266890A1 (en) | 2018-09-20 |
ES2910448T3 (es) | 2022-05-12 |
US10006811B2 (en) | 2018-06-26 |
AU2014343422A1 (en) | 2016-05-05 |
EP3063515B1 (en) | 2022-03-23 |
ES2912116T3 (es) | 2022-05-24 |
US20160258817A1 (en) | 2016-09-08 |
CA2928892A1 (en) | 2015-05-07 |
CN105705922B (zh) | 2020-04-14 |
WO2015063481A2 (en) | 2015-05-07 |
EP3225962A2 (en) | 2017-10-04 |
JP2017501385A (ja) | 2017-01-12 |
CN105705922A (zh) | 2016-06-22 |
KR20160120269A (ko) | 2016-10-17 |
EP3225962A3 (en) | 2018-02-14 |
JP6983836B2 (ja) | 2021-12-17 |
AU2014343422B2 (en) | 2019-07-04 |
JP2019215351A (ja) | 2019-12-19 |
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