JP6654948B2 - パルス光の波形計測方法及び波形計測装置 - Google Patents
パルス光の波形計測方法及び波形計測装置 Download PDFInfo
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- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/137—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells characterised by the electro-optical or magneto-optical effect, e.g. field-induced phase transition, orientation effect, guest-host interaction or dynamic scattering
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- G02F2203/00—Function characteristic
- G02F2203/20—Intrinsic phase difference, i.e. optical bias, of an optical modulator; Methods for the pre-set thereof
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
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Description
EMO=Ecosθ
ENON=Esinθ
数式(3)の右辺第一項(第1の偏光成分EMO)は変調の影響を受けて遅延するが、第二項(第2の偏光成分ENON)は変調されないため遅延しない。従って、変調されたパルス光Lp1と変調されなかったパルス光Lp2とが時間的に分離される。更に、任意の時間強度波形に変換するための制御を行うと、複素電場は次の数式(4)のようになる。I’(t)は変換後の時間強度波形を表し、φ’(t)は変換後の時間位相を表す。
数式(4)は、任意の波形に変換されたパルス光Lp1と、パルス光Lpの波形を保ったパルス光Lp2とが時間的に分離されることを示している。
数式(5)は、パルス光Lp1とパルス光Lp2との相関波形を表す。一般的に初期パルス光Lpの波形はsech関数型やガウス型であるため、得られる相関波形は、複雑に変換されたパルス光Lp1の時間強度波形に近い波形となる。初期パルス光Lpが歪んでいたり、レンズなどの光学素子によって歪んでしまう場合には、回折格子対やチャープミラー等を用いて歪みを補償するとよい。
この数式(6)はFROGトレースと呼ばれ、このデータから位相情報を求めることができる。例えば、演算部26は、上記の相関波形に変えて、若しくは上記の相関波形とともに、SHG光の強度スペクトルに基づいてパルス光Lp1とパルス光Lp2との相関マップ(時間、相関波形、及び波長の三次元情報)を求めてもよい。なお、FROG法については、Rick Trebino et al., “Measuring ultrashort laser pulses in thetime-frequency domain using frequencyresolved optical gating”, Review ofScientific Instruments, Vol.68, No.9, pp.3277-3295 (1997)に詳しく記載されている。
まず、パルス光Lpの偏光面の回転角θを偏光制御部22により調整する。回転角θ(単位:度)は、90×n(nは整数)以外であればよい。その後、パルス光LpはSLM14を経てパルス光Lp1とパルス光Lp2とに分離される。ここで、パルス光Lp1の位相変調を行い、パルス光Lp2に対する時間差を与える。ここで図6(a)は、パルス光Lp1に与えるスペクトル波形(グラフG1:スペクトル強度、グラフG21〜G23:スペクトル位相)を示す。図6(b)のグラフG31〜G33はパルス光Lp1の時間強度波形を示し、グラフG4はパルス光Lp2の時間強度波形を示す。図6(c)は、図6(b)に示される各パルス光の偏光方向を示す。
この方法では、パルス光Lp1とパルス光Lp2との時間差に加えて、パルス光Lp1の時間強度波形を任意に制御する。ここで図8(a)は、パルス光Lp1に与えるスペクトル波形(グラフG5:スペクトル強度、グラフG6:スペクトル位相)を示す。図8(b)のグラフG7はパルス光Lp1の時間強度波形を示し、グラフG8はパルス光Lp2の時間強度波形を示す。図8(c)は、図8(b)に示される各パルス光の偏光方向を示す。
Claims (7)
- 初期パルス光を波長毎に空間的に分散し、偏光依存型の空間光変調器において変調作用が得られる偏光方向に対して偏光面を傾斜させた状態で、分散後の前記初期パルス光を前記空間光変調器に入力し、前記偏光方向に沿った前記初期パルス光の第1の偏光成分の位相スペクトルを変調したのち各波長成分を合成することにより、前記第1の偏光成分から成る第1のパルス光と、該第1の偏光成分と直交する前記初期パルス光の第2の偏光成分から成る第2のパルス光とに時間差を生じさせる時間差生成ステップと、
前記第1のパルス光及び前記第2のパルス光を対象物に照射し、該照射に起因して前記対象物に生じる光を検出する光検出ステップと、を含み、
前記時間差生成ステップにおける前記第1のパルス光と前記第2のパルス光との時間差を変更しながら前記光検出ステップを行い、各光検出ステップの検出結果に基づいて前記第1のパルス光の時間強度波形を求める、パルス光の波形計測方法。 - 前記時間差生成ステップは、前記初期パルス光の偏光面を回転させる偏光制御ステップを含む、請求項1に記載のパルス光の波形計測方法。
- 前記対象物が非線形光学結晶を含む、請求項1または2に記載のパルス光の波形計測方法。
- 前記第1のパルス光の時間強度波形を求める為に、各光検出ステップの検出結果から前記第1のパルス光と前記第2のパルス光との相関波形若しくは相関マップを求める、請求項1〜3のいずれか一項に記載のパルス光の波形計測方法。
- 前記対象物に生じる光は、少なくとも第二高調波、第三高調波、高次高調波、和周波、差周波、ラマン散乱光の何れか1つを含む、請求項1〜4のいずれか一項に記載のパルス光の波形計測方法。
- 前記光検出ステップでは、少なくとも分光器、光電子増倍管、及びフォトダイオードの何れか1つを用いて前記対象物に生じる光を検出する、請求項1〜5のいずれか一項に記載のパルス光の波形計測方法。
- 偏光依存型の空間光変調器を有し、該空間光変調器において変調作用が得られる偏光方向に対して偏光面を傾斜させた状態で、波長毎に空間的に分散された初期パルス光を前記空間光変調器に入力し、前記偏光方向に沿った前記初期パルス光の第1の偏光成分の位相スペクトルを変調したのち各波長成分を合成することにより、前記第1の偏光成分から成る第1のパルス光と、該第1の偏光成分と直交する前記初期パルス光の第2の偏光成分から成る第2のパルス光とに時間差を生じさせる変調部と、
前記第1のパルス光及び前記第2のパルス光を対象物に照射することにより前記対象物に生じる光を検出する光検出部と、
前記第1のパルス光と前記第2のパルス光との時間差が変更される毎に得られる前記光検出部の検出結果に基づいて前記第1のパルス光の時間強度波形を求める演算部と、
を備える、パルス光の波形計測装置。
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EP17774344.0A EP3438625B1 (en) | 2016-03-30 | 2017-03-15 | Pulsed light waveform measurement method and waveform measurement device |
PCT/JP2017/010477 WO2017169800A1 (ja) | 2016-03-30 | 2017-03-15 | パルス光の波形計測方法及び波形計測装置 |
US16/088,875 US10378964B2 (en) | 2016-03-30 | 2017-03-15 | Pulsed light waveform measurement method and waveform measurement device |
CN201780020106.XA CN108885138B (zh) | 2016-03-30 | 2017-03-15 | 脉冲光的波形测量方法及波形测量装置 |
TW106110083A TWI729098B (zh) | 2016-03-30 | 2017-03-27 | 脈衝光之波形計測方法及波形計測裝置 |
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